---
_id: '64838'
author:
- first_name: Hanieh
full_name: Jafarzadeh, Hanieh
last_name: Jafarzadeh
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Hussam
full_name: Amrouch, Hussam
last_name: Amrouch
- first_name: Sybille
full_name: Hellebrand, Sybille
last_name: Hellebrand
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Jafarzadeh H, Reimer JD, Amrouch H, Hellebrand S, Wunderlich H-J. Validating
Statistical Delay Test Generation under Timing Variations via SAT-Based ATPG.
In: To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March
2026. ; 2026.'
apa: 'Jafarzadeh, H., Reimer, J. D., Amrouch, H., Hellebrand, S., & Wunderlich,
H.-J. (2026). Validating Statistical Delay Test Generation under Timing Variations
via SAT-Based ATPG. To Appear in: 27th IEEE Latin American Test Symposium (LATS2026),
March 2026.'
bibtex: '@inproceedings{Jafarzadeh_Reimer_Amrouch_Hellebrand_Wunderlich_2026, place={Florianopolis,
Brazil}, title={Validating Statistical Delay Test Generation under Timing Variations
via SAT-Based ATPG}, booktitle={To appear in: 27th IEEE Latin American Test Symposium
(LATS2026), March 2026}, author={Jafarzadeh, Hanieh and Reimer, Jan Dennis and
Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2026}
}'
chicago: 'Jafarzadeh, Hanieh, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand,
and Hans-Joachim Wunderlich. “Validating Statistical Delay Test Generation under
Timing Variations via SAT-Based ATPG.” In To Appear in: 27th IEEE Latin American
Test Symposium (LATS2026), March 2026. Florianopolis, Brazil, 2026.'
ieee: H. Jafarzadeh, J. D. Reimer, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich,
“Validating Statistical Delay Test Generation under Timing Variations via SAT-Based
ATPG,” 2026.
mla: 'Jafarzadeh, Hanieh, et al. “Validating Statistical Delay Test Generation under
Timing Variations via SAT-Based ATPG.” To Appear in: 27th IEEE Latin American
Test Symposium (LATS2026), March 2026, 2026.'
short: 'H. Jafarzadeh, J.D. Reimer, H. Amrouch, S. Hellebrand, H.-J. Wunderlich,
in: To Appear in: 27th IEEE Latin American Test Symposium (LATS2026), March 2026,
Florianopolis, Brazil, 2026.'
date_created: 2026-03-04T15:44:27Z
date_updated: 2026-03-04T15:50:59Z
department:
- _id: '48'
language:
- iso: eng
place: Florianopolis, Brazil
publication: 'To appear in: 27th IEEE Latin American Test Symposium (LATS2026), March
2026'
status: public
title: Validating Statistical Delay Test Generation under Timing Variations via SAT-Based
ATPG
type: conference
user_id: '36703'
year: '2026'
...
---
_id: '64839'
author:
- first_name: Hanieh
full_name: Jafarzadeh, Hanieh
last_name: Jafarzadeh
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Hussam
full_name: Amrouch, Hussam
last_name: Amrouch
- first_name: Sybille
full_name: Hellebrand, Sybille
last_name: Hellebrand
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Jafarzadeh H, Reimer JD, Amrouch H, Hellebrand S, Wunderlich H-J. SAT-Based
Validation of Statistical Delay Test Generation under Timing Variations.;
2026.
apa: Jafarzadeh, H., Reimer, J. D., Amrouch, H., Hellebrand, S., & Wunderlich,
H.-J. (2026). SAT-Based Validation of Statistical Delay Test Generation under
Timing Variations.
bibtex: '@book{Jafarzadeh_Reimer_Amrouch_Hellebrand_Wunderlich_2026, place={Workshop:
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2026), Feb.
2026}, title={SAT-Based Validation of Statistical Delay Test Generation under
Timing Variations}, author={Jafarzadeh, Hanieh and Reimer, Jan Dennis and Amrouch,
Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2026} }'
chicago: 'Jafarzadeh, Hanieh, Jan Dennis Reimer, Hussam Amrouch, Sybille Hellebrand,
and Hans-Joachim Wunderlich. SAT-Based Validation of Statistical Delay Test
Generation under Timing Variations. Workshop: Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen (TuZ 2026), Feb. 2026, 2026.'
ieee: 'H. Jafarzadeh, J. D. Reimer, H. Amrouch, S. Hellebrand, and H.-J. Wunderlich,
SAT-Based Validation of Statistical Delay Test Generation under Timing Variations.
Workshop: Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2026),
Feb. 2026, 2026.'
mla: Jafarzadeh, Hanieh, et al. SAT-Based Validation of Statistical Delay Test
Generation under Timing Variations. 2026.
short: 'H. Jafarzadeh, J.D. Reimer, H. Amrouch, S. Hellebrand, H.-J. Wunderlich,
SAT-Based Validation of Statistical Delay Test Generation under Timing Variations,
Workshop: Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2026),
Feb. 2026, 2026.'
date_created: 2026-03-04T15:49:51Z
date_updated: 2026-03-04T15:49:55Z
department:
- _id: '48'
language:
- iso: eng
place: 'Workshop: Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ
2026), Feb. 2026'
status: public
title: SAT-Based Validation of Statistical Delay Test Generation under Timing Variations
type: misc
user_id: '36703'
year: '2026'
...
---
_id: '59218'
author:
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Stefan
full_name: Holst, Stefan
last_name: Holst
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
last_name: Sadeghi-Kohan
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Sybille
full_name: Hellebrand, Sybille
last_name: Hellebrand
citation:
ama: 'Reimer JD, Holst S, Sadeghi-Kohan S, Wunderlich H-J, Hellebrand S. ThorSim:
Throughput-Oriented Timing Simulation of FinFET Digital Circuits. In: IEEE
International Symposium of Electronics Design Automation (ISEDA’25), May 2025.
; 2025.'
apa: 'Reimer, J. D., Holst, S., Sadeghi-Kohan, S., Wunderlich, H.-J., & Hellebrand,
S. (2025). ThorSim: Throughput-Oriented Timing Simulation of FinFET Digital Circuits.
IEEE International Symposium of Electronics Design Automation (ISEDA’25), May
2025.'
bibtex: '@inproceedings{Reimer_Holst_Sadeghi-Kohan_Wunderlich_Hellebrand_2025, place={Hong
Kong, China}, title={ThorSim: Throughput-Oriented Timing Simulation of FinFET
Digital Circuits}, booktitle={IEEE International Symposium of Electronics Design
Automation (ISEDA’25), May 2025}, author={Reimer, Jan Dennis and Holst, Stefan
and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim and Hellebrand, Sybille},
year={2025} }'
chicago: 'Reimer, Jan Dennis, Stefan Holst, Somayeh Sadeghi-Kohan, Hans-Joachim
Wunderlich, and Sybille Hellebrand. “ThorSim: Throughput-Oriented Timing Simulation
of FinFET Digital Circuits.” In IEEE International Symposium of Electronics
Design Automation (ISEDA’25), May 2025. Hong Kong, China, 2025.'
ieee: 'J. D. Reimer, S. Holst, S. Sadeghi-Kohan, H.-J. Wunderlich, and S. Hellebrand,
“ThorSim: Throughput-Oriented Timing Simulation of FinFET Digital Circuits,” 2025.'
mla: 'Reimer, Jan Dennis, et al. “ThorSim: Throughput-Oriented Timing Simulation
of FinFET Digital Circuits.” IEEE International Symposium of Electronics Design
Automation (ISEDA’25), May 2025, 2025.'
short: 'J.D. Reimer, S. Holst, S. Sadeghi-Kohan, H.-J. Wunderlich, S. Hellebrand,
in: IEEE International Symposium of Electronics Design Automation (ISEDA’25),
May 2025, Hong Kong, China, 2025.'
date_created: 2025-03-31T15:57:21Z
date_updated: 2025-11-03T13:30:51Z
department:
- _id: '48'
language:
- iso: eng
place: Hong Kong, China
publication: IEEE International Symposium of Electronics Design Automation (ISEDA'25),
May 2025
status: public
title: 'ThorSim: Throughput-Oriented Timing Simulation of FinFET Digital Circuits'
type: conference
user_id: '36703'
year: '2025'
...
---
_id: '50284'
author:
- first_name: Alisa
full_name: Stiballe, Alisa
last_name: Stiballe
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Stiballe A, Reimer JD, Sadeghi-Kohan S, Hellebrand S. Modeling Crosstalk-Induced
Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop
“Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb.
2024; 2024.
apa: Stiballe, A., Reimer, J. D., Sadeghi-Kohan, S., & Hellebrand, S. (2024).
Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression.
37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen
und Systemen” (TuZ’24), Feb. 2024.
bibtex: '@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt,
Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial
Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and
Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024}
}'
chicago: 'Stiballe, Alisa, Jan Dennis Reimer, Somayeh Sadeghi-Kohan, and Sybille
Hellebrand. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression.
Darmstadt, Germany: 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’24), Feb. 2024, 2024.'
ieee: 'A. Stiballe, J. D. Reimer, S. Sadeghi-Kohan, and S. Hellebrand, Modeling
Crosstalk-induced Interconnect Delay with Polynomial Regression. Darmstadt,
Germany: 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen
und Systemen” (TuZ’24), Feb. 2024, 2024.'
mla: Stiballe, Alisa, et al. Modeling Crosstalk-Induced Interconnect Delay with
Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’24), Feb. 2024, 2024.
short: A. Stiballe, J.D. Reimer, S. Sadeghi-Kohan, S. Hellebrand, Modeling Crosstalk-Induced
Interconnect Delay with Polynomial Regression, 37. ITG / GMM / GI -Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, Darmstadt,
Germany, 2024.
date_created: 2024-01-08T08:47:32Z
date_updated: 2024-03-22T17:12:39Z
department:
- _id: '48'
language:
- iso: eng
place: Darmstadt, Germany
publication_status: published
publisher: 37. ITG / GMM / GI -Workshop "Testmethoden und Zuverlässigkeit von Schaltungen
und Systemen" (TuZ'24), Feb. 2024
status: public
title: Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression
type: misc
user_id: '209'
year: '2024'
...
---
_id: '56014'
author:
- first_name: Hanieh
full_name: Jafarzadeh, Hanieh
last_name: Jafarzadeh
- first_name: Florian
full_name: Klemme, Florian
last_name: Klemme
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Hussam
full_name: ' Amrouch, Hussam'
last_name: ' Amrouch'
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Jafarzadeh H, Klemme F, Reimer JD, Amrouch H, Hellebrand S, Wunderlich H-J.
Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC)
for Robust Delay Fault Testing. In: In: IEEE International Test Conference
(ITC’24), San Diego, CA, USA, November 2024. IEEE; 2024.'
apa: 'Jafarzadeh, H., Klemme, F., Reimer, J. D., Amrouch, H., Hellebrand, S., &
Wunderlich, H.-J. (2024). Minimizing PVT-Variability by Exploiting the Zero Temperature
Coefficient (ZTC) for Robust Delay Fault Testing. In: IEEE International Test
Conference (ITC’24), San Diego, CA, USA, November 2024. IEEE International
Test Conference (ITC’24), San Diego, CA, USA.'
bibtex: '@inproceedings{Jafarzadeh_Klemme_Reimer_ Amrouch_Hellebrand_Wunderlich_2024,
place={San Diego, CA}, title={Minimizing PVT-Variability by Exploiting the Zero
Temperature Coefficient (ZTC) for Robust Delay Fault Testing}, booktitle={In:
IEEE International Test Conference (ITC’24), San Diego, CA, USA, November 2024},
publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan
Dennis and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
year={2024} }'
chicago: 'Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Hussam Amrouch,
Sybille Hellebrand, and Hans-Joachim Wunderlich. “Minimizing PVT-Variability by
Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing.”
In In: IEEE International Test Conference (ITC’24), San Diego, CA, USA, November
2024. San Diego, CA: IEEE, 2024.'
ieee: H. Jafarzadeh, F. Klemme, J. D. Reimer, H. Amrouch, S. Hellebrand, and H.-J.
Wunderlich, “Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient
(ZTC) for Robust Delay Fault Testing,” presented at the IEEE International Test
Conference (ITC’24), San Diego, CA, USA, 2024.
mla: 'Jafarzadeh, Hanieh, et al. “Minimizing PVT-Variability by Exploiting the Zero
Temperature Coefficient (ZTC) for Robust Delay Fault Testing.” In: IEEE International
Test Conference (ITC’24), San Diego, CA, USA, November 2024, IEEE, 2024.'
short: 'H. Jafarzadeh, F. Klemme, J.D. Reimer, H. Amrouch, S. Hellebrand, H.-J.
Wunderlich, in: In: IEEE International Test Conference (ITC’24), San Diego, CA,
USA, November 2024, IEEE, San Diego, CA, 2024.'
conference:
end_date: 2024-11-08
location: San Diego, CA, USA
name: IEEE International Test Conference (ITC'24)
start_date: 2024-11-03
date_created: 2024-09-04T09:25:20Z
date_updated: 2025-03-31T15:57:16Z
department:
- _id: '48'
language:
- iso: eng
place: San Diego, CA
publication: 'In: IEEE International Test Conference (ITC''24), San Diego, CA, USA,
November 2024'
publisher: IEEE
status: public
title: Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC)
for Robust Delay Fault Testing
type: conference
user_id: '36703'
year: '2024'
...
---
_id: '46738'
author:
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Sadeghi-Kohan S, Reimer JD, Hellebrand S, Wunderlich H-J. Optimizing the Streaming
of Sensor Data with Approximate Communication. In: IEEE Asian Test Symposium
(ATS’23), October 2023. ; 2023.'
apa: Sadeghi-Kohan, S., Reimer, J. D., Hellebrand, S., & Wunderlich, H.-J. (2023).
Optimizing the Streaming of Sensor Data with Approximate Communication. IEEE
Asian Test Symposium (ATS’23), October 2023. IEEE Asian Test Symposium (ATS’23).
bibtex: '@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing,
China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication},
booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan,
Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
year={2023} }'
chicago: Sadeghi-Kohan, Somayeh, Jan Dennis Reimer, Sybille Hellebrand, and Hans-Joachim
Wunderlich. “Optimizing the Streaming of Sensor Data with Approximate Communication.”
In IEEE Asian Test Symposium (ATS’23), October 2023. Beijing, China, 2023.
ieee: S. Sadeghi-Kohan, J. D. Reimer, S. Hellebrand, and H.-J. Wunderlich, “Optimizing
the Streaming of Sensor Data with Approximate Communication,” presented at the
IEEE Asian Test Symposium (ATS’23), 2023.
mla: Sadeghi-Kohan, Somayeh, et al. “Optimizing the Streaming of Sensor Data with
Approximate Communication.” IEEE Asian Test Symposium (ATS’23), October 2023,
2023.
short: 'S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, in: IEEE
Asian Test Symposium (ATS’23), October 2023, Beijing, China, 2023.'
conference:
end_date: 2023-10-17
name: IEEE Asian Test Symposium (ATS'23)
start_date: 2023-10-14
date_created: 2023-08-26T08:47:52Z
date_updated: 2024-01-08T08:49:08Z
department:
- _id: '48'
language:
- iso: eng
place: Beijing, China
publication: IEEE Asian Test Symposium (ATS'23), October 2023
status: public
title: Optimizing the Streaming of Sensor Data with Approximate Communication
type: conference
user_id: '36703'
year: '2023'
...
---
_id: '45830'
author:
- first_name: Hanieh
full_name: Jafarzadeh, Hanieh
last_name: Jafarzadeh
- first_name: Florian
full_name: Klemme, Florian
last_name: Klemme
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Zahra Paria
full_name: Najafi Haghi, Zahra Paria
last_name: Najafi Haghi
- first_name: Hussam
full_name: ' Amrouch, Hussam'
last_name: ' Amrouch'
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: ' Wunderlich, Hans-Joachim'
last_name: ' Wunderlich'
citation:
ama: 'Jafarzadeh H, Klemme F, Reimer JD, et al. Robust Pattern Generation for Small
Delay Faults under Process Variations. In: IEEE International Test Conference
(ITC’23), Anaheim, USA, October 2023. IEEE; 2023.'
apa: Jafarzadeh, H., Klemme, F., Reimer, J. D., Najafi Haghi, Z. P., Amrouch, H.,
Hellebrand, S., & Wunderlich, H.-J. (2023). Robust Pattern Generation for
Small Delay Faults under Process Variations. IEEE International Test Conference
(ITC’23), Anaheim, USA, October 2023. IEEE International Test Conference (ITC’23),
Anaheim, USA.
bibtex: '@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_
Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for
Small Delay Faults under Process Variations}, booktitle={IEEE International Test
Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh,
Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria
and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}
}'
chicago: 'Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi
Haghi, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Robust
Pattern Generation for Small Delay Faults under Process Variations.” In IEEE
International Test Conference (ITC’23), Anaheim, USA, October 2023. Anaheim,
CA, USA: IEEE, 2023.'
ieee: H. Jafarzadeh et al., “Robust Pattern Generation for Small Delay Faults
under Process Variations,” presented at the IEEE International Test Conference
(ITC’23), Anaheim, USA, 2023.
mla: Jafarzadeh, Hanieh, et al. “Robust Pattern Generation for Small Delay Faults
under Process Variations.” IEEE International Test Conference (ITC’23), Anaheim,
USA, October 2023, IEEE, 2023.
short: 'H. Jafarzadeh, F. Klemme, J.D. Reimer, Z.P. Najafi Haghi, H. Amrouch, S.
Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’23),
Anaheim, USA, October 2023, IEEE, Anaheim, CA, USA, 2023.'
conference:
end_date: 2023-10-13
location: Anaheim, USA
name: IEEE International Test Conference (ITC'23)
start_date: 2023-10-08
date_created: 2023-07-03T08:20:17Z
date_updated: 2024-03-22T17:14:02Z
department:
- _id: '48'
language:
- iso: eng
place: Anaheim, CA, USA
publication: IEEE International Test Conference (ITC'23), Anaheim, USA, October 2023
publication_status: published
publisher: IEEE
status: public
title: Robust Pattern Generation for Small Delay Faults under Process Variations
type: conference
user_id: '209'
year: '2023'
...
---
_id: '35204'
author:
- first_name: Abdulkarim
full_name: Ghazal, Abdulkarim
last_name: Ghazal
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Ghazal A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. On Cryptography Effects
on Interconnect Reliability. 35. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’23), Feb. 2023; 2023.
apa: Ghazal, A., Sadeghi-Kohan, S., Reimer, J. D., & Hellebrand, S. (2023).
On Cryptography Effects on Interconnect Reliability. 35. Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023.
bibtex: '@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany},
title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop
“Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb.
2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis
and Hellebrand, Sybille}, year={2023} }'
chicago: 'Ghazal, Abdulkarim, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille
Hellebrand. On Cryptography Effects on Interconnect Reliability. Erfurt,
Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”
(TuZ’23), Feb. 2023, 2023.'
ieee: 'A. Ghazal, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, On Cryptography
Effects on Interconnect Reliability. Erfurt, Germany: 35. Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.'
mla: Ghazal, Abdulkarim, et al. On Cryptography Effects on Interconnect Reliability.
35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23),
Feb. 2023, 2023.
short: A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography
Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
date_created: 2023-01-04T10:20:41Z
date_updated: 2023-04-06T21:06:37Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
page: '2'
place: Erfurt, Germany
publisher: 35. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'23), Feb. 2023
status: public
title: On Cryptography Effects on Interconnect Reliability
type: misc
user_id: '36703'
year: '2023'
...
---
_id: '41875'
author:
- first_name: 'Abdalrhman '
full_name: 'Badran, Abdalrhman '
last_name: Badran
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Badran A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. Approximate Computing:
Balancing Performance, Power, Reliability, and Safety. In: 28th IEEE European
Test Symposium (ETS’23), May 2023. ; 2023.'
apa: 'Badran, A., Sadeghi-Kohan, S., Reimer, J. D., & Hellebrand, S. (2023).
Approximate Computing: Balancing Performance, Power, Reliability, and Safety.
28th IEEE European Test Symposium (ETS’23), May 2023.'
bibtex: '@inproceedings{Badran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Venice,
Italy}, title={Approximate Computing: Balancing Performance, Power, Reliability,
and Safety}, booktitle={28th IEEE European Test Symposium (ETS’23), May 2023},
author={Badran, Abdalrhman and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis
and Hellebrand, Sybille}, year={2023} }'
chicago: 'Badran, Abdalrhman , Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille
Hellebrand. “Approximate Computing: Balancing Performance, Power, Reliability,
and Safety.” In 28th IEEE European Test Symposium (ETS’23), May 2023. Venice,
Italy, 2023.'
ieee: 'A. Badran, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, “Approximate
Computing: Balancing Performance, Power, Reliability, and Safety,” 2023.'
mla: 'Badran, Abdalrhman, et al. “Approximate Computing: Balancing Performance,
Power, Reliability, and Safety.” 28th IEEE European Test Symposium (ETS’23),
May 2023, 2023.'
short: 'A. Badran, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: 28th IEEE European
Test Symposium (ETS’23), May 2023, Venice, Italy, 2023.'
conference:
end_date: 2023-05-26
start_date: 2023-05-22
date_created: 2023-02-07T13:57:34Z
date_updated: 2023-06-19T14:21:47Z
language:
- iso: eng
place: Venice, Italy
publication: 28th IEEE European Test Symposium (ETS'23), May 2023
status: public
title: 'Approximate Computing: Balancing Performance, Power, Reliability, and Safety'
type: conference
user_id: '36703'
year: '2023'
...
---
_id: '19422'
author:
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Sprenger A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. Variation-Aware Test
for Logic Interconnects using Neural Networks - A Case Study. In: IEEE International
Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20),
October 2020. ; 2020.'
apa: Sprenger, A., Sadeghi-Kohan, S., Reimer, J. D., & Hellebrand, S. (2020).
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study.
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology
Systems (DFT’20), October 2020.
bibtex: '@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual
Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for
Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International
Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20),
October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer,
Jan Dennis and Hellebrand, Sybille}, year={2020} }'
chicago: Sprenger, Alexander, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille
Hellebrand. “Variation-Aware Test for Logic Interconnects Using Neural Networks
- A Case Study.” In IEEE International Symposium on Defect and Fault Tolerance
in VLSI and Nanotechnology Systems (DFT’20), October 2020. Virtual Conference
- Originally Frascati (Rome), Italy, 2020.
ieee: A. Sprenger, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, “Variation-Aware
Test for Logic Interconnects using Neural Networks - A Case Study,” 2020.
mla: Sprenger, Alexander, et al. “Variation-Aware Test for Logic Interconnects Using
Neural Networks - A Case Study.” IEEE International Symposium on Defect and
Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020,
2020.
short: 'A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International
Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20),
October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.'
conference:
end_date: 2020-10-21
start_date: 2020-10-19
date_created: 2020-09-15T14:03:02Z
date_updated: 2022-02-19T14:16:58Z
department:
- _id: '48'
language:
- iso: eng
place: Virtual Conference - Originally Frascati (Rome), Italy
publication: IEEE International Symposium on Defect and Fault Tolerance in VLSI and
Nanotechnology Systems (DFT’20), October 2020
publication_status: published
status: public
title: Variation-Aware Test for Logic Interconnects using Neural Networks - A Case
Study
type: conference
user_id: '209'
year: '2020'
...
---
_id: '19421'
author:
- first_name: Stefan
full_name: Holst, Stefan
last_name: Holst
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Jan Dennis
full_name: Reimer, Jan Dennis
id: '36703'
last_name: Reimer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Xiaoqing
full_name: Weng, Xiaoqing
last_name: Weng
citation:
ama: 'Holst S, Kampmann M, Sprenger A, et al. Logic Fault Diagnosis of Hidden Delay
Defects. In: IEEE International Test Conference (ITC’20), November 2020.
; 2020.'
apa: Holst, S., Kampmann, M., Sprenger, A., Reimer, J. D., Hellebrand, S., Wunderlich,
H.-J., & Weng, X. (2020). Logic Fault Diagnosis of Hidden Delay Defects. IEEE
International Test Conference (ITC’20), November 2020.
bibtex: '@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020,
place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault
Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference
(ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger,
Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim
and Weng, Xiaoqing}, year={2020} }'
chicago: Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer,
Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis
of Hidden Delay Defects.” In IEEE International Test Conference (ITC’20), November
2020. Virtual Conference - Originally Washington, DC, USA, 2020.
ieee: S. Holst et al., “Logic Fault Diagnosis of Hidden Delay Defects,” 2020.
mla: Holst, Stefan, et al. “Logic Fault Diagnosis of Hidden Delay Defects.” IEEE
International Test Conference (ITC’20), November 2020, 2020.
short: 'S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich,
X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual
Conference - Originally Washington, DC, USA, 2020.'
date_created: 2020-09-15T13:56:08Z
date_updated: 2022-05-11T17:08:20Z
department:
- _id: '48'
language:
- iso: eng
place: Virtual Conference - Originally Washington, DC, USA
publication: IEEE International Test Conference (ITC'20), November 2020
publication_status: published
status: public
title: Logic Fault Diagnosis of Hidden Delay Defects
type: conference
user_id: '209'
year: '2020'
...