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Gebhardt, Lernkulturen an Hochschulen: Theoretische Überlegungen zur Betrachtung studentischen Lernens unter individueller, pädagogischer und organisationaler Perspektive. 2009.","short":"T. Jenert, F. Zellweger, J. Dommen, A. Gebhardt, Lernkulturen an Hochschulen: Theoretische Überlegungen Zur Betrachtung Studentischen Lernens Unter Individueller, Pädagogischer Und Organisationaler Perspektive, 2009."},"type":"report","year":"2009"},{"page":"379 - 389","citation":{"short":"T. Jenert, F. Zellweger , C. Meier, in: E-Learning 2009 - Lernen im Digitalen Zeitalter, Waxmann Verlag GmbH , Münster, 2009, pp. 379–389.","ieee":"T. Jenert, F. Zellweger , and C. Meier, “Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation,” in E-Learning 2009 - Lernen im Digitalen Zeitalter, vol. 51, Münster: Waxmann Verlag GmbH , 2009, pp. 379–389.","apa":"Jenert, T., Zellweger , F., & Meier, C. (2009). Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation. In E-Learning 2009 - Lernen im Digitalen Zeitalter (Vol. 51, pp. 379–389). Münster: Waxmann Verlag GmbH .","ama":"Jenert T, Zellweger F, Meier C. Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation. In: E-Learning 2009 - Lernen im Digitalen Zeitalter. Vol 51. Medien in der Wissenschaft . Münster: Waxmann Verlag GmbH ; 2009:379-389.","chicago":"Jenert, Tobias, Franziska Zellweger , and Christoph Meier. “Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation.” In E-Learning 2009 - Lernen im Digitalen Zeitalter, 51:379–89. Medien in der Wissenschaft . Münster: Waxmann Verlag GmbH , 2009.","mla":"Jenert, Tobias, et al. “Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation.” E-Learning 2009 - Lernen im Digitalen Zeitalter, vol. 51, Waxmann Verlag GmbH , 2009, pp. 379–89.","bibtex":"@inbook{Jenert_Zellweger _Meier_2009, place={Münster}, series={Medien in der Wissenschaft }, title={Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation}, volume={51}, booktitle={ E-Learning 2009 - Lernen im Digitalen Zeitalter}, publisher={Waxmann Verlag GmbH }, author={Jenert, Tobias and Zellweger , Franziska and Meier, Christoph}, year={2009}, pages={379–389}, collection={Medien in der Wissenschaft } }"},"type":"book_chapter","year":"2009","intvolume":" 51","_id":"4522","volume":51,"date_created":"2018-09-20T08:29:43Z","status":"public","publication":" E-Learning 2009 - Lernen im Digitalen Zeitalter","publisher":"Waxmann Verlag GmbH ","author":[{"first_name":"Tobias","full_name":"Jenert, Tobias","orcid":" https://orcid.org/0000-0001-9262-5646","last_name":"Jenert","id":"71994"},{"full_name":"Zellweger , Franziska","first_name":"Franziska","last_name":"Zellweger "},{"last_name":"Meier","first_name":"Christoph","full_name":"Meier, Christoph"}],"user_id":"51057","extern":"1","language":[{"iso":"ger"}],"series_title":"Medien in der Wissenschaft ","date_updated":"2022-01-06T07:01:08Z","publication_identifier":{"isbn":["978-3-8309-2199-8"]},"department":[{"_id":"208"},{"_id":"282"}],"title":"Prüfungskulturgestalten?!: Prozess- und Qualitätsunterstützung schriftlicher Prüfungen an Hochschulen durch eine Web-Applikation","place":"Münster"},{"abstract":[{"lang":"eng","text":"We present results on ferroelectric micro-domains obtained by confocal second harmonic microscopy. The high potential of this technique is demonstrated by imaging periodic ferroelectric domain structures in the surface of planar X-cut lithium niobate (LN) and in the body of ridges fabricated by plasma etching on X-cut LN as well. In both cases the measured second harmonic signal reveals a strong contrast between inverted and non-inverted domain sections. This enabled a depth-resolved non-destructive tomography of micro-domains in ridge structures in all three dimensions."}],"article_type":"original","user_id":"49428","keyword":["Nonlinear microscopy","ferroelectric micro-domains","confocal imaging","LiNbO3"],"publication":"Ferroelectrics","author":[{"full_name":"Berth, Gerhard","first_name":"Gerhard","id":"53","last_name":"Berth"},{"last_name":"Wiedemeier","full_name":"Wiedemeier, Volker","first_name":"Volker"},{"last_name":"Hüsch","first_name":"Klaus-Peter","full_name":"Hüsch, Klaus-Peter"},{"first_name":"Li","full_name":"Gui, Li","last_name":"Gui"},{"last_name":"Hu","first_name":"Hui","full_name":"Hu, Hui"},{"last_name":"Sohler","first_name":"Wolfgang","full_name":"Sohler, Wolfgang"},{"id":"606","last_name":"Zrenner","full_name":"Zrenner, Artur","orcid":"0000-0002-5190-0944","first_name":"Artur"}],"publisher":"Informa UK Limited","date_created":"2018-09-20T12:54:14Z","status":"public","volume":389,"intvolume":" 389","_id":"4553","issue":"1","page":"132-141","citation":{"short":"G. Berth, V. Wiedemeier, K.-P. Hüsch, L. Gui, H. Hu, W. Sohler, A. Zrenner, Ferroelectrics 389 (2009) 132–141.","ieee":"G. Berth et al., “Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy,” Ferroelectrics, vol. 389, no. 1, pp. 132–141, 2009.","ama":"Berth G, Wiedemeier V, Hüsch K-P, et al. Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy. Ferroelectrics. 2009;389(1):132-141. doi:10.1080/00150190902993267","apa":"Berth, G., Wiedemeier, V., Hüsch, K.-P., Gui, L., Hu, H., Sohler, W., & Zrenner, A. (2009). Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy. Ferroelectrics, 389(1), 132–141. https://doi.org/10.1080/00150190902993267","chicago":"Berth, Gerhard, Volker Wiedemeier, Klaus-Peter Hüsch, Li Gui, Hui Hu, Wolfgang Sohler, and Artur Zrenner. “Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy.” Ferroelectrics 389, no. 1 (2009): 132–41. https://doi.org/10.1080/00150190902993267.","mla":"Berth, Gerhard, et al. “Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy.” Ferroelectrics, vol. 389, no. 1, Informa UK Limited, 2009, pp. 132–41, doi:10.1080/00150190902993267.","bibtex":"@article{Berth_Wiedemeier_Hüsch_Gui_Hu_Sohler_Zrenner_2009, title={Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy}, volume={389}, DOI={10.1080/00150190902993267}, number={1}, journal={Ferroelectrics}, publisher={Informa UK Limited}, author={Berth, Gerhard and Wiedemeier, Volker and Hüsch, Klaus-Peter and Gui, Li and Hu, Hui and Sohler, Wolfgang and Zrenner, Artur}, year={2009}, pages={132–141} }"},"year":"2009","type":"journal_article","title":"Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"publication_status":"published","publication_identifier":{"issn":["0015-0193","1563-5112"]},"date_updated":"2022-01-06T07:01:09Z","doi":"10.1080/00150190902993267","language":[{"iso":"eng"}]},{"language":[{"iso":"eng"}],"doi":"10.1080/00949650802352019","date_updated":"2022-01-06T07:01:14Z","publication_identifier":{"issn":["0094-9655","1563-5163"]},"publication_status":"published","department":[{"_id":"206"}],"title":"A simple bootstrap bandwidth selector for local polynomial fitting","type":"journal_article","year":"2009","citation":{"bibtex":"@article{Feng_Heiler_2009, title={A simple bootstrap bandwidth selector for local polynomial fitting}, volume={79}, DOI={10.1080/00949650802352019}, number={12}, journal={Journal of Statistical Computation and Simulation}, publisher={Informa UK Limited}, author={Feng, Yuanhua and Heiler, Siegfried}, year={2009}, pages={1425–1439} }","mla":"Feng, Yuanhua, and Siegfried Heiler. “A Simple Bootstrap Bandwidth Selector for Local Polynomial Fitting.” Journal of Statistical Computation and Simulation, vol. 79, no. 12, Informa UK Limited, 2009, pp. 1425–39, doi:10.1080/00949650802352019.","ama":"Feng Y, Heiler S. 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A macro-evaluation using empirical matching functions,” German economic review, no. 3, pp. 284--316, 2009.","short":"R. Fahr, U. Sunde, German Economic Review (2009) 284--316.","mla":"Fahr, Ren{\\’e}, and Uwe Sunde. “Did the Hartz Reforms Speed-up the Matching Process? A Macro-Evaluation Using Empirical Matching Functions.” German Economic Review, no. 3, 2009, pp. 284--316.","bibtex":"@article{Fahr_Sunde_2009, title={Did the Hartz Reforms speed-up the matching process? A macro-evaluation using empirical matching functions}, number={3}, journal={German economic review}, author={Fahr, Ren{\\’e} and Sunde, Uwe}, year={2009}, pages={284--316} }","apa":"Fahr, R., & Sunde, U. (2009). Did the Hartz Reforms speed-up the matching process? A macro-evaluation using empirical matching functions. German Economic Review, (3), 284--316.","ama":"Fahr R, Sunde U. Did the Hartz Reforms speed-up the matching process? A macro-evaluation using empirical matching functions. 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Reussner, “Design for Future – Legacy-Probleme von morgen vermeidbar?,” Informatik-Spektrum, vol. 32, no. 5, pp. 393–397, 2009."},"issue":"5","intvolume":" 32","_id":"7368","date_created":"2019-01-31T15:22:05Z","status":"public","volume":32,"publication":"Informatik-Spektrum","author":[{"first_name":"Gregor","full_name":"Engels, Gregor","last_name":"Engels","id":"107"},{"last_name":"Goedicke","first_name":"Michael","full_name":"Goedicke, Michael"},{"full_name":"Goltz, Ursula","first_name":"Ursula","last_name":"Goltz"},{"last_name":"Rausch","full_name":"Rausch, Andreas","first_name":"Andreas"},{"last_name":"Reussner","full_name":"Reussner, Ralf","first_name":"Ralf"}],"publisher":"Springer Nature","user_id":"52534","language":[{"iso":"ger"}],"doi":"10.1007/s00287-009-0356-3","date_updated":"2022-01-06T07:03:35Z","publication_status":"published","publication_identifier":{"issn":["0170-6012","1432-122X"]},"department":[{"_id":"66"}],"title":"Design for Future – Legacy-Probleme von morgen vermeidbar?"},{"date_updated":"2022-01-06T07:03:38Z","_id":"7441","language":[{"iso":"eng"}],"year":"2009","type":"book_chapter","citation":{"chicago":"Helm, S, A Eggert, and I Garnefeld. “Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS.” In Handbook of Partial Least Squares - Concepts, Methods and Applications, edited by V Esposito Vinzi, W Chin, J Henseler, and H Wang, 515–34. 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Berlin: Springer.","mla":"Helm, S., et al. “Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS.” Handbook of Partial Least Squares - Concepts, Methods and Applications, edited by V Esposito Vinzi et al., Springer, 2009, pp. 515–34.","bibtex":"@inbook{Helm_Eggert_Garnefeld_2009, place={Berlin}, title={Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS}, booktitle={Handbook of Partial Least Squares - Concepts, Methods and Applications}, publisher={Springer}, author={Helm, S and Eggert, A and Garnefeld, I}, editor={Esposito Vinzi, V and Chin, W and Henseler, J and Wang, HEditors}, year={2009}, pages={515–534} }","short":"S. Helm, A. Eggert, I. Garnefeld, in: V. Esposito Vinzi, W. Chin, J. Henseler, H. Wang (Eds.), Handbook of Partial Least Squares - Concepts, Methods and Applications, Springer, Berlin, 2009, pp. 515–534.","ieee":"S. Helm, A. Eggert, and I. 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Nienhaus, and Cedrik Meier. “Inductively Coupled Plasma Reactive Ion Etching of Bulk ZnO Single Crystal and Molecular Beam Epitaxy Grown ZnO Films.” Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 27, no. 5 (2009). https://doi.org/10.1116/1.3186528.","mla":"Mehta, M., et al. “Inductively Coupled Plasma Reactive Ion Etching of Bulk ZnO Single Crystal and Molecular Beam Epitaxy Grown ZnO Films.” Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 27, no. 5, 2097, American Vacuum Society, 2009, doi:10.1116/1.3186528.","bibtex":"@article{Mehta_Ruth_Piegdon_Krix_Nienhaus_Meier_2009, title={Inductively coupled plasma reactive ion etching of bulk ZnO single crystal and molecular beam epitaxy grown ZnO films}, volume={27}, DOI={10.1116/1.3186528}, number={52097}, journal={Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures}, publisher={American Vacuum Society}, author={Mehta, M. and Ruth, M. and Piegdon, K. A. and Krix, D. and Nienhaus, H. and Meier, Cedrik}, year={2009} }"},"type":"journal_article","year":"2009","article_number":"2097","issue":"5","intvolume":" 27","_id":"7497","volume":27,"status":"public","date_created":"2019-02-04T14:44:44Z","author":[{"first_name":"M.","full_name":"Mehta, M.","last_name":"Mehta"},{"full_name":"Ruth, M.","first_name":"M.","last_name":"Ruth"},{"full_name":"Piegdon, K. A.","first_name":"K. A.","last_name":"Piegdon"},{"full_name":"Krix, D.","first_name":"D.","last_name":"Krix"},{"last_name":"Nienhaus","first_name":"H.","full_name":"Nienhaus, H."},{"orcid":"https://orcid.org/0000-0002-3787-3572","full_name":"Meier, Cedrik","first_name":"Cedrik","id":"20798","last_name":"Meier"}],"publisher":"American Vacuum Society","publication":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures","user_id":"20798","language":[{"iso":"eng"}],"doi":"10.1116/1.3186528","date_updated":"2022-01-06T07:03:39Z","publication_status":"published","publication_identifier":{"issn":["1071-1023"]},"department":[{"_id":"15"},{"_id":"230"},{"_id":"287"},{"_id":"35"}],"title":"Inductively coupled plasma reactive ion etching of bulk ZnO single crystal and molecular beam epitaxy grown ZnO films"},{"issue":"07","_id":"7498","intvolume":" 24","citation":{"ieee":"W. Lei et al., “Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation,” Journal of Materials Research, vol. 24, no. 07, pp. 2179–2184, 2009.","short":"W. Lei, C. Notthoff, M. Offer, C. Meier, A. Lorke, C. Jagadish, A.D. Wieck, Journal of Materials Research 24 (2009) 2179–2184.","bibtex":"@article{Lei_Notthoff_Offer_Meier_Lorke_Jagadish_Wieck_2009, title={Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation}, volume={24}, DOI={10.1557/jmr.2009.0293}, number={07}, journal={Journal of Materials Research}, publisher={Cambridge University Press (CUP)}, author={Lei, Wen and Notthoff, Christian and Offer, Matthias and Meier, Cedrik and Lorke, Axel and Jagadish, Chennupati and Wieck, Andreas D.}, year={2009}, pages={2179–2184} }","mla":"Lei, Wen, et al. “Electron Energy Structure of Self-Assembled In(Ga)As Nanostructures Probed by Capacitance-Voltage Spectroscopy and One-Dimensional Numerical Simulation.” Journal of Materials Research, vol. 24, no. 07, Cambridge University Press (CUP), 2009, pp. 2179–84, doi:10.1557/jmr.2009.0293.","apa":"Lei, W., Notthoff, C., Offer, M., Meier, C., Lorke, A., Jagadish, C., & Wieck, A. 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Wieck. “Electron Energy Structure of Self-Assembled In(Ga)As Nanostructures Probed by Capacitance-Voltage Spectroscopy and One-Dimensional Numerical Simulation.” Journal of Materials Research 24, no. 07 (2009): 2179–84. https://doi.org/10.1557/jmr.2009.0293."},"type":"journal_article","year":"2009","page":"2179-2184","user_id":"20798","status":"public","date_created":"2019-02-04T14:46:14Z","volume":24,"author":[{"last_name":"Lei","full_name":"Lei, Wen","first_name":"Wen"},{"last_name":"Notthoff","first_name":"Christian","full_name":"Notthoff, Christian"},{"first_name":"Matthias","full_name":"Offer, Matthias","last_name":"Offer"},{"first_name":"Cedrik","full_name":"Meier, Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","last_name":"Meier","id":"20798"},{"first_name":"Axel","full_name":"Lorke, Axel","last_name":"Lorke"},{"first_name":"Chennupati","full_name":"Jagadish, Chennupati","last_name":"Jagadish"},{"full_name":"Wieck, Andreas D.","first_name":"Andreas D.","last_name":"Wieck"}],"publisher":"Cambridge University Press (CUP)","publication":"Journal of Materials Research","doi":"10.1557/jmr.2009.0293","date_updated":"2022-01-06T07:03:39Z","language":[{"iso":"eng"}],"title":"Electron energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation","publication_identifier":{"issn":["0884-2914","2044-5326"]},"publication_status":"published","department":[{"_id":"15"},{"_id":"230"},{"_id":"287"},{"_id":"35"}]},{"page":"889-894","citation":{"short":"K. Huba, D. Krix, C. Meier, H. Nienhaus, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27 (2009) 889–894.","ieee":"K. Huba, D. Krix, C. Meier, and H. Nienhaus, “Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers,” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, pp. 889–894, 2009.","chicago":"Huba, K., D. Krix, Cedrik Meier, and H. Nienhaus. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27, no. 4 (2009): 889–94. https://doi.org/10.1116/1.3100218.","apa":"Huba, K., Krix, D., Meier, C., & Nienhaus, H. (2009). Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 27(4), 889–894. https://doi.org/10.1116/1.3100218","ama":"Huba K, Krix D, Meier C, Nienhaus H. Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 2009;27(4):889-894. doi:10.1116/1.3100218","mla":"Huba, K., et al. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, American Vacuum Society, 2009, pp. 889–94, doi:10.1116/1.3100218.","bibtex":"@article{Huba_Krix_Meier_Nienhaus_2009, title={Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers}, volume={27}, DOI={10.1116/1.3100218}, number={4}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Huba, K. and Krix, D. and Meier, Cedrik and Nienhaus, H.}, year={2009}, pages={889–894} }"},"year":"2009","type":"journal_article","issue":"4","_id":"7499","intvolume":" 27","volume":27,"date_created":"2019-02-04T14:47:36Z","status":"public","publication":"Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films","author":[{"last_name":"Huba","first_name":"K.","full_name":"Huba, K."},{"full_name":"Krix, D.","first_name":"D.","last_name":"Krix"},{"orcid":"https://orcid.org/0000-0002-3787-3572","full_name":"Meier, Cedrik","first_name":"Cedrik","id":"20798","last_name":"Meier"},{"first_name":"H.","full_name":"Nienhaus, H.","last_name":"Nienhaus"}],"publisher":"American Vacuum Society","user_id":"20798","language":[{"iso":"eng"}],"doi":"10.1116/1.3100218","date_updated":"2022-01-06T07:03:39Z","publication_status":"published","publication_identifier":{"issn":["0734-2101","1520-8559"]},"department":[{"_id":"15"},{"_id":"230"},{"_id":"287"},{"_id":"35"}],"title":"Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers"},{"language":[{"iso":"eng"}],"citation":{"short":"H. Voigt, Kontextsensitive Qualitätsplanung von Softwaremodellen, 2009.","ieee":"H. Voigt, Kontextsensitive Qualitätsplanung von Softwaremodellen. 2009.","apa":"Voigt, H. (2009). Kontextsensitive Qualitätsplanung von Softwaremodellen.","ama":"Voigt H. Kontextsensitive Qualitätsplanung von Softwaremodellen.; 2009.","chicago":"Voigt, Hendrik. Kontextsensitive Qualitätsplanung von Softwaremodellen, 2009.","mla":"Voigt, Hendrik. Kontextsensitive Qualitätsplanung von Softwaremodellen. 2009.","bibtex":"@book{Voigt_2009, title={Kontextsensitive Qualitätsplanung von Softwaremodellen}, author={Voigt, Hendrik}, year={2009} }"},"type":"dissertation","year":"2009","_id":"7574","date_updated":"2022-01-06T07:03:40Z","date_created":"2019-02-06T14:21:13Z","status":"public","department":[{"_id":"66"}],"author":[{"full_name":"Voigt, Hendrik","first_name":"Hendrik","last_name":"Voigt"}],"user_id":"52534","title":"Kontextsensitive Qualitätsplanung von Softwaremodellen","abstract":[{"text":"The Model Quality Plan (MQP) approach provided by us allows for the systematic and efficient development of quality plans that serve as a basis for the assessment of software models. MQP emphasizes the context of a software model as a major factor of influence for the whole quality planning activity. In order to adjust a quality plan to project specific requirements, quality goals are derived from a characterization of that context. We achieve a differentiated description of quality goals by introducing structured goals and questions in combination with a defined quality model. Afterwards, metrics and indicators are identified for checking the fulfillment of the quality goals. The result of our approach consists of a context sensitive quality plan for software models. Conceptually, we combine a metamodel for formulating relevant contents, a process that serves as a guideline for defining quality plans, and a rule concept for packaging and reusing experience into an integrated framework. We show its feasibility by three case studies that include a quality plan for analysis models, design models, and test models, respectively. For that, we provide tool support for the definition and application of quality plans.","lang":"eng"}]},{"user_id":"52534","title":"Platform independent modeling of synthesizable software systems using UML 2","date_created":"2019-02-06T14:22:06Z","status":"public","department":[{"_id":"66"}],"author":[{"last_name":"Schattkowsky","full_name":"Schattkowsky, Tim","first_name":"Tim"}],"date_updated":"2022-01-06T07:03:40Z","_id":"7575","language":[{"iso":"eng"}],"type":"dissertation","citation":{"bibtex":"@book{Schattkowsky_2009, title={Platform independent modeling of synthesizable software systems using UML 2}, author={Schattkowsky, Tim}, year={2009} }","mla":"Schattkowsky, Tim. Platform Independent Modeling of Synthesizable Software Systems Using UML 2. 2009.","ama":"Schattkowsky T. Platform Independent Modeling of Synthesizable Software Systems Using UML 2.; 2009.","apa":"Schattkowsky, T. (2009). Platform independent modeling of synthesizable software systems using UML 2.","chicago":"Schattkowsky, Tim. Platform Independent Modeling of Synthesizable Software Systems Using UML 2, 2009.","ieee":"T. Schattkowsky, Platform independent modeling of synthesizable software systems using UML 2. 2009.","short":"T. Schattkowsky, Platform Independent Modeling of Synthesizable Software Systems Using UML 2, 2009."},"year":"2009"},{"language":[{"iso":"eng"}],"type":"dissertation","citation":{"short":"A. Förster, Pattern Based Business Process Design and Verification, 2009.","ieee":"A. Förster, Pattern based business process design and verification. 2009.","ama":"Förster A. Pattern Based Business Process Design and Verification.; 2009.","apa":"Förster, A. (2009). Pattern based business process design and verification.","chicago":"Förster, Alexander. Pattern Based Business Process Design and Verification, 2009.","bibtex":"@book{Förster_2009, title={Pattern based business process design and verification}, author={Förster, Alexander}, year={2009} }","mla":"Förster, Alexander. Pattern Based Business Process Design and Verification. 2009."},"year":"2009","_id":"7577","date_updated":"2022-01-06T07:03:40Z","status":"public","date_created":"2019-02-06T14:22:40Z","author":[{"last_name":"Förster","full_name":"Förster, Alexander","first_name":"Alexander"}],"department":[{"_id":"66"}],"user_id":"52534","title":"Pattern based business process design and verification"},{"abstract":[{"text":"Enterprise Architecture (EA) has undergone many changes since the IT has found its way into the world of enterprises. The introduction of Service-Oriented Architecture (SOA) is such a change with major consequences. The introduction of an SOA increases the flexibility and thus the productivity of an enterprise architecture, but unfortunately also its complexity. This makes the transformation of an enterprise architecture to an SOA-like enterprise architecture to a challenging and risky task. To overcome the change- and complexity-related problems when introducing SOA, Enterprise Architecture Management (EAM) systems are required. The approach of this thesis suggests a method on how to establish Enterprise Architecture Management that is especially suited for an SOA introduction. This thesis suggests a variant of an EAM system that is especially suited for the introduction of an SOA. The presented method on creating such an EAM system includes guidance on how to define a meta model for Service-Oriented Enterprise Architecture (SOEA), which is harmonized with the respective enterprise architecture. The SOA introduction is especially supported by defining SOA quality criteria and corresponding metrics. Some metrics have to be ascertained by experts. Other metrics have their measuring points within the SOEA models (instances of the SOEA meta model) and their calculation is automatable. Creating and maintaining SOEA models as well as applying the automatable metrics are supported by an eclipse-based tool. As metrics only produce measures that are hard to interpret, indicators are introduced. They allow interpreting the measures concerning the quality criteria. With the help of this EAM system, the transformation of an enterprise to a service-oriented enterprise can be planned and the level of goal-achievement (SOA-conformance of the EA) can be monitored steadily. By this, the contribution of this work aims at the reduction of the risk when introducing an SOA.","lang":"eng"}],"title":"Model-based evaluation of service-oriented enterprise architectures","user_id":"52534","department":[{"_id":"66"}],"author":[{"first_name":"Martin","full_name":"Assmann, Martin","last_name":"Assmann"}],"date_created":"2019-02-06T14:23:06Z","status":"public","date_updated":"2022-01-06T07:03:40Z","_id":"7578","year":"2009","citation":{"ama":"Assmann M. Model-Based Evaluation of Service-Oriented Enterprise Architectures.; 2009.","apa":"Assmann, M. (2009). Model-based evaluation of service-oriented enterprise architectures.","chicago":"Assmann, Martin. Model-Based Evaluation of Service-Oriented Enterprise Architectures, 2009.","mla":"Assmann, Martin. Model-Based Evaluation of Service-Oriented Enterprise Architectures. 2009.","bibtex":"@book{Assmann_2009, title={Model-based evaluation of service-oriented enterprise architectures}, author={Assmann, Martin}, year={2009} }","short":"M. Assmann, Model-Based Evaluation of Service-Oriented Enterprise Architectures, 2009.","ieee":"M. Assmann, Model-based evaluation of service-oriented enterprise architectures. 2009."},"type":"dissertation","language":[{"iso":"eng"}]},{"author":[{"last_name":"Ertl","first_name":"H.","full_name":"Ertl, H."},{"last_name":"Kremer","id":"15280","first_name":"H.-Hugo","full_name":"Kremer, H.-Hugo"}],"department":[{"_id":"211"}],"publication":"SKOPE","status":"public","date_created":"2019-02-08T09:39:43Z","user_id":"74378","title":"Innovation and Reform in College-based VET Contexts: An outline of research in England and Germany","main_file_link":[{"url":"http://www.skope.ox.ac.uk/wp-content/uploads/2014/04/SKOPEWP87.pdf"}],"language":[{"iso":"eng"}],"type":"journal_article","citation":{"ieee":"H. Ertl and H.-H. Kremer, “Innovation and Reform in College-based VET Contexts: An outline of research in England and Germany,” SKOPE, no. 87, 2009.","short":"H. Ertl, H.-H. Kremer, SKOPE (2009).","mla":"Ertl, H., and H. Hugo Kremer. “Innovation and Reform in College-Based VET Contexts: An Outline of Research in England and Germany.” SKOPE, no. 87, 2009.","bibtex":"@article{Ertl_Kremer_2009, title={Innovation and Reform in College-based VET Contexts: An outline of research in England and Germany}, number={87}, journal={SKOPE}, author={Ertl, H. and Kremer, H.-Hugo}, year={2009} }","apa":"Ertl, H., & Kremer, H.-H. (2009). Innovation and Reform in College-based VET Contexts: An outline of research in England and Germany. SKOPE, (87).","ama":"Ertl H, Kremer H-H. Innovation and Reform in College-based VET Contexts: An outline of research in England and Germany. SKOPE. 2009;(87).","chicago":"Ertl, H., and H.-Hugo Kremer. “Innovation and Reform in College-Based VET Contexts: An Outline of Research in England and Germany.” SKOPE, no. 87 (2009)."},"year":"2009","date_updated":"2022-01-06T07:03:40Z","_id":"7605","issue":"87"},{"extern":"1","user_id":"16148","title":"Cornerstones of a renewable energy law for emerging markets in South America","author":[{"full_name":"Kissel, J.","first_name":"J.","last_name":"Kissel"},{"last_name":"Hanitsch","first_name":"Rolf","full_name":"Hanitsch, Rolf"},{"first_name":"Stefan","orcid":"0000-0002-3594-260X","full_name":"Krauter, Stefan","last_name":"Krauter","id":"28836"}],"department":[{"_id":"53"}],"publication":"Energy Policy","status":"public","date_created":"2019-03-05T13:38:09Z","volume":37,"_id":"8349","date_updated":"2022-01-06T07:03:53Z","intvolume":" 37","issue":"9/September 2009","language":[{"iso":"eng"}],"type":"journal_article","citation":{"bibtex":"@article{Kissel_Hanitsch_Krauter_2009, title={Cornerstones of a renewable energy law for emerging markets in South America}, volume={37}, number={9/September 2009}, journal={Energy Policy}, author={Kissel, J. and Hanitsch, Rolf and Krauter, Stefan}, year={2009}, pages={3621–3626} }","mla":"Kissel, J., et al. “Cornerstones of a Renewable Energy Law for Emerging Markets in South America.” Energy Policy, vol. 37, no. 9/September 2009, 2009, pp. 3621–26.","apa":"Kissel, J., Hanitsch, R., & Krauter, S. (2009). Cornerstones of a renewable energy law for emerging markets in South America. Energy Policy, 37(9/September 2009), 3621–3626.","ama":"Kissel J, Hanitsch R, Krauter S. Cornerstones of a renewable energy law for emerging markets in South America. Energy Policy. 2009;37(9/September 2009):3621-3626.","chicago":"Kissel, J., Rolf Hanitsch, and Stefan Krauter. “Cornerstones of a Renewable Energy Law for Emerging Markets in South America.” Energy Policy 37, no. 9/September 2009 (2009): 3621–26.","ieee":"J. Kissel, R. Hanitsch, and S. Krauter, “Cornerstones of a renewable energy law for emerging markets in South America,” Energy Policy, vol. 37, no. 9/September 2009, pp. 3621–3626, 2009.","short":"J. Kissel, R. Hanitsch, S. Krauter, Energy Policy 37 (2009) 3621–3626."},"year":"2009","page":"3621-3626"},{"status":"public","date_created":"2019-03-05T13:40:46Z","author":[{"first_name":"A.","full_name":"Preiss, A.","last_name":"Preiss"},{"first_name":"Stefan","orcid":"0000-0002-3594-260X","full_name":"Krauter, Stefan","last_name":"Krauter","id":"28836"}],"publication":"Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849","department":[{"_id":"53"}],"user_id":"16148","title":"Yield prediction and comparison of a-Si modules","extern":"1","language":[{"iso":"eng"}],"type":"conference","year":"2009","citation":{"short":"A. Preiss, S. Krauter, in: Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849, 2009.","ieee":"A. Preiss and S. Krauter, “Yield prediction and comparison of a-Si modules,” in Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849, 2009.","chicago":"Preiss, A., and Stefan Krauter. “Yield Prediction and Comparison of A-Si Modules.” In Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849, 2009.","apa":"Preiss, A., & Krauter, S. (2009). Yield prediction and comparison of a-Si modules. In Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849.","ama":"Preiss A, Krauter S. Yield prediction and comparison of a-Si modules. In: Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849. ; 2009.","mla":"Preiss, A., and Stefan Krauter. “Yield Prediction and Comparison of A-Si Modules.” Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849, 2009.","bibtex":"@inproceedings{Preiss_Krauter_2009, title={Yield prediction and comparison of a-Si modules}, booktitle={Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849}, author={Preiss, A. and Krauter, Stefan}, year={2009} }"},"date_updated":"2022-01-06T07:03:53Z","_id":"8350","conference":{"name":"24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009"}},{"title":"From Design Models to Test Models by Means of Test Ideas","user_id":"52534","place":"New York, NY, USA","date_created":"2019-03-06T16:20:26Z","status":"public","department":[{"_id":"66"}],"publication":"MoDeVVa '09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation","author":[{"full_name":"Mlynarski, Michael","first_name":"Michael","last_name":"Mlynarski"},{"last_name":"Güldali","full_name":"Güldali, Baris","first_name":"Baris"},{"full_name":"Späth, Melanie","first_name":"Melanie","last_name":"Späth"},{"first_name":"Gregor","full_name":"Engels, Gregor","last_name":"Engels","id":"107"}],"publisher":"ACM","doi":"http://doi.acm.org/10.1145/1656485.1656492","date_updated":"2022-01-06T07:03:55Z","_id":"8431","page":"1-10","citation":{"mla":"Mlynarski, Michael, et al. “From Design Models to Test Models by Means of Test Ideas.” MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation, ACM, 2009, pp. 1–10, doi:http://doi.acm.org/10.1145/1656485.1656492.","bibtex":"@inproceedings{Mlynarski_Güldali_Späth_Engels_2009, place={New York, NY, USA}, title={From Design Models to Test Models by Means of Test Ideas}, DOI={http://doi.acm.org/10.1145/1656485.1656492}, booktitle={MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation}, publisher={ACM}, author={Mlynarski, Michael and Güldali, Baris and Späth, Melanie and Engels, Gregor}, year={2009}, pages={1–10} }","ama":"Mlynarski M, Güldali B, Späth M, Engels G. From Design Models to Test Models by Means of Test Ideas. In: MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation. New York, NY, USA: ACM; 2009:1-10. doi:http://doi.acm.org/10.1145/1656485.1656492","apa":"Mlynarski, M., Güldali, B., Späth, M., & Engels, G. (2009). From Design Models to Test Models by Means of Test Ideas. In MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation (pp. 1–10). New York, NY, USA: ACM. http://doi.acm.org/10.1145/1656485.1656492","chicago":"Mlynarski, Michael, Baris Güldali, Melanie Späth, and Gregor Engels. “From Design Models to Test Models by Means of Test Ideas.” In MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation, 1–10. New York, NY, USA: ACM, 2009. http://doi.acm.org/10.1145/1656485.1656492.","ieee":"M. Mlynarski, B. Güldali, M. Späth, and G. Engels, “From Design Models to Test Models by Means of Test Ideas,” in MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation, 2009, pp. 1–10.","short":"M. Mlynarski, B. Güldali, M. Späth, G. Engels, in: MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven Engineering, Verification and Validation, ACM, New York, NY, USA, 2009, pp. 1–10."},"year":"2009","type":"conference","language":[{"iso":"eng"}]},{"date_updated":"2022-01-06T07:03:55Z","_id":"8432","language":[{"iso":"eng"}],"page":"5","year":"2009","type":"conference","citation":{"short":"G. Engels, in: First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA), ACM Press (New York, NY, USA), New York, NY, USA, 2009, p. 5.","ieee":"G. Engels, “Automatic Generation of Behavioral Code - too ambitious or even unwanted?,” in First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA), 2009, p. 5.","chicago":"Engels, Gregor. “Automatic Generation of Behavioral Code - Too Ambitious or Even Unwanted?” In First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA), 5. New York, NY, USA: ACM Press (New York, NY, USA), 2009.","apa":"Engels, G. (2009). Automatic Generation of Behavioral Code - too ambitious or even unwanted? In First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA) (p. 5). New York, NY, USA: ACM Press (New York, NY, USA).","ama":"Engels G. Automatic Generation of Behavioral Code - too ambitious or even unwanted? In: First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA). New York, NY, USA: ACM Press (New York, NY, USA); 2009:5.","mla":"Engels, Gregor. “Automatic Generation of Behavioral Code - Too Ambitious or Even Unwanted?” First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA), ACM Press (New York, NY, USA), 2009, p. 5.","bibtex":"@inproceedings{Engels_2009, place={New York, NY, USA}, title={Automatic Generation of Behavioral Code - too ambitious or even unwanted?}, booktitle={First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA)}, publisher={ACM Press (New York, NY, USA)}, author={Engels, Gregor}, year={2009}, pages={5} }"},"place":"New York, NY, USA","user_id":"52534","title":"Automatic Generation of Behavioral Code - too ambitious or even unwanted?","publication":"First European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA)","department":[{"_id":"66"}],"author":[{"last_name":"Engels","id":"107","first_name":"Gregor","full_name":"Engels, Gregor"}],"publisher":"ACM Press (New York, NY, USA)","date_created":"2019-03-06T16:20:27Z","status":"public"},{"author":[{"last_name":"Salger","first_name":"Frank","full_name":"Salger, Frank"},{"last_name":"Engels","id":"107","first_name":"Gregor","full_name":"Engels, Gregor"},{"last_name":"Hofmann","full_name":"Hofmann, Alexander","first_name":"Alexander"}],"publication":"Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009)","department":[{"_id":"66"}],"status":"public","date_created":"2019-03-06T16:20:28Z","user_id":"52534","title":"Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study","language":[{"iso":"eng"}],"year":"2009","type":"conference","citation":{"bibtex":"@inproceedings{Salger_Engels_Hofmann_2009, title={Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study}, booktitle={Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009)}, author={Salger, Frank and Engels, Gregor and Hofmann, Alexander}, year={2009}, pages={15–21} }","mla":"Salger, Frank, et al. “Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study.” Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009), 2009, pp. 15–21.","apa":"Salger, F., Engels, G., & Hofmann, A. (2009). Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study. In Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009) (pp. 15–21).","ama":"Salger F, Engels G, Hofmann A. Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study. In: Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009). ; 2009:15-21.","chicago":"Salger, Frank, Gregor Engels, and Alexander Hofmann. “Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study.” In Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009), 15–21, 2009.","ieee":"F. Salger, G. Engels, and A. Hofmann, “Inspection Effectiveness for Different Quality Attributes of Software Requirement Specifications - An Industrial Case Study,” in Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009), 2009, pp. 15–21.","short":"F. Salger, G. Engels, A. Hofmann, in: Proceedings of the ICSE Workshop on Software Quality (WoSQ 2009), 2009, pp. 15–21."},"page":"15-21","_id":"8433","date_updated":"2022-01-06T07:03:55Z"},{"_id":"8434","date_updated":"2022-01-06T07:03:55Z","intvolume":" 453","language":[{"iso":"eng"}],"page":"25-30","year":"2009","type":"conference","citation":{"chicago":"Salger, Frank, Stefan Sauer, and Gregor Engels. “An Integrated Quality Assurance Framework for Specifying Business Information Systems.” In Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands), 453:25–30. CEUR, 2009.","apa":"Salger, F., Sauer, S., & Engels, G. (2009). An Integrated Quality Assurance Framework for Specifying Business Information Systems. In Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands) (Vol. 453, pp. 25–30). CEUR.","ama":"Salger F, Sauer S, Engels G. An Integrated Quality Assurance Framework for Specifying Business Information Systems. In: Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands). Vol 453. CEUR; 2009:25-30.","mla":"Salger, Frank, et al. “An Integrated Quality Assurance Framework for Specifying Business Information Systems.” Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands), vol. 453, CEUR, 2009, pp. 25–30.","bibtex":"@inproceedings{Salger_Sauer_Engels_2009, title={An Integrated Quality Assurance Framework for Specifying Business Information Systems}, volume={453}, booktitle={Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands)}, publisher={CEUR}, author={Salger, Frank and Sauer, Stefan and Engels, Gregor}, year={2009}, pages={25–30} }","short":"F. Salger, S. Sauer, G. Engels, in: Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands), CEUR, 2009, pp. 25–30.","ieee":"F. Salger, S. Sauer, and G. Engels, “An Integrated Quality Assurance Framework for Specifying Business Information Systems,” in Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands), 2009, vol. 453, pp. 25–30."},"abstract":[{"lang":"eng","text":"The software specification acts as a bridge between customers, architects, software developers and testers. If information gets lost or distorted when building this bridge, the wrong system will be built or the system will not be built in time and budget–or both! Standards and recommendations give advice on how to structure specifications or check software-engineering artefacts with reviews or inspections. But these constructive and analytical approaches are not well integrated with each other. Moreover, they are often too generic to efficiently support the specification of particular system types. In this paper, we present the integrated “specification framework” of Capgemini sd&m. It consists of our specification method for business information systems (BIS) and its concerted analytical counterpart, the “specification quality gate”. Since this framework is tailored to the specification of large BIS, it allows a quick ramp-up phase for software engineering projects without the need for extensive tailoring or extension."}],"user_id":"52534","title":"An Integrated Quality Assurance Framework for Specifying Business Information Systems","publication":"Proceedings of the Forum at the CAiSE 2009 Conference, Amsterdam (The Netherlands)","department":[{"_id":"66"}],"author":[{"first_name":"Frank","full_name":"Salger, Frank","last_name":"Salger"},{"last_name":"Sauer","id":"447","first_name":"Stefan","full_name":"Sauer, Stefan"},{"full_name":"Engels, Gregor","first_name":"Gregor","id":"107","last_name":"Engels"}],"publisher":"CEUR","date_created":"2019-03-06T16:20:30Z","status":"public","volume":453},{"abstract":[{"lang":"eng","text":"Visual Process Pattern (VPP) is a visual language to describe constraints on the behavior of UML Activities. They have been developed for the sake of formulating and verifying requirements on business process models (with Activities being one possible description language). In the VPP approach, a visual pattern is translated into an LTL formula, which can then be verified against a transition system describing the behavior of the Activity under consideration. In this paper, we aim at generalizing VPP. We show how to formulate patterns more generally, using either concrete or abstract syntax of the behavioral model under consideration. Additionally, we describe how these more general patterns can be verified against a model’s behavior."}],"user_id":"14955","title":"Towards Generalizing Visual Process Pattern","department":[{"_id":"66"}],"publication":"Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA)","author":[{"full_name":"Soltenborn, Christian","orcid":"0000-0002-0342-8227","first_name":"Christian","id":"1737","last_name":"Soltenborn"},{"last_name":"Engels","id":"107","first_name":"Gregor","full_name":"Engels, Gregor"}],"publisher":"European Association of Software Science and Technology","date_created":"2019-03-06T16:20:31Z","status":"public","volume":25,"date_updated":"2022-01-06T07:03:55Z","_id":"8435","intvolume":" 25","series_title":"Electronic Communications of the EASST","language":[{"iso":"eng"}],"type":"conference","year":"2009","citation":{"ieee":"C. Soltenborn and G. Engels, “Towards Generalizing Visual Process Pattern,” in Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA), 2009, vol. 25.","short":"C. Soltenborn, G. Engels, in: Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA), European Association of Software Science and Technology, 2009.","mla":"Soltenborn, Christian, and Gregor Engels. “Towards Generalizing Visual Process Pattern.” Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA), vol. 25, European Association of Software Science and Technology, 2009.","bibtex":"@inproceedings{Soltenborn_Engels_2009, series={Electronic Communications of the EASST}, title={Towards Generalizing Visual Process Pattern}, volume={25}, booktitle={Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA)}, publisher={European Association of Software Science and Technology}, author={Soltenborn, Christian and Engels, Gregor}, year={2009}, collection={Electronic Communications of the EASST} }","apa":"Soltenborn, C., & Engels, G. (2009). Towards Generalizing Visual Process Pattern. In Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA) (Vol. 25). European Association of Software Science and Technology.","ama":"Soltenborn C, Engels G. Towards Generalizing Visual Process Pattern. In: Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA). Vol 25. Electronic Communications of the EASST. European Association of Software Science and Technology; 2009.","chicago":"Soltenborn, Christian, and Gregor Engels. “Towards Generalizing Visual Process Pattern.” In Proceedings of the 1st International Workshop on Visual Formalisms for Patterns (VFfP 2009), Corvallis, OR (USA), Vol. 25. Electronic Communications of the EASST. European Association of Software Science and Technology, 2009."}},{"title":"Lösungsorientierte Software Produktlinienentwicklung in heterogenen Systemlandschaften","user_id":"52534","author":[{"last_name":"von der Maßen","full_name":"von der Maßen, Thomas","first_name":"Thomas"},{"last_name":"Wübbeke","full_name":"Wübbeke, Andreas","first_name":"Andreas"}],"department":[{"_id":"66"}],"publication":"Proceedings of Produktlinien im Kontext (PIK09)","status":"public","date_created":"2019-03-06T16:20:32Z","_id":"8436","date_updated":"2022-01-06T07:03:55Z","series_title":"Hildesheimer Informatikberichte","year":"2009","citation":{"ieee":"T. von der Maßen and A. Wübbeke, “Lösungsorientierte Software Produktlinienentwicklung in heterogenen Systemlandschaften,” in Proceedings of Produktlinien im Kontext (PIK09), 2009, pp. 15–23.","short":"T. von der Maßen, A. Wübbeke, in: Proceedings of Produktlinien Im Kontext (PIK09), 2009, pp. 15–23.","bibtex":"@inproceedings{von der Maßen_Wübbeke_2009, series={Hildesheimer Informatikberichte}, title={Lösungsorientierte Software Produktlinienentwicklung in heterogenen Systemlandschaften}, booktitle={Proceedings of Produktlinien im Kontext (PIK09)}, author={von der Maßen, Thomas and Wübbeke, Andreas}, year={2009}, pages={15–23}, collection={Hildesheimer Informatikberichte} }","mla":"von der Maßen, Thomas, and Andreas Wübbeke. “Lösungsorientierte Software Produktlinienentwicklung in Heterogenen Systemlandschaften.” Proceedings of Produktlinien Im Kontext (PIK09), 2009, pp. 15–23.","ama":"von der Maßen T, Wübbeke A. Lösungsorientierte Software Produktlinienentwicklung in heterogenen Systemlandschaften. In: Proceedings of Produktlinien Im Kontext (PIK09). Hildesheimer Informatikberichte. ; 2009:15-23.","apa":"von der Maßen, T., & Wübbeke, A. (2009). Lösungsorientierte Software Produktlinienentwicklung in heterogenen Systemlandschaften. In Proceedings of Produktlinien im Kontext (PIK09) (pp. 15–23).","chicago":"Maßen, Thomas von der, and Andreas Wübbeke. “Lösungsorientierte Software Produktlinienentwicklung in Heterogenen Systemlandschaften.” In Proceedings of Produktlinien Im Kontext (PIK09), 15–23. Hildesheimer Informatikberichte, 2009."},"type":"conference","page":"15-23","language":[{"iso":"eng"}]},{"publication_status":"published","publication_identifier":{"issn":["1098-0121","1550-235X"]},"status":"public","date_created":"2019-03-26T07:58:30Z","author":[{"first_name":"M. A.","full_name":"Wilde, M. A.","last_name":"Wilde"},{"id":"37763","last_name":"Reuter","full_name":"Reuter, Dirk","first_name":"Dirk"},{"last_name":"Heyn","first_name":"Ch.","full_name":"Heyn, Ch."},{"last_name":"Wieck","first_name":"A. D.","full_name":"Wieck, A. D."},{"last_name":"Grundler","first_name":"D.","full_name":"Grundler, D."}],"publication":"Physical Review B","department":[{"_id":"15"},{"_id":"230"}],"title":"Inversion-asymmetry-induced spin splitting observed in the quantum oscillatory magnetization of a two-dimensional electron system","user_id":"42514","year":"2009","citation":{"ieee":"M. A. Wilde, D. Reuter, C. Heyn, A. D. Wieck, and D. Grundler, “Inversion-asymmetry-induced spin splitting observed in the quantum oscillatory magnetization of a two-dimensional electron system,” Physical Review B, 2009.","short":"M.A. Wilde, D. Reuter, C. Heyn, A.D. Wieck, D. Grundler, Physical Review B (2009).","bibtex":"@article{Wilde_Reuter_Heyn_Wieck_Grundler_2009, title={Inversion-asymmetry-induced spin splitting observed in the quantum oscillatory magnetization of a two-dimensional electron system}, DOI={10.1103/physrevb.79.125330}, journal={Physical Review B}, author={Wilde, M. A. and Reuter, Dirk and Heyn, Ch. and Wieck, A. D. and Grundler, D.}, year={2009} }","mla":"Wilde, M. A., et al. “Inversion-Asymmetry-Induced Spin Splitting Observed in the Quantum Oscillatory Magnetization of a Two-Dimensional Electron System.” Physical Review B, 2009, doi:10.1103/physrevb.79.125330.","apa":"Wilde, M. A., Reuter, D., Heyn, C., Wieck, A. D., & Grundler, D. (2009). Inversion-asymmetry-induced spin splitting observed in the quantum oscillatory magnetization of a two-dimensional electron system. Physical Review B. https://doi.org/10.1103/physrevb.79.125330","ama":"Wilde MA, Reuter D, Heyn C, Wieck AD, Grundler D. Inversion-asymmetry-induced spin splitting observed in the quantum oscillatory magnetization of a two-dimensional electron system. Physical Review B. 2009. doi:10.1103/physrevb.79.125330","chicago":"Wilde, M. A., Dirk Reuter, Ch. Heyn, A. D. Wieck, and D. Grundler. “Inversion-Asymmetry-Induced Spin Splitting Observed in the Quantum Oscillatory Magnetization of a Two-Dimensional Electron System.” Physical Review B, 2009. https://doi.org/10.1103/physrevb.79.125330."},"type":"journal_article","language":[{"iso":"eng"}],"doi":"10.1103/physrevb.79.125330","_id":"8578","date_updated":"2022-01-06T07:03:57Z"},{"author":[{"first_name":"S. S.","full_name":"Buchholz, S. S.","last_name":"Buchholz"},{"last_name":"Fischer","full_name":"Fischer, S. F.","first_name":"S. F."},{"full_name":"Kunze, U.","first_name":"U.","last_name":"Kunze"},{"id":"37763","last_name":"Reuter","full_name":"Reuter, Dirk","first_name":"Dirk"},{"full_name":"Wieck, A. D.","first_name":"A. 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D.","last_name":"Wieck"}],"department":[{"_id":"15"},{"_id":"230"}],"publication":"Physical Review B","user_id":"42514","title":"Measurement of the Knight field and local nuclear dipole-dipole field in an InGaAs/GaAs quantum dot ensemble"},{"user_id":"42514","title":"Lateral electron tunnelling spectroscopy in etched GaAs/AlGaAs-based nanostructures","author":[{"first_name":"S F","full_name":"Fischer, S F","last_name":"Fischer"},{"full_name":"Deborde, J L","first_name":"J L","last_name":"Deborde"},{"last_name":"Kunze","first_name":"U","full_name":"Kunze, U"},{"last_name":"Reuter","id":"37763","first_name":"Dirk","full_name":"Reuter, Dirk"},{"full_name":"Wieck, A D","first_name":"A D","last_name":"Wieck"}],"publication":"Journal of Physics: Conference Series","department":[{"_id":"15"},{"_id":"230"}],"status":"public","date_created":"2019-03-26T08:58:33Z","publication_status":"published","publication_identifier":{"issn":["1742-6596"]},"_id":"8588","date_updated":"2022-01-06T07:03:57Z","article_number":"012043","doi":"10.1088/1742-6596/193/1/012043","language":[{"iso":"eng"}],"citation":{"ieee":"S. F. Fischer, J. L. Deborde, U. Kunze, D. Reuter, and A. D. Wieck, “Lateral electron tunnelling spectroscopy in etched GaAs/AlGaAs-based nanostructures,” Journal of Physics: Conference Series, 2009.","short":"S.F. Fischer, J.L. Deborde, U. Kunze, D. Reuter, A.D. Wieck, Journal of Physics: Conference Series (2009).","mla":"Fischer, S. F., et al. “Lateral Electron Tunnelling Spectroscopy in Etched GaAs/AlGaAs-Based Nanostructures.” Journal of Physics: Conference Series, 012043, 2009, doi:10.1088/1742-6596/193/1/012043.","bibtex":"@article{Fischer_Deborde_Kunze_Reuter_Wieck_2009, title={Lateral electron tunnelling spectroscopy in etched GaAs/AlGaAs-based nanostructures}, DOI={10.1088/1742-6596/193/1/012043}, number={012043}, journal={Journal of Physics: Conference Series}, author={Fischer, S F and Deborde, J L and Kunze, U and Reuter, Dirk and Wieck, A D}, year={2009} }","ama":"Fischer SF, Deborde JL, Kunze U, Reuter D, Wieck AD. 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