---
_id: '62167'
abstract:
- lang: eng
text: Diese Dissertation befasst sich mit der Entwicklung eines induktiv-basierten
Lokalisierungsverfahrens mittels planarer Spulen, das auf magnetischer Kopplung
beruht. Grundlage ist die elektromagnetische Induktion, bei der sich die entstehende
Spannung proportional zur Gegeninduktivität verhält. Das Verfahren arbeitet im
physikalischen Nahfeld und im Frequenzbereich von einigen kHz bis MHz, um eine
effiziente Kopplung ohne Ausbreitung elektromagnetischer Wellen zu gewährleisten.
Im Vergleich zu etablierten Verfahren wie GPS oder Ultraschall zeigt die induktive
Ortung Vorteile bei kurzer Reichweite, insbesondere durch hohe Genauigkeit im
Zentimeterbereich und geringe Materialabhängigkeit. Zudem lässt sie sich in bestehende
Technologien wie bei der drahtlosen Energieübertragung integrieren und durch Sensorfusion
mit anderen Verfahren kombinieren. Zur Modellierung und Optimierung werden physikalische
Eigenschaften von planaren Spulen und EM-Feldern analysiert und elektrische Ersatzschaltbilder
eingesetzt. Die geometriebasierte Berechnung der Gegeninduktivität ermöglicht
die Entwicklung und Bewertung geeigneter Ortungsalgorithmen. Stochastische Filterverfahren
verbessern zusätzlich die Robustheit gegenüber Umgebungseinflüssen. Abschließend
wird eine modulare Simulationsplattform vorgestellt, die als Grundlage für die
Generierung von Trainingsdaten sowie zur Weiterentwicklung von Mess-, Ortungs-
und Filtermethoden dient.
- lang: eng
text: This dissertation addresses the development of an inductively based localization
method using planar coils, which relies on magnetic coupling. The underlying principle
is electromagnetic induction, where the resulting voltage is proportional to the
mutual inductance. The method operates in the physical near field and within a
frequency range from a few kHz to MHz, ensuring efficient coupling without the
propagation of electromagnetic waves. Compared to established methods such as
GPS or ultrasound, inductive localization offers advantages at short range—particularly
high accuracy in the centimeter range and low dependency on surrounding materials.
Additionally, it can be integrated into existing technologies, such as wireless
power transfer systems, and combined with other methods through sensor fusion.
To support modeling and optimization, the physical properties of planar coils
and electromagnetic fields are analyzed, and equivalent electrical circuit models
are used. Geometry-based calculations of mutual inductance enable the development
and evaluation of suitable localization algorithms. Stochastic filtering methods
further enhance robustness against environmental influences. Finally, a modular
simulation platform is presented, which serves as a foundation for generating
training data as well as for the further development of measurement, localization,
and filtering methods.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
citation:
ama: Lange S. Analyse und Modellierung eines induktiven Ortungsprozesses unter
Berücksichtigung der elektromagnetischen Wechselwirkungen planarer Spulensysteme.
Universitätsbibliothek Paderborn; 2025. doi:10.17619/UNIPB/1-2436
apa: Lange, S. (2025). Analyse und Modellierung eines induktiven Ortungsprozesses
unter Berücksichtigung der elektromagnetischen Wechselwirkungen planarer Spulensysteme.
Universitätsbibliothek Paderborn. https://doi.org/10.17619/UNIPB/1-2436
bibtex: '@book{Lange_2025, place={Paderborn}, title={Analyse und Modellierung eines
induktiven Ortungsprozesses unter Berücksichtigung der elektromagnetischen Wechselwirkungen
planarer Spulensysteme}, DOI={10.17619/UNIPB/1-2436},
publisher={Universitätsbibliothek Paderborn}, author={Lange, Sven}, year={2025}
}'
chicago: 'Lange, Sven. Analyse und Modellierung eines induktiven Ortungsprozesses
unter Berücksichtigung der elektromagnetischen Wechselwirkungen planarer Spulensysteme.
Paderborn: Universitätsbibliothek Paderborn, 2025. https://doi.org/10.17619/UNIPB/1-2436.'
ieee: 'S. Lange, Analyse und Modellierung eines induktiven Ortungsprozesses unter
Berücksichtigung der elektromagnetischen Wechselwirkungen planarer Spulensysteme.
Paderborn: Universitätsbibliothek Paderborn, 2025.'
mla: Lange, Sven. Analyse und Modellierung eines induktiven Ortungsprozesses
unter Berücksichtigung der elektromagnetischen Wechselwirkungen planarer Spulensysteme.
Universitätsbibliothek Paderborn, 2025, doi:10.17619/UNIPB/1-2436.
short: S. Lange, Analyse und Modellierung eines induktiven Ortungsprozesses unter
Berücksichtigung der elektromagnetischen Wechselwirkungen planarer Spulensysteme,
Universitätsbibliothek Paderborn, Paderborn, 2025.
date_created: 2025-11-12T10:06:39Z
date_updated: 2025-11-12T10:15:29Z
department:
- _id: '59'
- _id: '61'
- _id: '485'
doi: 10.17619/UNIPB/1-2436
language:
- iso: ger
main_file_link:
- open_access: '1'
url: https://digital.ub.uni-paderborn.de/hs/content/titleinfo/8122147
oa: '1'
page: '247'
place: Paderborn
publication_status: published
publisher: Universitätsbibliothek Paderborn
status: public
supervisor:
- first_name: Jens
full_name: Förstner, Jens
id: '158'
last_name: Förstner
orcid: 0000-0001-7059-9862
- first_name: Marcus
full_name: Stiemer, Marcus
last_name: Stiemer
title: Analyse und Modellierung eines induktiven Ortungsprozesses unter Berücksichtigung
der elektromagnetischen Wechselwirkungen planarer Spulensysteme
type: dissertation
user_id: '38240'
year: '2025'
...
---
_id: '56782'
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: Marcel
full_name: Olbrich, Marcel
last_name: Olbrich
- first_name: Dennis
full_name: Hemker, Dennis
last_name: Hemker
- first_name: Jad
full_name: Maalouly, Jad
last_name: Maalouly
- first_name: Jürgen
full_name: Kutter, Jürgen
last_name: Kutter
- first_name: Dominik
full_name: Schröder, Dominik
last_name: Schröder
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Michael
full_name: Kleinen, Michael
last_name: Kleinen
- first_name: Andreas
full_name: Grünwaldt, Andreas
last_name: Grünwaldt
- first_name: Jörg
full_name: Bärenfänger, Jörg
last_name: Bärenfänger
- first_name: Harald
full_name: Mathis, Harald
last_name: Mathis
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
citation:
ama: 'Lange S, Olbrich M, Hemker D, et al. A Hybrid Data Generation Approach for
the Development of an AI-based EMC Interference Recognition Method. In: 2024
International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE;
2024. doi:10.1109/emceurope59828.2024.10722681'
apa: Lange, S., Olbrich, M., Hemker, D., Maalouly, J., Kutter, J., Schröder, D.,
Hedayat, C., Kleinen, M., Grünwaldt, A., Bärenfänger, J., Mathis, H., & Kuhn,
H. (2024). A Hybrid Data Generation Approach for the Development of an AI-based
EMC Interference Recognition Method. 2024 International Symposium on Electromagnetic
Compatibility – EMC Europe. 2024 International Symposium on Electromagnetic
Compatibility – EMC Europe, Bruges, Belgium. https://doi.org/10.1109/emceurope59828.2024.10722681
bibtex: '@inproceedings{Lange_Olbrich_Hemker_Maalouly_Kutter_Schröder_Hedayat_Kleinen_Grünwaldt_Bärenfänger_et
al._2024, place={Bruges, Belgium}, title={A Hybrid Data Generation Approach for
the Development of an AI-based EMC Interference Recognition Method}, DOI={10.1109/emceurope59828.2024.10722681},
booktitle={2024 International Symposium on Electromagnetic Compatibility – EMC
Europe}, publisher={IEEE}, author={Lange, Sven and Olbrich, Marcel and Hemker,
Dennis and Maalouly, Jad and Kutter, Jürgen and Schröder, Dominik and Hedayat,
Christian and Kleinen, Michael and Grünwaldt, Andreas and Bärenfänger, Jörg and
et al.}, year={2024} }'
chicago: 'Lange, Sven, Marcel Olbrich, Dennis Hemker, Jad Maalouly, Jürgen Kutter,
Dominik Schröder, Christian Hedayat, et al. “A Hybrid Data Generation Approach
for the Development of an AI-Based EMC Interference Recognition Method.” In 2024
International Symposium on Electromagnetic Compatibility – EMC Europe. Bruges,
Belgium: IEEE, 2024. https://doi.org/10.1109/emceurope59828.2024.10722681.'
ieee: 'S. Lange et al., “A Hybrid Data Generation Approach for the Development
of an AI-based EMC Interference Recognition Method,” presented at the 2024 International
Symposium on Electromagnetic Compatibility – EMC Europe, Bruges, Belgium, 2024,
doi: 10.1109/emceurope59828.2024.10722681.'
mla: Lange, Sven, et al. “A Hybrid Data Generation Approach for the Development
of an AI-Based EMC Interference Recognition Method.” 2024 International Symposium
on Electromagnetic Compatibility – EMC Europe, IEEE, 2024, doi:10.1109/emceurope59828.2024.10722681.
short: 'S. Lange, M. Olbrich, D. Hemker, J. Maalouly, J. Kutter, D. Schröder, C.
Hedayat, M. Kleinen, A. Grünwaldt, J. Bärenfänger, H. Mathis, H. Kuhn, in: 2024
International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, Bruges,
Belgium, 2024.'
conference:
end_date: 2024-09-05
location: Bruges, Belgium
name: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe
start_date: 2024-09-02
date_created: 2024-10-29T10:35:08Z
date_updated: 2025-03-17T12:14:38Z
department:
- _id: '59'
doi: 10.1109/emceurope59828.2024.10722681
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/10722681
place: Bruges, Belgium
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe
publication_status: published
publisher: IEEE
status: public
title: A Hybrid Data Generation Approach for the Development of an AI-based EMC Interference
Recognition Method
type: conference
user_id: '38240'
year: '2024'
...
---
_id: '56781'
author:
- first_name: Jad
full_name: Maalouly, Jad
last_name: Maalouly
- first_name: Dennis
full_name: Hemker, Dennis
last_name: Hemker
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: Marcel
full_name: Olbrich, Marcel
last_name: Olbrich
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Jürgen
full_name: Kutter, Jürgen
last_name: Kutter
- first_name: Harald
full_name: Mathis, Harald
last_name: Mathis
citation:
ama: 'Maalouly J, Hemker D, Lange S, et al. Evaluation of Simulated and Real Measurement
Data for AI-based Interference Classification in EMC Applications. In: 2024
International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE;
2024. doi:10.1109/emceurope59828.2024.10722094'
apa: Maalouly, J., Hemker, D., Lange, S., Olbrich, M., Hedayat, C., Kutter, J.,
& Mathis, H. (2024). Evaluation of Simulated and Real Measurement Data for
AI-based Interference Classification in EMC Applications. 2024 International
Symposium on Electromagnetic Compatibility – EMC Europe. 2024 International
Symposium on Electromagnetic Compatibility – EMC Europe, Brugge, Belgium . https://doi.org/10.1109/emceurope59828.2024.10722094
bibtex: '@inproceedings{Maalouly_Hemker_Lange_Olbrich_Hedayat_Kutter_Mathis_2024,
place={Brugge, Belgium }, title={Evaluation of Simulated and Real Measurement
Data for AI-based Interference Classification in EMC Applications}, DOI={10.1109/emceurope59828.2024.10722094},
booktitle={2024 International Symposium on Electromagnetic Compatibility – EMC
Europe}, publisher={IEEE}, author={Maalouly, Jad and Hemker, Dennis and Lange,
Sven and Olbrich, Marcel and Hedayat, Christian and Kutter, Jürgen and Mathis,
Harald}, year={2024} }'
chicago: 'Maalouly, Jad, Dennis Hemker, Sven Lange, Marcel Olbrich, Christian Hedayat,
Jürgen Kutter, and Harald Mathis. “Evaluation of Simulated and Real Measurement
Data for AI-Based Interference Classification in EMC Applications.” In 2024
International Symposium on Electromagnetic Compatibility – EMC Europe. Brugge,
Belgium : IEEE, 2024. https://doi.org/10.1109/emceurope59828.2024.10722094.'
ieee: 'J. Maalouly et al., “Evaluation of Simulated and Real Measurement
Data for AI-based Interference Classification in EMC Applications,” presented
at the 2024 International Symposium on Electromagnetic Compatibility – EMC Europe,
Brugge, Belgium , 2024, doi: 10.1109/emceurope59828.2024.10722094.'
mla: Maalouly, Jad, et al. “Evaluation of Simulated and Real Measurement Data for
AI-Based Interference Classification in EMC Applications.” 2024 International
Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2024, doi:10.1109/emceurope59828.2024.10722094.
short: 'J. Maalouly, D. Hemker, S. Lange, M. Olbrich, C. Hedayat, J. Kutter, H.
Mathis, in: 2024 International Symposium on Electromagnetic Compatibility – EMC
Europe, IEEE, Brugge, Belgium , 2024.'
conference:
end_date: 2024-09-05
location: 'Brugge, Belgium '
name: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe
start_date: 2024-09-02
date_created: 2024-10-29T10:34:53Z
date_updated: 2025-03-17T12:14:48Z
department:
- _id: '59'
doi: 10.1109/emceurope59828.2024.10722094
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/10722094
place: 'Brugge, Belgium '
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2024 International Symposium on Electromagnetic Compatibility – EMC Europe
publication_status: published
publisher: IEEE
status: public
title: Evaluation of Simulated and Real Measurement Data for AI-based Interference
Classification in EMC Applications
type: conference
user_id: '38240'
year: '2024'
...
---
_id: '56924'
author:
- first_name: Marcus
full_name: Stiemer, Marcus
last_name: Stiemer
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: Dominik
full_name: Schröder, Dominik
last_name: Schröder
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Jad
full_name: Maalouly, Jad
last_name: Maalouly
- first_name: Dennis
full_name: Hemker, Dennis
last_name: Hemker
- first_name: Harald
full_name: Mathis, Harald
last_name: Mathis
citation:
ama: 'Stiemer M, Lange S, Schröder D, et al. Enhancing Information Extraction in
EMC Measurements through Artificial Intelligence. In: 2024 Smart Systems Integration
Conference and Exhibition (SSI). IEEE; 2024. doi:10.1109/ssi63222.2024.10740546'
apa: Stiemer, M., Lange, S., Schröder, D., Hedayat, C., Maalouly, J., Hemker, D.,
& Mathis, H. (2024). Enhancing Information Extraction in EMC Measurements
through Artificial Intelligence. 2024 Smart Systems Integration Conference
and Exhibition (SSI). 2024 Smart Systems Integration Conference and Exhibition
(SSI), Hamburg. https://doi.org/10.1109/ssi63222.2024.10740546
bibtex: '@inproceedings{Stiemer_Lange_Schröder_Hedayat_Maalouly_Hemker_Mathis_2024,
place={Hamburg}, title={Enhancing Information Extraction in EMC Measurements through
Artificial Intelligence}, DOI={10.1109/ssi63222.2024.10740546},
booktitle={2024 Smart Systems Integration Conference and Exhibition (SSI)}, publisher={IEEE},
author={Stiemer, Marcus and Lange, Sven and Schröder, Dominik and Hedayat, Christian
and Maalouly, Jad and Hemker, Dennis and Mathis, Harald}, year={2024} }'
chicago: 'Stiemer, Marcus, Sven Lange, Dominik Schröder, Christian Hedayat, Jad
Maalouly, Dennis Hemker, and Harald Mathis. “Enhancing Information Extraction
in EMC Measurements through Artificial Intelligence.” In 2024 Smart Systems
Integration Conference and Exhibition (SSI). Hamburg: IEEE, 2024. https://doi.org/10.1109/ssi63222.2024.10740546.'
ieee: 'M. Stiemer et al., “Enhancing Information Extraction in EMC Measurements
through Artificial Intelligence,” presented at the 2024 Smart Systems Integration
Conference and Exhibition (SSI), Hamburg, 2024, doi: 10.1109/ssi63222.2024.10740546.'
mla: Stiemer, Marcus, et al. “Enhancing Information Extraction in EMC Measurements
through Artificial Intelligence.” 2024 Smart Systems Integration Conference
and Exhibition (SSI), IEEE, 2024, doi:10.1109/ssi63222.2024.10740546.
short: 'M. Stiemer, S. Lange, D. Schröder, C. Hedayat, J. Maalouly, D. Hemker, H.
Mathis, in: 2024 Smart Systems Integration Conference and Exhibition (SSI), IEEE,
Hamburg, 2024.'
conference:
end_date: 2024-04-28
location: Hamburg
name: 2024 Smart Systems Integration Conference and Exhibition (SSI)
start_date: 2024-04-26
date_created: 2024-11-06T13:36:01Z
date_updated: 2025-03-17T12:14:22Z
department:
- _id: '59'
doi: 10.1109/ssi63222.2024.10740546
language:
- iso: eng
place: Hamburg
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2024 Smart Systems Integration Conference and Exhibition (SSI)
publication_status: published
publisher: IEEE
status: public
title: Enhancing Information Extraction in EMC Measurements through Artificial Intelligence
type: conference
user_id: '38240'
year: '2024'
...
---
_id: '57499'
author:
- first_name: J.
full_name: Maalouly, J.
last_name: Maalouly
- first_name: D.
full_name: Hemker, D.
last_name: Hemker
- first_name: C.
full_name: Hedayat, C.
last_name: Hedayat
- first_name: M.
full_name: Olbrich, M.
last_name: Olbrich
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: H.
full_name: Mathis, H.
last_name: Mathis
citation:
ama: Maalouly J, Hemker D, Hedayat C, Olbrich M, Lange S, Mathis H. Using Autoencoders
to Classify EMC Problems in Electronic System Development. Advances in Radio
Science. 2024;22:53–59. doi:10.5194/ars-22-53-2024
apa: Maalouly, J., Hemker, D., Hedayat, C., Olbrich, M., Lange, S., & Mathis,
H. (2024). Using Autoencoders to Classify EMC Problems in Electronic System Development.
Advances in Radio Science, 22, 53–59. https://doi.org/10.5194/ars-22-53-2024
bibtex: '@article{Maalouly_Hemker_Hedayat_Olbrich_Lange_Mathis_2024, title={Using
Autoencoders to Classify EMC Problems in Electronic System Development}, volume={22},
DOI={10.5194/ars-22-53-2024},
journal={Advances in Radio Science}, author={Maalouly, J. and Hemker, D. and Hedayat,
C. and Olbrich, M. and Lange, Sven and Mathis, H.}, year={2024}, pages={53–59}
}'
chicago: 'Maalouly, J., D. Hemker, C. Hedayat, M. Olbrich, Sven Lange, and H. Mathis.
“Using Autoencoders to Classify EMC Problems in Electronic System Development.”
Advances in Radio Science 22 (2024): 53–59. https://doi.org/10.5194/ars-22-53-2024.'
ieee: 'J. Maalouly, D. Hemker, C. Hedayat, M. Olbrich, S. Lange, and H. Mathis,
“Using Autoencoders to Classify EMC Problems in Electronic System Development,”
Advances in Radio Science, vol. 22, pp. 53–59, 2024, doi: 10.5194/ars-22-53-2024.'
mla: Maalouly, J., et al. “Using Autoencoders to Classify EMC Problems in Electronic
System Development.” Advances in Radio Science, vol. 22, 2024, pp. 53–59,
doi:10.5194/ars-22-53-2024.
short: J. Maalouly, D. Hemker, C. Hedayat, M. Olbrich, S. Lange, H. Mathis, Advances
in Radio Science 22 (2024) 53–59.
conference:
end_date: 2023-09-28
location: Miltenberg
name: Kleinheubacher Berichte 2023
start_date: 2023-09-26
date_created: 2024-11-29T10:05:47Z
date_updated: 2025-03-17T12:13:32Z
department:
- _id: '59'
- _id: '485'
doi: 10.5194/ars-22-53-2024
intvolume: ' 22'
language:
- iso: eng
main_file_link:
- url: https://ars.copernicus.org/articles/22/53/2024/
page: 53–59
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: Advances in Radio Science
publication_status: published
status: public
title: Using Autoencoders to Classify EMC Problems in Electronic System Development
type: journal_article
user_id: '38240'
volume: 22
year: '2024'
...
---
_id: '49890'
abstract:
- lang: eng
text: In this paper, the influence of the environment on an inductive location system
is analyzed. In the inductive location method, high frequency magnetic fields
generated by planar coils lead to induction in other coils, which is used for
localization analysis. Magnetic fields are not affected by changes in the dielectric
properties of the environment, which is an advantage over other localization methods.
However, electrical material parameters can still affect the localization results
by indirect effects. For this reason, in this publication the influence will be
investigated using real material parameters and their effects on the localization
will be considered, so that the robustness and the limits of the inductive localization
can be evaluated.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
id: '20179'
last_name: Hilleringmann
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
- first_name: Jens
full_name: Förstner, Jens
id: '158'
last_name: Förstner
orcid: 0000-0001-7059-9862
citation:
ama: 'Lange S, Hilleringmann U, Hedayat C, Kuhn H, Förstner J. Characterization
of Various Environmental Influences on the Inductive Localization. In: 2023
IEEE Conference on Antenna Measurements and Applications (CAMA). IEEE; 2023.
doi:10.1109/cama57522.2023.10352780'
apa: Lange, S., Hilleringmann, U., Hedayat, C., Kuhn, H., & Förstner, J. (2023).
Characterization of Various Environmental Influences on the Inductive Localization.
2023 IEEE Conference on Antenna Measurements and Applications (CAMA). 2023
IEEE Conference on Antenna Measurements and Applications (CAMA), Genoa, Italy
. https://doi.org/10.1109/cama57522.2023.10352780
bibtex: '@inproceedings{Lange_Hilleringmann_Hedayat_Kuhn_Förstner_2023, place={Genoa,
Italy }, title={Characterization of Various Environmental Influences on the Inductive
Localization}, DOI={10.1109/cama57522.2023.10352780},
booktitle={2023 IEEE Conference on Antenna Measurements and Applications (CAMA)},
publisher={IEEE}, author={Lange, Sven and Hilleringmann, Ulrich and Hedayat, Christian
and Kuhn, Harald and Förstner, Jens}, year={2023} }'
chicago: 'Lange, Sven, Ulrich Hilleringmann, Christian Hedayat, Harald Kuhn, and
Jens Förstner. “Characterization of Various Environmental Influences on the Inductive
Localization.” In 2023 IEEE Conference on Antenna Measurements and Applications
(CAMA). Genoa, Italy : IEEE, 2023. https://doi.org/10.1109/cama57522.2023.10352780.'
ieee: 'S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn, and J. Förstner, “Characterization
of Various Environmental Influences on the Inductive Localization,” presented
at the 2023 IEEE Conference on Antenna Measurements and Applications (CAMA), Genoa,
Italy , 2023, doi: 10.1109/cama57522.2023.10352780.'
mla: Lange, Sven, et al. “Characterization of Various Environmental Influences on
the Inductive Localization.” 2023 IEEE Conference on Antenna Measurements and
Applications (CAMA), IEEE, 2023, doi:10.1109/cama57522.2023.10352780.
short: 'S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn, J. Förstner, in: 2023 IEEE
Conference on Antenna Measurements and Applications (CAMA), IEEE, Genoa, Italy
, 2023.'
conference:
end_date: 2023-11-17
location: 'Genoa, Italy '
name: 2023 IEEE Conference on Antenna Measurements and Applications (CAMA)
start_date: 2023-11-15
date_created: 2023-12-20T08:36:58Z
date_updated: 2024-11-30T19:31:57Z
department:
- _id: '59'
- _id: '61'
- _id: '485'
doi: 10.1109/cama57522.2023.10352780
keyword:
- Planar coils
- inductive locating
- magnetic fields
- environmental influences
- eddy currents
- tet_topic_hf
- tet_enas
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/10352780
place: 'Genoa, Italy '
publication: 2023 IEEE Conference on Antenna Measurements and Applications (CAMA)
publication_identifier:
eisbn:
- 979-8-3503-2304-7
publication_status: published
publisher: IEEE
status: public
title: Characterization of Various Environmental Influences on the Inductive Localization
type: conference
user_id: '158'
year: '2023'
...
---
_id: '34140'
abstract:
- lang: eng
text: In this paper, machine learning techniques will be used to classify different
PCB layouts given their electromagnetic frequency spectra. These spectra result
from a simulated near-field measurement of electric field strengths at different
locations. Measured values consist of real and imaginary parts (amplitude and
phase) in X, Y and Z directions. Training data was obtained in the time domain
by varying transmission line geometries (size, distance and signaling). It was
then transformed into the frequency domain and used as deep neural network input.
Principal component analysis was applied to reduce the sample dimension. The results
show that classifying different designs is possible with high accuracy based on
synthetic data. Future work comprises measurements of real, custom-made PCB with
varying parameters to adapt the simulation model and also test the neural network.
Finally, the trained model could be used to give hints about the error’s cause
when overshooting EMC limits.
author:
- first_name: Jad
full_name: Maalouly, Jad
last_name: Maalouly
- first_name: Dennis
full_name: Hemker, Dennis
last_name: Hemker
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Christian
full_name: Rückert, Christian
last_name: Rückert
- first_name: Ivan
full_name: Kaufmann, Ivan
last_name: Kaufmann
- first_name: Marcel
full_name: Olbrich, Marcel
last_name: Olbrich
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Harald
full_name: Mathis, Harald
last_name: Mathis
citation:
ama: 'Maalouly J, Hemker D, Hedayat C, et al. AI Assisted Interference Classification
to Improve EMC Troubleshooting in Electronic System Development. In: 2022 Kleinheubach
Conference. IEEE; 2022.'
apa: Maalouly, J., Hemker, D., Hedayat, C., Rückert, C., Kaufmann, I., Olbrich,
M., Lange, S., & Mathis, H. (2022). AI Assisted Interference Classification
to Improve EMC Troubleshooting in Electronic System Development. 2022 Kleinheubach
Conference. 2022 Kleinheubach Conference, Miltenberg, Germany.
bibtex: '@inproceedings{Maalouly_Hemker_Hedayat_Rückert_Kaufmann_Olbrich_Lange_Mathis_2022,
place={Miltenberg, Germany}, title={AI Assisted Interference Classification to
Improve EMC Troubleshooting in Electronic System Development}, booktitle={2022
Kleinheubach Conference}, publisher={IEEE}, author={Maalouly, Jad and Hemker,
Dennis and Hedayat, Christian and Rückert, Christian and Kaufmann, Ivan and Olbrich,
Marcel and Lange, Sven and Mathis, Harald}, year={2022} }'
chicago: 'Maalouly, Jad, Dennis Hemker, Christian Hedayat, Christian Rückert, Ivan
Kaufmann, Marcel Olbrich, Sven Lange, and Harald Mathis. “AI Assisted Interference
Classification to Improve EMC Troubleshooting in Electronic System Development.”
In 2022 Kleinheubach Conference. Miltenberg, Germany: IEEE, 2022.'
ieee: J. Maalouly et al., “AI Assisted Interference Classification to Improve
EMC Troubleshooting in Electronic System Development,” presented at the 2022 Kleinheubach
Conference, Miltenberg, Germany, 2022.
mla: Maalouly, Jad, et al. “AI Assisted Interference Classification to Improve EMC
Troubleshooting in Electronic System Development.” 2022 Kleinheubach Conference,
IEEE, 2022.
short: 'J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich,
S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany,
2022.'
conference:
end_date: 2022-09-29
location: Miltenberg, Germany
name: 2022 Kleinheubach Conference
start_date: 2022-09-27
date_created: 2022-11-24T14:21:17Z
date_updated: 2022-11-24T14:21:34Z
department:
- _id: '59'
- _id: '485'
keyword:
- emc
- pcb
- electronic system development
- machine learning
- neural network
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9954484
place: Miltenberg, Germany
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2022 Kleinheubach Conference
publication_identifier:
eisbn:
- 978-3-948571-07-8
publication_status: published
publisher: IEEE
status: public
title: AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic
System Development
type: conference
user_id: '38240'
year: '2022'
...
---
_id: '33508'
abstract:
- lang: eng
text: In this work, methods will be evaluated to numerically calculate the passive
electrical parameters of planar coils. These parameters can then be used to optimize
inductive applications such as wireless power transmission. The focus here will
be on inductive localization, which uses high-frequency magnetic fields and the
resulting induced voltage to provide localization through the coupling parameter
mutual inductance. To achieve localization with high accuracy and best possible
operation (resonance, signal strength, etc.), the coil parameters need to be well
known. For this reason, some numerical methods for the calculation of these quantities
are presented and validated. In addition, the physical effects are thereby considered
in more detail, allowing the localization procedure to be better optimized compared
to simulative black-box methods. The goal should be a dedicated simulation platform
for planar coils to be able to develop training data for neural networks and to
test and optimize localization algorithms.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
citation:
ama: 'Lange S, Hedayat C, Kuhn H, Hilleringmann U. Modeling and Characterization
of a 3D Environment for the Design of an Inductively Based Locating Method by
Coil Couplings. In: 2022 Smart Systems Integration (SSI). IEEE; 2022. doi:10.1109/ssi56489.2022.9901416'
apa: Lange, S., Hedayat, C., Kuhn, H., & Hilleringmann, U. (2022). Modeling
and Characterization of a 3D Environment for the Design of an Inductively Based
Locating Method by Coil Couplings. 2022 Smart Systems Integration (SSI).
2022 Smart Systems Integration (SSI), Grenoble, France. https://doi.org/10.1109/ssi56489.2022.9901416
bibtex: '@inproceedings{Lange_Hedayat_Kuhn_Hilleringmann_2022, place={Grenoble,
France}, title={Modeling and Characterization of a 3D Environment for the Design
of an Inductively Based Locating Method by Coil Couplings}, DOI={10.1109/ssi56489.2022.9901416},
booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Lange,
Sven and Hedayat, Christian and Kuhn, Harald and Hilleringmann, Ulrich}, year={2022}
}'
chicago: 'Lange, Sven, Christian Hedayat, Harald Kuhn, and Ulrich Hilleringmann.
“Modeling and Characterization of a 3D Environment for the Design of an Inductively
Based Locating Method by Coil Couplings.” In 2022 Smart Systems Integration
(SSI). Grenoble, France: IEEE, 2022. https://doi.org/10.1109/ssi56489.2022.9901416.'
ieee: 'S. Lange, C. Hedayat, H. Kuhn, and U. Hilleringmann, “Modeling and Characterization
of a 3D Environment for the Design of an Inductively Based Locating Method by
Coil Couplings,” presented at the 2022 Smart Systems Integration (SSI), Grenoble,
France, 2022, doi: 10.1109/ssi56489.2022.9901416.'
mla: Lange, Sven, et al. “Modeling and Characterization of a 3D Environment for
the Design of an Inductively Based Locating Method by Coil Couplings.” 2022
Smart Systems Integration (SSI), IEEE, 2022, doi:10.1109/ssi56489.2022.9901416.
short: 'S. Lange, C. Hedayat, H. Kuhn, U. Hilleringmann, in: 2022 Smart Systems
Integration (SSI), IEEE, Grenoble, France, 2022.'
conference:
end_date: 2022-04-28
location: Grenoble, France
name: 2022 Smart Systems Integration (SSI)
start_date: 2022-04-27
date_created: 2022-10-04T11:26:11Z
date_updated: 2022-10-04T11:35:11Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/ssi56489.2022.9901416
keyword:
- Simulation Environment
- Inductive Localization
- Coil Parameters
- Inductive Applications
- Near-Field
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9901416
place: Grenoble, France
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2022 Smart Systems Integration (SSI)
publication_identifier:
eisbn:
- 978-1-6654-8849-5
publication_status: published
publisher: IEEE
status: public
title: Modeling and Characterization of a 3D Environment for the Design of an Inductively
Based Locating Method by Coil Couplings
type: conference
user_id: '38240'
year: '2022'
...
---
_id: '33510'
abstract:
- lang: eng
text: In the manufacture of real wood products, defects can quickly occur during
the production process. To quickly sort out these defects, a system is needed
that finds damage in the irregularly structured surfaces of the product. The difficulty
in this task is that each surface is visually different and no standard defects
can be defined. Thus, damage detection using correlation does not work, so this
paper will test different machine learning methods. To evaluate different machine
learning methods, a data set is needed. For this reason, the available samples
were recorded manually using a static fixed camera. Subsequently, the images were
divided into sub-images, which resulted in a relatively small data set. Next,
a convolutional neural network (CNN) was constructed to classify the images. However,
this approach did not lead to a generalized solution, so the dataset was hashed
using the a- and pHash. These hash values were then trained with a fully supervised
system that will later serve as a reference model, in the semi-supervised learning
procedures. To improve the supervised model and not have to label every data point,
semi-supervised learning methods are used in the following. For this purpose,
the CEAL method (wrapper method) is considered in the first and then the Π-Model
(intrinsically semi-supervised).
author:
- first_name: Tom
full_name: Sander, Tom
last_name: Sander
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
- first_name: Volker
full_name: Geneiß, Volker
last_name: Geneiß
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
citation:
ama: 'Sander T, Lange S, Hilleringmann U, Geneiß V, Hedayat C, Kuhn H. Detection
of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised
Learning Methods. In: 2022 Smart Systems Integration (SSI). IEEE; 2022.
doi:10.1109/ssi56489.2022.9901433'
apa: Sander, T., Lange, S., Hilleringmann, U., Geneiß, V., Hedayat, C., & Kuhn,
H. (2022). Detection of Defects on Irregularly Structured Surfaces using Supervised
and Semi-Supervised Learning Methods. 2022 Smart Systems Integration (SSI).
2022 Smart Systems Integration (SSI), Grenoble, France. https://doi.org/10.1109/ssi56489.2022.9901433
bibtex: '@inproceedings{Sander_Lange_Hilleringmann_Geneiß_Hedayat_Kuhn_2022, place={Grenoble,
France}, title={Detection of Defects on Irregularly Structured Surfaces using
Supervised and Semi-Supervised Learning Methods}, DOI={10.1109/ssi56489.2022.9901433},
booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Sander,
Tom and Lange, Sven and Hilleringmann, Ulrich and Geneiß, Volker and Hedayat,
Christian and Kuhn, Harald}, year={2022} }'
chicago: 'Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneiß, Christian
Hedayat, and Harald Kuhn. “Detection of Defects on Irregularly Structured Surfaces
Using Supervised and Semi-Supervised Learning Methods.” In 2022 Smart Systems
Integration (SSI). Grenoble, France: IEEE, 2022. https://doi.org/10.1109/ssi56489.2022.9901433.'
ieee: 'T. Sander, S. Lange, U. Hilleringmann, V. Geneiß, C. Hedayat, and H. Kuhn,
“Detection of Defects on Irregularly Structured Surfaces using Supervised and
Semi-Supervised Learning Methods,” presented at the 2022 Smart Systems Integration
(SSI), Grenoble, France, 2022, doi: 10.1109/ssi56489.2022.9901433.'
mla: Sander, Tom, et al. “Detection of Defects on Irregularly Structured Surfaces
Using Supervised and Semi-Supervised Learning Methods.” 2022 Smart Systems
Integration (SSI), IEEE, 2022, doi:10.1109/ssi56489.2022.9901433.
short: 'T. Sander, S. Lange, U. Hilleringmann, V. Geneiß, C. Hedayat, H. Kuhn, in:
2022 Smart Systems Integration (SSI), IEEE, Grenoble, France, 2022.'
conference:
end_date: 2022-04-28
location: Grenoble, France
name: 2022 Smart Systems Integration (SSI)
start_date: 2022-04-27
date_created: 2022-10-04T11:35:55Z
date_updated: 2022-10-04T11:37:39Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/ssi56489.2022.9901433
keyword:
- Machine Learning
- CNN
- Hashing
- semi-supervised learning
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9901433
place: Grenoble, France
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2022 Smart Systems Integration (SSI)
publication_status: published
publisher: IEEE
status: public
title: Detection of Defects on Irregularly Structured Surfaces using Supervised and
Semi-Supervised Learning Methods
type: conference
user_id: '38240'
year: '2022'
...
---
_id: '33509'
abstract:
- lang: eng
text: In this publication a novel method for far-field prediction from magnetic
Huygens box data based on the boundary element method (BEM) is presented. Two
examples are considered for the validation of this method. The first example represents
an electric dipole so that the obtained calculations can be compared to an analytical
solution. As a second example, a printed circuit board is considered and the calculated
far-field is compared to a fullwave simulation. In both cases, the calculations
for different field integral equations are under comparison, and the results indicate
that the presented method performs very well with a combined field integral equation,
for the specified problem, when only magnetic Huygens box data is given.
author:
- first_name: Christoph
full_name: Marschalt, Christoph
last_name: Marschalt
- first_name: Dominik
full_name: Schroder, Dominik
last_name: Schroder
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
id: '20179'
last_name: Hilleringmann
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
- first_name: Denis
full_name: Sievers, Denis
last_name: Sievers
- first_name: Jens
full_name: Förstner, Jens
id: '158'
last_name: Förstner
orcid: 0000-0001-7059-9862
citation:
ama: 'Marschalt C, Schroder D, Lange S, et al. Far-field Calculation from magnetic
Huygens Box Data using the Boundary Element Method. In: 2022 Smart Systems
Integration (SSI). IEEE; 2022. doi:10.1109/ssi56489.2022.9901431'
apa: Marschalt, C., Schroder, D., Lange, S., Hilleringmann, U., Hedayat, C., Kuhn,
H., Sievers, D., & Förstner, J. (2022). Far-field Calculation from magnetic
Huygens Box Data using the Boundary Element Method. 2022 Smart Systems Integration
(SSI). 2022 Smart Systems Integration (SSI), Grenoble, France. https://doi.org/10.1109/ssi56489.2022.9901431
bibtex: '@inproceedings{Marschalt_Schroder_Lange_Hilleringmann_Hedayat_Kuhn_Sievers_Förstner_2022,
place={Grenoble, France}, title={Far-field Calculation from magnetic Huygens Box
Data using the Boundary Element Method}, DOI={10.1109/ssi56489.2022.9901431},
booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Marschalt,
Christoph and Schroder, Dominik and Lange, Sven and Hilleringmann, Ulrich and
Hedayat, Christian and Kuhn, Harald and Sievers, Denis and Förstner, Jens}, year={2022}
}'
chicago: 'Marschalt, Christoph, Dominik Schroder, Sven Lange, Ulrich Hilleringmann,
Christian Hedayat, Harald Kuhn, Denis Sievers, and Jens Förstner. “Far-Field Calculation
from Magnetic Huygens Box Data Using the Boundary Element Method.” In 2022
Smart Systems Integration (SSI). Grenoble, France: IEEE, 2022. https://doi.org/10.1109/ssi56489.2022.9901431.'
ieee: 'C. Marschalt et al., “Far-field Calculation from magnetic Huygens
Box Data using the Boundary Element Method,” presented at the 2022 Smart Systems
Integration (SSI), Grenoble, France, 2022, doi: 10.1109/ssi56489.2022.9901431.'
mla: Marschalt, Christoph, et al. “Far-Field Calculation from Magnetic Huygens Box
Data Using the Boundary Element Method.” 2022 Smart Systems Integration (SSI),
IEEE, 2022, doi:10.1109/ssi56489.2022.9901431.
short: 'C. Marschalt, D. Schroder, S. Lange, U. Hilleringmann, C. Hedayat, H. Kuhn,
D. Sievers, J. Förstner, in: 2022 Smart Systems Integration (SSI), IEEE, Grenoble,
France, 2022.'
conference:
end_date: 2022-04-28
location: Grenoble, France
name: 2022 Smart Systems Integration (SSI)
start_date: 2022-04-27
date_created: 2022-10-04T11:31:43Z
date_updated: 2024-11-30T19:32:14Z
department:
- _id: '59'
- _id: '61'
- _id: '485'
doi: 10.1109/ssi56489.2022.9901431
keyword:
- Near-Field Scanning
- Huygens Box
- Boundary Element Method
- Method of Moments
- tet_topic_hf
- tet_enas
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9901431
place: Grenoble, France
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2022 Smart Systems Integration (SSI)
publication_identifier:
eisbn:
- 978-1-6654-8849-5
publication_status: published
publisher: IEEE
status: public
title: Far-field Calculation from magnetic Huygens Box Data using the Boundary Element
Method
type: conference
user_id: '158'
year: '2022'
...
---
_id: '22480'
abstract:
- lang: eng
text: In this publication important aspects for the implementation of inductive
locating are explained. The miniaturized sensor platform called Sens-o-Spheres
is used as an application of this locating method. The sensor platform is applied
in bioreactors in order to obtain the environmental parameters, which makes a
localization by magnetic fields necessary. Since the properties of magnetic fields
in the localization area are very different from the wave characteristics, the
principle of inductive localization is investigated in this publication and explained
by using electrical equivalent circuit diagrams. Thereby, inductive localization
uses the coupling or the mutual inductivities between coils, which is noticeable
by an induced voltage. Therefore some properties and procedures are explained
to extract the location of Sens-o-Spheres or other industrial sensor platforms
from the couplings of the coils. One method calculates the location from an adapted
ratio calculation and the other method uses neural networks and stochastic filters
to obtain the results. In the end, these results are evaluated and compared.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Dominik
full_name: Schröder, Dominik
last_name: Schröder
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
citation:
ama: 'Lange S, Schröder D, Hedayat C, Kuhn H, Hilleringmann U. Development of Methods
for Coil-Based Localization by Magnetic Fields of Miniaturized Sensor Platforms
in Bioprocesses. In: 22nd IEEE International Conference on Industrial Technology
(ICIT). Valencia, Spain : IEEE; 2021. doi:10.1109/icit46573.2021.9453609'
apa: 'Lange, S., Schröder, D., Hedayat, C., Kuhn, H., & Hilleringmann, U. (2021).
Development of Methods for Coil-Based Localization by Magnetic Fields of Miniaturized
Sensor Platforms in Bioprocesses. In 22nd IEEE International Conference on
Industrial Technology (ICIT). Valencia, Spain : IEEE. https://doi.org/10.1109/icit46573.2021.9453609'
bibtex: '@inproceedings{Lange_Schröder_Hedayat_Kuhn_Hilleringmann_2021, place={
Valencia, Spain }, title={Development of Methods for Coil-Based Localization by
Magnetic Fields of Miniaturized Sensor Platforms in Bioprocesses}, DOI={10.1109/icit46573.2021.9453609},
booktitle={22nd IEEE International Conference on Industrial Technology (ICIT)},
publisher={IEEE}, author={Lange, Sven and Schröder, Dominik and Hedayat, Christian
and Kuhn, Harald and Hilleringmann, Ulrich}, year={2021} }'
chicago: 'Lange, Sven, Dominik Schröder, Christian Hedayat, Harald Kuhn, and Ulrich
Hilleringmann. “Development of Methods for Coil-Based Localization by Magnetic
Fields of Miniaturized Sensor Platforms in Bioprocesses.” In 22nd IEEE International
Conference on Industrial Technology (ICIT). Valencia, Spain : IEEE, 2021.
https://doi.org/10.1109/icit46573.2021.9453609.'
ieee: S. Lange, D. Schröder, C. Hedayat, H. Kuhn, and U. Hilleringmann, “Development
of Methods for Coil-Based Localization by Magnetic Fields of Miniaturized Sensor
Platforms in Bioprocesses,” in 22nd IEEE International Conference on Industrial
Technology (ICIT), Valencia, Spain , 2021.
mla: Lange, Sven, et al. “Development of Methods for Coil-Based Localization by
Magnetic Fields of Miniaturized Sensor Platforms in Bioprocesses.” 22nd IEEE
International Conference on Industrial Technology (ICIT), IEEE, 2021, doi:10.1109/icit46573.2021.9453609.
short: 'S. Lange, D. Schröder, C. Hedayat, H. Kuhn, U. Hilleringmann, in: 22nd IEEE
International Conference on Industrial Technology (ICIT), IEEE, Valencia, Spain
, 2021.'
conference:
end_date: 2021-03-12
location: 'Valencia, Spain '
name: 22nd IEEE International Conference on Industrial Technology (ICIT)
start_date: 2021-03-10
date_created: 2021-06-20T23:25:54Z
date_updated: 2022-01-06T06:55:33Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/icit46573.2021.9453609
keyword:
- Location awareness
- Coils
- Couplings
- Nonuniform electric fields
- Magnetic separation
- Neural networks
- Training data
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9453609
place: ' Valencia, Spain '
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: 22nd IEEE International Conference on Industrial Technology (ICIT)
publication_identifier:
isbn:
- '9781728157306'
publication_status: published
publisher: IEEE
status: public
title: Development of Methods for Coil-Based Localization by Magnetic Fields of Miniaturized
Sensor Platforms in Bioprocesses
type: conference
user_id: '38240'
year: '2021'
...
---
_id: '22481'
abstract:
- lang: eng
text: During the industrial processing of materials for the manufacture of new products,
surface defects can quickly occur. In order to achieve high quality without a
long time delay, it makes sense to inspect the work pieces so that defective work
pieces can be sorted out right at the beginning of the process. At the same time,
the evaluation unit should come close the perception of the human eye regarding
detection of defects in surfaces. Such defects often manifest themselves by a
deviation of the existing structure. The only restriction should be that only
matt surfaces should be considered here. Therefore in this work, different classification
and image processing algorithms are applied to surface data to identify possible
surface damages. For this purpose, the Gabor filter and the FST (Fused Structure
and Texture) features generated with it, as well as the salience metric are used
on the image processing side. On the classification side, however, deep neural
networks, Convolutional Neural Networks (CNN), and autoencoders are used to make
a decision. A distinction is also made between training using class labels and
without. It turns out later that the salience metric are best performed by CNN.
On the other hand, if there is no labeled training data available, a novelty classification
can easily be achieved by using autoencoders as well as the salience metric and
some filters.
author:
- first_name: Tom
full_name: Sander, Tom
last_name: Sander
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
- first_name: Volker
full_name: Geneis, Volker
last_name: Geneis
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
- first_name: Franz-Barthold
full_name: Gockel, Franz-Barthold
last_name: Gockel
citation:
ama: 'Sander T, Lange S, Hilleringmann U, et al. Detection of Defects on Irregular
Structured Surfaces by Image Processing Methods for Feature Extraction. In: 22nd
IEEE International Conference on Industrial Technology (ICIT). Valencia, Spain
: IEEE; 2021. doi:10.1109/icit46573.2021.9453646'
apa: 'Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., Kuhn, H.,
& Gockel, F.-B. (2021). Detection of Defects on Irregular Structured Surfaces
by Image Processing Methods for Feature Extraction. In 22nd IEEE International
Conference on Industrial Technology (ICIT). Valencia, Spain : IEEE. https://doi.org/10.1109/icit46573.2021.9453646'
bibtex: '@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_Gockel_2021,
place={Valencia, Spain }, title={Detection of Defects on Irregular Structured
Surfaces by Image Processing Methods for Feature Extraction}, DOI={10.1109/icit46573.2021.9453646},
booktitle={22nd IEEE International Conference on Industrial Technology (ICIT)},
publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich
and Geneis, Volker and Hedayat, Christian and Kuhn, Harald and Gockel, Franz-Barthold},
year={2021} }'
chicago: 'Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian
Hedayat, Harald Kuhn, and Franz-Barthold Gockel. “Detection of Defects on Irregular
Structured Surfaces by Image Processing Methods for Feature Extraction.” In 22nd
IEEE International Conference on Industrial Technology (ICIT). Valencia, Spain
: IEEE, 2021. https://doi.org/10.1109/icit46573.2021.9453646.'
ieee: T. Sander et al., “Detection of Defects on Irregular Structured Surfaces
by Image Processing Methods for Feature Extraction,” in 22nd IEEE International
Conference on Industrial Technology (ICIT), Valencia, Spain , 2021.
mla: Sander, Tom, et al. “Detection of Defects on Irregular Structured Surfaces
by Image Processing Methods for Feature Extraction.” 22nd IEEE International
Conference on Industrial Technology (ICIT), IEEE, 2021, doi:10.1109/icit46573.2021.9453646.
short: 'T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, F.-B.
Gockel, in: 22nd IEEE International Conference on Industrial Technology (ICIT),
IEEE, Valencia, Spain , 2021.'
conference:
end_date: 2021-03-12
location: 'Valencia, Spain '
name: 22nd IEEE International Conference on Industrial Technology (ICIT)
start_date: 2021-03-10
date_created: 2021-06-20T23:32:11Z
date_updated: 2022-01-06T06:55:33Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/icit46573.2021.9453646
keyword:
- Image Processing
- Defect Detection
- wooden surfaces
- Machine Learning
- Neural Networks
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9453646
place: 'Valencia, Spain '
publication: 22nd IEEE International Conference on Industrial Technology (ICIT)
publication_identifier:
isbn:
- '9781728157306'
publication_status: published
publisher: IEEE
status: public
title: Detection of Defects on Irregular Structured Surfaces by Image Processing Methods
for Feature Extraction
type: conference
user_id: '38240'
year: '2021'
...
---
_id: '22532'
abstract:
- lang: eng
text: In this publication, further elements of the newly developed inductive localization
in the near field are presented. The advantage of inductive localization is the
usage of the magnetic fields, which have a very low influence of non-metallic
materials in the environment and thus follows good applications in the area of
medicine and biochemistry. This allows a precise localization of sensor platforms
in inhomogeneous mixtures of materials, where classical methods have major problems
with inhomogeneous dielectric conductivity or density. The calculation of the
localization of the searched object differs from other methods such as ultrasound
or electromagnetic waves due to the source-free propagation of the magnetic field.
Therefore, new mathematical evaluation methods and systematic adaptations are
necessary, which are presented in this paper in circuit analysis. For this purpose,
the exact circuit influences of one coil and the influence of another coil are
investigated and which resonance circuit should be selected for both coils for
a inductive localization with optimized signal strength.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Harald
full_name: Kuhn, Harald
last_name: Kuhn
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
citation:
ama: 'Lange S, Hedayat C, Kuhn H, Hilleringmann U. Adaptation and Optimization of
Planar Coils for a More Accurate and Far-Reaching Magnetic Field-Based Localization
in the Near Field. In: 2021 Smart Systems Integration (SSI). Grenoble,
France: IEEE; 2021. doi:10.1109/ssi52265.2021.9466958'
apa: 'Lange, S., Hedayat, C., Kuhn, H., & Hilleringmann, U. (2021). Adaptation
and Optimization of Planar Coils for a More Accurate and Far-Reaching Magnetic
Field-Based Localization in the Near Field. In 2021 Smart Systems Integration
(SSI). Grenoble, France: IEEE. https://doi.org/10.1109/ssi52265.2021.9466958'
bibtex: '@inproceedings{Lange_Hedayat_Kuhn_Hilleringmann_2021, place={Grenoble,
France}, title={Adaptation and Optimization of Planar Coils for a More Accurate
and Far-Reaching Magnetic Field-Based Localization in the Near Field}, DOI={10.1109/ssi52265.2021.9466958},
booktitle={2021 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Lange,
Sven and Hedayat, Christian and Kuhn, Harald and Hilleringmann, Ulrich}, year={2021}
}'
chicago: 'Lange, Sven, Christian Hedayat, Harald Kuhn, and Ulrich Hilleringmann.
“Adaptation and Optimization of Planar Coils for a More Accurate and Far-Reaching
Magnetic Field-Based Localization in the Near Field.” In 2021 Smart Systems
Integration (SSI). Grenoble, France: IEEE, 2021. https://doi.org/10.1109/ssi52265.2021.9466958.'
ieee: S. Lange, C. Hedayat, H. Kuhn, and U. Hilleringmann, “Adaptation and Optimization
of Planar Coils for a More Accurate and Far-Reaching Magnetic Field-Based Localization
in the Near Field,” in 2021 Smart Systems Integration (SSI), Grenoble,
France , 2021.
mla: Lange, Sven, et al. “Adaptation and Optimization of Planar Coils for a More
Accurate and Far-Reaching Magnetic Field-Based Localization in the Near Field.”
2021 Smart Systems Integration (SSI), IEEE, 2021, doi:10.1109/ssi52265.2021.9466958.
short: 'S. Lange, C. Hedayat, H. Kuhn, U. Hilleringmann, in: 2021 Smart Systems
Integration (SSI), IEEE, Grenoble, France, 2021.'
conference:
end_date: 2021-04-29
location: 'Grenoble, France '
name: 2021 Smart Systems Integration (SSI)
start_date: 2021-04-27
date_created: 2021-07-05T19:31:52Z
date_updated: 2022-01-06T06:55:36Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/ssi52265.2021.9466958
keyword:
- Electrotechnical Characteristics of Real Coils
- Inductive Localization
- Resonant Circuit
- Mutual Inductance
- Near-Field
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9466958
place: Grenoble, France
publication: 2021 Smart Systems Integration (SSI)
publication_identifier:
isbn:
- '9781665440929'
publication_status: published
publisher: IEEE
status: public
title: Adaptation and Optimization of Planar Coils for a More Accurate and Far-Reaching
Magnetic Field-Based Localization in the Near Field
type: conference
user_id: '38240'
year: '2021'
...
---
_id: '21541'
abstract:
- lang: eng
text: In this publication, the near-field to far-field transformation using the
self-built near-field scanner NFS3000 is examined with regard to its geometry.
This device allows to measure electric and magnetic fields in small distances
to the DUT (Device under Test) with high geometric precision and high sensitivity.
Leading to a fast examination of EMC (Electromagnetic Compatibility) problems,
because the electromagnetic properties are better understandable and therefore
easier to solve than e.g. measurements in a far-field chamber. In addition, it
is possible to extrapolate the near-fields into the far-field and to determine
the radiation pattern of antennas and emitting objects. For this purpose, this
paper deals with the basis of this transformation, the so-called surface equivalence
theorem. This principle is then adapted to the measurement of near-field scanners
and implemented accordingly. Due to the non-ideal design of the near-field scanner,
the effects on a far-field transformation are finally presented and discussed.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Dominik
full_name: Schroder, Dominik
last_name: Schroder
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Christian
full_name: Hangmann, Christian
last_name: Hangmann
- first_name: Thomas
full_name: Otto, Thomas
last_name: Otto
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
citation:
ama: 'Lange S, Schroder D, Hedayat C, Hangmann C, Otto T, Hilleringmann U. Investigation
of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field
Transformation by the NFS3000. In: 2020 International Symposium on Electromagnetic
Compatibility - EMC EUROPE. IEEE; 2020. doi:10.1109/emceurope48519.2020.9245697'
apa: 'Lange, S., Schroder, D., Hedayat, C., Hangmann, C., Otto, T., & Hilleringmann,
U. (2020). Investigation of the Surface Equivalence Principle on a Metal Surface
for a Near-Field to Far-Field Transformation by the NFS3000. In 2020 International
Symposium on Electromagnetic Compatibility - EMC EUROPE. Rome, Italy : IEEE.
https://doi.org/10.1109/emceurope48519.2020.9245697'
bibtex: '@inproceedings{Lange_Schroder_Hedayat_Hangmann_Otto_Hilleringmann_2020,
title={Investigation of the Surface Equivalence Principle on a Metal Surface for
a Near-Field to Far-Field Transformation by the NFS3000}, DOI={10.1109/emceurope48519.2020.9245697},
booktitle={2020 International Symposium on Electromagnetic Compatibility - EMC
EUROPE}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat,
Christian and Hangmann, Christian and Otto, Thomas and Hilleringmann, Ulrich},
year={2020} }'
chicago: Lange, Sven, Dominik Schroder, Christian Hedayat, Christian Hangmann, Thomas
Otto, and Ulrich Hilleringmann. “Investigation of the Surface Equivalence Principle
on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.”
In 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE.
IEEE, 2020. https://doi.org/10.1109/emceurope48519.2020.9245697.
ieee: S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann,
“Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field
to Far-Field Transformation by the NFS3000,” in 2020 International Symposium
on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy , 2020.
mla: Lange, Sven, et al. “Investigation of the Surface Equivalence Principle on
a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.”
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE,
IEEE, 2020, doi:10.1109/emceurope48519.2020.9245697.
short: 'S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, U. Hilleringmann,
in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE,
IEEE, 2020.'
conference:
end_date: 2020-09-25
location: 'Rome, Italy '
name: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
start_date: 2020-09-23
date_created: 2021-03-18T13:43:53Z
date_updated: 2022-01-06T06:55:03Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/emceurope48519.2020.9245697
keyword:
- Near-Field Scanner
- Near-Field to Far-Field Transformation
- Directivity
- Surface Equivalence Theorem
- Huygens’ Box
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9245697
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE
publication_identifier:
eisbn:
- 978-1-7281-5579-1
isbn:
- 978-1-7281-5580-7
issn:
- '2325-0364 '
publication_status: published
publisher: IEEE
related_material:
record:
- id: '21541'
relation: original
status: public
status: public
title: Investigation of the Surface Equivalence Principle on a Metal Surface for a
Near-Field to Far-Field Transformation by the NFS3000
type: conference
user_id: '38240'
year: '2020'
...
---
_id: '21542'
abstract:
- lang: eng
text: Using near-field (NF) scan data to predict the far-field (FF) behaviour of
radiating electronic systems represents a novel method to accompany the whole
RF design process. This approach involves so-called Huygens' box as an efficient
radiation model inside an electromagnetic (EM) simulation tool and then transforms
the scanned NF measured data into the FF. For this, the basic idea of the Huygens'box
principle and the NF-to-FF transformation are briefly presented. The NF is measured
on the Huygens' box around a device under test using anNF scanner, recording the
magnitude and phase of the site-related magnetic and electric components. A comparison
between a fullwave simulation and the measurement results shows a good similarity
in both the NF and the simulated and transformed FF.Thus, this method is applicable
to predict the FF behaviour of any electronic system by measuring the NF. With
this knowledge, the RF design can be improved due to allowing a significant reduction
of EM compatibility failure at the end of the development flow. In addition, the
very efficient FF radiation model can be used for detailed investigations in various
environments and the impact of such an equivalent radiation source on other electronic
systems can be assessed.
author:
- first_name: Dominik
full_name: Schröder, Dominik
last_name: Schröder
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Christian
full_name: Hangmann, Christian
last_name: Hangmann
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
citation:
ama: 'Schröder D, Lange S, Hangmann C, Hedayat C. Far-field prediction combining
simulations with near-field measurements for EMI assessment of PCBs. In: Tensorial
Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis.
1st ed. Croyton, UK: The Institution of Engineering and Technology (IET); 2020:315-346
(32). doi:10.1049/pbcs072e_ch14'
apa: 'Schröder, D., Lange, S., Hangmann, C., & Hedayat, C. (2020). Far-field
prediction combining simulations with near-field measurements for EMI assessment
of PCBs. In Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
and EMC Analysis (1st ed., pp. 315-346 (32)). Croyton, UK: The Institution
of Engineering and Technology (IET). https://doi.org/10.1049/pbcs072e_ch14'
bibtex: '@inbook{Schröder_Lange_Hangmann_Hedayat_2020, place={Croyton, UK}, edition={1},
title={Far-field prediction combining simulations with near-field measurements
for EMI assessment of PCBs}, DOI={10.1049/pbcs072e_ch14},
booktitle={Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
and EMC Analysis}, publisher={ The Institution of Engineering and Technology (IET)},
author={Schröder, Dominik and Lange, Sven and Hangmann, Christian and Hedayat,
Christian}, year={2020}, pages={315-346 (32)} }'
chicago: 'Schröder, Dominik, Sven Lange, Christian Hangmann, and Christian Hedayat.
“Far-Field Prediction Combining Simulations with near-Field Measurements for EMI
Assessment of PCBs.” In Tensorial Analysis of Networks (TAN) Modelling for
PCB Signal Integrity and EMC Analysis, 1st ed., 315-346 (32). Croyton, UK: The
Institution of Engineering and Technology (IET), 2020. https://doi.org/10.1049/pbcs072e_ch14.'
ieee: 'D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction
combining simulations with near-field measurements for EMI assessment of PCBs,”
in Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
and EMC Analysis, 1st ed., Croyton, UK: The Institution of Engineering and
Technology (IET), 2020, pp. 315-346 (32).'
mla: Schröder, Dominik, et al. “Far-Field Prediction Combining Simulations with
near-Field Measurements for EMI Assessment of PCBs.” Tensorial Analysis of
Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed., The
Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32), doi:10.1049/pbcs072e_ch14.
short: 'D. Schröder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis
of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed., The
Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346
(32).'
date_created: 2021-03-18T13:49:49Z
date_updated: 2022-01-06T06:55:03Z
department:
- _id: '485'
doi: 10.1049/pbcs072e_ch14
edition: '1'
keyword:
- Huygens' box
- NF-to-FF transformation
- efficient FF radiation model
- FF behaviour
- EMI assessment
- PCB
- near-field measurements
- efficient radiation model
- far-field behaviour
- RF design process
- far-field prediction
- Huygens'box principle
- fullwave simulation
- electronic system radiation
- equivalent radiation source
- electromagnetic simulation tool
- near-field scan data
- EM compatibility failure reduction
language:
- iso: eng
main_file_link:
- url: https://digital-library.theiet.org/content/books/10.1049/pbcs072e_ch14
page: 315-346 (32)
place: Croyton, UK
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity
and EMC Analysis
publication_identifier:
isbn:
- '9781839530494'
- '9781839530500'
publication_status: published
publisher: ' The Institution of Engineering and Technology (IET)'
related_material:
record:
- id: '21542'
relation: other
status: public
status: public
title: Far-field prediction combining simulations with near-field measurements for
EMI assessment of PCBs
type: book_chapter
user_id: '38240'
year: '2020'
...
---
_id: '21524'
abstract:
- lang: eng
text: For the measurement of process data in bioreactors, very small wireless sensors
are currently under development to replace the conventional rod probes. The so-called
Sens-o-Spheres measure the temperature and in future the oxygen content and the
pH of fluids. In order to evaluate the distribution of the measured values within
the process, it is necessary to locate the wireless sensors. Because of the small
size of the sphere (diameter 8 mm), inhomogeneous ambient media and the size of
the reactor (less than 2 m), an inductive locating by magnetic fields with a frequency
of f = 13.56 MHz is necessary. Since the behaviour of the magnetic field is very
different from that of the electromagnetic wave, new locating methods are required,
which are presented in this paper.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Dominik
full_name: Schröder, Dominik
last_name: Schröder
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Thomas
full_name: Otto, Thomas
last_name: Otto
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
citation:
ama: 'Lange S, Schröder D, Hedayat C, Otto T, Hilleringmann U. Inductive Locating
Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics.
In: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS).
; 2019. doi:10.1109/newcas44328.2019.8961227'
apa: Lange, S., Schröder, D., Hedayat, C., Otto, T., & Hilleringmann, U. (2019).
Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous
Dielectrics. In 2019 17th IEEE International New Circuits and Systems Conference
(NEWCAS). Munich, Germany. https://doi.org/10.1109/newcas44328.2019.8961227
bibtex: '@inproceedings{Lange_Schröder_Hedayat_Otto_Hilleringmann_2019, title={Inductive
Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics},
DOI={10.1109/newcas44328.2019.8961227},
booktitle={2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)},
author={Lange, Sven and Schröder, Dominik and Hedayat, Christian and Otto, Thomas
and Hilleringmann, Ulrich}, year={2019} }'
chicago: Lange, Sven, Dominik Schröder, Christian Hedayat, Thomas Otto, and Ulrich
Hilleringmann. “Inductive Locating Method to Locate Miniaturized Wireless Sensors
within Inhomogeneous Dielectrics.” In 2019 17th IEEE International New Circuits
and Systems Conference (NEWCAS), 2019. https://doi.org/10.1109/newcas44328.2019.8961227.
ieee: S. Lange, D. Schröder, C. Hedayat, T. Otto, and U. Hilleringmann, “Inductive
Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics,”
in 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS),
Munich, Germany, 2019.
mla: Lange, Sven, et al. “Inductive Locating Method to Locate Miniaturized Wireless
Sensors within Inhomogeneous Dielectrics.” 2019 17th IEEE International New
Circuits and Systems Conference (NEWCAS), 2019, doi:10.1109/newcas44328.2019.8961227.
short: 'S. Lange, D. Schröder, C. Hedayat, T. Otto, U. Hilleringmann, in: 2019 17th
IEEE International New Circuits and Systems Conference (NEWCAS), 2019.'
conference:
end_date: 2019-06-26
location: Munich, Germany
name: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)
start_date: 2019-06-23
date_created: 2021-03-17T09:52:41Z
date_updated: 2022-01-06T06:55:03Z
department:
- _id: '59'
- _id: '485'
doi: 10.1109/newcas44328.2019.8961227
keyword:
- oxygen content
- inhomogeneous ambient media
- magnetic field
- inductive locating method
- miniaturized wireless sensors
- inhomogeneous dielectrics
- conventional rod probes
- Sens-o-Spheres measure
- frequency 13.56 MHz
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/8961227
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)
publication_identifier:
isbn:
- '9781728110318'
publication_status: published
related_material:
record:
- id: '21524'
relation: earlier_version
status: public
status: public
title: Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous
Dielectrics
type: conference
user_id: '38240'
year: '2019'
...
---
_id: '21462'
abstract:
- lang: eng
text: This paper presents a new methodology by using a multiple coil array for energy
transmission. The complex current strengths of the transmitting coil array are
calculated by having the knowledge about of the mutual inductances and the symmetries
of the transmitting coil array, so that its resulting magnetic field mainly penetrates
only the receiving coil and is strongly attenuated outside. This method is used
for an optimized wireless energy transmission but can also be implemented for
other inductive applications.
author:
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
orcid: '0009-0007-9150-2266 '
- first_name: Maik-Julian
full_name: Büker, Maik-Julian
last_name: Büker
- first_name: Denis
full_name: Sievers, Denis
last_name: Sievers
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Jens
full_name: Förstner, Jens
id: '158'
last_name: Förstner
orcid: 0000-0001-7059-9862
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
- first_name: Thomas
full_name: Otto, Thomas
last_name: Otto
citation:
ama: 'Lange S, Büker M-J, Sievers D, et al. Method of superposing a multiple driven
magnetic field to minimize stray fields around the receiver for inductive wireless
power transmission. In: Smart Systems Integration; 13th International Conference
and Exhibition on Integration Issues of Miniaturized Systems. VDE VERLAG GMBH;
2019:1-4.'
apa: Lange, S., Büker, M.-J., Sievers, D., Hedayat, C., Förstner, J., Hilleringmann,
U., & Otto, T. (2019). Method of superposing a multiple driven magnetic field
to minimize stray fields around the receiver for inductive wireless power transmission.
Smart Systems Integration; 13th International Conference and Exhibition on
Integration Issues of Miniaturized Systems, 1–4.
bibtex: '@inproceedings{Lange_Büker_Sievers_Hedayat_Förstner_Hilleringmann_Otto_2019,
place={Berlin · Offenbach}, title={Method of superposing a multiple driven magnetic
field to minimize stray fields around the receiver for inductive wireless power
transmission}, booktitle={Smart Systems Integration; 13th International Conference
and Exhibition on Integration Issues of Miniaturized Systems}, publisher={VDE
VERLAG GMBH}, author={Lange, Sven and Büker, Maik-Julian and Sievers, Denis and
Hedayat, Christian and Förstner, Jens and Hilleringmann, Ulrich and Otto, Thomas},
year={2019}, pages={1–4} }'
chicago: 'Lange, Sven, Maik-Julian Büker, Denis Sievers, Christian Hedayat, Jens
Förstner, Ulrich Hilleringmann, and Thomas Otto. “Method of Superposing a Multiple
Driven Magnetic Field to Minimize Stray Fields around the Receiver for Inductive
Wireless Power Transmission.” In Smart Systems Integration; 13th International
Conference and Exhibition on Integration Issues of Miniaturized Systems, 1–4.
Berlin · Offenbach: VDE VERLAG GMBH, 2019.'
ieee: S. Lange et al., “Method of superposing a multiple driven magnetic
field to minimize stray fields around the receiver for inductive wireless power
transmission,” in Smart Systems Integration; 13th International Conference
and Exhibition on Integration Issues of Miniaturized Systems, Barcelona, Spain
, 2019, pp. 1–4.
mla: Lange, Sven, et al. “Method of Superposing a Multiple Driven Magnetic Field
to Minimize Stray Fields around the Receiver for Inductive Wireless Power Transmission.”
Smart Systems Integration; 13th International Conference and Exhibition on
Integration Issues of Miniaturized Systems, VDE VERLAG GMBH, 2019, pp. 1–4.
short: 'S. Lange, M.-J. Büker, D. Sievers, C. Hedayat, J. Förstner, U. Hilleringmann,
T. Otto, in: Smart Systems Integration; 13th International Conference and Exhibition
on Integration Issues of Miniaturized Systems, VDE VERLAG GMBH, Berlin · Offenbach,
2019, pp. 1–4.'
conference:
end_date: 2019-04-11
location: 'Barcelona, Spain '
name: Smart Systems Integration; 13th International Conference and Exhibition on
Integration Issues of Miniaturized Systems
start_date: 2019-04-10
date_created: 2021-03-12T09:46:55Z
date_updated: 2024-11-30T19:32:36Z
department:
- _id: '59'
- _id: '61'
- _id: '485'
keyword:
- tet_enas
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/8727831
page: 1-4
place: Berlin · Offenbach
publication: Smart Systems Integration; 13th International Conference and Exhibition
on Integration Issues of Miniaturized Systems
publication_identifier:
isbn:
- 978-3-8007-4919-5
publication_status: published
publisher: VDE VERLAG GMBH
related_material:
record:
- id: '9265'
relation: other
status: deleted
status: public
title: Method of superposing a multiple driven magnetic field to minimize stray fields
around the receiver for inductive wireless power transmission
type: conference
user_id: '158'
year: '2019'
...