@inproceedings{64838,
  author       = {{Jafarzadeh, Hanieh and Reimer, Jan Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{To appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026}},
  title        = {{{Validating Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG}}},
  year         = {{2026}},
}

@misc{64839,
  author       = {{Jafarzadeh, Hanieh and Reimer, Jan Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  title        = {{{SAT-Based Validation of Statistical Delay Test Generation under Timing Variations}}},
  year         = {{2026}},
}

@inproceedings{59218,
  author       = {{Reimer, Jan Dennis and Holst, Stefan and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim and Hellebrand, Sybille}},
  booktitle    = {{IEEE International Symposium of Electronics Design Automation (ISEDA'25), May 2025}},
  title        = {{{ThorSim: Throughput-Oriented Timing Simulation of FinFET Digital Circuits}}},
  year         = {{2025}},
}

@misc{50284,
  author       = {{Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}},
  publisher    = {{37. ITG / GMM / GI -Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"  (TuZ'24), Feb. 2024}},
  title        = {{{Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}}},
  year         = {{2024}},
}

@inproceedings{56014,
  author       = {{Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and  Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{In: IEEE International Test Conference (ITC'24), San Diego, CA, USA, November 2024}},
  location     = {{San Diego, CA, USA}},
  publisher    = {{IEEE}},
  title        = {{{Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing}}},
  year         = {{2024}},
}

@inproceedings{46738,
  author       = {{Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE Asian Test Symposium (ATS'23), October 2023}},
  title        = {{{Optimizing the Streaming of Sensor Data with Approximate Communication}}},
  year         = {{2023}},
}

@inproceedings{45830,
  author       = {{Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE International Test Conference (ITC'23), Anaheim, USA, October 2023}},
  location     = {{Anaheim, USA}},
  publisher    = {{IEEE}},
  title        = {{{Robust Pattern Generation for Small Delay Faults under Process Variations}}},
  year         = {{2023}},
}

@misc{35204,
  author       = {{Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  pages        = {{2}},
  publisher    = {{35. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'23), Feb. 2023}},
  title        = {{{On Cryptography Effects on Interconnect Reliability}}},
  year         = {{2023}},
}

@inproceedings{41875,
  author       = {{Badran, Abdalrhman  and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}},
  booktitle    = {{28th IEEE European Test Symposium (ETS'23), May 2023}},
  title        = {{{Approximate Computing: Balancing Performance, Power, Reliability, and Safety}}},
  year         = {{2023}},
}

@inproceedings{19422,
  author       = {{Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}},
  booktitle    = {{IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}},
  title        = {{{Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}}},
  year         = {{2020}},
}

@inproceedings{19421,
  author       = {{Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}},
  booktitle    = {{IEEE International Test Conference (ITC'20), November 2020}},
  title        = {{{Logic Fault Diagnosis of Hidden Delay Defects}}},
  year         = {{2020}},
}