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Visuelle Perspektiven Auf Auditive Kulturen</i>, edited by Carola Bebersmeier and Sabine Meine, Böhlau, 2023, pp. 83–108.","bibtex":"@inbook{Steigerwald_2023, place={Wien / Köln}, title={Illustrationen musikalischen Vergnügens. Die Bildrhetorik des “Grand Divertissement royal” (1668)}, booktitle={Musik im Blick. Visuelle Perspektiven auf auditive Kulturen}, publisher={Böhlau}, author={Steigerwald, Jörn}, editor={Bebersmeier, Carola and Meine, Sabine}, year={2023}, pages={83–108} }","short":"J. Steigerwald, in: C. Bebersmeier, S. Meine (Eds.), Musik Im Blick. Visuelle Perspektiven Auf Auditive Kulturen, Böhlau, Wien / Köln, 2023, pp. 83–108.","apa":"Steigerwald, J. (2023). Illustrationen musikalischen Vergnügens. Die Bildrhetorik des “Grand Divertissement royal” (1668). In C. Bebersmeier &#38; S. Meine (Eds.), <i>Musik im Blick. Visuelle Perspektiven auf auditive Kulturen</i> (pp. 83–108). Böhlau.","ama":"Steigerwald J. Illustrationen musikalischen Vergnügens. 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Schlieper, Eds. 2023, pp. 37–55.","chicago":"Schlieper, Hendrik. “Fautes Donjuanesques, Remontrances Galantes. Réflexions Sur Le Festin de Pierre de Molière.” In <i>Molière, Dramaturge de La Société de Cour</i>, edited by Jörn  Steigerwald and Hendrik Schlieper, 47/2:37–55. Œuvres &#38; Critiques , 2023.","apa":"Schlieper, H. (2023). Fautes donjuanesques, remontrances galantes. Réflexions sur Le Festin de Pierre de Molière. In J. Steigerwald &#38; H. Schlieper (Eds.), <i>Molière, dramaturge de la société de cour</i> (Vol. 47/2, pp. 37–55).","ama":"Schlieper H. Fautes donjuanesques, remontrances galantes. Réflexions sur Le Festin de Pierre de Molière. In: Steigerwald J, Schlieper H, eds. <i>Molière, Dramaturge de La Société de Cour</i>. Vol 47/2. Œuvres &#38; Critiques . ; 2023:37-55."},"department":[{"_id":"116"}]},{"quality_controlled":"1","publication":"Proceedings of the Asia Pacific Conference of the PHM Society 2023 ","date_created":"2023-09-18T07:52:32Z","status":"public","year":"2023","type":"conference","language":[{"iso":"eng"}],"volume":4,"_id":"47116","date_updated":"2024-08-19T07:39:12Z","issue":"1","author":[{"full_name":"Aimiyekagbon, Osarenren Kennedy","first_name":"Osarenren Kennedy","id":"9557","last_name":"Aimiyekagbon"},{"first_name":"Alexander","full_name":"Löwen, Alexander","id":"47233","last_name":"Löwen"},{"id":"54290","last_name":"Bender","full_name":"Bender, Amelie","first_name":"Amelie"},{"orcid":"0000-0002-2938-5616","id":"77313","last_name":"Muth","full_name":"Muth, Lars","first_name":"Lars"},{"full_name":"Sextro, Walter","first_name":"Walter","id":"21220","last_name":"Sextro"}],"title":"Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System","abstract":[{"text":"This paper presents a comprehensive study on diagnosing a spacecraft propulsion system utilizing data provided by the Prognostics and Health Management (PHM) society, specifically obtained as part of the Asia-Pacific PHM conference’s data challenge 2023. The objective of the challenge is to identify and diagnose known faults as well as unknown anomalies in the spacecraft’s propulsion system, which is critical for ensuring the spacecraft’s proper functionality and safety. To address this challenge, the proposed method follows a systematic approach of feature extraction, feature selection, and model development. The models employed in this study are kMeans clustering and decision trees combined to ensembles, enriched with expert knowledge. With the method presented, our team was capable of reaching high accuracy in identifying anomalies as well as diagnosing faults, resulting in attaining the seventh place with a score of 93.08 %.","lang":"eng"}],"intvolume":"         4","doi":"10.36001/phmap.2023.v4i1.3596","user_id":"9557","oa":"1","keyword":["PHM","Fault Diagnostics","Multiple Fault Modes","Expert-Informed Diagnostics","Anomaly Detection"],"main_file_link":[{"open_access":"1","url":"https://www.papers.phmsociety.org/index.php/phmap/article/view/3596"}],"citation":{"chicago":"Aimiyekagbon, Osarenren Kennedy, Alexander Löwen, Amelie Bender, Lars Muth, and Walter Sextro. “Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System.” In <i>Proceedings of the Asia Pacific Conference of the PHM Society 2023 </i>, Vol. 4, 2023. <a href=\"https://doi.org/10.36001/phmap.2023.v4i1.3596\">https://doi.org/10.36001/phmap.2023.v4i1.3596</a>.","ieee":"O. K. Aimiyekagbon, A. Löwen, A. Bender, L. Muth, and W. Sextro, “Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System,” in <i>Proceedings of the Asia Pacific Conference of the PHM Society 2023 </i>, 2023, vol. 4, no. 1, doi: <a href=\"https://doi.org/10.36001/phmap.2023.v4i1.3596\">10.36001/phmap.2023.v4i1.3596</a>.","ama":"Aimiyekagbon OK, Löwen A, Bender A, Muth L, Sextro W. Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System. In: <i>Proceedings of the Asia Pacific Conference of the PHM Society 2023 </i>. Vol 4. ; 2023. doi:<a href=\"https://doi.org/10.36001/phmap.2023.v4i1.3596\">10.36001/phmap.2023.v4i1.3596</a>","apa":"Aimiyekagbon, O. K., Löwen, A., Bender, A., Muth, L., &#38; Sextro, W. (2023). Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System. <i>Proceedings of the Asia Pacific Conference of the PHM Society 2023 </i>, <i>4</i>(1). <a href=\"https://doi.org/10.36001/phmap.2023.v4i1.3596\">https://doi.org/10.36001/phmap.2023.v4i1.3596</a>","short":"O.K. Aimiyekagbon, A. Löwen, A. Bender, L. Muth, W. Sextro, in: Proceedings of the Asia Pacific Conference of the PHM Society 2023 , 2023.","mla":"Aimiyekagbon, Osarenren Kennedy, et al. “Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System.” <i>Proceedings of the Asia Pacific Conference of the PHM Society 2023 </i>, vol. 4, no. 1, 2023, doi:<a href=\"https://doi.org/10.36001/phmap.2023.v4i1.3596\">10.36001/phmap.2023.v4i1.3596</a>.","bibtex":"@inproceedings{Aimiyekagbon_Löwen_Bender_Muth_Sextro_2023, title={Expert-Informed Hierarchical Diagnostics of Multiple Fault Modes of a Spacecraft Propulsion System}, volume={4}, DOI={<a href=\"https://doi.org/10.36001/phmap.2023.v4i1.3596\">10.36001/phmap.2023.v4i1.3596</a>}, number={1}, booktitle={Proceedings of the Asia Pacific Conference of the PHM Society 2023 }, author={Aimiyekagbon, Osarenren Kennedy and Löwen, Alexander and Bender, Amelie and Muth, Lars and Sextro, Walter}, year={2023} }"},"department":[{"_id":"151"}]},{"author":[{"first_name":"Jörn","full_name":"Steigerwald, Jörn","last_name":"Steigerwald","id":"37947"}],"title":" Pantalones Pariser Metamorphosen: Louis Riccobonis Observations sur la comédie et sur le génie de Molière","intvolume":"        27","user_id":"80845","citation":{"mla":"Steigerwald, Jörn. “ Pantalones Pariser Metamorphosen: Louis Riccobonis Observations Sur La Comédie et Sur Le Génie de Molière.” <i>Zeitsprünge – Forschungen Zur Frühen Neuzeit</i>, vol. 27, no. 3–4, 2023, pp. 310–32.","bibtex":"@article{Steigerwald_2023, title={ Pantalones Pariser Metamorphosen: Louis Riccobonis Observations sur la comédie et sur le génie de Molière}, volume={27}, number={3–4}, journal={Zeitsprünge – Forschungen zur Frühen Neuzeit}, author={Steigerwald, Jörn}, year={2023}, pages={310–332} }","short":"J. Steigerwald, Zeitsprünge – Forschungen Zur Frühen Neuzeit 27 (2023) 310–332.","apa":"Steigerwald, J. (2023).  Pantalones Pariser Metamorphosen: Louis Riccobonis Observations sur la comédie et sur le génie de Molière. <i>Zeitsprünge – Forschungen Zur Frühen Neuzeit</i>, <i>27</i>(3–4), 310–332.","ama":"Steigerwald J.  Pantalones Pariser Metamorphosen: Louis Riccobonis Observations sur la comédie et sur le génie de Molière. <i>Zeitsprünge – Forschungen zur Frühen Neuzeit</i>. 2023;27(3-4):310-332.","chicago":"Steigerwald, Jörn. “ Pantalones Pariser Metamorphosen: Louis Riccobonis Observations Sur La Comédie et Sur Le Génie de Molière.” <i>Zeitsprünge – Forschungen Zur Frühen Neuzeit</i> 27, no. 3–4 (2023): 310–32.","ieee":"J. Steigerwald, “ Pantalones Pariser Metamorphosen: Louis Riccobonis Observations sur la comédie et sur le génie de Molière,” <i>Zeitsprünge – Forschungen zur Frühen Neuzeit</i>, vol. 27, no. 3–4, pp. 310–332, 2023."},"publication":"Zeitsprünge – Forschungen zur Frühen Neuzeit","date_created":"2024-08-19T07:41:58Z","status":"public","type":"journal_article","year":"2023","language":[{"iso":"eng"}],"volume":27,"page":"310-332","_id":"55630","date_updated":"2024-08-19T07:42:24Z","issue":"3-4"},{"_id":"53358","date_updated":"2024-08-21T07:07:24Z","publisher":"IEEE","date_created":"2024-04-08T09:35:02Z","publication":"2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)","status":"public","language":[{"iso":"eng"}],"type":"conference","year":"2023","publication_status":"published","user_id":"97123","citation":{"bibtex":"@inproceedings{Terhörst_Ihlefeld_Huber_Damer_Kirchbuchner_Raja_Kuijper_2023, title={QMagFace: Simple and Accurate Quality-Aware Face Recognition}, DOI={<a href=\"https://doi.org/10.1109/wacv56688.2023.00348\">10.1109/wacv56688.2023.00348</a>}, booktitle={2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)}, publisher={IEEE}, author={Terhörst, Philipp and Ihlefeld, Malte and Huber, Marco and Damer, Naser and Kirchbuchner, Florian and Raja, Kiran and Kuijper, Arjan}, year={2023} }","mla":"Terhörst, Philipp, et al. “QMagFace: Simple and Accurate Quality-Aware Face Recognition.” <i>2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/wacv56688.2023.00348\">10.1109/wacv56688.2023.00348</a>.","short":"P. Terhörst, M. Ihlefeld, M. Huber, N. Damer, F. Kirchbuchner, K. Raja, A. Kuijper, in: 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), IEEE, 2023.","apa":"Terhörst, P., Ihlefeld, M., Huber, M., Damer, N., Kirchbuchner, F., Raja, K., &#38; Kuijper, A. (2023). QMagFace: Simple and Accurate Quality-Aware Face Recognition. <i>2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>. <a href=\"https://doi.org/10.1109/wacv56688.2023.00348\">https://doi.org/10.1109/wacv56688.2023.00348</a>","ama":"Terhörst P, Ihlefeld M, Huber M, et al. QMagFace: Simple and Accurate Quality-Aware Face Recognition. In: <i>2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/wacv56688.2023.00348\">10.1109/wacv56688.2023.00348</a>","ieee":"P. Terhörst <i>et al.</i>, “QMagFace: Simple and Accurate Quality-Aware Face Recognition,” 2023, doi: <a href=\"https://doi.org/10.1109/wacv56688.2023.00348\">10.1109/wacv56688.2023.00348</a>.","chicago":"Terhörst, Philipp, Malte Ihlefeld, Marco Huber, Naser Damer, Florian Kirchbuchner, Kiran Raja, and Arjan Kuijper. “QMagFace: Simple and Accurate Quality-Aware Face Recognition.” In <i>2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/wacv56688.2023.00348\">https://doi.org/10.1109/wacv56688.2023.00348</a>."},"author":[{"first_name":"Philipp","full_name":"Terhörst, Philipp","id":"97123","last_name":"Terhörst"},{"last_name":"Ihlefeld","full_name":"Ihlefeld, Malte","first_name":"Malte"},{"full_name":"Huber, Marco","first_name":"Marco","last_name":"Huber"},{"last_name":"Damer","full_name":"Damer, Naser","first_name":"Naser"},{"last_name":"Kirchbuchner","full_name":"Kirchbuchner, Florian","first_name":"Florian"},{"first_name":"Kiran","full_name":"Raja, Kiran","last_name":"Raja"},{"last_name":"Kuijper","full_name":"Kuijper, Arjan","first_name":"Arjan"}],"title":"QMagFace: Simple and Accurate Quality-Aware Face Recognition","doi":"10.1109/wacv56688.2023.00348"},{"date_created":"2024-04-08T09:34:22Z","publication":"2023 IEEE International Joint Conference on Biometrics (IJCB)","publisher":"IEEE","language":[{"iso":"eng"}],"type":"conference","year":"2023","status":"public","_id":"53357","date_updated":"2024-08-21T07:07:31Z","title":"Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment","author":[{"last_name":"Biagi","first_name":"Clara","full_name":"Biagi, Clara"},{"last_name":"Rethfeld","first_name":"Louis","full_name":"Rethfeld, Louis"},{"first_name":"Arjan","full_name":"Kuijper, Arjan","last_name":"Kuijper"},{"first_name":"Philipp","full_name":"Terhörst, Philipp","id":"97123","last_name":"Terhörst"}],"doi":"10.1109/ijcb57857.2023.10448905","citation":{"bibtex":"@inproceedings{Biagi_Rethfeld_Kuijper_Terhörst_2023, title={Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment}, DOI={<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>}, booktitle={2023 IEEE International Joint Conference on Biometrics (IJCB)}, publisher={IEEE}, author={Biagi, Clara and Rethfeld, Louis and Kuijper, Arjan and Terhörst, Philipp}, year={2023} }","mla":"Biagi, Clara, et al. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>.","short":"C. Biagi, L. Rethfeld, A. Kuijper, P. Terhörst, in: 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2023.","apa":"Biagi, C., Rethfeld, L., Kuijper, A., &#38; Terhörst, P. (2023). Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">https://doi.org/10.1109/ijcb57857.2023.10448905</a>","ama":"Biagi C, Rethfeld L, Kuijper A, Terhörst P. Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. In: <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>","ieee":"C. Biagi, L. Rethfeld, A. Kuijper, and P. Terhörst, “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment,” 2023, doi: <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>.","chicago":"Biagi, Clara, Louis Rethfeld, Arjan Kuijper, and Philipp Terhörst. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” In <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">https://doi.org/10.1109/ijcb57857.2023.10448905</a>."},"publication_status":"published","user_id":"97123"},{"volume":206,"article_number":"104900","ddc":["370"],"publication":"Computers & Education","type":"journal_article","user_id":"429","keyword":["Education","General Computer Science"],"file":[{"file_id":"55665","content_type":"application/pdf","access_level":"closed","date_created":"2024-08-21T08:56:23Z","creator":"riejon","file_name":"1-s2.0-S036013152300177X-main.pdf","file_size":4364880,"success":1,"date_updated":"2024-08-21T08:56:23Z","relation":"main_file"}],"title":"Predicting the development of digital media PCK/TPACK: The role of PCK, motivation to use digital media, interest in and previous experience with digital media","doi":"10.1016/j.compedu.2023.104900","has_accepted_license":"1","_id":"47085","file_date_updated":"2024-08-21T08:56:23Z","date_updated":"2024-08-21T08:57:00Z","publisher":"Elsevier BV","date_created":"2023-09-15T12:57:53Z","status":"public","year":"2023","publication_identifier":{"issn":["0360-1315"]},"language":[{"iso":"eng"}],"publication_status":"published","citation":{"short":"T. Schubatzky, J.-P. Burde, R.I. Große-Heilmann, C. Haagen-Schützenhöfer, J. Riese, D. Weiler, Computers &#38; Education 206 (2023).","bibtex":"@article{Schubatzky_Burde_Große-Heilmann_Haagen-Schützenhöfer_Riese_Weiler_2023, title={Predicting the development of digital media PCK/TPACK: The role of PCK, motivation to use digital media, interest in and previous experience with digital media}, volume={206}, DOI={<a href=\"https://doi.org/10.1016/j.compedu.2023.104900\">10.1016/j.compedu.2023.104900</a>}, number={104900}, journal={Computers &#38; Education}, publisher={Elsevier BV}, author={Schubatzky, Thomas and Burde, Jan-Philipp and Große-Heilmann, Rike Isabel and Haagen-Schützenhöfer, Claudia and Riese, Josef and Weiler, David}, year={2023} }","mla":"Schubatzky, Thomas, et al. “Predicting the Development of Digital Media PCK/TPACK: The Role of PCK, Motivation to Use Digital Media, Interest in and Previous Experience with Digital Media.” <i>Computers &#38; Education</i>, vol. 206, 104900, Elsevier BV, 2023, doi:<a href=\"https://doi.org/10.1016/j.compedu.2023.104900\">10.1016/j.compedu.2023.104900</a>.","ieee":"T. Schubatzky, J.-P. Burde, R. I. Große-Heilmann, C. Haagen-Schützenhöfer, J. Riese, and D. Weiler, “Predicting the development of digital media PCK/TPACK: The role of PCK, motivation to use digital media, interest in and previous experience with digital media,” <i>Computers &#38; Education</i>, vol. 206, Art. no. 104900, 2023, doi: <a href=\"https://doi.org/10.1016/j.compedu.2023.104900\">10.1016/j.compedu.2023.104900</a>.","chicago":"Schubatzky, Thomas, Jan-Philipp Burde, Rike Isabel Große-Heilmann, Claudia Haagen-Schützenhöfer, Josef Riese, and David Weiler. “Predicting the Development of Digital Media PCK/TPACK: The Role of PCK, Motivation to Use Digital Media, Interest in and Previous Experience with Digital Media.” <i>Computers &#38; Education</i> 206 (2023). <a href=\"https://doi.org/10.1016/j.compedu.2023.104900\">https://doi.org/10.1016/j.compedu.2023.104900</a>.","ama":"Schubatzky T, Burde J-P, Große-Heilmann RI, Haagen-Schützenhöfer C, Riese J, Weiler D. Predicting the development of digital media PCK/TPACK: The role of PCK, motivation to use digital media, interest in and previous experience with digital media. <i>Computers &#38; Education</i>. 2023;206. doi:<a href=\"https://doi.org/10.1016/j.compedu.2023.104900\">10.1016/j.compedu.2023.104900</a>","apa":"Schubatzky, T., Burde, J.-P., Große-Heilmann, R. I., Haagen-Schützenhöfer, C., Riese, J., &#38; Weiler, D. (2023). Predicting the development of digital media PCK/TPACK: The role of PCK, motivation to use digital media, interest in and previous experience with digital media. <i>Computers &#38; Education</i>, <i>206</i>, Article 104900. <a href=\"https://doi.org/10.1016/j.compedu.2023.104900\">https://doi.org/10.1016/j.compedu.2023.104900</a>"},"department":[{"_id":"299"}],"author":[{"first_name":"Thomas","full_name":"Schubatzky, Thomas","last_name":"Schubatzky"},{"last_name":"Burde","first_name":"Jan-Philipp","full_name":"Burde, Jan-Philipp"},{"last_name":"Große-Heilmann","id":"99511","full_name":"Große-Heilmann, Rike Isabel","first_name":"Rike Isabel","orcid":"0000-0001-8713-3014"},{"last_name":"Haagen-Schützenhöfer","full_name":"Haagen-Schützenhöfer, Claudia","first_name":"Claudia"},{"full_name":"Riese, Josef","first_name":"Josef","id":"429","last_name":"Riese","orcid":"0000-0003-2927-2619"},{"full_name":"Weiler, David","first_name":"David","last_name":"Weiler"}],"intvolume":"       206"},{"_id":"53356","date_updated":"2024-08-21T07:07:35Z","date_created":"2024-04-08T09:33:24Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","year":"2023","publication_identifier":{"issn":["2637-6407"]},"language":[{"iso":"eng"}],"status":"public","citation":{"short":"P. Terhörst, M. Huber, N. Damer, F. Kirchbuchner, K. Raja, A. Kuijper, IEEE Transactions on Biometrics, Behavior, and Identity Science 5 (2023) 288–297.","mla":"Terhörst, Philipp, et al. “Pixel-Level Face Image Quality Assessment for Explainable Face Recognition.” <i>IEEE Transactions on Biometrics, Behavior, and Identity Science</i>, vol. 5, no. 2, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 288–97, doi:<a href=\"https://doi.org/10.1109/tbiom.2023.3263186\">10.1109/tbiom.2023.3263186</a>.","bibtex":"@article{Terhörst_Huber_Damer_Kirchbuchner_Raja_Kuijper_2023, title={Pixel-Level Face Image Quality Assessment for Explainable Face Recognition}, volume={5}, DOI={<a href=\"https://doi.org/10.1109/tbiom.2023.3263186\">10.1109/tbiom.2023.3263186</a>}, number={2}, journal={IEEE Transactions on Biometrics, Behavior, and Identity Science}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Terhörst, Philipp and Huber, Marco and Damer, Naser and Kirchbuchner, Florian and Raja, Kiran and Kuijper, Arjan}, year={2023}, pages={288–297} }","chicago":"Terhörst, Philipp, Marco Huber, Naser Damer, Florian Kirchbuchner, Kiran Raja, and Arjan Kuijper. “Pixel-Level Face Image Quality Assessment for Explainable Face Recognition.” <i>IEEE Transactions on Biometrics, Behavior, and Identity Science</i> 5, no. 2 (2023): 288–97. <a href=\"https://doi.org/10.1109/tbiom.2023.3263186\">https://doi.org/10.1109/tbiom.2023.3263186</a>.","ieee":"P. Terhörst, M. Huber, N. Damer, F. Kirchbuchner, K. Raja, and A. Kuijper, “Pixel-Level Face Image Quality Assessment for Explainable Face Recognition,” <i>IEEE Transactions on Biometrics, Behavior, and Identity Science</i>, vol. 5, no. 2, pp. 288–297, 2023, doi: <a href=\"https://doi.org/10.1109/tbiom.2023.3263186\">10.1109/tbiom.2023.3263186</a>.","apa":"Terhörst, P., Huber, M., Damer, N., Kirchbuchner, F., Raja, K., &#38; Kuijper, A. (2023). Pixel-Level Face Image Quality Assessment for Explainable Face Recognition. <i>IEEE Transactions on Biometrics, Behavior, and Identity Science</i>, <i>5</i>(2), 288–297. <a href=\"https://doi.org/10.1109/tbiom.2023.3263186\">https://doi.org/10.1109/tbiom.2023.3263186</a>","ama":"Terhörst P, Huber M, Damer N, Kirchbuchner F, Raja K, Kuijper A. Pixel-Level Face Image Quality Assessment for Explainable Face Recognition. <i>IEEE Transactions on Biometrics, Behavior, and Identity Science</i>. 2023;5(2):288-297. doi:<a href=\"https://doi.org/10.1109/tbiom.2023.3263186\">10.1109/tbiom.2023.3263186</a>"},"publication_status":"published","author":[{"first_name":"Philipp","full_name":"Terhörst, Philipp","id":"97123","last_name":"Terhörst"},{"last_name":"Huber","first_name":"Marco","full_name":"Huber, Marco"},{"full_name":"Damer, Naser","first_name":"Naser","last_name":"Damer"},{"last_name":"Kirchbuchner","first_name":"Florian","full_name":"Kirchbuchner, Florian"},{"last_name":"Raja","full_name":"Raja, Kiran","first_name":"Kiran"},{"last_name":"Kuijper","full_name":"Kuijper, Arjan","first_name":"Arjan"}],"intvolume":"         5","page":"288-297","volume":5,"issue":"2","publication":"IEEE Transactions on Biometrics, Behavior, and Identity Science","type":"journal_article","user_id":"97123","keyword":["Artificial Intelligence","Computer Science Applications","Computer Vision and Pattern Recognition","Instrumentation"],"title":"Pixel-Level Face Image Quality Assessment for Explainable Face Recognition","doi":"10.1109/tbiom.2023.3263186"},{"citation":{"apa":"Neto, P. C., Sequeira, A. F., Cardoso, J. S., &#38; Terhörst, P. (2023). PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition. <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>. <a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">https://doi.org/10.1109/cvprw59228.2023.00109</a>","ama":"Neto PC, Sequeira AF, Cardoso JS, Terhörst P. PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition. In: <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">10.1109/cvprw59228.2023.00109</a>","chicago":"Neto, Pedro C., Ana F. Sequeira, Jaime S. Cardoso, and Philipp Terhörst. “PIC-Score: Probabilistic Interpretable Comparison Score for Optimal Matching Confidence in Single- and Multi-Biometric Face Recognition.” In <i>2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/cvprw59228.2023.00109\">https://doi.org/10.1109/cvprw59228.2023.00109</a>.","ieee":"P. C. Neto, A. F. Sequeira, J. S. Cardoso, and P. 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