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Kappers, et al. “GaN-Based LEDs Grown on 6-Inch Diameter Si (111) Substrates by MOVPE.” In <i>Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII</i>, edited by Klaus P. Streubel, Heonsu Jeon, and Li-Wei Tu, Vol. 7231. SPIE, 2009. <a href=\"https://doi.org/10.1117/12.814919\">https://doi.org/10.1117/12.814919</a>.","apa":"Zhu, D., McAleese, C., McLaughlin, K. K., Häberlen, M., Salcianu, C. O., Thrush, E. J., … Humphreys, C. J. (2009). GaN-based LEDs grown on 6-inch diameter Si (111) substrates by MOVPE. In K. P. Streubel, H. Jeon, &#38; L.-W. Tu (Eds.), <i>Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII</i> (Vol. 7231). San Jose, California (USA): SPIE. <a href=\"https://doi.org/10.1117/12.814919\">https://doi.org/10.1117/12.814919</a>","ieee":"D. Zhu <i>et al.</i>, “GaN-based LEDs grown on 6-inch diameter Si (111) substrates by MOVPE,” in <i>Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII</i>, San Jose, California (USA), 2009, vol. 7231.","ama":"Zhu D, McAleese C, McLaughlin KK, et al. GaN-based LEDs grown on 6-inch diameter Si (111) substrates by MOVPE. In: Streubel KP, Jeon H, Tu L-W, eds. <i>Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII</i>. Vol 7231. SPIE; 2009. doi:<a href=\"https://doi.org/10.1117/12.814919\">10.1117/12.814919</a>","bibtex":"@inproceedings{Zhu_McAleese_McLaughlin_Häberlen_Salcianu_Thrush_Kappers_Phillips_Lane_Wallis_et al._2009, title={GaN-based LEDs grown on 6-inch diameter Si (111) substrates by MOVPE}, volume={7231}, DOI={<a href=\"https://doi.org/10.1117/12.814919\">10.1117/12.814919</a>}, number={723118}, booktitle={Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII}, publisher={SPIE}, author={Zhu, D. and McAleese, C. and McLaughlin, K. K. and Häberlen, M. and Salcianu, C. O. and Thrush, E. J. and Kappers, M. J. and Phillips, W. A. and Lane, P. and Wallis, D. J. and et al.}, editor={Streubel, Klaus P. and Jeon, Heonsu and Tu, Li-WeiEditors}, year={2009} }","mla":"Zhu, D., et al. “GaN-Based LEDs Grown on 6-Inch Diameter Si (111) Substrates by MOVPE.” <i>Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII</i>, edited by Klaus P. Streubel et al., vol. 7231, 723118, SPIE, 2009, doi:<a href=\"https://doi.org/10.1117/12.814919\">10.1117/12.814919</a>."},"intvolume":"      7231","date_updated":"2022-01-06T07:00:39Z","publication_status":"published","author":[{"full_name":"Zhu, D.","first_name":"D.","last_name":"Zhu"},{"first_name":"C.","last_name":"McAleese","full_name":"McAleese, C."},{"last_name":"McLaughlin","first_name":"K. K.","full_name":"McLaughlin, K. K."},{"full_name":"Häberlen, M.","first_name":"M.","last_name":"Häberlen"},{"full_name":"Salcianu, C. O.","first_name":"C. O.","last_name":"Salcianu"},{"first_name":"E. J.","last_name":"Thrush","full_name":"Thrush, E. J."},{"full_name":"Kappers, M. J.","last_name":"Kappers","first_name":"M. J."},{"first_name":"W. A.","last_name":"Phillips","full_name":"Phillips, W. A."},{"first_name":"P.","last_name":"Lane","full_name":"Lane, P."},{"full_name":"Wallis, D. J.","last_name":"Wallis","first_name":"D. J."},{"first_name":"T.","last_name":"Martin","full_name":"Martin, T."},{"full_name":"Astles, M.","last_name":"Astles","first_name":"M."},{"full_name":"Thomas, S.","first_name":"S.","last_name":"Thomas"},{"full_name":"Pakes, A.","last_name":"Pakes","first_name":"A."},{"full_name":"Heuken, M.","first_name":"M.","last_name":"Heuken"},{"last_name":"Humphreys","first_name":"C. J.","full_name":"Humphreys, C. J."}],"year":"2009","title":"GaN-based LEDs grown on 6-inch diameter Si (111) substrates by MOVPE","doi":"10.1117/12.814919","language":[{"iso":"eng"}],"article_number":"723118","abstract":[{"text":"The issues and challenges of growing GaN-based structures on large area Si substrates have been studied. These include Si slip resulting from large temperature non-uniformities and cracking due to differential thermal expansion. Using an AlN nucleation layer in conjunction with an AlGaN buffer layer for stress management, and together with the interactive use of real time in-situ optical monitoring it was possible to realise flat, crack-free and uniform GaN and LED structures on 6-inch Si (111) substrates. The EL performance of processed LED devices was also studied on-wafer, giving good EL characteristics including a forward bias voltage of ~3.5 V at 20 mA from a 500 μm x 500 μm device.","lang":"eng"}],"publication":"Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII","department":[{"_id":"15"}],"type":"conference","date_created":"2018-08-28T13:15:19Z"},{"citation":{"short":"J. Lindner, in: 2009.","chicago":"Lindner, Jörg. “Characterisation of Nanostructured Materials for Electronic and Photonic Information Processing,” 2009.","ieee":"J. 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Ion Implantation: Fundamental Aspects and Recent Applications. In: ; 2009.","ieee":"J. Lindner, “Ion Implantation: Fundamental Aspects and Recent Applications,” presented at the 2nd GRK Convention, Bad Karlshafen (Germany), 2009.","apa":"Lindner, J. (2009). Ion Implantation: Fundamental Aspects and Recent Applications. Presented at the 2nd GRK Convention, Bad Karlshafen (Germany).","chicago":"Lindner, Jörg. “Ion Implantation: Fundamental Aspects and Recent Applications,” 2009.","short":"J. Lindner, in: 2009."},"date_created":"2018-08-28T13:23:22Z","type":"conference","department":[{"_id":"15"}],"status":"public","year":"2009","title":"Ion Implantation: Fundamental Aspects and Recent Applications","author":[{"id":"20797","last_name":"Lindner","first_name":"Jörg","full_name":"Lindner, Jörg"}],"conference":{"end_date":"2009-11-27","location":"Bad Karlshafen (Germany)","start_date":"2009-11-26","name":"2nd GRK Convention"},"date_updated":"2022-01-06T07:00:40Z","language":[{"iso":"eng"}],"_id":"4232","user_id":"55706"},{"citation":{"chicago":"Lindner, Jörg. “Ionenstrahlmodifikation Kleiner Oberflächenbereiche Mittels Selbstorganisierter Nanomasken,” 2009.","short":"J. Lindner, in: 2009.","apa":"Lindner, J. (2009). Ionenstrahlmodifikation kleiner Oberflächenbereiche mittels selbstorganisierter Nanomasken. Presented at the Seminar des RUBION der Ruhr-Universität Bochum, Bochum (Germany).","ieee":"J. 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Synthesis of 2D-Nanostructured ZnO Thin Films using Nanosphere Lithography and Sputter Deposition. In: ; 2009.","short":"F. Reichardt, M. Weinl, D. Gogel, K. Wätje, A. Wixforth, B. Stritzker, J. Lindner, in: 2009.","chicago":"Reichardt, F., M. Weinl, D. Gogel, K. Wätje, A. Wixforth, B. Stritzker, and Jörg Lindner. “Synthesis of 2D-Nanostructured ZnO Thin Films Using Nanosphere Lithography and Sputter Deposition,” 2009.","ieee":"F. Reichardt <i>et al.</i>, “Synthesis of 2D-Nanostructured ZnO Thin Films using Nanosphere Lithography and Sputter Deposition,” presented at the E-MRS Spring Meeting 2009, Straßburg (France), 2009.","apa":"Reichardt, F., Weinl, M., Gogel, D., Wätje, K., Wixforth, A., Stritzker, B., &#38; Lindner, J. (2009). Synthesis of 2D-Nanostructured ZnO Thin Films using Nanosphere Lithography and Sputter Deposition. Presented at the E-MRS Spring Meeting 2009, Straßburg (France).","mla":"Reichardt, F., et al. <i>Synthesis of 2D-Nanostructured ZnO Thin Films Using Nanosphere Lithography and Sputter Deposition</i>. 2009."},"user_id":"55706","_id":"4234","language":[{"iso":"eng"}],"date_updated":"2022-01-06T07:00:40Z","conference":{"end_date":"2009-06-12","name":"E-MRS Spring Meeting 2009","start_date":"2009-06-08","location":"Straßburg (France)"},"author":[{"last_name":"Reichardt","first_name":"F.","full_name":"Reichardt, F."},{"last_name":"Weinl","first_name":"M.","full_name":"Weinl, M."},{"last_name":"Gogel","first_name":"D.","full_name":"Gogel, D."},{"last_name":"Wätje","first_name":"K.","full_name":"Wätje, K."},{"first_name":"A.","last_name":"Wixforth","full_name":"Wixforth, A."},{"last_name":"Stritzker","first_name":"B.","full_name":"Stritzker, B."},{"id":"20797","last_name":"Lindner","first_name":"Jörg","full_name":"Lindner, Jörg"}],"title":"Synthesis of 2D-Nanostructured ZnO Thin Films using Nanosphere Lithography and Sputter Deposition","status":"public","year":"2009"},{"author":[{"first_name":"Deutsches","last_name":"Institut für Normung e.V.","full_name":"Institut für Normung e.V., Deutsches"}],"title":"PAS 1094: Hybride Wertschöpfung --- Integration von Produktion und Dienstleistung.","status":"public","year":"2009","date_updated":"2022-01-06T07:01:36Z","_id":"5072","user_id":"21671","citation":{"apa":"Institut für Normung e.V., D. 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Early Internationalization: A Transaction Cost Economics and Structural Embeddedness Perspective. <i>Journal of International Entrepreneurship (JIE) </i>. 2009;7(4):323-340."},"date_created":"2018-11-14T10:09:38Z","type":"journal_article","department":[{"_id":"274"}],"title":"Early Internationalization: A Transaction Cost Economics and Structural Embeddedness Perspective.","status":"public","year":"2009","author":[{"full_name":"Schwens, C","first_name":"C","last_name":"Schwens"},{"id":"42362","first_name":"Rüdiger","last_name":"Kabst","full_name":"Kabst, Rüdiger"}],"date_updated":"2022-01-06T07:01:59Z","intvolume":"         7","page":"323-340","_id":"5559","language":[{"iso":"eng"}],"user_id":"46632","volume":7},{"volume":18,"user_id":"46632","language":[{"iso":"eng"}],"_id":"5560","page":"509-522","intvolume":"        18","date_updated":"2022-01-06T07:01:59Z","author":[{"full_name":"Schwens, C","first_name":"C","last_name":"Schwens"},{"first_name":"Rüdiger","last_name":"Kabst","full_name":"Kabst, Rüdiger","id":"42362"}],"status":"public","title":"How Early Opposed to Late Internationalizers Learn: Experience of Others and Paradigms of Interpretation.","year":"2009","department":[{"_id":"274"}],"type":"journal_article","date_created":"2018-11-14T10:10:58Z","citation":{"mla":"Schwens, C., and Rüdiger Kabst. “How Early Opposed to Late Internationalizers Learn: Experience of Others and Paradigms of Interpretation.” <i> International Business Review (IBR)</i>, vol. 18, no. 5, 2009, pp. 509–22.","bibtex":"@article{Schwens_Kabst_2009, title={How Early Opposed to Late Internationalizers Learn: Experience of Others and Paradigms of Interpretation.}, volume={18}, number={5}, journal={ International Business Review (IBR)}, author={Schwens, C and Kabst, Rüdiger}, year={2009}, pages={509–522} }","ama":"Schwens C, Kabst R. 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","issue":"6","citation":{"short":"S. Strohmeier, R. Kabst, Journal of Managerial Psychology.  24 (2009) 482–501.","chicago":"Strohmeier, S, and Rüdiger Kabst. “Organisational Adoption of E-HRM in Europe: An Empirical Exploration of Major Adoption Factors. .” <i>Journal of Managerial Psychology. </i> 24, no. 6 (2009): 482–501.","ieee":"S. Strohmeier and R. Kabst, “Organisational adoption of e-HRM in Europe: An empirical exploration of major adoption factors. ,” <i>Journal of Managerial Psychology. </i>, vol. 24, no. 6, pp. 482–501, 2009.","apa":"Strohmeier, S., &#38; Kabst, R. (2009). Organisational adoption of e-HRM in Europe: An empirical exploration of major adoption factors. . <i>Journal of Managerial Psychology. </i>, <i>24</i>(6), 482–501.","bibtex":"@article{Strohmeier_Kabst_2009, title={Organisational adoption of e-HRM in Europe: An empirical exploration of major adoption factors. }, volume={24}, number={6}, journal={Journal of Managerial Psychology. }, author={Strohmeier, S and Kabst, Rüdiger}, year={2009}, pages={482–501} }","ama":"Strohmeier S, Kabst R. Organisational adoption of e-HRM in Europe: An empirical exploration of major adoption factors. . <i>Journal of Managerial Psychology </i>. 2009;24(6):482-501.","mla":"Strohmeier, S., and Rüdiger Kabst. “Organisational Adoption of E-HRM in Europe: An Empirical Exploration of Major Adoption Factors. .” <i>Journal of Managerial Psychology. </i>, vol. 24, no. 6, 2009, pp. 482–501."},"user_id":"46632","volume":24,"page":"482-501","_id":"5562","language":[{"iso":"eng"}],"date_updated":"2022-01-06T07:01:59Z","intvolume":"        24","title":"Organisational adoption of e-HRM in Europe: An empirical exploration of major adoption factors. ","status":"public","year":"2009","author":[{"last_name":"Strohmeier","first_name":"S","full_name":"Strohmeier, S"},{"id":"42362","full_name":"Kabst, Rüdiger","last_name":"Kabst","first_name":"Rüdiger"}]},{"date_updated":"2022-01-06T07:01:59Z","intvolume":"        19","status":"public","year":"2009","title":"Organizational Commitment und Job Involvement in Deutschland und Südkorea: Eine bedürfnisorientierte empirische Analyse.","author":[{"first_name":"Y K","last_name":"Park","full_name":"Park, Y K"},{"first_name":"Rüdiger","last_name":"Kabst","full_name":"Kabst, Rüdiger","id":"42362"},{"id":"43261","full_name":"Steinmetz, Holger","last_name":"Steinmetz","first_name":"Holger"},{"full_name":"Turner, M","first_name":"M","last_name":"Turner"}],"user_id":"46632","volume":19,"page":"1-30","language":[{"iso":"eng"}],"_id":"5564","publication":"Managementforschung. ","citation":{"ama":"Park YK, Kabst R, Steinmetz H, Turner M. Organizational Commitment und Job Involvement in Deutschland und Südkorea: Eine bedürfnisorientierte empirische Analyse. <i>Managementforschung </i>. 2009;19:1-30.","bibtex":"@article{Park_Kabst_Steinmetz_Turner_2009, title={Organizational Commitment und Job Involvement in Deutschland und Südkorea: Eine bedürfnisorientierte empirische Analyse.}, volume={19}, journal={Managementforschung. }, author={Park, Y K and Kabst, Rüdiger and Steinmetz, Holger and Turner, M}, year={2009}, pages={1–30} }","mla":"Park, Y. K., et al. “Organizational Commitment Und Job Involvement in Deutschland Und Südkorea: Eine Bedürfnisorientierte Empirische Analyse.” <i>Managementforschung. </i>, vol. 19, 2009, pp. 1–30.","short":"Y.K. Park, R. Kabst, H. Steinmetz, M. Turner, Managementforschung.  19 (2009) 1–30.","chicago":"Park, Y K, Rüdiger Kabst, Holger Steinmetz, and M Turner. “Organizational Commitment Und Job Involvement in Deutschland Und Südkorea: Eine Bedürfnisorientierte Empirische Analyse.” <i>Managementforschung. </i> 19 (2009): 1–30.","apa":"Park, Y. K., Kabst, R., Steinmetz, H., &#38; Turner, M. (2009). Organizational Commitment und Job Involvement in Deutschland und Südkorea: Eine bedürfnisorientierte empirische Analyse. <i>Managementforschung. </i>, <i>19</i>, 1–30.","ieee":"Y. K. Park, R. Kabst, H. Steinmetz, and M. Turner, “Organizational Commitment und Job Involvement in Deutschland und Südkorea: Eine bedürfnisorientierte empirische Analyse.,” <i>Managementforschung. </i>, vol. 19, pp. 1–30, 2009."},"type":"journal_article","department":[{"_id":"274"}],"date_created":"2018-11-14T10:26:51Z"},{"volume":43,"user_id":"46632","_id":"5566","language":[{"iso":"eng"}],"page":"599-616","intvolume":"        43","date_updated":"2022-01-06T07:01:59Z","author":[{"full_name":"Steinmetz, H","first_name":"H","last_name":"Steinmetz"},{"last_name":"Schmidt","first_name":"P","full_name":"Schmidt, P"},{"full_name":"Tina-Booh, A","last_name":"Tina-Booh","first_name":"A"},{"full_name":"Schwartz, S H","first_name":"S H","last_name":"Schwartz"},{"full_name":"Wieczorek, S","last_name":"Wieczorek","first_name":"S"}],"year":"2009","status":"public","title":"Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement.","department":[{"_id":"274"}],"type":"journal_article","date_created":"2018-11-14T10:47:28Z","citation":{"chicago":"Steinmetz, H, P Schmidt, A Tina-Booh, S H Schwartz, and S Wieczorek. “Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement.” <i>Quality and Quantity. </i> 43, no. 4 (2009): 599–616.","short":"H. Steinmetz, P. Schmidt, A. Tina-Booh, S.H. Schwartz, S. Wieczorek, Quality and Quantity.  43 (2009) 599–616.","ieee":"H. Steinmetz, P. Schmidt, A. Tina-Booh, S. H. Schwartz, and S. Wieczorek, “Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement.,” <i>Quality and Quantity. </i>, vol. 43, no. 4, pp. 599–616, 2009.","apa":"Steinmetz, H., Schmidt, P., Tina-Booh, A., Schwartz, S. H., &#38; Wieczorek, S. (2009). Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement. <i>Quality and Quantity. </i>, <i>43</i>(4), 599–616.","bibtex":"@article{Steinmetz_Schmidt_Tina-Booh_Schwartz_Wieczorek_2009, title={Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement.}, volume={43}, number={4}, journal={Quality and Quantity. }, author={Steinmetz, H and Schmidt, P and Tina-Booh, A and Schwartz, S H and Wieczorek, S}, year={2009}, pages={599–616} }","ama":"Steinmetz H, Schmidt P, Tina-Booh A, Schwartz SH, Wieczorek S. Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement. <i>Quality and Quantity </i>. 2009;43(4):599-616.","mla":"Steinmetz, H., et al. “Testing Measurement Invariance Using Multigroup CFA: Differences between Educational Groups in Human Values Measurement.” <i>Quality and Quantity. </i>, vol. 43, no. 4, 2009, pp. 599–616."},"issue":"4","publication":"Quality and Quantity. "},{"date_created":"2018-11-14T10:51:49Z","type":"journal_article","department":[{"_id":"274"}],"publication":"Journal of International Business Studies (JIBS). ","citation":{"chicago":"Beck, N, Rüdiger Kabst, and P Walgenbach. “The Cultural Dependence of Vocational Training.” <i>Journal of International Business Studies (JIBS). </i> 40 (2009): 1374–95.","short":"N. Beck, R. Kabst, P. Walgenbach, Journal of International Business Studies (JIBS).  40 (2009) 1374–1395.","apa":"Beck, N., Kabst, R., &#38; Walgenbach, P. (2009). The Cultural Dependence of Vocational Training. <i>Journal of International Business Studies (JIBS). </i>, <i>40</i>, 1374–1395.","ieee":"N. Beck, R. Kabst, and P. Walgenbach, “The Cultural Dependence of Vocational Training.,” <i>Journal of International Business Studies (JIBS). </i>, vol. 40, pp. 1374–1395, 2009.","ama":"Beck N, Kabst R, Walgenbach P. The Cultural Dependence of Vocational Training. <i>Journal of International Business Studies (JIBS) </i>. 2009;40:1374-1395.","bibtex":"@article{Beck_Kabst_Walgenbach_2009, title={The Cultural Dependence of Vocational Training.}, volume={40}, journal={Journal of International Business Studies (JIBS). }, author={Beck, N and Kabst, Rüdiger and Walgenbach, P}, year={2009}, pages={1374–1395} }","mla":"Beck, N., et al. “The Cultural Dependence of Vocational Training.” <i>Journal of International Business Studies (JIBS). </i>, vol. 40, 2009, pp. 1374–95."},"page":"1374-1395","language":[{"iso":"eng"}],"_id":"5567","user_id":"46632","volume":40,"title":"The Cultural Dependence of Vocational Training.","year":"2009","status":"public","author":[{"first_name":"N","last_name":"Beck","full_name":"Beck, N"},{"full_name":"Kabst, Rüdiger","last_name":"Kabst","first_name":"Rüdiger","id":"42362"},{"first_name":"P","last_name":"Walgenbach","full_name":"Walgenbach, P"}],"date_updated":"2022-01-06T07:01:59Z","intvolume":"        40"},{"file_date_updated":"2018-12-18T13:15:26Z","publication":"Workshop Elektronische Wahlen, elektronische Teilhabe, Societyware, 39th GI-Jahrestagung","citation":{"mla":"Volkamer, Melanie, et al. “Elektronische Wahlen: Verifizierung vs. Zertifizierung.” <i>Workshop Elektronische Wahlen, Elektronische Teilhabe, Societyware, 39th GI-Jahrestagung</i>, 2009.","bibtex":"@inproceedings{Volkamer_Schryen_Langer_Schmidt_Buchmann_2009, title={Elektronische Wahlen: Verifizierung vs. Zertifizierung}, booktitle={Workshop Elektronische Wahlen, elektronische Teilhabe, Societyware, 39th GI-Jahrestagung}, author={Volkamer, Melanie and Schryen, Guido and Langer, Lucie and Schmidt, Axel and Buchmann, Johannes}, year={2009} }","ama":"Volkamer M, Schryen G, Langer L, Schmidt A, Buchmann J. Elektronische Wahlen: Verifizierung vs. Zertifizierung. In: <i>Workshop Elektronische Wahlen, Elektronische Teilhabe, Societyware, 39th GI-Jahrestagung</i>. ; 2009.","ieee":"M. Volkamer, G. Schryen, L. Langer, A. Schmidt, and J. Buchmann, “Elektronische Wahlen: Verifizierung vs. Zertifizierung,” in <i>Workshop Elektronische Wahlen, elektronische Teilhabe, Societyware, 39th GI-Jahrestagung</i>, 2009.","apa":"Volkamer, M., Schryen, G., Langer, L., Schmidt, A., &#38; Buchmann, J. (2009). Elektronische Wahlen: Verifizierung vs. Zertifizierung. In <i>Workshop Elektronische Wahlen, elektronische Teilhabe, Societyware, 39th GI-Jahrestagung</i>.","short":"M. Volkamer, G. Schryen, L. Langer, A. Schmidt, J. Buchmann, in: Workshop Elektronische Wahlen, Elektronische Teilhabe, Societyware, 39th GI-Jahrestagung, 2009.","chicago":"Volkamer, Melanie, Guido Schryen, Lucie Langer, Axel Schmidt, and Johannes Buchmann. “Elektronische Wahlen: Verifizierung vs. Zertifizierung.” In <i>Workshop Elektronische Wahlen, Elektronische Teilhabe, Societyware, 39th GI-Jahrestagung</i>, 2009."},"extern":"1","abstract":[{"text":"Der Beitrag diskutiert die kontroversen Ans{\\\"a}tze ? Verifizierung versus Evaluation/Zertifizierung ? zur Sicherung elektronischer Wahlen mit Wahlger{\\\"a}ten. Dabei spielt das Urteils des Bundesverfassungsgerichts [BVG099] eine zentrale Rolle. Hierin wird entschieden, dass die Zertifizierung des Wahlger{\\\"a}tes nicht ausreicht und es werden Verifizierungsfunktionen gefordert, die den W{\\\"a}hlern die M{\\\"o}glichkeit geben sich von der Integrit{\\\"a}t des Wahlergebnisses zu {\\\"u}berzeugen. Der Beitrag zeigt auf, dass auch mit der Implementierung entsprechender Verifizierungsfunktionen nicht auf Zertifizierung verzichtet werden kann, da an ein Wahlger{\\\"a}t auch andere Anforderungen wie etwa hinsichtlich des Wahlgeheimnisses gestellt werden. Es wird au{\\ss}erdem die Frage diskutiert, warum der Zertifizierung hinsichtlich dieser zus{\\\"a}tzlichen Anforderungen vertraut werden kann, w{\\\"a}hrend dies nicht der Fall bei der Integrit{\\\"a}tsanforderung ist.","lang":"eng"}],"file":[{"date_created":"2018-12-18T13:15:26Z","creator":"hsiemes","content_type":"application/pdf","file_id":"6313","date_updated":"2018-12-18T13:15:26Z","relation":"main_file","access_level":"open_access","file_size":60870,"file_name":"Elektronische Wahlen - GI 2009.pdf"}],"date_created":"2018-11-14T11:49:04Z","type":"conference","department":[{"_id":"277"}],"oa":"1","title":"Elektronische Wahlen: Verifizierung vs. Zertifizierung","year":"2009","status":"public","author":[{"full_name":"Volkamer, Melanie","last_name":"Volkamer","first_name":"Melanie"},{"id":"72850","full_name":"Schryen, Guido","last_name":"Schryen","first_name":"Guido"},{"full_name":"Langer, Lucie","last_name":"Langer","first_name":"Lucie"},{"first_name":"Axel","last_name":"Schmidt","full_name":"Schmidt, Axel"},{"full_name":"Buchmann, Johannes","last_name":"Buchmann","first_name":"Johannes"}],"date_updated":"2022-01-06T07:02:05Z","has_accepted_license":"1","language":[{"iso":"eng"}],"_id":"5597","user_id":"61579","ddc":["000"]},{"status":"public","has_accepted_license":"1","page":"729-744","_id":"5621","publisher":"IEEE","ddc":["000"],"user_id":"61579","volume":4,"file_date_updated":"2018-12-18T13:16:07Z","citation":{"short":"G. Schryen, E. Rich, IEEE Transactions on Information Forensics \\&#38; Security 4 (2009) 729–744.","chicago":"Schryen, Guido, and Eliot Rich. “Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland.” <i>IEEE Transactions on Information Forensics \\&#38; Security</i> 4, no. 4 Part (2009): 729–44.","apa":"Schryen, G., &#38; Rich, E. (2009). Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland. <i>IEEE Transactions on Information Forensics \\&#38; Security</i>, <i>4</i>(4 Part), 729–744.","ieee":"G. Schryen and E. Rich, “Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland,” <i>IEEE Transactions on Information Forensics \\&#38; Security</i>, vol. 4, no. 4 Part, pp. 729–744, 2009.","ama":"Schryen G, Rich E. Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland. <i>IEEE Transactions on Information Forensics \\&#38; Security</i>. 2009;4(4 Part):729-744.","bibtex":"@article{Schryen_Rich_2009, title={Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland}, volume={4}, number={4 Part}, journal={IEEE Transactions on Information Forensics \\&#38; Security}, publisher={IEEE}, author={Schryen, Guido and Rich, Eliot}, year={2009}, pages={729–744} }","mla":"Schryen, Guido, and Eliot Rich. “Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland.” <i>IEEE Transactions on Information Forensics \\&#38; Security</i>, vol. 4, no. 4 Part, IEEE, 2009, pp. 729–44."},"oa":"1","year":"2009","title":"Security in Large-Scale Internet Elections: A Retrospective Analysis of Elections in Estonia, The Netherlands, and Switzerland","author":[{"id":"72850","last_name":"Schryen","first_name":"Guido","full_name":"Schryen, Guido"},{"last_name":"Rich","first_name":"Eliot","full_name":"Rich, Eliot"}],"date_updated":"2022-01-06T07:02:12Z","intvolume":"         4","language":[{"iso":"eng"}],"issue":"4 Part","publication":"IEEE Transactions on Information Forensics \\& Security","abstract":[{"text":"Remote voting through the Internet provides convenience and access to the electorate. At the same time, the security concerns facing any distributed application are magnified when the task is so crucial to democratic society. In addition, some of the electoral process loses transparency when it is encapsulated in information technology. In this paper, we examine the public record of three recent elections that used Internet voting. Our specific goal is to identify any potential flaws that security experts would recognize, but may have not been identified in the rush to implement technology. To do this, we present a multiple exploratory case study, looking at elections conducted between 2006 and 2007 in Estonia, Netherlands, and Switzerland. These elections were selected as particularly interesting and accessible, and each presents its own technical and security challenges. The electoral environment, technical design and process for each election are described, including reconstruction of details which are implied but not specified within the source material. We found that all three elections warrant significant concern about voter security, verifiability, and transparency. Usability, our fourth area of focus, seems to have been well-addressed in these elections. While our analysis is based on public documents and previously published reports, and therefore lacking access to any confidential materials held by electoral officials, this comparative analysis provides interesting insight and consistent questions across all these cases. Effective review of Internet voting requires an aggressive stance towards identifying potential security and operational flaws, and we encourage the use of third party reviews with critical technology skills during design, programming, and voting to reduce the changes of failure or fraud that would undermine public confidence.","lang":"eng"}],"extern":"1","file":[{"file_id":"6316","content_type":"application/pdf","relation":"main_file","date_updated":"2018-12-18T13:16:07Z","file_name":"JOURNAL VERSION.pdf","file_size":1544790,"access_level":"open_access","date_created":"2018-12-18T13:16:07Z","creator":"hsiemes"}],"date_created":"2018-11-14T14:06:44Z","type":"journal_article","keyword":["e-voting","Internet voting","Internet election","security","verifiability","RIES","Estonia","Neuch{\\^a}tel"],"department":[{"_id":"277"}]},{"_id":"5625","ddc":["000"],"user_id":"61579","status":"public","has_accepted_license":"1","oa":"1","citation":{"short":"G. Schryen, R. Kadura, in: 24th Annual ACM Symposium on Applied Computing, 2009.","chicago":"Schryen, Guido, and Rouven Kadura. “Open Source vs. Closed Source Software: Towards Measuring Security.” In <i>24th Annual ACM Symposium on Applied Computing</i>, 2009.","ieee":"G. Schryen and R. Kadura, “Open Source vs. Closed Source Software: Towards Measuring Security,” in <i>24th Annual ACM Symposium on Applied Computing</i>, 2009.","apa":"Schryen, G., &#38; Kadura, R. (2009). Open Source vs. Closed Source Software: Towards Measuring Security. In <i>24th Annual ACM Symposium on Applied Computing</i>.","bibtex":"@inproceedings{Schryen_Kadura_2009, title={Open Source vs. Closed Source Software: Towards Measuring Security}, booktitle={24th Annual ACM Symposium on Applied Computing}, author={Schryen, Guido and Kadura, Rouven}, year={2009} }","ama":"Schryen G, Kadura R. Open Source vs. Closed Source Software: Towards Measuring Security. In: <i>24th Annual ACM Symposium on Applied Computing</i>. ; 2009.","mla":"Schryen, Guido, and Rouven Kadura. “Open Source vs. Closed Source Software: Towards Measuring Security.” <i>24th Annual ACM Symposium on Applied Computing</i>, 2009."},"file_date_updated":"2018-12-18T13:14:09Z","language":[{"iso":"eng"}],"author":[{"id":"72850","first_name":"Guido","last_name":"Schryen","full_name":"Schryen, Guido"},{"full_name":"Kadura, Rouven","last_name":"Kadura","first_name":"Rouven"}],"year":"2009","title":"Open Source vs. Closed Source Software: Towards Measuring Security","date_updated":"2022-01-06T07:02:13Z","date_created":"2018-11-14T14:12:27Z","file":[{"file_id":"6310","content_type":"application/pdf","file_name":"ACM VERSION.pdf","file_size":456497,"access_level":"open_access","relation":"main_file","date_updated":"2018-12-18T13:14:09Z","date_created":"2018-12-18T13:14:09Z","creator":"hsiemes"}],"department":[{"_id":"277"}],"type":"conference","keyword":["Open source software","Closed source software","Security","Metrics"],"publication":"24th Annual ACM Symposium on Applied Computing","abstract":[{"text":"The increasing availability and deployment of open source software in personal and commercial environments makes open source software highly appealing for hackers, and others who are interested in exploiting software vulnerabilities. This deployment has resulted in a debate ?full of religion? on the security of open source software compared to that of closed source software. However, beyond such arguments, only little quantitative analysis on this research issue has taken place. We discuss the state-of-the-art of the security debate and identify shortcomings. Based on these, we propose new metrics, which allows to answer the question to what extent the review process of open source and closed source development has helped to fix vulnerabilities. We illustrate the application of some of these metrics in a case study on OpenOffice (open source software) vs. Microsoft Office (closed source software).","lang":"eng"}],"extern":"1"},{"publication":"5th International Conference on IT Security Incident Management \\& IT Forensics","file_date_updated":"2018-12-18T13:14:48Z","citation":{"ieee":"G. Schryen, “A comprehensive and comparative analysis of the patching behavior of open source and closed source software vendors,” in <i>5th International Conference on IT Security Incident Management \\&#38; IT Forensics</i>, 2009.","apa":"Schryen, G. (2009). A comprehensive and comparative analysis of the patching behavior of open source and closed source software vendors. In <i>5th International Conference on IT Security Incident Management \\&#38; IT Forensics</i>.","chicago":"Schryen, Guido. “A Comprehensive and Comparative Analysis of the Patching Behavior of Open Source and Closed Source Software Vendors.” In <i>5th International Conference on IT Security Incident Management \\&#38; IT Forensics</i>, 2009.","short":"G. Schryen, in: 5th International Conference on IT Security Incident Management \\&#38; IT Forensics, 2009.","mla":"Schryen, Guido. “A Comprehensive and Comparative Analysis of the Patching Behavior of Open Source and Closed Source Software Vendors.” <i>5th International Conference on IT Security Incident Management \\&#38; IT Forensics</i>, 2009.","bibtex":"@inproceedings{Schryen_2009, title={A comprehensive and comparative analysis of the patching behavior of open source and closed source software vendors}, booktitle={5th International Conference on IT Security Incident Management \\&#38; IT Forensics}, author={Schryen, Guido}, year={2009} }","ama":"Schryen G. A comprehensive and comparative analysis of the patching behavior of open source and closed source software vendors. In: <i>5th International Conference on IT Security Incident Management \\&#38; IT Forensics</i>. ; 2009."},"abstract":[{"lang":"eng","text":"While many theoretical arguments against or in favor of open source and closed source software development have been presented, the empirical basis for the assessment of arguments is still weak. Addressing this research gap, this paper presents a comprehensive empirical investigation of the patching behavior of software vendors/communities of widely deployed open source and closed source software packages, including operating systems, database systems, web browsers, email clients, and office systems. As the value of any empirical study relies on the quality of data available, this paper also discusses in detail data issues, explains to what extent the empirical analysis can be based on vulnerability data contained in the NIST National Vulnerability Database, and shows how data on vulnerability patches was collected by the author to support this study. The results of the analysis suggest that it is not the particular software development style that determines patching behavior, but rather the policy of the particular software vendor."}],"extern":"1","file":[{"creator":"hsiemes","date_created":"2018-12-18T13:14:48Z","file_size":594302,"access_level":"open_access","file_name":"Conference Version.pdf","date_updated":"2018-12-18T13:14:48Z","relation":"main_file","content_type":"application/pdf","file_id":"6311"}],"date_created":"2018-11-14T14:40:04Z","type":"conference","oa":"1","department":[{"_id":"277"}],"title":"A comprehensive and comparative analysis of the patching behavior of open source and closed source software vendors","status":"public","year":"2009","author":[{"id":"72850","full_name":"Schryen, Guido","last_name":"Schryen","first_name":"Guido"}],"date_updated":"2022-01-06T07:02:19Z","has_accepted_license":"1","language":[{"iso":"eng"}],"_id":"5646","ddc":["000"],"user_id":"61579"},{"publication":"15th Americas Conference on Information Systems","abstract":[{"text":"Reviewing literature on open source and closed source security reveals that the discussion is often determined by biased attitudes toward one of these development styles. The discussion specifically lacks appropriate metrics, methodology and hard data. This paper contributes to solving this problem by analyzing and comparing published vulnerabilities of eight open source software and nine closed source software packages, all of which are widely deployed. Thereby, it provides an extensive empirical analysis of vulnerabilities in terms of mean time between vulnerability disclosures, the development of disclosure over time, and the severity of vulnerabilities, and allows for validating models provided in the literature. The investigation reveals that (a) the mean time between vulnerability disclosures was lower for open source software in half of the cases, while the other cases show no differences, (b) in contrast to literature assumption, 14 out of 17 software packages showed a significant linear or piecewise linear correlation between time and the number of published vulnerabilities, and (c) regarding the severity of vulnerabilities, no significant differences were found between open source and closed source.","lang":"eng"}],"extern":"1","file":[{"file_name":"Security of Open Source and Closed Source Software An Empirical - AMCIS Version.pdf","access_level":"open_access","file_size":483690,"relation":"main_file","date_updated":"2018-12-18T13:16:39Z","file_id":"6317","content_type":"application/pdf","creator":"hsiemes","date_created":"2018-12-18T13:16:39Z"}],"date_created":"2018-11-14T14:41:24Z","keyword":["Vulnerabilities","security","open source software","closed source software","empirical comparison"],"type":"conference","department":[{"_id":"277"}],"title":"Security of open source and closed source software: An empirical comparison of published vulnerabilities","year":"2009","author":[{"id":"72850","full_name":"Schryen, Guido","last_name":"Schryen","first_name":"Guido"}],"date_updated":"2022-01-06T07:02:19Z","language":[{"iso":"eng"}],"file_date_updated":"2018-12-18T13:16:39Z","citation":{"ieee":"G. Schryen, “Security of open source and closed source software: An empirical comparison of published vulnerabilities,” in <i>15th Americas Conference on Information Systems</i>, 2009.","apa":"Schryen, G. (2009). Security of open source and closed source software: An empirical comparison of published vulnerabilities. In <i>15th Americas Conference on Information Systems</i>.","short":"G. Schryen, in: 15th Americas Conference on Information Systems, 2009.","chicago":"Schryen, Guido. “Security of Open Source and Closed Source Software: An Empirical Comparison of Published Vulnerabilities.” In <i>15th Americas Conference on Information Systems</i>, 2009.","mla":"Schryen, Guido. “Security of Open Source and Closed Source Software: An Empirical Comparison of Published Vulnerabilities.” <i>15th Americas Conference on Information Systems</i>, 2009.","bibtex":"@inproceedings{Schryen_2009, title={Security of open source and closed source software: An empirical comparison of published vulnerabilities}, booktitle={15th Americas Conference on Information Systems}, author={Schryen, Guido}, year={2009} }","ama":"Schryen G. Security of open source and closed source software: An empirical comparison of published vulnerabilities. In: <i>15th Americas Conference on Information Systems</i>. ; 2009."},"oa":"1","status":"public","has_accepted_license":"1","_id":"5647","ddc":["000"],"user_id":"61579"},{"department":[{"_id":"53"}],"type":"conference","date_created":"2019-01-16T15:57:51Z","citation":{"ama":"Bendfeld J, Tigges M, Voss J. Offshore measurements in the Baltic Sea. In: <i>World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009</i>. ; 2009.","bibtex":"@inproceedings{Bendfeld_Tigges_Voss_2009, title={Offshore measurements in the Baltic Sea}, booktitle={World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009}, author={Bendfeld, Jörg and Tigges, Martin and Voss, Jürgen}, year={2009} }","mla":"Bendfeld, Jörg, et al. “Offshore Measurements in the Baltic Sea.” <i>World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009</i>, 2009.","short":"J. Bendfeld, M. Tigges, J. Voss, in: World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009, 2009.","chicago":"Bendfeld, Jörg, Martin Tigges, and Jürgen Voss. “Offshore Measurements in the Baltic Sea.” In <i>World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009</i>, 2009.","apa":"Bendfeld, J., Tigges, M., &#38; Voss, J. (2009). Offshore measurements in the Baltic Sea. In <i>World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009</i>.","ieee":"J. Bendfeld, M. Tigges, and J. Voss, “Offshore measurements in the Baltic Sea,” in <i>World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009</i>, 2009."},"publication":"World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009","user_id":"16148","language":[{"iso":"eng"}],"_id":"6791","date_updated":"2022-01-06T07:03:19Z","author":[{"full_name":"Bendfeld, Jörg","first_name":"Jörg","last_name":"Bendfeld","id":"16148"},{"last_name":"Tigges","first_name":"Martin","full_name":"Tigges, Martin"},{"first_name":"Jürgen","last_name":"Voss","full_name":"Voss, Jürgen"}],"conference":{"name":"World Sustainable Energy Days (WSED 2009), Wels, Austria, Februar 2009"},"status":"public","title":"Offshore measurements in the Baltic Sea","year":"2009"}]