---
_id: '28086'
author:
- first_name: Bea
full_name: Bloh, Bea
id: '69910'
last_name: Bloh
citation:
ama: Bloh B. Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung
am Ende der Grundschulzeit. Münster; 2007.
apa: Bloh, B. (2007). Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung
am Ende der Grundschulzeit. Münster.
bibtex: '@book{Bloh_2007, place={Waxmann}, title={Die Bildungsentscheidung. Zur
Ablehnung der Schulformempfehlung am Ende der Grundschulzeit}, publisher={Münster},
author={Bloh, Bea}, year={2007} }'
chicago: 'Bloh, Bea. Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung
am Ende der Grundschulzeit. Waxmann: Münster, 2007.'
ieee: 'B. Bloh, Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung
am Ende der Grundschulzeit. Waxmann: Münster, 2007.'
mla: Bloh, Bea. Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung
am Ende der Grundschulzeit. Münster, 2007.
short: B. Bloh, Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung
am Ende der Grundschulzeit, Münster, Waxmann, 2007.
date_created: 2021-11-29T16:30:03Z
date_updated: 2022-01-13T19:01:49Z
department:
- _id: '36'
- _id: '456'
extern: '1'
language:
- iso: ger
place: Waxmann
publication_status: published
publisher: Münster
quality_controlled: '1'
status: public
title: Die Bildungsentscheidung. Zur Ablehnung der Schulformempfehlung am Ende der
Grundschulzeit
type: book
user_id: '49044'
year: '2007'
...
---
_id: '28088'
author:
- first_name: Stefanie
full_name: van Ophuysen, Stefanie
last_name: van Ophuysen
- first_name: Bea
full_name: Bloh, Bea
id: '69910'
last_name: Bloh
citation:
ama: 'van Ophuysen S, Bloh B. Transition expectations of German pupils moving to
secondary school. In: ; 2007.'
apa: van Ophuysen, S., & Bloh, B. (2007). Transition expectations of German
pupils moving to secondary school. First International Conference on Transition.
bibtex: '@inproceedings{van Ophuysen_Bloh_2007, title={Transition expectations of
German pupils moving to secondary school}, author={van Ophuysen, Stefanie and
Bloh, Bea}, year={2007} }'
chicago: Ophuysen, Stefanie van, and Bea Bloh. “Transition expectations of German
pupils moving to secondary school,” 2007.
ieee: S. van Ophuysen and B. Bloh, “Transition expectations of German pupils moving
to secondary school,” presented at the First International Conference on Transition,
2007.
mla: van Ophuysen, Stefanie, and Bea Bloh. Transition expectations of German
pupils moving to secondary school. 2007.
short: 'S. van Ophuysen, B. Bloh, in: 2007.'
conference:
name: First International Conference on Transition
date_created: 2021-11-29T16:32:04Z
date_updated: 2022-01-13T19:00:44Z
department:
- _id: '36'
- _id: '456'
extern: '1'
language:
- iso: ger
status: public
title: Transition expectations of German pupils moving to secondary school
type: conference
user_id: '49044'
year: '2007'
...
---
_id: '28089'
author:
- first_name: Bea
full_name: Bloh, Bea
id: '69910'
last_name: Bloh
citation:
ama: 'Bloh B. Entscheidung für einen höheren Bildungsgang: Wie begründen Eltern
die Ablehnung der Schulformempfehlung? In: ; 2007.'
apa: 'Bloh, B. (2007). Entscheidung für einen höheren Bildungsgang: Wie begründen
Eltern die Ablehnung der Schulformempfehlung? AEPF.'
bibtex: '@inproceedings{Bloh_2007, title={Entscheidung für einen höheren Bildungsgang:
Wie begründen Eltern die Ablehnung der Schulformempfehlung?}, author={Bloh, Bea},
year={2007} }'
chicago: 'Bloh, Bea. “Entscheidung für einen höheren Bildungsgang: Wie begründen
Eltern die Ablehnung der Schulformempfehlung?,” 2007.'
ieee: 'B. Bloh, “Entscheidung für einen höheren Bildungsgang: Wie begründen Eltern
die Ablehnung der Schulformempfehlung?,” presented at the AEPF, 2007.'
mla: 'Bloh, Bea. Entscheidung für einen höheren Bildungsgang: Wie begründen Eltern
die Ablehnung der Schulformempfehlung? 2007.'
short: 'B. Bloh, in: 2007.'
conference:
name: AEPF
date_created: 2021-11-29T16:33:36Z
date_updated: 2022-01-13T19:00:54Z
department:
- _id: '36'
- _id: '456'
extern: '1'
language:
- iso: ger
status: public
title: 'Entscheidung für einen höheren Bildungsgang: Wie begründen Eltern die Ablehnung
der Schulformempfehlung?'
type: conference
user_id: '49044'
year: '2007'
...
---
_id: '28091'
author:
- first_name: Bea
full_name: Bloh, Bea
id: '69910'
last_name: Bloh
citation:
ama: 'Bloh B. Was kennzeichnet Eltern, die die Grundschulempfehlung nicht wahrnehmen?
In: ; 2007.'
apa: Bloh, B. (2007). Was kennzeichnet Eltern, die die Grundschulempfehlung nicht
wahrnehmen? DGfE.
bibtex: '@inproceedings{Bloh_2007, title={Was kennzeichnet Eltern, die die Grundschulempfehlung
nicht wahrnehmen?}, author={Bloh, Bea}, year={2007} }'
chicago: Bloh, Bea. “Was kennzeichnet Eltern, die die Grundschulempfehlung nicht
wahrnehmen?,” 2007.
ieee: B. Bloh, “Was kennzeichnet Eltern, die die Grundschulempfehlung nicht wahrnehmen?,”
presented at the DGfE, 2007.
mla: Bloh, Bea. Was kennzeichnet Eltern, die die Grundschulempfehlung nicht wahrnehmen?
2007.
short: 'B. Bloh, in: 2007.'
conference:
name: DGfE
date_created: 2021-11-29T16:35:45Z
date_updated: 2022-01-13T19:01:19Z
department:
- _id: '36'
- _id: '456'
extern: '1'
language:
- iso: ger
status: public
title: Was kennzeichnet Eltern, die die Grundschulempfehlung nicht wahrnehmen?
type: conference
user_id: '49044'
year: '2007'
...
---
_id: '9840'
author:
- first_name: Jarmila
full_name: Mildorf, Jarmila
id: '356'
last_name: Mildorf
citation:
ama: 'Mildorf J. Book review: Katharina Uhsadel (2005). Antonia Byatts Quartet in
der Tradition des Englischen Bildungsromans. Heidelberg: Winter. Anglistik.
2007;18(1):193-194.'
apa: 'Mildorf, J. (2007). Book review: Katharina Uhsadel (2005). Antonia Byatts
Quartet in der Tradition des Englischen Bildungsromans. Heidelberg: Winter. In
Anglistik (Vol. 18, Issue 1, pp. 193–194).'
bibtex: '@article{Mildorf_2007, title={Book review: Katharina Uhsadel (2005). Antonia
Byatts Quartet in der Tradition des Englischen Bildungsromans. Heidelberg: Winter},
volume={18}, number={1}, journal={Anglistik}, author={Mildorf, Jarmila}, year={2007},
pages={193–194} }'
chicago: 'Mildorf, Jarmila. “Book Review: Katharina Uhsadel (2005). Antonia Byatts
Quartet in Der Tradition Des Englischen Bildungsromans. Heidelberg: Winter.” Anglistik,
2007.'
ieee: 'J. Mildorf, “Book review: Katharina Uhsadel (2005). Antonia Byatts Quartet
in der Tradition des Englischen Bildungsromans. Heidelberg: Winter,” Anglistik,
vol. 18, no. 1. pp. 193–194, 2007.'
mla: 'Mildorf, Jarmila. “Book Review: Katharina Uhsadel (2005). Antonia Byatts Quartet
in Der Tradition Des Englischen Bildungsromans. Heidelberg: Winter.” Anglistik,
vol. 18, no. 1, 2007, pp. 193–94.'
short: J. Mildorf, Anglistik 18 (2007) 193–194.
date_created: 2019-05-18T18:21:36Z
date_updated: 2022-01-16T11:47:01Z
department:
- _id: '1'
intvolume: ' 18'
issue: '1'
language:
- iso: eng
page: 193-194
publication: Anglistik
status: public
title: 'Book review: Katharina Uhsadel (2005). Antonia Byatts Quartet in der Tradition
des Englischen Bildungsromans. Heidelberg: Winter'
type: review
user_id: '356'
volume: 18
year: '2007'
...
---
_id: '29385'
author:
- first_name: Korinna
full_name: Schönhärl, Korinna
id: '89037'
last_name: Schönhärl
orcid: 0000-0002-7967-3261
citation:
ama: Schönhärl K. Die Ökonomen des George-Kreises zwischen Historischer Methode
und Ökonometrie 1918-1933. Der Ökonom Kurt Singer und die Methode der Semiotik.
Auskunft Zeitschrift für Bibliothek, Archiv und Information in Norddeutschland.
2007;4:551-568.
apa: Schönhärl, K. (2007). Die Ökonomen des George-Kreises zwischen Historischer
Methode und Ökonometrie 1918-1933. Der Ökonom Kurt Singer und die Methode der
Semiotik. Auskunft. Zeitschrift für Bibliothek, Archiv und Information in Norddeutschland,
4, 551–568.
bibtex: '@article{Schönhärl_2007, title={Die Ökonomen des George-Kreises zwischen
Historischer Methode und Ökonometrie 1918-1933. Der Ökonom Kurt Singer und die
Methode der Semiotik}, volume={4}, journal={Auskunft. Zeitschrift für Bibliothek,
Archiv und Information in Norddeutschland}, author={Schönhärl, Korinna}, year={2007},
pages={551–568} }'
chicago: 'Schönhärl, Korinna. “Die Ökonomen des George-Kreises zwischen Historischer
Methode und Ökonometrie 1918-1933. Der Ökonom Kurt Singer und die Methode der
Semiotik.” Auskunft. Zeitschrift für Bibliothek, Archiv und Information in
Norddeutschland 4 (2007): 551–68.'
ieee: K. Schönhärl, “Die Ökonomen des George-Kreises zwischen Historischer Methode
und Ökonometrie 1918-1933. Der Ökonom Kurt Singer und die Methode der Semiotik,”
Auskunft. Zeitschrift für Bibliothek, Archiv und Information in Norddeutschland,
vol. 4, pp. 551–568, 2007.
mla: Schönhärl, Korinna. “Die Ökonomen des George-Kreises zwischen Historischer
Methode und Ökonometrie 1918-1933. Der Ökonom Kurt Singer und die Methode der
Semiotik.” Auskunft. Zeitschrift für Bibliothek, Archiv und Information in
Norddeutschland, vol. 4, 2007, pp. 551–68.
short: K. Schönhärl, Auskunft. Zeitschrift für Bibliothek, Archiv und Information
in Norddeutschland 4 (2007) 551–568.
date_created: 2022-01-18T08:50:45Z
date_updated: 2022-01-18T08:50:56Z
department:
- _id: '445'
extern: '1'
intvolume: ' 4'
language:
- iso: ger
page: 551-568
publication: Auskunft. Zeitschrift für Bibliothek, Archiv und Information in Norddeutschland
status: public
title: Die Ökonomen des George-Kreises zwischen Historischer Methode und Ökonometrie
1918-1933. Der Ökonom Kurt Singer und die Methode der Semiotik
type: journal_article
user_id: '89037'
volume: 4
year: '2007'
...
---
_id: '20021'
author:
- first_name: S.
full_name: Leyendecker, S.
last_name: Leyendecker
- first_name: Sina
full_name: Ober-Blöbaum, Sina
id: '16494'
last_name: Ober-Blöbaum
- first_name: J.E.
full_name: Marsden, J.E.
last_name: Marsden
- first_name: M.
full_name: Ortiz, M.
last_name: Ortiz
citation:
ama: 'Leyendecker S, Ober-Blöbaum S, Marsden JE, Ortiz M. Discrete mechanics and
optimal control for constrained multibody dynamics. In: 6th International Conference
on Multibody Systems, Nonlinear Dynamics, and Control, ASME International Design
Engineering Technical Conferences. Vol 5. ; 2007:623-632.'
apa: Leyendecker, S., Ober-Blöbaum, S., Marsden, J. E., & Ortiz, M. (2007).
Discrete mechanics and optimal control for constrained multibody dynamics. 6th
International Conference on Multibody Systems, Nonlinear Dynamics, and Control,
ASME International Design Engineering Technical Conferences, 5, 623–632.
bibtex: '@inproceedings{Leyendecker_Ober-Blöbaum_Marsden_Ortiz_2007, title={Discrete
mechanics and optimal control for constrained multibody dynamics}, volume={5},
booktitle={6th International Conference on Multibody Systems, Nonlinear Dynamics,
and Control, ASME International Design Engineering Technical Conferences}, author={Leyendecker,
S. and Ober-Blöbaum, Sina and Marsden, J.E. and Ortiz, M.}, year={2007}, pages={623–632}
}'
chicago: Leyendecker, S., Sina Ober-Blöbaum, J.E. Marsden, and M. Ortiz. “Discrete
Mechanics and Optimal Control for Constrained Multibody Dynamics.” In 6th International
Conference on Multibody Systems, Nonlinear Dynamics, and Control, ASME International
Design Engineering Technical Conferences, 5:623–32, 2007.
ieee: S. Leyendecker, S. Ober-Blöbaum, J. E. Marsden, and M. Ortiz, “Discrete mechanics
and optimal control for constrained multibody dynamics,” in 6th International
Conference on Multibody Systems, Nonlinear Dynamics, and Control, ASME International
Design Engineering Technical Conferences, Las Vegas, Nevada, USA, 2007, vol.
5, pp. 623–632.
mla: Leyendecker, S., et al. “Discrete Mechanics and Optimal Control for Constrained
Multibody Dynamics.” 6th International Conference on Multibody Systems, Nonlinear
Dynamics, and Control, ASME International Design Engineering Technical Conferences,
vol. 5, 2007, pp. 623–32.
short: 'S. Leyendecker, S. Ober-Blöbaum, J.E. Marsden, M. Ortiz, in: 6th International
Conference on Multibody Systems, Nonlinear Dynamics, and Control, ASME International
Design Engineering Technical Conferences, 2007, pp. 623–632.'
conference:
end_date: 2007-09-07
location: Las Vegas, Nevada, USA
start_date: 2007-09-04
date_created: 2020-10-15T15:53:53Z
date_updated: 2022-01-24T07:42:34Z
intvolume: ' 5'
language:
- iso: eng
page: 623-632
publication: 6th International Conference on Multibody Systems, Nonlinear Dynamics,
and Control, ASME International Design Engineering Technical Conferences
status: public
title: Discrete mechanics and optimal control for constrained multibody dynamics
type: conference
user_id: '15694'
volume: 5
year: '2007'
...
---
_id: '31083'
citation:
ama: van Laak L, Kaul S, eds. Ethik des Verstehens. Beiträge zur philosophischen
und literarischen Hermeneutik. Wilhelm Fink Verlag; 2007.
apa: van Laak, L., & Kaul, S. (Eds.). (2007). Ethik des Verstehens. Beiträge
zur philosophischen und literarischen Hermeneutik. Wilhelm Fink Verlag.
bibtex: '@book{van Laak_Kaul_2007, place={München}, title={Ethik des Verstehens.
Beiträge zur philosophischen und literarischen Hermeneutik}, publisher={Wilhelm
Fink Verlag}, year={2007} }'
chicago: 'Laak, Lothar van, and Susanne Kaul, eds. Ethik des Verstehens. Beiträge
zur philosophischen und literarischen Hermeneutik. München: Wilhelm Fink Verlag,
2007.'
ieee: 'L. van Laak and S. Kaul, Eds., Ethik des Verstehens. Beiträge zur philosophischen
und literarischen Hermeneutik. München: Wilhelm Fink Verlag, 2007.'
mla: van Laak, Lothar, and Susanne Kaul, editors. Ethik des Verstehens. Beiträge
zur philosophischen und literarischen Hermeneutik. Wilhelm Fink Verlag, 2007.
short: L. van Laak, S. Kaul, eds., Ethik des Verstehens. Beiträge zur philosophischen
und literarischen Hermeneutik, Wilhelm Fink Verlag, München, 2007.
date_created: 2022-05-09T08:36:34Z
date_updated: 2022-05-10T12:14:46Z
editor:
- first_name: Lothar
full_name: van Laak, Lothar
id: '42976'
last_name: van Laak
- first_name: Susanne
full_name: Kaul, Susanne
last_name: Kaul
language:
- iso: ger
page: '256'
place: München
publisher: Wilhelm Fink Verlag
status: public
title: Ethik des Verstehens. Beiträge zur philosophischen und literarischen Hermeneutik
type: book_editor
user_id: '14931'
year: '2007'
...
---
_id: '12995'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Christian
full_name: G. Zoellin, Christian
last_name: G. Zoellin
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Stefan
full_name: Ludwig, Stefan
last_name: Ludwig
- first_name: Torsten
full_name: Coym, Torsten
last_name: Coym
- first_name: Bernd
full_name: Straube, Bernd
last_name: Straube
citation:
ama: 'Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. A
Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction.
In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI
Systems (DFT’07). IEEE; 2007:50-58. doi:10.1109/dft.2007.43'
apa: Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., &
Straube, B. (2007). A Refined Electrical Model for Particle Strikes and its Impact
on SEU Prediction. 22nd IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT’07), 50–58. https://doi.org/10.1109/dft.2007.43
bibtex: '@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007,
place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and
its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43},
booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in
VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin,
Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and
Straube, Bernd}, year={2007}, pages={50–58} }'
chicago: 'Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan
Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle
Strikes and Its Impact on SEU Prediction.” In 22nd IEEE International Symposium
on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 50–58. Rome, Italy:
IEEE, 2007. https://doi.org/10.1109/dft.2007.43.'
ieee: 'S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B.
Straube, “A Refined Electrical Model for Particle Strikes and its Impact on SEU
Prediction,” in 22nd IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT’07), 2007, pp. 50–58, doi: 10.1109/dft.2007.43.'
mla: Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes
and Its Impact on SEU Prediction.” 22nd IEEE International Symposium on Defect
and Fault-Tolerance in VLSI Systems (DFT’07), IEEE, 2007, pp. 50–58, doi:10.1109/dft.2007.43.
short: 'S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube,
in: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
(DFT’07), IEEE, Rome, Italy, 2007, pp. 50–58.'
date_created: 2019-08-28T10:18:57Z
date_updated: 2022-05-11T16:32:38Z
department:
- _id: '48'
doi: 10.1109/dft.2007.43
language:
- iso: eng
page: 50-58
place: Rome, Italy
publication: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI
Systems (DFT'07)
publisher: IEEE
status: public
title: A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction
type: conference
user_id: '209'
year: '2007'
...
---
_id: '12996'
author:
- first_name: Philipp
full_name: Oehler, Philipp
last_name: Oehler
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Oehler P, Hellebrand S, Wunderlich H-J. Analyzing Test and Repair Times for
2D Integrated Memory Built-in Test and Repair. In: 10th IEEE Workshop on Design
and Diagnostics of Electronic Circuits and Systems (DDECS’07). IEEE; 2007:185-190.
doi:10.1109/ddecs.2007.4295278'
apa: Oehler, P., Hellebrand, S., & Wunderlich, H.-J. (2007). Analyzing Test
and Repair Times for 2D Integrated Memory Built-in Test and Repair. 10th IEEE
Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07),
185–190. https://doi.org/10.1109/ddecs.2007.4295278
bibtex: '@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Krakow, Poland},
title={Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test
and Repair}, DOI={10.1109/ddecs.2007.4295278},
booktitle={10th IEEE Workshop on Design and Diagnostics of Electronic Circuits
and Systems (DDECS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand,
Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={185–190} }'
chicago: 'Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Analyzing
Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.” In 10th
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07),
185–90. Krakow, Poland: IEEE, 2007. https://doi.org/10.1109/ddecs.2007.4295278.'
ieee: 'P. Oehler, S. Hellebrand, and H.-J. Wunderlich, “Analyzing Test and Repair
Times for 2D Integrated Memory Built-in Test and Repair,” in 10th IEEE Workshop
on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 2007,
pp. 185–190, doi: 10.1109/ddecs.2007.4295278.'
mla: Oehler, Philipp, et al. “Analyzing Test and Repair Times for 2D Integrated
Memory Built-in Test and Repair.” 10th IEEE Workshop on Design and Diagnostics
of Electronic Circuits and Systems (DDECS’07), IEEE, 2007, pp. 185–90, doi:10.1109/ddecs.2007.4295278.
short: 'P. Oehler, S. Hellebrand, H.-J. Wunderlich, in: 10th IEEE Workshop on Design
and Diagnostics of Electronic Circuits and Systems (DDECS’07), IEEE, Krakow, Poland,
2007, pp. 185–190.'
date_created: 2019-08-28T10:19:52Z
date_updated: 2022-05-11T16:34:43Z
department:
- _id: '48'
doi: 10.1109/ddecs.2007.4295278
language:
- iso: eng
page: 185-190
place: Krakow, Poland
publication: 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and
Systems (DDECS'07)
publisher: IEEE
status: public
title: Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and
Repair
type: conference
user_id: '209'
year: '2007'
...
---
_id: '12997'
author:
- first_name: Philipp
full_name: Oehler, Philipp
last_name: Oehler
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Oehler P, Hellebrand S, Wunderlich H-J. An Integrated Built-In Test and Repair
Approach for Memories with 2D Redundancy. In: 12th IEEE European Test Symposium
(ETS’07). IEEE; 2007:91-96. doi:10.1109/ets.2007.10'
apa: Oehler, P., Hellebrand, S., & Wunderlich, H.-J. (2007). An Integrated Built-In
Test and Repair Approach for Memories with 2D Redundancy. 12th IEEE European
Test Symposium (ETS’07), 91–96. https://doi.org/10.1109/ets.2007.10
bibtex: '@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany},
title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy},
DOI={10.1109/ets.2007.10}, booktitle={12th
IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp
and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96}
}'
chicago: 'Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An
Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.”
In 12th IEEE European Test Symposium (ETS’07), 91–96. Freiburg, Germany:
IEEE, 2007. https://doi.org/10.1109/ets.2007.10.'
ieee: 'P. Oehler, S. Hellebrand, and H.-J. Wunderlich, “An Integrated Built-In Test
and Repair Approach for Memories with 2D Redundancy,” in 12th IEEE European
Test Symposium (ETS’07), 2007, pp. 91–96, doi: 10.1109/ets.2007.10.'
mla: Oehler, Philipp, et al. “An Integrated Built-In Test and Repair Approach for
Memories with 2D Redundancy.” 12th IEEE European Test Symposium (ETS’07),
IEEE, 2007, pp. 91–96, doi:10.1109/ets.2007.10.
short: 'P. Oehler, S. Hellebrand, H.-J. Wunderlich, in: 12th IEEE European Test
Symposium (ETS’07), IEEE, Freiburg, Germany, 2007, pp. 91–96.'
date_created: 2019-08-28T10:19:53Z
date_updated: 2022-05-11T16:33:32Z
department:
- _id: '48'
doi: 10.1109/ets.2007.10
language:
- iso: eng
page: 91-96
place: Freiburg, Germany
publication: 12th IEEE European Test Symposium (ETS'07)
publisher: IEEE
status: public
title: An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
type: conference
user_id: '209'
year: '2007'
...
---
_id: '13037'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Christian
full_name: G. Zoellin, Christian
last_name: G. Zoellin
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Stefan
full_name: Ludwig, Stefan
last_name: Ludwig
- first_name: Torsten
full_name: Coym, Torsten
last_name: Coym
- first_name: Bernd
full_name: Straube, Bernd
last_name: Straube
citation:
ama: 'Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing
and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality
Assurance. In: 43rd International Conference on Microelectronics, Devices and
Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper).
; 2007.'
apa: Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., &
Straube, B. (2007). Testing and Monitoring Nanoscale Systems - Challenges and
Strategies for Advanced Quality Assurance. 43rd International Conference on
Microelectronics, Devices and Material with the Workshop on Electronic Testing
(MIDEM’07), (Invited Paper).
bibtex: '@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007,
place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges
and Strategies for Advanced Quality Assurance}, booktitle={43rd International
Conference on Microelectronics, Devices and Material with the Workshop on Electronic
Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin,
Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and
Straube, Bernd}, year={2007} }'
chicago: Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan
Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems
- Challenges and Strategies for Advanced Quality Assurance.” In 43rd International
Conference on Microelectronics, Devices and Material with the Workshop on Electronic
Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.
ieee: S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B.
Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies
for Advanced Quality Assurance,” 2007.
mla: Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges
and Strategies for Advanced Quality Assurance.” 43rd International Conference
on Microelectronics, Devices and Material with the Workshop on Electronic Testing
(MIDEM’07), (Invited Paper), 2007.
short: 'S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube,
in: 43rd International Conference on Microelectronics, Devices and Material with
the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), Bled, Slovenia,
2007.'
date_created: 2019-08-28T10:40:00Z
date_updated: 2022-05-11T16:35:35Z
department:
- _id: '48'
language:
- iso: eng
place: Bled, Slovenia
publication: 43rd International Conference on Microelectronics, Devices and Material
with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper)
status: public
title: Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced
Quality Assurance
type: conference
user_id: '209'
year: '2007'
...
---
_id: '13036'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Christian
full_name: G. Zoellin, Christian
last_name: G. Zoellin
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Stefan
full_name: Ludwig, Stefan
last_name: Ludwig
- first_name: Torsten
full_name: Coym, Torsten
last_name: Coym
- first_name: Bernd
full_name: Straube, Bernd
last_name: Straube
citation:
ama: Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing
and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality
Assurance. Informacije MIDEM, Ljubljana (Invited Paper). 2007;37(4 (124)):212-219.
apa: Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., &
Straube, B. (2007). Testing and Monitoring Nanoscale Systems - Challenges and
Strategies for Advanced Quality Assurance. Informacije MIDEM, Ljubljana (Invited
Paper), 37(4 (124)), 212–219.
bibtex: '@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing
and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality
Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana
(Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich,
Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007},
pages={212–219} }'
chicago: 'Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan
Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems
- Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM,
Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.'
ieee: S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B.
Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies
for Advanced Quality Assurance,” Informacije MIDEM, Ljubljana (Invited Paper),
vol. 37, no. 4 (124), pp. 212–219, 2007.
mla: Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges
and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana
(Invited Paper), vol. 37, no. 4 (124), 2007, pp. 212–19.
short: S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube,
Informacije MIDEM, Ljubljana (Invited Paper) 37 (2007) 212–219.
date_created: 2019-08-28T10:39:59Z
date_updated: 2022-05-11T16:36:10Z
department:
- _id: '48'
intvolume: ' 37'
issue: 4 (124)
language:
- iso: eng
page: 212-219
publication: Informacije MIDEM, Ljubljana (Invited Paper)
status: public
title: Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced
Quality Assurance
type: journal_article
user_id: '209'
volume: 37
year: '2007'
...
---
_id: '13044'
author:
- first_name: Muhammad
full_name: Ali, Muhammad
last_name: Ali
- first_name: Sven
full_name: Hessler, Sven
last_name: Hessler
- first_name: Michael
full_name: Welzl, Michael
last_name: Welzl
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Ali M, Hessler S, Welzl M, Hellebrand S. An Efficient Fault Tolerant Mechanism
to Deal with Permanent and Transient Failures in a Network on Chip. International
Journal on High Performance Systems Architecture. 2007;1(2):113-123.
apa: Ali, M., Hessler, S., Welzl, M., & Hellebrand, S. (2007). An Efficient
Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network
on Chip. International Journal on High Performance Systems Architecture,
1(2), 113–123.
bibtex: '@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant
Mechanism to Deal with Permanent and Transient Failures in a Network on Chip},
volume={1}, number={2}, journal={International Journal on High Performance Systems
Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and
Hellebrand, Sybille}, year={2007}, pages={113–123} }'
chicago: 'Ali, Muhammad, Sven Hessler, Michael Welzl, and Sybille Hellebrand. “An
Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures
in a Network on Chip.” International Journal on High Performance Systems Architecture
1, no. 2 (2007): 113–23.'
ieee: M. Ali, S. Hessler, M. Welzl, and S. Hellebrand, “An Efficient Fault Tolerant
Mechanism to Deal with Permanent and Transient Failures in a Network on Chip,”
International Journal on High Performance Systems Architecture, vol. 1,
no. 2, pp. 113–123, 2007.
mla: Ali, Muhammad, et al. “An Efficient Fault Tolerant Mechanism to Deal with Permanent
and Transient Failures in a Network on Chip.” International Journal on High
Performance Systems Architecture, vol. 1, no. 2, 2007, pp. 113–23.
short: M. Ali, S. Hessler, M. Welzl, S. Hellebrand, International Journal on High
Performance Systems Architecture 1 (2007) 113–123.
date_created: 2019-08-28T10:44:52Z
date_updated: 2022-05-11T16:37:57Z
department:
- _id: '48'
intvolume: ' 1'
issue: '2'
language:
- iso: eng
page: 113-123
publication: International Journal on High Performance Systems Architecture
status: public
title: An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient
Failures in a Network on Chip
type: journal_article
user_id: '209'
volume: 1
year: '2007'
...
---
_id: '13040'
author:
- first_name: Muhammad
full_name: Ali, Muhammad
last_name: Ali
- first_name: Michael
full_name: Welzl, Michael
last_name: Welzl
- first_name: Sven
full_name: Hessler, Sven
last_name: Hessler
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Ali M, Welzl M, Hessler S, Hellebrand S. A Fault Tolerant Mechanism for Handling
Permanent and Transient Failures in a Network on Chip. In: 4th International
Conference on Information Technology: New Generations (ITNG’07). ; 2007:1027-1032.'
apa: 'Ali, M., Welzl, M., Hessler, S., & Hellebrand, S. (2007). A Fault Tolerant
Mechanism for Handling Permanent and Transient Failures in a Network on Chip.
4th International Conference on Information Technology: New Generations (ITNG’07),
1027–1032.'
bibtex: '@inproceedings{Ali_Welzl_Hessler_Hellebrand_2007, place={Las Vegas, Nevada,
USA}, title={A Fault Tolerant Mechanism for Handling Permanent and Transient Failures
in a Network on Chip}, booktitle={4th International Conference on Information
Technology: New Generations (ITNG’07)}, author={Ali, Muhammad and Welzl, Michael
and Hessler, Sven and Hellebrand, Sybille}, year={2007}, pages={1027–1032} }'
chicago: 'Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. “A
Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network
on Chip.” In 4th International Conference on Information Technology: New Generations
(ITNG’07), 1027–32. Las Vegas, Nevada, USA, 2007.'
ieee: 'M. Ali, M. Welzl, S. Hessler, and S. Hellebrand, “A Fault Tolerant Mechanism
for Handling Permanent and Transient Failures in a Network on Chip,” in 4th
International Conference on Information Technology: New Generations (ITNG’07),
2007, pp. 1027–1032.'
mla: 'Ali, Muhammad, et al. “A Fault Tolerant Mechanism for Handling Permanent and
Transient Failures in a Network on Chip.” 4th International Conference on Information
Technology: New Generations (ITNG’07), 2007, pp. 1027–32.'
short: 'M. Ali, M. Welzl, S. Hessler, S. Hellebrand, in: 4th International Conference
on Information Technology: New Generations (ITNG’07), Las Vegas, Nevada, USA,
2007, pp. 1027–1032.'
date_created: 2019-08-28T10:42:27Z
date_updated: 2022-05-11T16:36:42Z
department:
- _id: '48'
language:
- iso: eng
page: 1027-1032
place: Las Vegas, Nevada, USA
publication: '4th International Conference on Information Technology: New Generations
(ITNG''07)'
status: public
title: A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in
a Network on Chip
type: conference
user_id: '209'
year: '2007'
...
---
_id: '13041'
author:
- first_name: Bernd
full_name: Becker, Bernd
last_name: Becker
- first_name: Ilia
full_name: Polian, Ilia
last_name: Polian
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Bernd
full_name: Straube, Bernd
last_name: Straube
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Becker B, Polian I, Hellebrand S, Straube B, Wunderlich H-J. Test und Zuverlässigkeit
nanoelektronischer Systeme. In: 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und
Entwurf.” ; 2007.'
apa: Becker, B., Polian, I., Hellebrand, S., Straube, B., & Wunderlich, H.-J.
(2007). Test und Zuverlässigkeit nanoelektronischer Systeme. 1. GMM/GI/ITG-Fachtagung
“Zuverlässigkeit Und Entwurf.”
bibtex: '@inproceedings{Becker_Polian_Hellebrand_Straube_Wunderlich_2007, place={Munich,
Germany}, title={Test und Zuverlässigkeit nanoelektronischer Systeme}, booktitle={1.
GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Becker, Bernd and
Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim},
year={2007} }'
chicago: Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim
Wunderlich. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” In 1. GMM/GI/ITG-Fachtagung
“Zuverlässigkeit Und Entwurf.” Munich, Germany, 2007.
ieee: B. Becker, I. Polian, S. Hellebrand, B. Straube, and H.-J. Wunderlich, “Test
und Zuverlässigkeit nanoelektronischer Systeme,” 2007.
mla: Becker, Bernd, et al. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.”
1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2007.
short: 'B. Becker, I. Polian, S. Hellebrand, B. Straube, H.-J. Wunderlich, in: 1.
GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Munich, Germany, 2007.'
date_created: 2019-08-28T10:42:28Z
date_updated: 2022-05-11T16:37:22Z
department:
- _id: '48'
language:
- iso: eng
place: Munich, Germany
publication: 1. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"
status: public
title: Test und Zuverlässigkeit nanoelektronischer Systeme
type: conference
user_id: '209'
year: '2007'
...
---
_id: '31117'
author:
- first_name: Lothar
full_name: van Laak, Lothar
id: '42976'
last_name: van Laak
citation:
ama: 'van Laak L. Bildlichkeit und Bildkonzepte beim späten Herder. In: Gross S,
Sauder G, eds. Der frühe und der späte Herder. Kontinuität und/oder Korrektur?
Beiträge zur Konferenz der Internationalen Herder Gesellschaft Saarbrücken 2004.
Synchron; 2007:321-329.'
apa: van Laak, L. (2007). Bildlichkeit und Bildkonzepte beim späten Herder. In S.
Gross & G. Sauder (Eds.), Der frühe und der späte Herder. Kontinuität und/oder
Korrektur? Beiträge zur Konferenz der Internationalen Herder Gesellschaft Saarbrücken
2004 (pp. 321–329). Synchron.
bibtex: '@inbook{van Laak_2007, place={Heidelberg}, title={Bildlichkeit und Bildkonzepte
beim späten Herder}, booktitle={Der frühe und der späte Herder. Kontinuität und/oder
Korrektur? Beiträge zur Konferenz der Internationalen Herder Gesellschaft Saarbrücken
2004}, publisher={Synchron}, author={van Laak, Lothar}, editor={Gross, Sabine
and Sauder, Gerhard}, year={2007}, pages={321–329} }'
chicago: 'Laak, Lothar van. “Bildlichkeit und Bildkonzepte beim späten Herder.”
In Der frühe und der späte Herder. Kontinuität und/oder Korrektur? Beiträge
zur Konferenz der Internationalen Herder Gesellschaft Saarbrücken 2004, edited
by Sabine Gross and Gerhard Sauder, 321–29. Heidelberg: Synchron, 2007.'
ieee: 'L. van Laak, “Bildlichkeit und Bildkonzepte beim späten Herder,” in Der
frühe und der späte Herder. Kontinuität und/oder Korrektur? Beiträge zur Konferenz
der Internationalen Herder Gesellschaft Saarbrücken 2004, S. Gross and G.
Sauder, Eds. Heidelberg: Synchron, 2007, pp. 321–329.'
mla: van Laak, Lothar. “Bildlichkeit und Bildkonzepte beim späten Herder.” Der
frühe und der späte Herder. Kontinuität und/oder Korrektur? Beiträge zur Konferenz
der Internationalen Herder Gesellschaft Saarbrücken 2004, edited by Sabine
Gross and Gerhard Sauder, Synchron, 2007, pp. 321–29.
short: 'L. van Laak, in: S. Gross, G. Sauder (Eds.), Der frühe und der späte Herder.
Kontinuität und/oder Korrektur? Beiträge zur Konferenz der Internationalen Herder
Gesellschaft Saarbrücken 2004, Synchron, Heidelberg, 2007, pp. 321–329.'
date_created: 2022-05-09T12:16:50Z
date_updated: 2022-05-12T12:57:27Z
department:
- _id: '465'
editor:
- first_name: Sabine
full_name: Gross, Sabine
last_name: Gross
- first_name: Gerhard
full_name: Sauder, Gerhard
last_name: Sauder
language:
- iso: ger
page: 321-329
place: Heidelberg
publication: Der frühe und der späte Herder. Kontinuität und/oder Korrektur? Beiträge
zur Konferenz der Internationalen Herder Gesellschaft Saarbrücken 2004
publisher: Synchron
status: public
title: Bildlichkeit und Bildkonzepte beim späten Herder
type: book_chapter
user_id: '21240'
year: '2007'
...
---
_id: '31116'
author:
- first_name: Lothar
full_name: van Laak, Lothar
id: '42976'
last_name: van Laak
citation:
ama: 'van Laak L. Gutes Deuten, schlechtes Deuten. Das Prinzip der hermeneutischen
Billigkeit. In: Kaul S, Laak L, eds. Ethik des Verstehens. Beiträge zur philosophischen
und literarischen Hermeneutik. Fink; 2007:83-104.'
apa: van Laak, L. (2007). Gutes Deuten, schlechtes Deuten. Das Prinzip der hermeneutischen
Billigkeit. In S. Kaul & L. Laak (Eds.), Ethik des Verstehens. Beiträge
zur philosophischen und literarischen Hermeneutik (pp. 83–104). Fink.
bibtex: '@inbook{van Laak_2007, place={München}, title={Gutes Deuten, schlechtes
Deuten. Das Prinzip der hermeneutischen Billigkeit}, booktitle={Ethik des Verstehens.
Beiträge zur philosophischen und literarischen Hermeneutik}, publisher={Fink},
author={van Laak, Lothar}, editor={Kaul, Susanne and Laak, Lothar}, year={2007},
pages={83–104} }'
chicago: 'Laak, Lothar van. “Gutes Deuten, schlechtes Deuten. Das Prinzip der hermeneutischen
Billigkeit.” In Ethik des Verstehens. Beiträge zur philosophischen und literarischen
Hermeneutik, edited by Susanne Kaul and Lothar Laak, 83–104. München: Fink,
2007.'
ieee: 'L. van Laak, “Gutes Deuten, schlechtes Deuten. Das Prinzip der hermeneutischen
Billigkeit,” in Ethik des Verstehens. Beiträge zur philosophischen und literarischen
Hermeneutik, S. Kaul and L. Laak, Eds. München: Fink, 2007, pp. 83–104.'
mla: van Laak, Lothar. “Gutes Deuten, schlechtes Deuten. Das Prinzip der hermeneutischen
Billigkeit.” Ethik des Verstehens. Beiträge zur philosophischen und literarischen
Hermeneutik, edited by Susanne Kaul and Lothar Laak, Fink, 2007, pp. 83–104.
short: 'L. van Laak, in: S. Kaul, L. Laak (Eds.), Ethik des Verstehens. Beiträge
zur philosophischen und literarischen Hermeneutik, Fink, München, 2007, pp. 83–104.'
date_created: 2022-05-09T12:10:31Z
date_updated: 2022-05-12T12:57:51Z
department:
- _id: '465'
editor:
- first_name: Susanne
full_name: Kaul, Susanne
last_name: Kaul
- first_name: Lothar
full_name: Laak, Lothar
last_name: Laak
language:
- iso: ger
page: 83-104
place: München
publication: Ethik des Verstehens. Beiträge zur philosophischen und literarischen
Hermeneutik
publisher: Fink
status: public
title: Gutes Deuten, schlechtes Deuten. Das Prinzip der hermeneutischen Billigkeit
type: book_chapter
user_id: '21240'
year: '2007'
...
---
_id: '31118'
author:
- first_name: Lothar
full_name: van Laak, Lothar
id: '42976'
last_name: van Laak
citation:
ama: 'van Laak L. Nachahmung nach der Nachahmungsästhetik – Mimesis und Präsenz
bei Karl Philipp Moritz. In: Kiening C, ed. Mediale Gegenwärtigkeit. Chronos;
2007:225-241.'
apa: van Laak, L. (2007). Nachahmung nach der Nachahmungsästhetik – Mimesis und
Präsenz bei Karl Philipp Moritz. In C. Kiening (Ed.), Mediale Gegenwärtigkeit
(pp. 225–241). Chronos.
bibtex: '@inbook{van Laak_2007, place={Zürich}, title={Nachahmung nach der Nachahmungsästhetik
– Mimesis und Präsenz bei Karl Philipp Moritz}, booktitle={Mediale Gegenwärtigkeit},
publisher={Chronos}, author={van Laak, Lothar}, editor={Kiening, Christian}, year={2007},
pages={225–241} }'
chicago: 'Laak, Lothar van. “Nachahmung nach der Nachahmungsästhetik – Mimesis und
Präsenz bei Karl Philipp Moritz.” In Mediale Gegenwärtigkeit, edited by
Christian Kiening, 225–41. Zürich: Chronos, 2007.'
ieee: 'L. van Laak, “Nachahmung nach der Nachahmungsästhetik – Mimesis und Präsenz
bei Karl Philipp Moritz,” in Mediale Gegenwärtigkeit, C. Kiening, Ed. Zürich:
Chronos, 2007, pp. 225–241.'
mla: van Laak, Lothar. “Nachahmung nach der Nachahmungsästhetik – Mimesis und Präsenz
bei Karl Philipp Moritz.” Mediale Gegenwärtigkeit, edited by Christian
Kiening, Chronos, 2007, pp. 225–41.
short: 'L. van Laak, in: C. Kiening (Ed.), Mediale Gegenwärtigkeit, Chronos, Zürich,
2007, pp. 225–241.'
date_created: 2022-05-09T12:19:33Z
date_updated: 2022-05-12T12:57:06Z
department:
- _id: '465'
editor:
- first_name: Christian
full_name: Kiening, Christian
last_name: Kiening
language:
- iso: ger
page: 225-241
place: Zürich
publication: Mediale Gegenwärtigkeit
publisher: Chronos
status: public
title: Nachahmung nach der Nachahmungsästhetik – Mimesis und Präsenz bei Karl Philipp
Moritz
type: book_chapter
user_id: '21240'
year: '2007'
...
---
_id: '31115'
author:
- first_name: Lothar
full_name: van Laak, Lothar
id: '42976'
last_name: van Laak
- first_name: Susanne
full_name: Kaul, Susanne
last_name: Kaul
citation:
ama: 'van Laak L, Kaul S. Einleitung zum Sammelband. In: Laak L, Kaul S, eds. Ethik
des Verstehens. Beiträge zur philosophischen und literarischen Hermeneutik.
Fink; 2007:9-20.'
apa: van Laak, L., & Kaul, S. (2007). Einleitung zum Sammelband. In L. Laak
& S. Kaul (Eds.), Ethik des Verstehens. Beiträge zur philosophischen und
literarischen Hermeneutik (pp. 9–20). Fink.
bibtex: '@inbook{van Laak_Kaul_2007, place={München}, title={Einleitung zum Sammelband},
booktitle={Ethik des Verstehens. Beiträge zur philosophischen und literarischen
Hermeneutik}, publisher={Fink}, author={van Laak, Lothar and Kaul, Susanne}, editor={Laak,
Lothar and Kaul, Susanne}, year={2007}, pages={9–20} }'
chicago: 'Laak, Lothar van, and Susanne Kaul. “Einleitung zum Sammelband.” In Ethik
des Verstehens. Beiträge zur philosophischen und literarischen Hermeneutik,
edited by Lothar Laak and Susanne Kaul, 9–20. München: Fink, 2007.'
ieee: 'L. van Laak and S. Kaul, “Einleitung zum Sammelband,” in Ethik des Verstehens.
Beiträge zur philosophischen und literarischen Hermeneutik, L. Laak and S.
Kaul, Eds. München: Fink, 2007, pp. 9–20.'
mla: van Laak, Lothar, and Susanne Kaul. “Einleitung zum Sammelband.” Ethik des
Verstehens. Beiträge zur philosophischen und literarischen Hermeneutik, edited
by Lothar Laak and Susanne Kaul, Fink, 2007, pp. 9–20.
short: 'L. van Laak, S. Kaul, in: L. Laak, S. Kaul (Eds.), Ethik des Verstehens.
Beiträge zur philosophischen und literarischen Hermeneutik, Fink, München, 2007,
pp. 9–20.'
date_created: 2022-05-09T11:52:49Z
date_updated: 2022-05-12T12:58:12Z
department:
- _id: '465'
editor:
- first_name: Lothar
full_name: Laak, Lothar
last_name: Laak
- first_name: Susanne
full_name: Kaul, Susanne
last_name: Kaul
language:
- iso: ger
page: 9-20
place: München
publication: Ethik des Verstehens. Beiträge zur philosophischen und literarischen
Hermeneutik
publisher: Fink
status: public
title: Einleitung zum Sammelband
type: book_chapter
user_id: '21240'
year: '2007'
...