[{"author":[{"full_name":"Lenz, Cederic","first_name":"Cederic","last_name":"Lenz"},{"last_name":"Bause","first_name":"Maximilian","full_name":"Bause, Maximilian","id":"52175"},{"first_name":"Christian","last_name":"Henke","full_name":"Henke, Christian"},{"full_name":"Trächtler, Ansgar","last_name":"Trächtler","first_name":"Ansgar","id":"552"}],"year":"2024","status":"public","title":"Boosting Low Data PINN Robustness with Transfer Learning*","publication_status":"published","date_updated":"2024-11-18T10:41:11Z","language":[{"iso":"eng"}],"_id":"57180","publisher":"IEEE","user_id":"41470","doi":"10.1109/icarm62033.2024.10715896","citation":{"ama":"Lenz C, Bause M, Henke C, Trächtler A. Boosting Low Data PINN Robustness with Transfer Learning*. In: <i>2024 International Conference on Advanced Robotics and Mechatronics (ICARM)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/icarm62033.2024.10715896\">10.1109/icarm62033.2024.10715896</a>","bibtex":"@inproceedings{Lenz_Bause_Henke_Trächtler_2024, title={Boosting Low Data PINN Robustness with Transfer Learning*}, DOI={<a href=\"https://doi.org/10.1109/icarm62033.2024.10715896\">10.1109/icarm62033.2024.10715896</a>}, booktitle={2024 International Conference on Advanced Robotics and Mechatronics (ICARM)}, publisher={IEEE}, author={Lenz, Cederic and Bause, Maximilian and Henke, Christian and Trächtler, Ansgar}, year={2024} }","mla":"Lenz, Cederic, et al. “Boosting Low Data PINN Robustness with Transfer Learning*.” <i>2024 International Conference on Advanced Robotics and Mechatronics (ICARM)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/icarm62033.2024.10715896\">10.1109/icarm62033.2024.10715896</a>.","chicago":"Lenz, Cederic, Maximilian Bause, Christian Henke, and Ansgar Trächtler. “Boosting Low Data PINN Robustness with Transfer Learning*.” In <i>2024 International Conference on Advanced Robotics and Mechatronics (ICARM)</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/icarm62033.2024.10715896\">https://doi.org/10.1109/icarm62033.2024.10715896</a>.","short":"C. Lenz, M. Bause, C. Henke, A. Trächtler, in: 2024 International Conference on Advanced Robotics and Mechatronics (ICARM), IEEE, 2024.","apa":"Lenz, C., Bause, M., Henke, C., &#38; Trächtler, A. (2024). Boosting Low Data PINN Robustness with Transfer Learning*. <i>2024 International Conference on Advanced Robotics and Mechatronics (ICARM)</i>. <a href=\"https://doi.org/10.1109/icarm62033.2024.10715896\">https://doi.org/10.1109/icarm62033.2024.10715896</a>","ieee":"C. Lenz, M. Bause, C. Henke, and A. Trächtler, “Boosting Low Data PINN Robustness with Transfer Learning*,” 2024, doi: <a href=\"https://doi.org/10.1109/icarm62033.2024.10715896\">10.1109/icarm62033.2024.10715896</a>."},"publication":"2024 International Conference on Advanced Robotics and Mechatronics (ICARM)","quality_controlled":"1","date_created":"2024-11-18T10:14:14Z","department":[{"_id":"153"},{"_id":"241"}],"type":"conference"},{"date_created":"2024-11-18T10:14:46Z","type":"conference","department":[{"_id":"153"},{"_id":"241"}],"publication":"2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)","citation":{"mla":"Lenz, Cederic, et al. “Contextual Anomaly Detection in Hot Forming Production Line Using PINN Architecture.” <i>2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/aim55361.2024.10637234\">10.1109/aim55361.2024.10637234</a>.","bibtex":"@inproceedings{Lenz_Bause_Reiling_Henke_Trächtler_2024, title={Contextual Anomaly Detection in Hot Forming Production Line using PINN Architecture}, DOI={<a href=\"https://doi.org/10.1109/aim55361.2024.10637234\">10.1109/aim55361.2024.10637234</a>}, booktitle={2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)}, publisher={IEEE}, author={Lenz, Cederic and Bause, Maximilian and Reiling, Fabian and Henke, Christian and Trächtler, Ansgar}, year={2024} }","ama":"Lenz C, Bause M, Reiling F, Henke C, Trächtler A. Contextual Anomaly Detection in Hot Forming Production Line using PINN Architecture. In: <i>2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/aim55361.2024.10637234\">10.1109/aim55361.2024.10637234</a>","ieee":"C. Lenz, M. Bause, F. Reiling, C. Henke, and A. Trächtler, “Contextual Anomaly Detection in Hot Forming Production Line using PINN Architecture,” 2024, doi: <a href=\"https://doi.org/10.1109/aim55361.2024.10637234\">10.1109/aim55361.2024.10637234</a>.","apa":"Lenz, C., Bause, M., Reiling, F., Henke, C., &#38; Trächtler, A. (2024). Contextual Anomaly Detection in Hot Forming Production Line using PINN Architecture. <i>2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)</i>. <a href=\"https://doi.org/10.1109/aim55361.2024.10637234\">https://doi.org/10.1109/aim55361.2024.10637234</a>","chicago":"Lenz, Cederic, Maximilian Bause, Fabian Reiling, Christian Henke, and Ansgar Trächtler. “Contextual Anomaly Detection in Hot Forming Production Line Using PINN Architecture.” In <i>2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/aim55361.2024.10637234\">https://doi.org/10.1109/aim55361.2024.10637234</a>.","short":"C. Lenz, M. Bause, F. Reiling, C. Henke, A. Trächtler, in: 2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), IEEE, 2024."},"quality_controlled":"1","language":[{"iso":"eng"}],"_id":"57181","publisher":"IEEE","user_id":"41470","doi":"10.1109/aim55361.2024.10637234","year":"2024","title":"Contextual Anomaly Detection in Hot Forming Production Line using PINN Architecture","status":"public","author":[{"full_name":"Lenz, Cederic","first_name":"Cederic","last_name":"Lenz"},{"id":"52175","first_name":"Maximilian","last_name":"Bause","full_name":"Bause, Maximilian"},{"first_name":"Fabian","last_name":"Reiling","full_name":"Reiling, Fabian"},{"full_name":"Henke, Christian","first_name":"Christian","last_name":"Henke"},{"id":"552","full_name":"Trächtler, Ansgar","first_name":"Ansgar","last_name":"Trächtler"}],"publication_status":"published","date_updated":"2024-11-18T10:47:15Z"},{"quality_controlled":"1","publication":"2023 IEEE 21st International Conference on Industrial Informatics (INDIN)","citation":{"mla":"Koppert, Steven, et al. “Learning the Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups.” <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217972\">10.1109/indin51400.2023.10217972</a>.","bibtex":"@inproceedings{Koppert_Bause_Henke_Trächtler_2023, title={Learning the Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups}, DOI={<a href=\"https://doi.org/10.1109/indin51400.2023.10217972\">10.1109/indin51400.2023.10217972</a>}, booktitle={2023 IEEE 21st International Conference on Industrial Informatics (INDIN)}, publisher={IEEE}, author={Koppert, Steven and Bause, Maximilian and Henke, Christian and Trächtler, Ansgar}, year={2023} }","ama":"Koppert S, Bause M, Henke C, Trächtler A. Learning the Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups. In: <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/indin51400.2023.10217972\">10.1109/indin51400.2023.10217972</a>","ieee":"S. Koppert, M. Bause, C. Henke, and A. Trächtler, “Learning the Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups,” 2023, doi: <a href=\"https://doi.org/10.1109/indin51400.2023.10217972\">10.1109/indin51400.2023.10217972</a>.","apa":"Koppert, S., Bause, M., Henke, C., &#38; Trächtler, A. (2023). Learning the Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups. <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. <a href=\"https://doi.org/10.1109/indin51400.2023.10217972\">https://doi.org/10.1109/indin51400.2023.10217972</a>","chicago":"Koppert, Steven, Maximilian Bause, Christian Henke, and Ansgar Trächtler. “Learning the Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups.” In <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/indin51400.2023.10217972\">https://doi.org/10.1109/indin51400.2023.10217972</a>.","short":"S. Koppert, M. Bause, C. Henke, A. 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