---
_id: '46482'
abstract:
- lang: eng
text: "Ever increasing demands on the performance of microchips are leading to ever
more complex semiconductor technologies with ever shrinking feature sizes. Complex
applications with high demands on safety and reliability, such as autonomous driving,
are simultaneously driving the requirements for test and diagnosis of VLSI circuits.
Throughout the life cycle of a microchip, uncertainties occur that affect its
timing behavior. For example, weak circuit structures, aging effects, or process
variations can lead to a change in the timing behavior of the circuit. While these
uncertainties do not necessarily lead to a change of the functional behavior,
they can lead to a reliability problem.\r\nWith modular and hybrid compaction
two test instruments are presented in this work that can be used for X-tolerant
test response compaction in the built-in Faster-than-At-Speed Test (FAST) which
is used to detect uncertainties in VLSI circuits. One challenge for test response
compaction during FAST is the high and varying X-rate at the outputs of the circuit
under test. By dividing the circuit outputs into test groups and separately compacting
these test groups using stochastic compactors, the modular compaction is able
to handle these high and varying X-rates.\r\nTo deal with uncertainties on logic
interconnects, a method for distinguishing crosstalk and process variation is
presented. In current semiconductor technologies, the number of parasitic coupling
capacitances between logic interconnects is growing. These coupling capacitances
can lead to crosstalk, which causes increased current flow in the logic interconnects,
which in turn can lead to increased electromigration. In the presented method,
delay maps describing the timing behavior of the circuit outputs at different
operating points are used to train artificial neural networks which classify the
tested circuits into fault-free and faulty."
- lang: ger
text: "Immer größere Anforderungen an die Leistungsfähigkeit von Mikrochips führen
zu Halbleitertechnologien mit immer kleiner werdenden Strukturgrößen. Anwendungen
mit hohen Ansprüchen an Sicherheit und Zuverlässigkeit, wie z.B. das autonome
Fahren, treiben gleichzeitig die Anforderungen an den Test hochintegrierter Schaltungen
an. Während des gesamten Lebenszyklus eines Mikrochips kommt es zu Unsicherheiten
im Zeitverhalten. So können z.B. schwache Schaltungsstrukturen, Alterungseffekte
oder Prozessvariationen zu einer Veränderung des Zeitverhaltens führen. Während
diese Unsicherheiten nicht zu einer Veränderung des funktionalen Verhaltens führen
müssen, können sie jedoch zu einem Zuverlässigkeitsproblem führen.\r\nMit der
modularen und der hybriden Kompaktierung werden in dieser Arbeit zwei Testinstrumente
vorgestellt, die für die X-tolerante Testantwortkompaktierung im eingebauten Hochgeschwindigkeitstest
verwendet werden können. Eine Herausforderung für die Testantwortkompaktierung
während des Hochgeschwindigkeitstests ist die hohe und variierende X-Rate an den
Ausgängen der zu testenden Schaltung. Durch die Einteilung der Schaltungsausgänge
in Prüfgruppen und die separierte Kompaktierung der Prüfgruppen mithilfe von stochastischen
Kompaktierern, können die vorgestellten Verfahren diese hohen und variierenden
X-Raten verarbeiten.\r\nFür den Umgang mit Unsicherheiten auf Verbindungsleitungen
der Logik-Schaltung wird ein Verfahren zur Unterscheidung von Übersprechen und
Prozessvariation vorgestellt. In aktuellen Halbleitertechnologien kommt es vermehrt
zu parasitären Koppelkapazitäten zwischen den Verbindungsleitungen. In dem vorgestellten
Verfahren werden künstliche neuronale Netze trainiert, um die Schaltungen in fehlerfrei
und fehlerhaft zu klassifizieren."
author:
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
orcid: 0000-0002-0775-7677
citation:
ama: Sprenger A. Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten
in Logikblöcken hochintegrierter Schaltungen. Universität Paderborn; 2023.
doi:10.17619/UNIPB/1-1787
apa: Sprenger, A. (2023). Testinstrumente und Testdatenanalyse zur Verarbeitung
von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Universität
Paderborn. https://doi.org/10.17619/UNIPB/1-1787
bibtex: '@book{Sprenger_2023, place={Paderborn}, title={Testinstrumente und Testdatenanalyse
zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen},
DOI={10.17619/UNIPB/1-1787},
publisher={Universität Paderborn}, author={Sprenger, Alexander}, year={2023} }'
chicago: 'Sprenger, Alexander. Testinstrumente und Testdatenanalyse zur Verarbeitung
von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Paderborn:
Universität Paderborn, 2023. https://doi.org/10.17619/UNIPB/1-1787.'
ieee: 'A. Sprenger, Testinstrumente und Testdatenanalyse zur Verarbeitung von
Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Paderborn: Universität
Paderborn, 2023.'
mla: Sprenger, Alexander. Testinstrumente und Testdatenanalyse zur Verarbeitung
von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Universität
Paderborn, 2023, doi:10.17619/UNIPB/1-1787.
short: A. Sprenger, Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten
in Logikblöcken hochintegrierter Schaltungen, Universität Paderborn, Paderborn,
2023.
date_created: 2023-08-12T09:10:38Z
date_updated: 2023-08-12T09:13:18Z
department:
- _id: '48'
doi: 10.17619/UNIPB/1-1787
extern: '1'
keyword:
- Testantwortkompaktierung
- Prozessvariation
- Silicon Lifecycle Management
language:
- iso: ger
main_file_link:
- open_access: '1'
url: https://nbn-resolving.org/urn:nbn:de:hbz:466:2-45493
oa: '1'
page: xi, 160
place: Paderborn
publication_status: published
publisher: Universität Paderborn
status: public
supervisor:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Marco
full_name: Platzner, Marco
id: '398'
last_name: Platzner
title: Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in
Logikblöcken hochintegrierter Schaltungen
type: dissertation
user_id: '22707'
year: '2023'
...
---
_id: '45715'
author:
- first_name: Vanessa Ingrid
full_name: Tcheussi Ngayap, Vanessa Ingrid
last_name: Tcheussi Ngayap
citation:
ama: Tcheussi Ngayap VI. FreeRTOS on a MicroBlaze Soft-Core Processor with Hardware
Accelerators.; 2022.
apa: Tcheussi Ngayap, V. I. (2022). FreeRTOS on a MicroBlaze Soft-Core Processor
with Hardware Accelerators.
bibtex: '@book{Tcheussi Ngayap_2022, title={FreeRTOS on a MicroBlaze Soft-Core Processor
with Hardware Accelerators}, author={Tcheussi Ngayap, Vanessa Ingrid}, year={2022}
}'
chicago: Tcheussi Ngayap, Vanessa Ingrid. FreeRTOS on a MicroBlaze Soft-Core
Processor with Hardware Accelerators, 2022.
ieee: V. I. Tcheussi Ngayap, FreeRTOS on a MicroBlaze Soft-Core Processor with
Hardware Accelerators. 2022.
mla: Tcheussi Ngayap, Vanessa Ingrid. FreeRTOS on a MicroBlaze Soft-Core Processor
with Hardware Accelerators. 2022.
short: V.I. Tcheussi Ngayap, FreeRTOS on a MicroBlaze Soft-Core Processor with Hardware
Accelerators, 2022.
date_created: 2023-06-22T12:04:57Z
date_updated: 2023-06-22T12:07:53Z
department:
- _id: '78'
language:
- iso: eng
project:
- _id: '83'
name: 'SFB 901 - T1: SFB 901 -Subproject T1'
- _id: '82'
name: 'SFB 901 - T: SFB 901 - Project Area T'
- _id: '1'
grant_number: '160364472'
name: 'SFB 901: SFB 901: On-The-Fly Computing - Individualisierte IT-Dienstleistungen
in dynamischen Märkten '
status: public
supervisor:
- first_name: Lennart
full_name: Clausing, Lennart
id: '74287'
last_name: Clausing
orcid: 0000-0003-3789-6034
- first_name: Marco
full_name: Platzner, Marco
id: '398'
last_name: Platzner
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
title: FreeRTOS on a MicroBlaze Soft-Core Processor with Hardware Accelerators
type: mastersthesis
user_id: '74287'
year: '2022'
...
---
_id: '15920'
abstract:
- lang: eng
text: "Secure hardware design is the most important aspect to be considered in addition
to functional correctness. Achieving hardware security in today’s globalized Integrated
Cir- cuit(IC) supply chain is a challenging task. One solution that is widely
considered to help achieve secure hardware designs is Information Flow Tracking(IFT).
It provides an ap- proach to verify that the systems adhere to security properties
either by static verification during design phase or dynamic checking during runtime.\r\nProof-Carrying
Hardware(PCH) is an approach to verify a functional design prior to using it in
hardware. It is a two-party verification approach, where the target party, the
consumer requests new functionalities with pre-defined properties to the producer.
In response, the producer designs the IP (Intellectual Property) cores with the
requested functionalities that adhere to the consumer-defined properties. The
producer provides the IP cores and a proof certificate combined into a proof-carrying
bitstream to the consumer to verify it. If the verification is successful, the
consumer can use the IP cores in his hardware. In essence, the consumer can only
run verified IP cores. Correctly applied, PCH techniques can help consumers to
defend against many unintentional modifications and malicious alterations of the
modules they receive. There are numerous published examples of how to use PCH
to detect any change in the functionality of a circuit, i.e., pairing a PCH approach
with functional equivalence checking for combinational or sequential circuits.
For non-functional properties, since opening new covert channels to leak secret
information from secure circuits is a viable attack vector for hardware trojans,
i.e., intentionally added malicious circuitry, IFT technique is employed to make
sure that secret/untrusted information never reaches any unclassified/trusted
outputs.\r\nThis master thesis aims to explore the possibility of adapting Information
Flow Tracking into a Proof-Carrying Hardware scenario. It aims to create a method
that combines Infor- mation Flow Tracking(IFT) with a PCH approach at bitstream
level enabling consumers to validate the trustworthiness of a module’s information
flow without the computational costs of a complete flow analysis."
author:
- first_name: Monica
full_name: Keerthipati, Monica
last_name: Keerthipati
citation:
ama: Keerthipati M. A Bitstream-Level Proof-Carrying Hardware Technique for Information
Flow Tracking. Universität Paderborn; 2019.
apa: Keerthipati, M. (2019). A Bitstream-Level Proof-Carrying Hardware Technique
for Information Flow Tracking. Universität Paderborn.
bibtex: '@book{Keerthipati_2019, title={A Bitstream-Level Proof-Carrying Hardware
Technique for Information Flow Tracking}, publisher={Universität Paderborn}, author={Keerthipati,
Monica}, year={2019} }'
chicago: Keerthipati, Monica. A Bitstream-Level Proof-Carrying Hardware Technique
for Information Flow Tracking. Universität Paderborn, 2019.
ieee: M. Keerthipati, A Bitstream-Level Proof-Carrying Hardware Technique for
Information Flow Tracking. Universität Paderborn, 2019.
mla: Keerthipati, Monica. A Bitstream-Level Proof-Carrying Hardware Technique
for Information Flow Tracking. Universität Paderborn, 2019.
short: M. Keerthipati, A Bitstream-Level Proof-Carrying Hardware Technique for Information
Flow Tracking, Universität Paderborn, 2019.
date_created: 2020-02-17T12:03:40Z
date_updated: 2022-01-06T06:52:41Z
department:
- _id: '78'
language:
- iso: eng
project:
- _id: '12'
name: SFB 901 - Subproject B4
- _id: '3'
name: SFB 901 - Project Area B
- _id: '1'
name: SFB 901
publisher: Universität Paderborn
status: public
supervisor:
- first_name: Tobias
full_name: Wiersema, Tobias
id: '3118'
last_name: Wiersema
- first_name: Marco
full_name: Platzner, Marco
id: '398'
last_name: Platzner
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
title: A Bitstream-Level Proof-Carrying Hardware Technique for Information Flow Tracking
type: mastersthesis
user_id: '477'
year: '2019'
...
---
_id: '15874'
author:
- first_name: Christian
full_name: Lienen, Christian
id: '60323'
last_name: Lienen
citation:
ama: Lienen C. Implementing a Real-Time System on a Platform FPGA Operated with
ReconOS. Universität Paderborn
apa: Lienen, C. (n.d.). Implementing a Real-time System on a Platform FPGA operated
with ReconOS. Universität Paderborn.
bibtex: '@book{Lienen, title={Implementing a Real-time System on a Platform FPGA
operated with ReconOS}, publisher={Universität Paderborn}, author={Lienen, Christian}
}'
chicago: Lienen, Christian. Implementing a Real-Time System on a Platform FPGA
Operated with ReconOS. Universität Paderborn, n.d.
ieee: C. Lienen, Implementing a Real-time System on a Platform FPGA operated
with ReconOS. Universität Paderborn.
mla: Lienen, Christian. Implementing a Real-Time System on a Platform FPGA Operated
with ReconOS. Universität Paderborn.
short: C. Lienen, Implementing a Real-Time System on a Platform FPGA Operated with
ReconOS, Universität Paderborn, n.d.
date_created: 2020-02-11T10:22:06Z
date_updated: 2023-07-31T11:58:50Z
ddc:
- '004'
department:
- _id: '78'
file:
- access_level: open_access
content_type: application/pdf
creator: clienen
date_created: 2020-07-01T11:46:49Z
date_updated: 2021-02-13T16:46:58Z
file_id: '17351'
file_name: thesis_main.pdf
file_size: 5920668
relation: main_file
file_date_updated: 2021-02-13T16:46:58Z
has_accepted_license: '1'
language:
- iso: eng
oa: '1'
project:
- _id: '83'
name: 'SFB 901 - T1: SFB 901 -Subproject T1'
- _id: '82'
name: 'SFB 901 - T: SFB 901 - Project Area T'
- _id: '1'
grant_number: '160364472'
name: 'SFB 901: SFB 901: On-The-Fly Computing - Individualisierte IT-Dienstleistungen
in dynamischen Märkten '
publication_status: submitted
publisher: Universität Paderborn
status: public
supervisor:
- first_name: Lennart
full_name: Clausing, Lennart
id: '74287'
last_name: Clausing
orcid: 0000-0003-3789-6034
- first_name: Marco
full_name: Platzner, Marco
id: '398'
last_name: Platzner
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
title: Implementing a Real-time System on a Platform FPGA operated with ReconOS
type: mastersthesis
user_id: '60323'
year: '2019'
...