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Krupp, L. Oravec, &#38; S. Schmid (Eds.), <i>44. Jahresband des Arbeitskreises Musikpädagogische Forschung / 44th Yearbook of the German Association for Research in Music Education</i> (Vol. 44, pp. 305–322). Waxmann Verlag GmbH. <a href=\"https://doi.org/10.31244/9783830997641.18\">https://doi.org/10.31244/9783830997641.18</a>"}},{"doi":"10.1515/cppm-2023-0054","title":"A new approach to model the fluid dynamics in sandwich packings","date_created":"2023-10-31T18:43:20Z","author":[{"last_name":"Franke","full_name":"Franke, Patrick","id":"93922","first_name":"Patrick"},{"first_name":"Iman","last_name":"Shabanilemraski","full_name":"Shabanilemraski, Iman"},{"full_name":"Schubert, Markus","last_name":"Schubert","first_name":"Markus"},{"first_name":"Uwe","full_name":"Hampel, Uwe","last_name":"Hampel"},{"first_name":"Eugeny Y.","last_name":"Kenig","id":"665","full_name":"Kenig, Eugeny Y."}],"volume":"0","publisher":"Walter de Gruyter GmbH","date_updated":"2025-02-07T11:29:15Z","citation":{"apa":"Franke, P., Shabanilemraski, I., Schubert, M., Hampel, U., &#38; Kenig, E. Y. (2023). A new approach to model the fluid dynamics in sandwich packings. <i>Chemical Product and Process Modeling</i>, <i>0</i>(0). <a href=\"https://doi.org/10.1515/cppm-2023-0054\">https://doi.org/10.1515/cppm-2023-0054</a>","mla":"Franke, Patrick, et al. “A New Approach to Model the Fluid Dynamics in Sandwich Packings.” <i>Chemical Product and Process Modeling</i>, vol. 0, no. 0, Walter de Gruyter GmbH, 2023, doi:<a href=\"https://doi.org/10.1515/cppm-2023-0054\">10.1515/cppm-2023-0054</a>.","short":"P. Franke, I. Shabanilemraski, M. Schubert, U. Hampel, E.Y. Kenig, Chemical Product and Process Modeling 0 (2023).","bibtex":"@article{Franke_Shabanilemraski_Schubert_Hampel_Kenig_2023, title={A new approach to model the fluid dynamics in sandwich packings}, volume={0}, DOI={<a href=\"https://doi.org/10.1515/cppm-2023-0054\">10.1515/cppm-2023-0054</a>}, number={0}, journal={Chemical Product and Process Modeling}, publisher={Walter de Gruyter GmbH}, author={Franke, Patrick and Shabanilemraski, Iman and Schubert, Markus and Hampel, Uwe and Kenig, Eugeny Y.}, year={2023} }","chicago":"Franke, Patrick, Iman Shabanilemraski, Markus Schubert, Uwe Hampel, and Eugeny Y. Kenig. “A New Approach to Model the Fluid Dynamics in Sandwich Packings.” <i>Chemical Product and Process Modeling</i> 0, no. 0 (2023). <a href=\"https://doi.org/10.1515/cppm-2023-0054\">https://doi.org/10.1515/cppm-2023-0054</a>.","ieee":"P. Franke, I. Shabanilemraski, M. Schubert, U. Hampel, and E. Y. Kenig, “A new approach to model the fluid dynamics in sandwich packings,” <i>Chemical Product and Process Modeling</i>, vol. 0, no. 0, 2023, doi: <a href=\"https://doi.org/10.1515/cppm-2023-0054\">10.1515/cppm-2023-0054</a>.","ama":"Franke P, Shabanilemraski I, Schubert M, Hampel U, Kenig EY. A new approach to model the fluid dynamics in sandwich packings. <i>Chemical Product and Process Modeling</i>. 2023;0(0). doi:<a href=\"https://doi.org/10.1515/cppm-2023-0054\">10.1515/cppm-2023-0054</a>"},"year":"2023","issue":"0","publication_status":"published","publication_identifier":{"issn":["1934-2659"]},"quality_controlled":"1","language":[{"iso":"eng"}],"keyword":["Modeling and Simulation","General Chemical Engineering"],"user_id":"93922","_id":"48580","status":"public","abstract":[{"lang":"eng","text":"<jats:title>Abstract</jats:title>\r\n               <jats:p>Sandwich packings represent new separation column internals, with a potential to intensify mass transfer. They comprise two conventional structured packings with different specific geometrical surface areas. In this work, the complex fluid dynamics in sandwich packings is modeled using a novel approach based on a one-dimensional, steady momentum balance of the liquid and gas phases. The interactions between the three present phases (gas, liquid, and solid) are considered by closures incorporated into the momentum balance. The formulation of these closures is derived from two fluid-dynamic analogies for the film and froth flow patterns. The adjustable parameters in the closures are regressed for the film flow using dry pressure drop measurements and liquid hold-up data in trickle flow conditions. For the froth flow, the tuning parameters are fitted to overall pressure drop measurements and local liquid hold-up data acquired from ultra-fast X-ray tomography (UFXCT). The model predicts liquid hold-up and pressure drop data with an average relative deviation of 16.4 % and 19 %, respectively. Compared to previous fluid dynamic models for sandwich packings, the number of adjustable parameters could be reduced while maintaining comparable accuracy.</jats:p>"}],"type":"journal_article","publication":"Chemical Product and Process Modeling"},{"citation":{"apa":"Kruse, S., &#38; Scheytt, J. C. (2023). <i>Elektrooptischer Mischer</i>.","bibtex":"@article{Kruse_Scheytt_2023, title={Elektrooptischer Mischer}, author={Kruse, Stephan and Scheytt, J. Christoph}, year={2023} }","mla":"Kruse, Stephan, and J. Christoph Scheytt. <i>Elektrooptischer Mischer</i>. 2023.","short":"S. Kruse, J.C. Scheytt, (2023).","chicago":"Kruse, Stephan, and J. Christoph Scheytt. “Elektrooptischer Mischer,” 2023.","ieee":"S. Kruse and J. C. Scheytt, “Elektrooptischer Mischer.” 2023.","ama":"Kruse S, Scheytt JC. Elektrooptischer Mischer. Published online 2023."},"year":"2023","ipn":"DE102022201070A1","title":"Elektrooptischer Mischer","date_created":"2023-11-06T10:29:41Z","author":[{"first_name":"Stephan","last_name":"Kruse","id":"38254","full_name":"Kruse, Stephan"},{"full_name":"Scheytt, J. Christoph","id":"37144","orcid":"0000-0002-5950-6618 ","last_name":"Scheytt","first_name":"J. Christoph"}],"ipc":"H03F 3/08 (2006.01),  H03F 3/45 (2006.01), H03F 1/34 (2006.01), H04B 10/00 (2013.01)","date_updated":"2025-02-10T13:15:50Z","status":"public","abstract":[{"lang":"ger","text":"Die Erfindung betrifft einen elektrooptischen Mischer (1) mit elektrischem Ausgang, aufweisend:\r\n• eine Photodiode (PD),\r\n• einen ersten Anschluss,\r\n• einen zweiten Anschluss,\r\n• wobei die Anschlüsse eine erste Spannungsversorgung (V1) und eine zweite Spannungsversorgung (V2) oder eine erste Stromversorgung (I1) und eine zweite Stromversorgung (I2) anschließbar ist,\r\n• einen Anschluss für ein Kleinsignal-Massepotential,\r\n• ein erstes Teilanpassungsnetzwerk (Z2, Z4), welches auf der Anodenseite der Photodiode (PD) angeordnet ist, wobei ein Teil des ersten Teilanpassungsnetzwerkes (Z2) mit dem Anschluss für die zweite Spannungsversorgung (V2) schaltbar (S2) verbindbar ist, und wobei ein anderer Teil des ersten Teilanpassungsnetzwerkes (Z4) mit dem Anschluss für das Kleinsignal-Massepotential schaltbar (S2') verbindbar ist,\r\n• ein zweites Teilanpassungsnetzwerk (Z1, Z3), welches auf der Kathodenseite der Photodiode (PD) angeordnet ist, wobei ein Teil des zweiten Teilanpassungsnetzwerkes (Z1) mit dem Anschluss für die erste Spannungsversorgung (V1) schaltbar (S1) verbindbar ist, und wobei ein anderer Teil des zweiten Teilanpassungsnetzwerkes (Z3) mit dem Anschluss für das Kleinsignal-Massepotential schaltbar (S1') verbindbar ist,\r\n• ein erstes entkoppelndes Element (C1) angeordnet auf der Kathodenseite und ein zweites entkoppelndes Element (C2) angeordnet auf der Anodenseite der Photodiode (PD),\r\n• wobei zwischen den von der Photodiode (PD) abgewandten Seiten des ersten entkoppelnden Elementes (C1) und des zweiten entkoppelnden Elementes (C2) im Betrieb einelektrisches Ausgangssignal bereitgestellt werden kann."}],"type":"patent","department":[{"_id":"58"}],"user_id":"37144","_id":"48626","publication_date":"03.08.2023"},{"_id":"47521","user_id":"76626","department":[{"_id":"58"},{"_id":"230"}],"language":[{"iso":"eng"}],"type":"conference","publication":"2023 PhotonIcs & Electromagnetics Research Symposium (PIERS), ","abstract":[{"text":"This paper experimentally investigates and interprets the e®ects of noise and non-\r\nlinearity in a silicon photonic optical test structure. For the analysis di®erent optoelectronic phase\r\nnoise measurement techniques are used. Our tests focuses on the performance of integrated opti-\r\ncal test structures using femtosecond pulses in the 1550nm spectral range. A primary objective\r\nis to understand the behaviour of silicon photonic waveguides that can be further employed in the\r\nimplementation of an optoelectronic phase-locked loop (OEPLL) in silicon photonics technology.\r\nA comparison of our results, as well as a discussion on the di®erent optoelectronic phase noise\r\nmeasurement techniques are presented. Our ¯ndings provide insights that can be leveraged to\r\noptimize the design and performance of ultra-low phase noise on-chip OEPLL systems locking\r\nto mode-locked laser (MLL) signals. In the future such systems can be essential for advanced\r\ncommunication and sensing applications.","lang":"eng"}],"status":"public","publisher":"IEEE","date_updated":"2025-02-11T10:58:57Z","date_created":"2023-09-27T11:08:23Z","author":[{"first_name":"Vijayalakshmi","id":"76626","full_name":"Surendranath Shroff, Vijayalakshmi","last_name":"Surendranath Shroff"},{"full_name":"Kress, Christian","id":"13256","last_name":"Kress","first_name":"Christian"},{"first_name":"Meysam","last_name":"Bahmanian","full_name":"Bahmanian, Meysam","id":"69233"},{"id":"37144","full_name":"Scheytt, J. Christoph","last_name":"Scheytt","orcid":"0000-0002-5950-6618 ","first_name":"J. Christoph"}],"title":"Analysis of Phase Noise in Waveguide-integrated Optical Test Structures in Silicon Photonics","conference":{"start_date":"2023-07-03","name":"2023 PhotonIcs & Electromagnetics Research Symposium (PIERS)","location":"Prague, Czech Republic","end_date":"2023-07-06"},"doi":"10.1109/PIERS59004.2023.10221473","publication_status":"published","publication_identifier":{"eisbn":["979-8-3503-1284-3"]},"year":"2023","citation":{"bibtex":"@inproceedings{Surendranath Shroff_Kress_Bahmanian_Scheytt_2023, title={Analysis of Phase Noise in Waveguide-integrated Optical Test Structures in Silicon Photonics}, DOI={<a href=\"https://doi.org/10.1109/PIERS59004.2023.10221473\">10.1109/PIERS59004.2023.10221473</a>}, booktitle={2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), }, publisher={IEEE}, author={Surendranath Shroff, Vijayalakshmi and Kress, Christian and Bahmanian, Meysam and Scheytt, J. Christoph}, year={2023} }","short":"V. Surendranath Shroff, C. Kress, M. Bahmanian, J.C. Scheytt, in: 2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), , IEEE, 2023.","mla":"Surendranath Shroff, Vijayalakshmi, et al. “Analysis of Phase Noise in Waveguide-Integrated Optical Test Structures in Silicon Photonics.” <i>2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), </i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/PIERS59004.2023.10221473\">10.1109/PIERS59004.2023.10221473</a>.","apa":"Surendranath Shroff, V., Kress, C., Bahmanian, M., &#38; Scheytt, J. C. (2023). Analysis of Phase Noise in Waveguide-integrated Optical Test Structures in Silicon Photonics. <i>2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), </i>. 2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), Prague, Czech Republic. <a href=\"https://doi.org/10.1109/PIERS59004.2023.10221473\">https://doi.org/10.1109/PIERS59004.2023.10221473</a>","chicago":"Surendranath Shroff, Vijayalakshmi, Christian Kress, Meysam Bahmanian, and J. Christoph Scheytt. “Analysis of Phase Noise in Waveguide-Integrated Optical Test Structures in Silicon Photonics.” In <i>2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), </i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/PIERS59004.2023.10221473\">https://doi.org/10.1109/PIERS59004.2023.10221473</a>.","ieee":"V. Surendranath Shroff, C. Kress, M. Bahmanian, and J. C. Scheytt, “Analysis of Phase Noise in Waveguide-integrated Optical Test Structures in Silicon Photonics,” presented at the 2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), Prague, Czech Republic, 2023, doi: <a href=\"https://doi.org/10.1109/PIERS59004.2023.10221473\">10.1109/PIERS59004.2023.10221473</a>.","ama":"Surendranath Shroff V, Kress C, Bahmanian M, Scheytt JC. Analysis of Phase Noise in Waveguide-integrated Optical Test Structures in Silicon Photonics. In: <i>2023 PhotonIcs &#38; Electromagnetics Research Symposium (PIERS), </i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/PIERS59004.2023.10221473\">10.1109/PIERS59004.2023.10221473</a>"}},{"date_updated":"2025-02-11T10:48:27Z","date_created":"2023-11-10T09:10:30Z","author":[{"full_name":"Wehde, Janis","id":"82257","last_name":"Wehde","orcid":"https://orcid.org/0009-0008-0720-7828","first_name":"Janis"},{"last_name":"Bloh","id":"69910","full_name":"Bloh, Bea","first_name":"Bea"}],"title":"Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren","conference":{"end_date":"2023-09-15","location":"Potsdam","name":"Jahrestagung der Arbeitsgruppe Empirische Pädagogische Forschung (AEPF)","start_date":"2023-09-13"},"quality_controlled":"1","publication_status":"published","year":"2023","citation":{"apa":"Wehde, J., &#38; Bloh, B. (2023). <i>Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren</i>. Jahrestagung der Arbeitsgruppe Empirische Pädagogische Forschung (AEPF), Potsdam.","mla":"Wehde, Janis, and Bea Bloh. <i>Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren</i>. 2023.","short":"J. Wehde, B. Bloh, in: 2023.","bibtex":"@inproceedings{Wehde_Bloh_2023, title={Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren}, author={Wehde, Janis and Bloh, Bea}, year={2023} }","ieee":"J. Wehde and B. Bloh, “Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren,” presented at the Jahrestagung der Arbeitsgruppe Empirische Pädagogische Forschung (AEPF), Potsdam, 2023.","chicago":"Wehde, Janis, and Bea Bloh. “Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren,” 2023.","ama":"Wehde J, Bloh B. Methoden zur Förderung von Kompetenzen für eine demokratische Kultur - Schriftliche Reflexionen von Lehramtsstudierenden aus bildungswissenschaftlichen Seminaren. In: ; 2023."},"_id":"48760","department":[{"_id":"450"},{"_id":"456"}],"user_id":"69910","language":[{"iso":"ger"}],"type":"conference","status":"public"},{"citation":{"short":"M. Homt, B. Bloh, Lehrerbildung Auf Dem Prüfstand 16 (2023) 114–131.","bibtex":"@article{Homt_Bloh_2023, title={Der formelle Diskurs Forschenden Lernens in der Lehrerbildung. Ein Blick zurück nach vorn}, volume={16}, number={1}, journal={Lehrerbildung auf dem Prüfstand}, author={Homt, Martina and Bloh, Bea}, year={2023}, pages={114–131} }","mla":"Homt, Martina, and Bea Bloh. “Der Formelle Diskurs Forschenden Lernens in Der Lehrerbildung. Ein Blick Zurück Nach Vorn.” <i>Lehrerbildung Auf Dem Prüfstand</i>, vol. 16, no. 1, 2023, pp. 114–31.","apa":"Homt, M., &#38; Bloh, B. (2023). Der formelle Diskurs Forschenden Lernens in der Lehrerbildung. Ein Blick zurück nach vorn. <i>Lehrerbildung Auf Dem Prüfstand</i>, <i>16</i>(1), 114–131.","ama":"Homt M, Bloh B. Der formelle Diskurs Forschenden Lernens in der Lehrerbildung. Ein Blick zurück nach vorn. <i>Lehrerbildung auf dem Prüfstand</i>. 2023;16(1):114-131.","ieee":"M. Homt and B. Bloh, “Der formelle Diskurs Forschenden Lernens in der Lehrerbildung. Ein Blick zurück nach vorn,” <i>Lehrerbildung auf dem Prüfstand</i>, vol. 16, no. 1, pp. 114–131, 2023.","chicago":"Homt, Martina, and Bea Bloh. “Der Formelle Diskurs Forschenden Lernens in Der Lehrerbildung. Ein Blick Zurück Nach Vorn.” <i>Lehrerbildung Auf Dem Prüfstand</i> 16, no. 1 (2023): 114–31."},"intvolume":"        16","page":"114-131","year":"2023","issue":"1","title":"Der formelle Diskurs Forschenden Lernens in der Lehrerbildung. Ein Blick zurück nach vorn","date_created":"2023-08-04T09:44:07Z","author":[{"last_name":"Homt","id":"11674","full_name":"Homt, Martina","first_name":"Martina"},{"last_name":"Bloh","id":"69910","full_name":"Bloh, Bea","first_name":"Bea"}],"volume":16,"date_updated":"2025-02-11T10:46:12Z","status":"public","type":"journal_article","publication":"Lehrerbildung auf dem Prüfstand","language":[{"iso":"eng"}],"user_id":"69910","department":[{"_id":"456"}],"_id":"46354"},{"date_updated":"2025-02-12T09:16:34Z","oa":"1","author":[{"last_name":"von Neumann","orcid":"https://orcid.org/0000-0002-7717-8670","full_name":"von Neumann, Thilo","id":"49870","first_name":"Thilo"},{"last_name":"Boeddeker","full_name":"Boeddeker, Christoph","id":"40767","first_name":"Christoph"},{"first_name":"Keisuke","full_name":"Kinoshita, Keisuke","last_name":"Kinoshita"},{"full_name":"Delcroix, Marc","last_name":"Delcroix","first_name":"Marc"},{"id":"242","full_name":"Haeb-Umbach, Reinhold","last_name":"Haeb-Umbach","first_name":"Reinhold"}],"doi":"10.1109/icassp49357.2023.10094784","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/10094784"}],"has_accepted_license":"1","publication_status":"published","related_material":{"link":[{"url":"https://github.com/fgnt/meeteval","relation":"software"}]},"citation":{"chicago":"Neumann, Thilo von, Christoph Boeddeker, Keisuke Kinoshita, Marc Delcroix, and Reinhold Haeb-Umbach. “On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems.” In <i>ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/icassp49357.2023.10094784\">https://doi.org/10.1109/icassp49357.2023.10094784</a>.","ieee":"T. von Neumann, C. Boeddeker, K. Kinoshita, M. Delcroix, and R. Haeb-Umbach, “On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems,” 2023, doi: <a href=\"https://doi.org/10.1109/icassp49357.2023.10094784\">10.1109/icassp49357.2023.10094784</a>.","ama":"von Neumann T, Boeddeker C, Kinoshita K, Delcroix M, Haeb-Umbach R. On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems. In: <i>ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/icassp49357.2023.10094784\">10.1109/icassp49357.2023.10094784</a>","bibtex":"@inproceedings{von Neumann_Boeddeker_Kinoshita_Delcroix_Haeb-Umbach_2023, title={On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems}, DOI={<a href=\"https://doi.org/10.1109/icassp49357.2023.10094784\">10.1109/icassp49357.2023.10094784</a>}, booktitle={ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)}, publisher={IEEE}, author={von Neumann, Thilo and Boeddeker, Christoph and Kinoshita, Keisuke and Delcroix, Marc and Haeb-Umbach, Reinhold}, year={2023} }","mla":"von Neumann, Thilo, et al. “On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems.” <i>ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/icassp49357.2023.10094784\">10.1109/icassp49357.2023.10094784</a>.","short":"T. von Neumann, C. Boeddeker, K. Kinoshita, M. Delcroix, R. Haeb-Umbach, in: ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), IEEE, 2023.","apa":"von Neumann, T., Boeddeker, C., Kinoshita, K., Delcroix, M., &#38; Haeb-Umbach, R. (2023). On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems. <i>ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)</i>. <a href=\"https://doi.org/10.1109/icassp49357.2023.10094784\">https://doi.org/10.1109/icassp49357.2023.10094784</a>"},"_id":"48281","project":[{"_id":"52","name":"PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing"},{"grant_number":"448568305","_id":"508","name":"Automatische Transkription von Gesprächssituationen"}],"department":[{"_id":"54"}],"user_id":"40767","file_date_updated":"2023-10-19T07:41:56Z","type":"conference","status":"public","publisher":"IEEE","date_created":"2023-10-19T07:38:31Z","title":"On Word Error Rate Definitions and Their Efficient Computation for Multi-Speaker Speech Recognition Systems","quality_controlled":"1","year":"2023","keyword":["Word Error Rate","Meeting Recognition","Levenshtein Distance"],"ddc":["000"],"language":[{"iso":"eng"}],"publication":"ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","abstract":[{"text":"\tWe propose a general framework to compute the word error rate (WER) of ASR systems that process recordings containing multiple speakers at their input and that produce multiple output word sequences (MIMO).\r\n\tSuch ASR systems are typically required, e.g., for meeting transcription.\r\n\tWe provide an efficient implementation based on a dynamic programming search in a multi-dimensional Levenshtein distance tensor under the constraint that a reference utterance must be matched consistently with one hypothesis output. \r\n\tThis also results in an efficient implementation of the ORC WER which previously suffered from exponential complexity.\r\n\tWe give an overview of commonly used WER definitions for multi-speaker scenarios and show that they are specializations of the above MIMO WER tuned to particular application scenarios. \r\n\tWe conclude with a  discussion of the pros and cons of the various WER definitions and a recommendation when to use which.","lang":"eng"}],"file":[{"date_updated":"2023-10-19T07:41:56Z","creator":"tvn","date_created":"2023-10-19T07:39:57Z","file_size":204994,"file_name":"ICASSP_2023_Meeting_Evaluation.pdf","file_id":"48282","access_level":"open_access","content_type":"application/pdf","relation":"main_file"}]},{"quality_controlled":"1","year":"2023","date_created":"2023-10-19T07:24:51Z","title":"MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems","publication":"Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments","file":[{"relation":"main_file","content_type":"application/pdf","file_size":263744,"file_id":"48276","access_level":"open_access","file_name":"Chime_7__MeetEval.pdf","date_updated":"2023-10-19T07:19:59Z","date_created":"2023-10-19T07:19:59Z","creator":"tvn"}],"abstract":[{"text":"MeetEval is an open-source toolkit to evaluate  all kinds of meeting transcription systems.\r\nIt provides a unified interface for the computation of commonly used Word Error Rates (WERs), specifically cpWER, ORC WER and MIMO WER along other WER definitions.\r\nWe extend the cpWER computation by a temporal constraint to ensure that only words are identified as correct when the temporal alignment is plausible.\r\nThis leads to a better quality of the matching of the hypothesis string to the reference string that more closely resembles the actual transcription quality, and a system is penalized if it provides poor time annotations.\r\nSince word-level timing information is often not available, we present a way to approximate exact word-level timings from segment-level timings (e.g., a sentence) and show that the approximation leads to a similar WER as a matching with exact word-level annotations.\r\nAt the same time, the time constraint leads to a speedup of the matching algorithm, which outweighs the additional overhead caused by processing the time stamps.","lang":"eng"}],"language":[{"iso":"eng"}],"keyword":["Speech Recognition","Word Error Rate","Meeting Transcription"],"ddc":["000"],"related_material":{"link":[{"url":"https://github.com/fgnt/meeteval","relation":"software"}]},"has_accepted_license":"1","citation":{"apa":"von Neumann, T., Boeddeker, C., Delcroix, M., &#38; Haeb-Umbach, R. (2023). MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems. <i>Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments</i>. CHiME 2023 Workshop on Speech Processing in Everyday Environments, Dublin.","bibtex":"@inproceedings{von Neumann_Boeddeker_Delcroix_Haeb-Umbach_2023, title={MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems}, booktitle={Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments}, author={von Neumann, Thilo and Boeddeker, Christoph and Delcroix, Marc and Haeb-Umbach, Reinhold}, year={2023} }","mla":"von Neumann, Thilo, et al. “MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems.” <i>Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments</i>, 2023.","short":"T. von Neumann, C. Boeddeker, M. Delcroix, R. Haeb-Umbach, in: Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments, 2023.","chicago":"Neumann, Thilo von, Christoph Boeddeker, Marc Delcroix, and Reinhold Haeb-Umbach. “MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems.” In <i>Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments</i>, 2023.","ieee":"T. von Neumann, C. Boeddeker, M. Delcroix, and R. Haeb-Umbach, “MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems,” presented at the CHiME 2023 Workshop on Speech Processing in Everyday Environments, Dublin, 2023.","ama":"von Neumann T, Boeddeker C, Delcroix M, Haeb-Umbach R. MeetEval: A Toolkit for Computation of Word Error Rates for Meeting Transcription Systems. In: <i>Proc. CHiME 2023 Workshop on Speech Processing in Everyday Environments</i>. ; 2023."},"author":[{"first_name":"Thilo","full_name":"von Neumann, Thilo","id":"49870","orcid":"https://orcid.org/0000-0002-7717-8670","last_name":"von Neumann"},{"first_name":"Christoph","id":"40767","full_name":"Boeddeker, Christoph","last_name":"Boeddeker"},{"first_name":"Marc","full_name":"Delcroix, Marc","last_name":"Delcroix"},{"first_name":"Reinhold","last_name":"Haeb-Umbach","id":"242","full_name":"Haeb-Umbach, Reinhold"}],"oa":"1","date_updated":"2025-02-12T09:12:05Z","conference":{"location":"Dublin","name":"CHiME 2023 Workshop on Speech Processing in Everyday Environments"},"main_file_link":[{"url":"https://arxiv.org/abs/2307.11394","open_access":"1"}],"type":"conference","status":"public","department":[{"_id":"54"}],"user_id":"40767","_id":"48275","project":[{"name":"PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"},{"name":"Automatische Transkription von Gesprächssituationen","_id":"508","grant_number":"448568305"}],"file_date_updated":"2023-10-19T07:19:59Z"}]