---
_id: '57180'
author:
- first_name: Cederic
  full_name: Lenz, Cederic
  last_name: Lenz
- first_name: Maximilian
  full_name: Bause, Maximilian
  id: '52175'
  last_name: Bause
- first_name: Christian
  full_name: Henke, Christian
  last_name: Henke
- first_name: Ansgar
  full_name: Trächtler, Ansgar
  id: '552'
  last_name: Trächtler
citation:
  ama: 'Lenz C, Bause M, Henke C, Trächtler A. Boosting Low Data PINN Robustness with
    Transfer Learning*. In: <i>2024 International Conference on Advanced Robotics
    and Mechatronics (ICARM)</i>. IEEE; 2024. doi:<a href="https://doi.org/10.1109/icarm62033.2024.10715896">10.1109/icarm62033.2024.10715896</a>'
  apa: Lenz, C., Bause, M., Henke, C., &#38; Trächtler, A. (2024). Boosting Low Data
    PINN Robustness with Transfer Learning*. <i>2024 International Conference on Advanced
    Robotics and Mechatronics (ICARM)</i>. <a href="https://doi.org/10.1109/icarm62033.2024.10715896">https://doi.org/10.1109/icarm62033.2024.10715896</a>
  bibtex: '@inproceedings{Lenz_Bause_Henke_Trächtler_2024, title={Boosting Low Data
    PINN Robustness with Transfer Learning*}, DOI={<a href="https://doi.org/10.1109/icarm62033.2024.10715896">10.1109/icarm62033.2024.10715896</a>},
    booktitle={2024 International Conference on Advanced Robotics and Mechatronics
    (ICARM)}, publisher={IEEE}, author={Lenz, Cederic and Bause, Maximilian and Henke,
    Christian and Trächtler, Ansgar}, year={2024} }'
  chicago: Lenz, Cederic, Maximilian Bause, Christian Henke, and Ansgar Trächtler.
    “Boosting Low Data PINN Robustness with Transfer Learning*.” In <i>2024 International
    Conference on Advanced Robotics and Mechatronics (ICARM)</i>. IEEE, 2024. <a href="https://doi.org/10.1109/icarm62033.2024.10715896">https://doi.org/10.1109/icarm62033.2024.10715896</a>.
  ieee: 'C. Lenz, M. Bause, C. Henke, and A. Trächtler, “Boosting Low Data PINN Robustness
    with Transfer Learning*,” 2024, doi: <a href="https://doi.org/10.1109/icarm62033.2024.10715896">10.1109/icarm62033.2024.10715896</a>.'
  mla: Lenz, Cederic, et al. “Boosting Low Data PINN Robustness with Transfer Learning*.”
    <i>2024 International Conference on Advanced Robotics and Mechatronics (ICARM)</i>,
    IEEE, 2024, doi:<a href="https://doi.org/10.1109/icarm62033.2024.10715896">10.1109/icarm62033.2024.10715896</a>.
  short: 'C. Lenz, M. Bause, C. Henke, A. Trächtler, in: 2024 International Conference
    on Advanced Robotics and Mechatronics (ICARM), IEEE, 2024.'
date_created: 2024-11-18T10:14:14Z
date_updated: 2024-11-18T10:41:11Z
department:
- _id: '153'
- _id: '241'
doi: 10.1109/icarm62033.2024.10715896
language:
- iso: eng
publication: 2024 International Conference on Advanced Robotics and Mechatronics (ICARM)
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: Boosting Low Data PINN Robustness with Transfer Learning*
type: conference
user_id: '41470'
year: '2024'
...
---
_id: '57181'
author:
- first_name: Cederic
  full_name: Lenz, Cederic
  last_name: Lenz
- first_name: Maximilian
  full_name: Bause, Maximilian
  id: '52175'
  last_name: Bause
- first_name: Fabian
  full_name: Reiling, Fabian
  last_name: Reiling
- first_name: Christian
  full_name: Henke, Christian
  last_name: Henke
- first_name: Ansgar
  full_name: Trächtler, Ansgar
  id: '552'
  last_name: Trächtler
citation:
  ama: 'Lenz C, Bause M, Reiling F, Henke C, Trächtler A. Contextual Anomaly Detection
    in Hot Forming Production Line using PINN Architecture. In: <i>2024 IEEE International
    Conference on Advanced Intelligent Mechatronics (AIM)</i>. IEEE; 2024. doi:<a
    href="https://doi.org/10.1109/aim55361.2024.10637234">10.1109/aim55361.2024.10637234</a>'
  apa: Lenz, C., Bause, M., Reiling, F., Henke, C., &#38; Trächtler, A. (2024). Contextual
    Anomaly Detection in Hot Forming Production Line using PINN Architecture. <i>2024
    IEEE International Conference on Advanced Intelligent Mechatronics (AIM)</i>.
    <a href="https://doi.org/10.1109/aim55361.2024.10637234">https://doi.org/10.1109/aim55361.2024.10637234</a>
  bibtex: '@inproceedings{Lenz_Bause_Reiling_Henke_Trächtler_2024, title={Contextual
    Anomaly Detection in Hot Forming Production Line using PINN Architecture}, DOI={<a
    href="https://doi.org/10.1109/aim55361.2024.10637234">10.1109/aim55361.2024.10637234</a>},
    booktitle={2024 IEEE International Conference on Advanced Intelligent Mechatronics
    (AIM)}, publisher={IEEE}, author={Lenz, Cederic and Bause, Maximilian and Reiling,
    Fabian and Henke, Christian and Trächtler, Ansgar}, year={2024} }'
  chicago: Lenz, Cederic, Maximilian Bause, Fabian Reiling, Christian Henke, and Ansgar
    Trächtler. “Contextual Anomaly Detection in Hot Forming Production Line Using
    PINN Architecture.” In <i>2024 IEEE International Conference on Advanced Intelligent
    Mechatronics (AIM)</i>. IEEE, 2024. <a href="https://doi.org/10.1109/aim55361.2024.10637234">https://doi.org/10.1109/aim55361.2024.10637234</a>.
  ieee: 'C. Lenz, M. Bause, F. Reiling, C. Henke, and A. Trächtler, “Contextual Anomaly
    Detection in Hot Forming Production Line using PINN Architecture,” 2024, doi:
    <a href="https://doi.org/10.1109/aim55361.2024.10637234">10.1109/aim55361.2024.10637234</a>.'
  mla: Lenz, Cederic, et al. “Contextual Anomaly Detection in Hot Forming Production
    Line Using PINN Architecture.” <i>2024 IEEE International Conference on Advanced
    Intelligent Mechatronics (AIM)</i>, IEEE, 2024, doi:<a href="https://doi.org/10.1109/aim55361.2024.10637234">10.1109/aim55361.2024.10637234</a>.
  short: 'C. Lenz, M. Bause, F. Reiling, C. Henke, A. Trächtler, in: 2024 IEEE International
    Conference on Advanced Intelligent Mechatronics (AIM), IEEE, 2024.'
date_created: 2024-11-18T10:14:46Z
date_updated: 2024-11-18T10:47:15Z
department:
- _id: '153'
- _id: '241'
doi: 10.1109/aim55361.2024.10637234
language:
- iso: eng
publication: 2024 IEEE International Conference on Advanced Intelligent Mechatronics
  (AIM)
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: Contextual Anomaly Detection in Hot Forming Production Line using PINN Architecture
type: conference
user_id: '41470'
year: '2024'
...
---
_id: '48571'
author:
- first_name: Steven
  full_name: Koppert, Steven
  last_name: Koppert
- first_name: Maximilian
  full_name: Bause, Maximilian
  id: '52175'
  last_name: Bause
- first_name: Christian
  full_name: Henke, Christian
  last_name: Henke
- first_name: Ansgar
  full_name: Trächtler, Ansgar
  id: '552'
  last_name: Trächtler
citation:
  ama: 'Koppert S, Bause M, Henke C, Trächtler A. Learning the Automated Setup of
    Profile Wrapping Lines for New Products from Few Past Setups. In: <i>2023 IEEE
    21st International Conference on Industrial Informatics (INDIN)</i>. IEEE; 2023.
    doi:<a href="https://doi.org/10.1109/indin51400.2023.10217972">10.1109/indin51400.2023.10217972</a>'
  apa: Koppert, S., Bause, M., Henke, C., &#38; Trächtler, A. (2023). Learning the
    Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups.
    <i>2023 IEEE 21st International Conference on Industrial Informatics (INDIN)</i>.
    <a href="https://doi.org/10.1109/indin51400.2023.10217972">https://doi.org/10.1109/indin51400.2023.10217972</a>
  bibtex: '@inproceedings{Koppert_Bause_Henke_Trächtler_2023, title={Learning the
    Automated Setup of Profile Wrapping Lines for New Products from Few Past Setups},
    DOI={<a href="https://doi.org/10.1109/indin51400.2023.10217972">10.1109/indin51400.2023.10217972</a>},
    booktitle={2023 IEEE 21st International Conference on Industrial Informatics (INDIN)},
    publisher={IEEE}, author={Koppert, Steven and Bause, Maximilian and Henke, Christian
    and Trächtler, Ansgar}, year={2023} }'
  chicago: Koppert, Steven, Maximilian Bause, Christian Henke, and Ansgar Trächtler.
    “Learning the Automated Setup of Profile Wrapping Lines for New Products from
    Few Past Setups.” In <i>2023 IEEE 21st International Conference on Industrial
    Informatics (INDIN)</i>. IEEE, 2023. <a href="https://doi.org/10.1109/indin51400.2023.10217972">https://doi.org/10.1109/indin51400.2023.10217972</a>.
  ieee: 'S. Koppert, M. Bause, C. Henke, and A. Trächtler, “Learning the Automated
    Setup of Profile Wrapping Lines for New Products from Few Past Setups,” 2023,
    doi: <a href="https://doi.org/10.1109/indin51400.2023.10217972">10.1109/indin51400.2023.10217972</a>.'
  mla: Koppert, Steven, et al. “Learning the Automated Setup of Profile Wrapping Lines
    for New Products from Few Past Setups.” <i>2023 IEEE 21st International Conference
    on Industrial Informatics (INDIN)</i>, IEEE, 2023, doi:<a href="https://doi.org/10.1109/indin51400.2023.10217972">10.1109/indin51400.2023.10217972</a>.
  short: 'S. Koppert, M. Bause, C. Henke, A. Trächtler, in: 2023 IEEE 21st International
    Conference on Industrial Informatics (INDIN), IEEE, 2023.'
date_created: 2023-10-31T14:00:13Z
date_updated: 2023-10-31T14:32:16Z
department:
- _id: '153'
- _id: '241'
doi: 10.1109/indin51400.2023.10217972
language:
- iso: eng
publication: 2023 IEEE 21st International Conference on Industrial Informatics (INDIN)
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: Learning the Automated Setup of Profile Wrapping Lines for New Products from
  Few Past Setups
type: conference
user_id: '41470'
year: '2023'
...