[{"publication":"Advances in Enterprise Engineering II","department":[{"_id":"66"}],"author":[{"first_name":"Stefan","full_name":"Sauer, Stefan","last_name":"Sauer","id":"447"},{"full_name":"Engels, Gregor","first_name":"Gregor","id":"107","last_name":"Engels"},{"first_name":"Johannes","full_name":"Willkomm, Johannes","last_name":"Willkomm"},{"last_name":"Baumann","full_name":"Baumann, Andrea","first_name":"Andrea"},{"full_name":"Hofmann, Alexander","first_name":"Alexander","last_name":"Hofmann"}],"date_created":"2019-01-31T15:19:42Z","status":"public","user_id":"52534","title":"A Holistic Software Engineering Method for Service-Oriented Application Landscape Development","language":[{"iso":"eng"}],"page":"1-17","citation":{"chicago":"Sauer, Stefan, Gregor Engels, Johannes Willkomm, Andrea Baumann, and Alexander Hofmann. “A Holistic Software Engineering Method for Service-Oriented Application Landscape Development.” Advances in Enterprise Engineering II, 2009, 1–17.","apa":"Sauer, S., Engels, G., Willkomm, J., Baumann, A., & Hofmann, A. (2009). A Holistic Software Engineering Method for Service-Oriented Application Landscape Development. Advances in Enterprise Engineering II, 1–17.","ama":"Sauer S, Engels G, Willkomm J, Baumann A, Hofmann A. A Holistic Software Engineering Method for Service-Oriented Application Landscape Development. Advances in Enterprise Engineering II. 2009:1-17.","bibtex":"@article{Sauer_Engels_Willkomm_Baumann_Hofmann_2009, title={A Holistic Software Engineering Method for Service-Oriented Application Landscape Development}, journal={Advances in Enterprise Engineering II}, author={Sauer, Stefan and Engels, Gregor and Willkomm, Johannes and Baumann, Andrea and Hofmann, Alexander}, year={2009}, pages={1–17} }","mla":"Sauer, Stefan, et al. “A Holistic Software Engineering Method for Service-Oriented Application Landscape Development.” Advances in Enterprise Engineering II, 2009, pp. 1–17.","short":"S. Sauer, G. Engels, J. Willkomm, A. Baumann, A. Hofmann, Advances in Enterprise Engineering II (2009) 1–17.","ieee":"S. Sauer, G. Engels, J. Willkomm, A. Baumann, and A. Hofmann, “A Holistic Software Engineering Method for Service-Oriented Application Landscape Development,” Advances in Enterprise Engineering II, pp. 1–17, 2009."},"year":"2009","type":"journal_article","date_updated":"2022-01-06T07:03:35Z","_id":"7367"},{"title":"Design for Future – Legacy-Probleme von morgen vermeidbar?","department":[{"_id":"66"}],"publication_status":"published","publication_identifier":{"issn":["0170-6012","1432-122X"]},"date_updated":"2022-01-06T07:03:35Z","doi":"10.1007/s00287-009-0356-3","language":[{"iso":"ger"}],"user_id":"52534","publication":"Informatik-Spektrum","publisher":"Springer Nature","author":[{"first_name":"Gregor","full_name":"Engels, Gregor","last_name":"Engels","id":"107"},{"first_name":"Michael","full_name":"Goedicke, Michael","last_name":"Goedicke"},{"first_name":"Ursula","full_name":"Goltz, Ursula","last_name":"Goltz"},{"full_name":"Rausch, Andreas","first_name":"Andreas","last_name":"Rausch"},{"last_name":"Reussner","full_name":"Reussner, Ralf","first_name":"Ralf"}],"date_created":"2019-01-31T15:22:05Z","status":"public","volume":32,"intvolume":" 32","_id":"7368","issue":"5","page":"393-397","type":"journal_article","year":"2009","citation":{"mla":"Engels, Gregor, et al. “Design for Future – Legacy-Probleme von morgen vermeidbar?” Informatik-Spektrum, vol. 32, no. 5, Springer Nature, 2009, pp. 393–97, doi:10.1007/s00287-009-0356-3.","bibtex":"@article{Engels_Goedicke_Goltz_Rausch_Reussner_2009, title={Design for Future – Legacy-Probleme von morgen vermeidbar?}, volume={32}, DOI={10.1007/s00287-009-0356-3}, number={5}, journal={Informatik-Spektrum}, publisher={Springer Nature}, author={Engels, Gregor and Goedicke, Michael and Goltz, Ursula and Rausch, Andreas and Reussner, Ralf}, year={2009}, pages={393–397} }","chicago":"Engels, Gregor, Michael Goedicke, Ursula Goltz, Andreas Rausch, and Ralf Reussner. “Design for Future – Legacy-Probleme von morgen vermeidbar?” Informatik-Spektrum 32, no. 5 (2009): 393–97. https://doi.org/10.1007/s00287-009-0356-3.","ama":"Engels G, Goedicke M, Goltz U, Rausch A, Reussner R. Design for Future – Legacy-Probleme von morgen vermeidbar? Informatik-Spektrum. 2009;32(5):393-397. doi:10.1007/s00287-009-0356-3","apa":"Engels, G., Goedicke, M., Goltz, U., Rausch, A., & Reussner, R. (2009). Design for Future – Legacy-Probleme von morgen vermeidbar? Informatik-Spektrum, 32(5), 393–397. https://doi.org/10.1007/s00287-009-0356-3","ieee":"G. Engels, M. Goedicke, U. Goltz, A. Rausch, and R. Reussner, “Design for Future – Legacy-Probleme von morgen vermeidbar?,” Informatik-Spektrum, vol. 32, no. 5, pp. 393–397, 2009.","short":"G. Engels, M. Goedicke, U. Goltz, A. Rausch, R. Reussner, Informatik-Spektrum 32 (2009) 393–397."}},{"language":[{"iso":"eng"}],"page":"515-534","year":"2009","type":"book_chapter","citation":{"short":"S. Helm, A. Eggert, I. Garnefeld, in: V. Esposito Vinzi, W. Chin, J. Henseler, H. Wang (Eds.), Handbook of Partial Least Squares - Concepts, Methods and Applications, Springer, Berlin, 2009, pp. 515–534.","ieee":"S. Helm, A. Eggert, and I. Garnefeld, “Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS,” in Handbook of Partial Least Squares - Concepts, Methods and Applications, V. Esposito Vinzi, W. Chin, J. Henseler, and H. Wang, Eds. Berlin: Springer, 2009, pp. 515–534.","apa":"Helm, S., Eggert, A., & Garnefeld, I. (2009). Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS. In V. Esposito Vinzi, W. Chin, J. Henseler, & H. Wang (Eds.), Handbook of Partial Least Squares - Concepts, Methods and Applications (pp. 515–534). Berlin: Springer.","ama":"Helm S, Eggert A, Garnefeld I. Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS. In: Esposito Vinzi V, Chin W, Henseler J, Wang H, eds. Handbook of Partial Least Squares - Concepts, Methods and Applications. Berlin: Springer; 2009:515-534.","chicago":"Helm, S, A Eggert, and I Garnefeld. “Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS.” In Handbook of Partial Least Squares - Concepts, Methods and Applications, edited by V Esposito Vinzi, W Chin, J Henseler, and H Wang, 515–34. Berlin: Springer, 2009.","bibtex":"@inbook{Helm_Eggert_Garnefeld_2009, place={Berlin}, title={Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS}, booktitle={Handbook of Partial Least Squares - Concepts, Methods and Applications}, publisher={Springer}, author={Helm, S and Eggert, A and Garnefeld, I}, editor={Esposito Vinzi, V and Chin, W and Henseler, J and Wang, HEditors}, year={2009}, pages={515–534} }","mla":"Helm, S., et al. “Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS.” Handbook of Partial Least Squares - Concepts, Methods and Applications, edited by V Esposito Vinzi et al., Springer, 2009, pp. 515–34."},"date_updated":"2022-01-06T07:03:38Z","_id":"7441","publication":"Handbook of Partial Least Squares - Concepts, Methods and Applications","department":[{"_id":"19"},{"_id":"180"}],"publisher":"Springer","author":[{"last_name":"Helm","full_name":"Helm, S","first_name":"S"},{"last_name":"Eggert","first_name":"A","full_name":"Eggert, A"},{"first_name":"I","full_name":"Garnefeld, I","last_name":"Garnefeld"}],"date_created":"2019-02-04T11:31:20Z","status":"public","editor":[{"last_name":"Esposito Vinzi","first_name":"V","full_name":"Esposito Vinzi, V"},{"full_name":"Chin, W","first_name":"W","last_name":"Chin"},{"last_name":"Henseler","first_name":"J","full_name":"Henseler, J"},{"last_name":"Wang","full_name":"Wang, H","first_name":"H"}],"place":"Berlin","user_id":"57352","title":"Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS"},{"year":"2009","citation":{"bibtex":"@article{Mehta_Ruth_Piegdon_Krix_Nienhaus_Meier_2009, title={Inductively coupled plasma reactive ion etching of bulk ZnO single crystal and molecular beam epitaxy grown ZnO films}, volume={27}, DOI={10.1116/1.3186528}, number={52097}, journal={Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures}, publisher={American Vacuum Society}, author={Mehta, M. and Ruth, M. and Piegdon, K. 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Lei, C. Notthoff, M. Offer, C. Meier, A. Lorke, C. Jagadish, A.D. Wieck, Journal of Materials Research 24 (2009) 2179–2184.","ieee":"W. Lei et al., “Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation,” Journal of Materials Research, vol. 24, no. 07, pp. 2179–2184, 2009.","apa":"Lei, W., Notthoff, C., Offer, M., Meier, C., Lorke, A., Jagadish, C., & Wieck, A. D. (2009). Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation. Journal of Materials Research, 24(07), 2179–2184. https://doi.org/10.1557/jmr.2009.0293","ama":"Lei W, Notthoff C, Offer M, et al. Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation. Journal of Materials Research. 2009;24(07):2179-2184. doi:10.1557/jmr.2009.0293","chicago":"Lei, Wen, Christian Notthoff, Matthias Offer, Cedrik Meier, Axel Lorke, Chennupati Jagadish, and Andreas D. Wieck. “Electron Energy Structure of Self-Assembled In(Ga)As Nanostructures Probed by Capacitance-Voltage Spectroscopy and One-Dimensional Numerical Simulation.” Journal of Materials Research 24, no. 07 (2009): 2179–84. https://doi.org/10.1557/jmr.2009.0293.","bibtex":"@article{Lei_Notthoff_Offer_Meier_Lorke_Jagadish_Wieck_2009, title={Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation}, volume={24}, DOI={10.1557/jmr.2009.0293}, number={07}, journal={Journal of Materials Research}, publisher={Cambridge University Press (CUP)}, author={Lei, Wen and Notthoff, Christian and Offer, Matthias and Meier, Cedrik and Lorke, Axel and Jagadish, Chennupati and Wieck, Andreas D.}, year={2009}, pages={2179–2184} }","mla":"Lei, Wen, et al. “Electron Energy Structure of Self-Assembled In(Ga)As Nanostructures Probed by Capacitance-Voltage Spectroscopy and One-Dimensional Numerical Simulation.” Journal of Materials Research, vol. 24, no. 07, Cambridge University Press (CUP), 2009, pp. 2179–84, doi:10.1557/jmr.2009.0293."},"type":"journal_article","page":"2179-2184"},{"issue":"4","_id":"7499","intvolume":" 27","citation":{"short":"K. Huba, D. Krix, C. Meier, H. Nienhaus, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27 (2009) 889–894.","ieee":"K. Huba, D. Krix, C. Meier, and H. Nienhaus, “Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers,” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, pp. 889–894, 2009.","ama":"Huba K, Krix D, Meier C, Nienhaus H. Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 2009;27(4):889-894. doi:10.1116/1.3100218","apa":"Huba, K., Krix, D., Meier, C., & Nienhaus, H. (2009). Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 27(4), 889–894. https://doi.org/10.1116/1.3100218","chicago":"Huba, K., D. Krix, Cedrik Meier, and H. Nienhaus. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27, no. 4 (2009): 889–94. https://doi.org/10.1116/1.3100218.","mla":"Huba, K., et al. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, American Vacuum Society, 2009, pp. 889–94, doi:10.1116/1.3100218.","bibtex":"@article{Huba_Krix_Meier_Nienhaus_2009, title={Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers}, volume={27}, DOI={10.1116/1.3100218}, number={4}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Huba, K. and Krix, D. and Meier, Cedrik and Nienhaus, H.}, year={2009}, pages={889–894} }"},"year":"2009","type":"journal_article","page":"889-894","user_id":"20798","volume":27,"status":"public","date_created":"2019-02-04T14:47:36Z","publisher":"American Vacuum Society","author":[{"first_name":"K.","full_name":"Huba, K.","last_name":"Huba"},{"last_name":"Krix","first_name":"D.","full_name":"Krix, D."},{"id":"20798","last_name":"Meier","full_name":"Meier, Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","first_name":"Cedrik"},{"first_name":"H.","full_name":"Nienhaus, H.","last_name":"Nienhaus"}],"publication":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","doi":"10.1116/1.3100218","date_updated":"2022-01-06T07:03:39Z","language":[{"iso":"eng"}],"title":"Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers","publication_identifier":{"issn":["0734-2101","1520-8559"]},"publication_status":"published","department":[{"_id":"15"},{"_id":"230"},{"_id":"287"},{"_id":"35"}]},{"year":"2009","type":"dissertation","citation":{"mla":"Voigt, Hendrik. Kontextsensitive Qualitätsplanung von Softwaremodellen. 2009.","bibtex":"@book{Voigt_2009, title={Kontextsensitive Qualitätsplanung von Softwaremodellen}, author={Voigt, Hendrik}, year={2009} }","chicago":"Voigt, Hendrik. Kontextsensitive Qualitätsplanung von Softwaremodellen, 2009.","ama":"Voigt H. Kontextsensitive Qualitätsplanung von Softwaremodellen.; 2009.","apa":"Voigt, H. (2009). Kontextsensitive Qualitätsplanung von Softwaremodellen.","ieee":"H. Voigt, Kontextsensitive Qualitätsplanung von Softwaremodellen. 2009.","short":"H. Voigt, Kontextsensitive Qualitätsplanung von Softwaremodellen, 2009."},"language":[{"iso":"eng"}],"date_updated":"2022-01-06T07:03:40Z","_id":"7574","department":[{"_id":"66"}],"author":[{"last_name":"Voigt","first_name":"Hendrik","full_name":"Voigt, Hendrik"}],"date_created":"2019-02-06T14:21:13Z","status":"public","abstract":[{"text":"The Model Quality Plan (MQP) approach provided by us allows for the systematic and efficient development of quality plans that serve as a basis for the assessment of software models. MQP emphasizes the context of a software model as a major factor of influence for the whole quality planning activity. In order to adjust a quality plan to project specific requirements, quality goals are derived from a characterization of that context. We achieve a differentiated description of quality goals by introducing structured goals and questions in combination with a defined quality model. Afterwards, metrics and indicators are identified for checking the fulfillment of the quality goals. The result of our approach consists of a context sensitive quality plan for software models. Conceptually, we combine a metamodel for formulating relevant contents, a process that serves as a guideline for defining quality plans, and a rule concept for packaging and reusing experience into an integrated framework. We show its feasibility by three case studies that include a quality plan for analysis models, design models, and test models, respectively. For that, we provide tool support for the definition and application of quality plans.","lang":"eng"}],"title":"Kontextsensitive Qualitätsplanung von Softwaremodellen","user_id":"52534"},{"title":"Platform independent modeling of synthesizable software systems using UML 2","user_id":"52534","department":[{"_id":"66"}],"author":[{"last_name":"Schattkowsky","full_name":"Schattkowsky, Tim","first_name":"Tim"}],"date_created":"2019-02-06T14:22:06Z","status":"public","date_updated":"2022-01-06T07:03:40Z","_id":"7575","citation":{"apa":"Schattkowsky, T. (2009). Platform independent modeling of synthesizable software systems using UML 2.","ama":"Schattkowsky T. Platform Independent Modeling of Synthesizable Software Systems Using UML 2.; 2009.","chicago":"Schattkowsky, Tim. Platform Independent Modeling of Synthesizable Software Systems Using UML 2, 2009.","mla":"Schattkowsky, Tim. Platform Independent Modeling of Synthesizable Software Systems Using UML 2. 2009.","bibtex":"@book{Schattkowsky_2009, title={Platform independent modeling of synthesizable software systems using UML 2}, author={Schattkowsky, Tim}, year={2009} }","short":"T. Schattkowsky, Platform Independent Modeling of Synthesizable Software Systems Using UML 2, 2009.","ieee":"T. Schattkowsky, Platform independent modeling of synthesizable software systems using UML 2. 2009."},"year":"2009","type":"dissertation","language":[{"iso":"eng"}]},{"user_id":"52534","title":"Pattern based business process design and verification","author":[{"last_name":"Förster","first_name":"Alexander","full_name":"Förster, Alexander"}],"department":[{"_id":"66"}],"status":"public","date_created":"2019-02-06T14:22:40Z","date_updated":"2022-01-06T07:03:40Z","_id":"7577","language":[{"iso":"eng"}],"citation":{"bibtex":"@book{Förster_2009, title={Pattern based business process design and verification}, author={Förster, Alexander}, year={2009} }","mla":"Förster, Alexander. Pattern Based Business Process Design and Verification. 2009.","chicago":"Förster, Alexander. Pattern Based Business Process Design and Verification, 2009.","apa":"Förster, A. (2009). Pattern based business process design and verification.","ama":"Förster A. Pattern Based Business Process Design and Verification.; 2009.","ieee":"A. Förster, Pattern based business process design and verification. 2009.","short":"A. Förster, Pattern Based Business Process Design and Verification, 2009."},"type":"dissertation","year":"2009"},{"type":"dissertation","citation":{"ieee":"M. Assmann, Model-based evaluation of service-oriented enterprise architectures. 2009.","short":"M. Assmann, Model-Based Evaluation of Service-Oriented Enterprise Architectures, 2009.","bibtex":"@book{Assmann_2009, title={Model-based evaluation of service-oriented enterprise architectures}, author={Assmann, Martin}, year={2009} }","mla":"Assmann, Martin. Model-Based Evaluation of Service-Oriented Enterprise Architectures. 2009.","chicago":"Assmann, Martin. Model-Based Evaluation of Service-Oriented Enterprise Architectures, 2009.","ama":"Assmann M. Model-Based Evaluation of Service-Oriented Enterprise Architectures.; 2009.","apa":"Assmann, M. (2009). Model-based evaluation of service-oriented enterprise architectures."},"year":"2009","language":[{"iso":"eng"}],"date_updated":"2022-01-06T07:03:40Z","_id":"7578","date_created":"2019-02-06T14:23:06Z","status":"public","department":[{"_id":"66"}],"author":[{"last_name":"Assmann","full_name":"Assmann, Martin","first_name":"Martin"}],"title":"Model-based evaluation of service-oriented enterprise architectures","user_id":"52534","abstract":[{"lang":"eng","text":"Enterprise Architecture (EA) has undergone many changes since the IT has found its way into the world of enterprises. The introduction of Service-Oriented Architecture (SOA) is such a change with major consequences. The introduction of an SOA increases the flexibility and thus the productivity of an enterprise architecture, but unfortunately also its complexity. This makes the transformation of an enterprise architecture to an SOA-like enterprise architecture to a challenging and risky task. To overcome the change- and complexity-related problems when introducing SOA, Enterprise Architecture Management (EAM) systems are required. The approach of this thesis suggests a method on how to establish Enterprise Architecture Management that is especially suited for an SOA introduction. This thesis suggests a variant of an EAM system that is especially suited for the introduction of an SOA. The presented method on creating such an EAM system includes guidance on how to define a meta model for Service-Oriented Enterprise Architecture (SOEA), which is harmonized with the respective enterprise architecture. The SOA introduction is especially supported by defining SOA quality criteria and corresponding metrics. Some metrics have to be ascertained by experts. Other metrics have their measuring points within the SOEA models (instances of the SOEA meta model) and their calculation is automatable. Creating and maintaining SOEA models as well as applying the automatable metrics are supported by an eclipse-based tool. As metrics only produce measures that are hard to interpret, indicators are introduced. They allow interpreting the measures concerning the quality criteria. With the help of this EAM system, the transformation of an enterprise to a service-oriented enterprise can be planned and the level of goal-achievement (SOA-conformance of the EA) can be monitored steadily. By this, the contribution of this work aims at the reduction of the risk when introducing an SOA."}]}]