---
_id: '7003'
citation:
  ama: Dehmel A, Kremer H-H, Schaper N, Sloane PFE, eds. <i>Bildungsperspektiven in
    alternden Gesellschaften</i>. Paderborn; 2009.
  apa: Dehmel, A., Kremer, H.-H., Schaper, N., &#38; Sloane, P. F. E. (Eds.). (2009).
    <i>Bildungsperspektiven in alternden Gesellschaften</i>. Paderborn.
  bibtex: '@book{Dehmel_Kremer_Schaper_Sloane_2009, place={Paderborn}, title={Bildungsperspektiven
    in alternden Gesellschaften}, year={2009} }'
  chicago: Dehmel, A., H.-Hugo Kremer, N. Schaper, and Peter F. E. Sloane, eds. <i>Bildungsperspektiven
    in alternden Gesellschaften</i>. Paderborn, 2009.
  ieee: A. Dehmel, H.-H. Kremer, N. Schaper, and P. F. E. Sloane, Eds., <i>Bildungsperspektiven
    in alternden Gesellschaften</i>. Paderborn, 2009.
  mla: Dehmel, A., et al., editors. <i>Bildungsperspektiven in alternden Gesellschaften</i>.
    2009.
  short: A. Dehmel, H.-H. Kremer, N. Schaper, P.F.E. Sloane, eds., Bildungsperspektiven
    in alternden Gesellschaften, Paderborn, 2009.
date_created: 2019-01-25T12:42:36Z
date_updated: 2022-01-06T07:03:26Z
department:
- _id: '211'
editor:
- first_name: A.
  full_name: Dehmel, A.
  last_name: Dehmel
- first_name: H.-Hugo
  full_name: Kremer, H.-Hugo
  id: '15280'
  last_name: Kremer
- first_name: N.
  full_name: Schaper, N.
  last_name: Schaper
- first_name: Peter F. E.
  full_name: Sloane, Peter F. E.
  id: '503'
  last_name: Sloane
language:
- iso: ger
place: Paderborn
status: public
title: Bildungsperspektiven in alternden Gesellschaften
type: book_editor
user_id: '74378'
year: '2009'
...
---
_id: '7004'
author:
- first_name: H.-Hugo
  full_name: Kremer, H.-Hugo
  id: '15280'
  last_name: Kremer
- first_name: T.
  full_name: Tramm, T.
  last_name: Tramm
- first_name: J.
  full_name: Siemon, J.
  last_name: Siemon
citation:
  ama: Kremer H-H, Tramm T, Siemon J. Praxisphasen in beruflichen Entwicklungsprozessen.
    <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>. 2009;(17).
  apa: Kremer, H.-H., Tramm, T., &#38; Siemon, J. (2009). Praxisphasen in beruflichen
    Entwicklungsprozessen. <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>,
    (17).
  bibtex: '@article{Kremer_Tramm_Siemon_2009, title={Praxisphasen in beruflichen Entwicklungsprozessen},
    number={17}, journal={bwp@ Berufs- und Wirtschaftspädagogik - online}, author={Kremer,
    H.-Hugo and Tramm, T. and Siemon, J.}, year={2009} }'
  chicago: Kremer, H.-Hugo, T. Tramm, and J. Siemon. “Praxisphasen in beruflichen
    Entwicklungsprozessen.” <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>,
    no. 17 (2009).
  ieee: H.-H. Kremer, T. Tramm, and J. Siemon, “Praxisphasen in beruflichen Entwicklungsprozessen,”
    <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>, no. 17, 2009.
  mla: Kremer, H. Hugo, et al. “Praxisphasen in beruflichen Entwicklungsprozessen.”
    <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>, no. 17, 2009.
  short: H.-H. Kremer, T. Tramm, J. Siemon, bwp@ Berufs- und Wirtschaftspädagogik
    - online (2009).
date_created: 2019-01-25T12:49:49Z
date_updated: 2022-01-06T07:03:26Z
department:
- _id: '211'
issue: '17'
language:
- iso: ger
publication: bwp@ Berufs- und Wirtschaftspädagogik - online
status: public
title: Praxisphasen in beruflichen Entwicklungsprozessen
type: journal_article
user_id: '74378'
year: '2009'
...
---
_id: '7058'
author:
- first_name: H.-Hugo
  full_name: Kremer, H.-Hugo
  id: '15280'
  last_name: Kremer
- first_name: C.
  full_name: Gockel, C.
  last_name: Gockel
citation:
  ama: 'Kremer H-H, Gockel C. Schülerbetriebspraktikum im Übergangssystem - Relevanz,
    Potenziale und Gestaltungsanforderungen . In: Tramm T, Kremer H-H, Dilger B, eds.
    <i>bwp@ Ausgabe 17, Praxisphasen in beruflichen Entwicklungsprozessen</i>. ; 2009.'
  apa: Kremer, H.-H., &#38; Gockel, C. (2009). Schülerbetriebspraktikum im Übergangssystem
    - Relevanz, Potenziale und Gestaltungsanforderungen . In T. Tramm, H.-H. Kremer,
    &#38; B. Dilger (Eds.), <i>bwp@ Ausgabe 17, Praxisphasen in beruflichen Entwicklungsprozessen</i>.
  bibtex: '@inbook{Kremer_Gockel_2009, title={Schülerbetriebspraktikum im Übergangssystem
    - Relevanz, Potenziale und Gestaltungsanforderungen }, booktitle={bwp@ Ausgabe
    17, Praxisphasen in beruflichen Entwicklungsprozessen}, author={Kremer, H.-Hugo
    and Gockel, C.}, editor={Tramm, T. and Kremer, H.-Hugo and Dilger, B.Editors},
    year={2009} }'
  chicago: Kremer, H.-Hugo, and C. Gockel. “Schülerbetriebspraktikum im Übergangssystem
    - Relevanz, Potenziale und Gestaltungsanforderungen .” In <i>bwp@ Ausgabe 17,
    Praxisphasen in beruflichen Entwicklungsprozessen</i>, edited by T. Tramm, H.-Hugo
    Kremer, and B. Dilger, 2009.
  ieee: H.-H. Kremer and C. Gockel, “Schülerbetriebspraktikum im Übergangssystem -
    Relevanz, Potenziale und Gestaltungsanforderungen ,” in <i>bwp@ Ausgabe 17, Praxisphasen
    in beruflichen Entwicklungsprozessen</i>, T. Tramm, H.-H. Kremer, and B. Dilger,
    Eds. 2009.
  mla: Kremer, H. Hugo, and C. Gockel. “Schülerbetriebspraktikum im Übergangssystem
    - Relevanz, Potenziale und Gestaltungsanforderungen .” <i>bwp@ Ausgabe 17, Praxisphasen
    in beruflichen Entwicklungsprozessen</i>, edited by T. Tramm et al., 2009.
  short: 'H.-H. Kremer, C. Gockel, in: T. Tramm, H.-H. Kremer, B. Dilger (Eds.), bwp@
    Ausgabe 17, Praxisphasen in beruflichen Entwicklungsprozessen, 2009.'
date_created: 2019-01-29T10:02:32Z
date_updated: 2022-01-06T07:03:27Z
department:
- _id: '211'
editor:
- first_name: T.
  full_name: Tramm, T.
  last_name: Tramm
- first_name: H.-Hugo
  full_name: Kremer, H.-Hugo
  last_name: Kremer
- first_name: B.
  full_name: Dilger, B.
  last_name: Dilger
language:
- iso: ger
main_file_link:
- url: http://bwpat.de/ausgabe17/kremer_gockel_bwpat17.pdf
publication: bwp@ Ausgabe 17, Praxisphasen in beruflichen Entwicklungsprozessen
status: public
title: 'Schülerbetriebspraktikum im Übergangssystem - Relevanz, Potenziale und Gestaltungsanforderungen '
type: book_chapter
user_id: '44715'
year: '2009'
...
---
_id: '7365'
author:
- first_name: Gregor
  full_name: Engels, Gregor
  id: '107'
  last_name: Engels
citation:
  ama: Engels G. Guest Editorial to the Special Section on MODELS 2007. <i>Software
    &#38; Systems Modeling</i>. 2009;9(1):5-6. doi:<a href="https://doi.org/10.1007/s10270-009-0140-5">10.1007/s10270-009-0140-5</a>
  apa: Engels, G. (2009). Guest Editorial to the Special Section on MODELS 2007. <i>Software
    &#38; Systems Modeling</i>, <i>9</i>(1), 5–6. <a href="https://doi.org/10.1007/s10270-009-0140-5">https://doi.org/10.1007/s10270-009-0140-5</a>
  bibtex: '@article{Engels_2009, title={Guest Editorial to the Special Section on
    MODELS 2007}, volume={9}, DOI={<a href="https://doi.org/10.1007/s10270-009-0140-5">10.1007/s10270-009-0140-5</a>},
    number={1}, journal={Software &#38; Systems Modeling}, publisher={Springer Nature},
    author={Engels, Gregor}, year={2009}, pages={5–6} }'
  chicago: 'Engels, Gregor. “Guest Editorial to the Special Section on MODELS 2007.”
    <i>Software &#38; Systems Modeling</i> 9, no. 1 (2009): 5–6. <a href="https://doi.org/10.1007/s10270-009-0140-5">https://doi.org/10.1007/s10270-009-0140-5</a>.'
  ieee: G. Engels, “Guest Editorial to the Special Section on MODELS 2007,” <i>Software
    &#38; Systems Modeling</i>, vol. 9, no. 1, pp. 5–6, 2009.
  mla: Engels, Gregor. “Guest Editorial to the Special Section on MODELS 2007.” <i>Software
    &#38; Systems Modeling</i>, vol. 9, no. 1, Springer Nature, 2009, pp. 5–6, doi:<a
    href="https://doi.org/10.1007/s10270-009-0140-5">10.1007/s10270-009-0140-5</a>.
  short: G. Engels, Software &#38; Systems Modeling 9 (2009) 5–6.
date_created: 2019-01-31T15:18:20Z
date_updated: 2022-01-06T07:03:35Z
department:
- _id: '66'
doi: 10.1007/s10270-009-0140-5
intvolume: '         9'
issue: '1'
language:
- iso: eng
page: 5-6
publication: Software & Systems Modeling
publication_identifier:
  issn:
  - 1619-1366
  - 1619-1374
publication_status: published
publisher: Springer Nature
status: public
title: Guest Editorial to the Special Section on MODELS 2007
type: journal_article
user_id: '52534'
volume: 9
year: '2009'
...
---
_id: '7366'
author:
- first_name: Michael
  full_name: Spijkerman, Michael
  last_name: Spijkerman
- first_name: Tobias
  full_name: Eckardt, Tobias
  last_name: Eckardt
citation:
  ama: Spijkerman M, Eckardt T. Modellbasiertes Testen auf Basis des fundamentalen
    Testprozesses. <i>Softwaretechnik-Trends</i>. 2009;29(4).
  apa: Spijkerman, M., &#38; Eckardt, T. (2009). Modellbasiertes Testen auf Basis
    des fundamentalen Testprozesses. <i>Softwaretechnik-Trends</i>, <i>29</i>(4).
  bibtex: '@article{Spijkerman_Eckardt_2009, title={Modellbasiertes Testen auf Basis
    des fundamentalen Testprozesses}, volume={29}, number={4}, journal={Softwaretechnik-Trends},
    author={Spijkerman, Michael and Eckardt, Tobias}, year={2009} }'
  chicago: Spijkerman, Michael, and Tobias Eckardt. “Modellbasiertes Testen Auf Basis
    Des Fundamentalen Testprozesses.” <i>Softwaretechnik-Trends</i> 29, no. 4 (2009).
  ieee: M. Spijkerman and T. Eckardt, “Modellbasiertes Testen auf Basis des fundamentalen
    Testprozesses,” <i>Softwaretechnik-Trends</i>, vol. 29, no. 4, 2009.
  mla: Spijkerman, Michael, and Tobias Eckardt. “Modellbasiertes Testen Auf Basis
    Des Fundamentalen Testprozesses.” <i>Softwaretechnik-Trends</i>, vol. 29, no.
    4, 2009.
  short: M. Spijkerman, T. Eckardt, Softwaretechnik-Trends 29 (2009).
date_created: 2019-01-31T15:19:07Z
date_updated: 2022-01-06T07:03:35Z
department:
- _id: '66'
intvolume: '        29'
issue: '4'
language:
- iso: eng
publication: Softwaretechnik-Trends
status: public
title: Modellbasiertes Testen auf Basis des fundamentalen Testprozesses
type: journal_article
user_id: '52534'
volume: 29
year: '2009'
...
---
_id: '7367'
author:
- first_name: Stefan
  full_name: Sauer, Stefan
  id: '447'
  last_name: Sauer
- first_name: Gregor
  full_name: Engels, Gregor
  id: '107'
  last_name: Engels
- first_name: Johannes
  full_name: Willkomm, Johannes
  last_name: Willkomm
- first_name: Andrea
  full_name: Baumann, Andrea
  last_name: Baumann
- first_name: Alexander
  full_name: Hofmann, Alexander
  last_name: Hofmann
citation:
  ama: Sauer S, Engels G, Willkomm J, Baumann A, Hofmann A. A Holistic Software Engineering
    Method for Service-Oriented Application Landscape Development. <i>Advances in
    Enterprise Engineering II</i>. 2009:1-17.
  apa: Sauer, S., Engels, G., Willkomm, J., Baumann, A., &#38; Hofmann, A. (2009).
    A Holistic Software Engineering Method for Service-Oriented Application Landscape
    Development. <i>Advances in Enterprise Engineering II</i>, 1–17.
  bibtex: '@article{Sauer_Engels_Willkomm_Baumann_Hofmann_2009, title={A Holistic
    Software Engineering Method for Service-Oriented Application Landscape Development},
    journal={Advances in Enterprise Engineering II}, author={Sauer, Stefan and Engels,
    Gregor and Willkomm, Johannes and Baumann, Andrea and Hofmann, Alexander}, year={2009},
    pages={1–17} }'
  chicago: Sauer, Stefan, Gregor Engels, Johannes Willkomm, Andrea Baumann, and Alexander
    Hofmann. “A Holistic Software Engineering Method for Service-Oriented Application
    Landscape Development.” <i>Advances in Enterprise Engineering II</i>, 2009, 1–17.
  ieee: S. Sauer, G. Engels, J. Willkomm, A. Baumann, and A. Hofmann, “A Holistic
    Software Engineering Method for Service-Oriented Application Landscape Development,”
    <i>Advances in Enterprise Engineering II</i>, pp. 1–17, 2009.
  mla: Sauer, Stefan, et al. “A Holistic Software Engineering Method for Service-Oriented
    Application Landscape Development.” <i>Advances in Enterprise Engineering II</i>,
    2009, pp. 1–17.
  short: S. Sauer, G. Engels, J. Willkomm, A. Baumann, A. Hofmann, Advances in Enterprise
    Engineering II (2009) 1–17.
date_created: 2019-01-31T15:19:42Z
date_updated: 2022-01-06T07:03:35Z
department:
- _id: '66'
language:
- iso: eng
page: 1-17
publication: Advances in Enterprise Engineering II
status: public
title: A Holistic Software Engineering Method for Service-Oriented Application Landscape
  Development
type: journal_article
user_id: '52534'
year: '2009'
...
---
_id: '7368'
author:
- first_name: Gregor
  full_name: Engels, Gregor
  id: '107'
  last_name: Engels
- first_name: Michael
  full_name: Goedicke, Michael
  last_name: Goedicke
- first_name: Ursula
  full_name: Goltz, Ursula
  last_name: Goltz
- first_name: Andreas
  full_name: Rausch, Andreas
  last_name: Rausch
- first_name: Ralf
  full_name: Reussner, Ralf
  last_name: Reussner
citation:
  ama: Engels G, Goedicke M, Goltz U, Rausch A, Reussner R. Design for Future – Legacy-Probleme
    von morgen vermeidbar? <i>Informatik-Spektrum</i>. 2009;32(5):393-397. doi:<a
    href="https://doi.org/10.1007/s00287-009-0356-3">10.1007/s00287-009-0356-3</a>
  apa: Engels, G., Goedicke, M., Goltz, U., Rausch, A., &#38; Reussner, R. (2009).
    Design for Future – Legacy-Probleme von morgen vermeidbar? <i>Informatik-Spektrum</i>,
    <i>32</i>(5), 393–397. <a href="https://doi.org/10.1007/s00287-009-0356-3">https://doi.org/10.1007/s00287-009-0356-3</a>
  bibtex: '@article{Engels_Goedicke_Goltz_Rausch_Reussner_2009, title={Design for
    Future – Legacy-Probleme von morgen vermeidbar?}, volume={32}, DOI={<a href="https://doi.org/10.1007/s00287-009-0356-3">10.1007/s00287-009-0356-3</a>},
    number={5}, journal={Informatik-Spektrum}, publisher={Springer Nature}, author={Engels,
    Gregor and Goedicke, Michael and Goltz, Ursula and Rausch, Andreas and Reussner,
    Ralf}, year={2009}, pages={393–397} }'
  chicago: 'Engels, Gregor, Michael Goedicke, Ursula Goltz, Andreas Rausch, and Ralf
    Reussner. “Design for Future – Legacy-Probleme von morgen vermeidbar?” <i>Informatik-Spektrum</i>
    32, no. 5 (2009): 393–97. <a href="https://doi.org/10.1007/s00287-009-0356-3">https://doi.org/10.1007/s00287-009-0356-3</a>.'
  ieee: G. Engels, M. Goedicke, U. Goltz, A. Rausch, and R. Reussner, “Design for
    Future – Legacy-Probleme von morgen vermeidbar?,” <i>Informatik-Spektrum</i>,
    vol. 32, no. 5, pp. 393–397, 2009.
  mla: Engels, Gregor, et al. “Design for Future – Legacy-Probleme von morgen vermeidbar?”
    <i>Informatik-Spektrum</i>, vol. 32, no. 5, Springer Nature, 2009, pp. 393–97,
    doi:<a href="https://doi.org/10.1007/s00287-009-0356-3">10.1007/s00287-009-0356-3</a>.
  short: G. Engels, M. Goedicke, U. Goltz, A. Rausch, R. Reussner, Informatik-Spektrum
    32 (2009) 393–397.
date_created: 2019-01-31T15:22:05Z
date_updated: 2022-01-06T07:03:35Z
department:
- _id: '66'
doi: 10.1007/s00287-009-0356-3
intvolume: '        32'
issue: '5'
language:
- iso: ger
page: 393-397
publication: Informatik-Spektrum
publication_identifier:
  issn:
  - 0170-6012
  - 1432-122X
publication_status: published
publisher: Springer Nature
status: public
title: Design for Future – Legacy-Probleme von morgen vermeidbar?
type: journal_article
user_id: '52534'
volume: 32
year: '2009'
...
---
_id: '7441'
author:
- first_name: S
  full_name: Helm, S
  last_name: Helm
- first_name: A
  full_name: Eggert, A
  last_name: Eggert
- first_name: I
  full_name: Garnefeld, I
  last_name: Garnefeld
citation:
  ama: 'Helm S, Eggert A, Garnefeld I. Modelling the Impact of Corporate Reputation
    on Customer Satisfaction and Loyalty Using PLS. In: Esposito Vinzi V, Chin W,
    Henseler J, Wang H, eds. <i>Handbook of Partial Least Squares - Concepts, Methods
    and Applications</i>. Berlin: Springer; 2009:515-534.'
  apa: 'Helm, S., Eggert, A., &#38; Garnefeld, I. (2009). Modelling the Impact of
    Corporate Reputation on Customer Satisfaction and Loyalty Using PLS. In V. Esposito
    Vinzi, W. Chin, J. Henseler, &#38; H. Wang (Eds.), <i>Handbook of Partial Least
    Squares - Concepts, Methods and Applications</i> (pp. 515–534). Berlin: Springer.'
  bibtex: '@inbook{Helm_Eggert_Garnefeld_2009, place={Berlin}, title={Modelling the
    Impact of Corporate Reputation on Customer Satisfaction and Loyalty Using PLS},
    booktitle={Handbook of Partial Least Squares - Concepts, Methods and Applications},
    publisher={Springer}, author={Helm, S and Eggert, A and Garnefeld, I}, editor={Esposito
    Vinzi, V and Chin, W and Henseler, J and Wang, HEditors}, year={2009}, pages={515–534}
    }'
  chicago: 'Helm, S, A Eggert, and I Garnefeld. “Modelling the Impact of Corporate
    Reputation on Customer Satisfaction and Loyalty Using PLS.” In <i>Handbook of
    Partial Least Squares - Concepts, Methods and Applications</i>, edited by V Esposito
    Vinzi, W Chin, J Henseler, and H Wang, 515–34. Berlin: Springer, 2009.'
  ieee: 'S. Helm, A. Eggert, and I. Garnefeld, “Modelling the Impact of Corporate
    Reputation on Customer Satisfaction and Loyalty Using PLS,” in <i>Handbook of
    Partial Least Squares - Concepts, Methods and Applications</i>, V. Esposito Vinzi,
    W. Chin, J. Henseler, and H. Wang, Eds. Berlin: Springer, 2009, pp. 515–534.'
  mla: Helm, S., et al. “Modelling the Impact of Corporate Reputation on Customer
    Satisfaction and Loyalty Using PLS.” <i>Handbook of Partial Least Squares - Concepts,
    Methods and Applications</i>, edited by V Esposito Vinzi et al., Springer, 2009,
    pp. 515–34.
  short: 'S. Helm, A. Eggert, I. Garnefeld, in: V. Esposito Vinzi, W. Chin, J. Henseler,
    H. Wang (Eds.), Handbook of Partial Least Squares - Concepts, Methods and Applications,
    Springer, Berlin, 2009, pp. 515–534.'
date_created: 2019-02-04T11:31:20Z
date_updated: 2022-01-06T07:03:38Z
department:
- _id: '19'
- _id: '180'
editor:
- first_name: V
  full_name: Esposito Vinzi, V
  last_name: Esposito Vinzi
- first_name: W
  full_name: Chin, W
  last_name: Chin
- first_name: J
  full_name: Henseler, J
  last_name: Henseler
- first_name: H
  full_name: Wang, H
  last_name: Wang
language:
- iso: eng
page: 515-534
place: Berlin
publication: Handbook of Partial Least Squares - Concepts, Methods and Applications
publisher: Springer
status: public
title: Modelling the Impact of Corporate Reputation on Customer Satisfaction and Loyalty
  Using PLS
type: book_chapter
user_id: '57352'
year: '2009'
...
---
_id: '7497'
article_number: '2097'
author:
- first_name: M.
  full_name: Mehta, M.
  last_name: Mehta
- first_name: M.
  full_name: Ruth, M.
  last_name: Ruth
- first_name: K. A.
  full_name: Piegdon, K. A.
  last_name: Piegdon
- first_name: D.
  full_name: Krix, D.
  last_name: Krix
- first_name: H.
  full_name: Nienhaus, H.
  last_name: Nienhaus
- first_name: Cedrik
  full_name: Meier, Cedrik
  id: '20798'
  last_name: Meier
  orcid: https://orcid.org/0000-0002-3787-3572
citation:
  ama: 'Mehta M, Ruth M, Piegdon KA, Krix D, Nienhaus H, Meier C. Inductively coupled
    plasma reactive ion etching of bulk ZnO single crystal and molecular beam epitaxy
    grown ZnO films. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures</i>. 2009;27(5). doi:<a href="https://doi.org/10.1116/1.3186528">10.1116/1.3186528</a>'
  apa: 'Mehta, M., Ruth, M., Piegdon, K. A., Krix, D., Nienhaus, H., &#38; Meier,
    C. (2009). Inductively coupled plasma reactive ion etching of bulk ZnO single
    crystal and molecular beam epitaxy grown ZnO films. <i>Journal of Vacuum Science
    &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>27</i>(5).
    <a href="https://doi.org/10.1116/1.3186528">https://doi.org/10.1116/1.3186528</a>'
  bibtex: '@article{Mehta_Ruth_Piegdon_Krix_Nienhaus_Meier_2009, title={Inductively
    coupled plasma reactive ion etching of bulk ZnO single crystal and molecular beam
    epitaxy grown ZnO films}, volume={27}, DOI={<a href="https://doi.org/10.1116/1.3186528">10.1116/1.3186528</a>},
    number={52097}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures}, publisher={American Vacuum Society}, author={Mehta,
    M. and Ruth, M. and Piegdon, K. A. and Krix, D. and Nienhaus, H. and Meier, Cedrik},
    year={2009} }'
  chicago: 'Mehta, M., M. Ruth, K. A. Piegdon, D. Krix, H. Nienhaus, and Cedrik Meier.
    “Inductively Coupled Plasma Reactive Ion Etching of Bulk ZnO Single Crystal and
    Molecular Beam Epitaxy Grown ZnO Films.” <i>Journal of Vacuum Science &#38; Technology
    B: Microelectronics and Nanometer Structures</i> 27, no. 5 (2009). <a href="https://doi.org/10.1116/1.3186528">https://doi.org/10.1116/1.3186528</a>.'
  ieee: 'M. Mehta, M. Ruth, K. A. Piegdon, D. Krix, H. Nienhaus, and C. Meier, “Inductively
    coupled plasma reactive ion etching of bulk ZnO single crystal and molecular beam
    epitaxy grown ZnO films,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics
    and Nanometer Structures</i>, vol. 27, no. 5, 2009.'
  mla: 'Mehta, M., et al. “Inductively Coupled Plasma Reactive Ion Etching of Bulk
    ZnO Single Crystal and Molecular Beam Epitaxy Grown ZnO Films.” <i>Journal of
    Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>,
    vol. 27, no. 5, 2097, American Vacuum Society, 2009, doi:<a href="https://doi.org/10.1116/1.3186528">10.1116/1.3186528</a>.'
  short: 'M. Mehta, M. Ruth, K.A. Piegdon, D. Krix, H. Nienhaus, C. Meier, Journal
    of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures
    27 (2009).'
date_created: 2019-02-04T14:44:44Z
date_updated: 2022-01-06T07:03:39Z
department:
- _id: '15'
- _id: '230'
- _id: '287'
- _id: '35'
doi: 10.1116/1.3186528
intvolume: '        27'
issue: '5'
language:
- iso: eng
publication: 'Journal of Vacuum Science & Technology B: Microelectronics and Nanometer
  Structures'
publication_identifier:
  issn:
  - 1071-1023
publication_status: published
publisher: American Vacuum Society
status: public
title: Inductively coupled plasma reactive ion etching of bulk ZnO single crystal
  and molecular beam epitaxy grown ZnO films
type: journal_article
user_id: '20798'
volume: 27
year: '2009'
...
---
_id: '7498'
author:
- first_name: Wen
  full_name: Lei, Wen
  last_name: Lei
- first_name: Christian
  full_name: Notthoff, Christian
  last_name: Notthoff
- first_name: Matthias
  full_name: Offer, Matthias
  last_name: Offer
- first_name: Cedrik
  full_name: Meier, Cedrik
  id: '20798'
  last_name: Meier
  orcid: https://orcid.org/0000-0002-3787-3572
- first_name: Axel
  full_name: Lorke, Axel
  last_name: Lorke
- first_name: Chennupati
  full_name: Jagadish, Chennupati
  last_name: Jagadish
- first_name: Andreas D.
  full_name: Wieck, Andreas D.
  last_name: Wieck
citation:
  ama: Lei W, Notthoff C, Offer M, et al. Electron energy structure of self-assembled
    In(Ga)As nanostructures probed by capacitance-voltage spectroscopy and one-dimensional
    numerical simulation. <i>Journal of Materials Research</i>. 2009;24(07):2179-2184.
    doi:<a href="https://doi.org/10.1557/jmr.2009.0293">10.1557/jmr.2009.0293</a>
  apa: Lei, W., Notthoff, C., Offer, M., Meier, C., Lorke, A., Jagadish, C., &#38;
    Wieck, A. D. (2009). Electron energy structure of self-assembled In(Ga)As nanostructures
    probed by capacitance-voltage spectroscopy and one-dimensional numerical simulation.
    <i>Journal of Materials Research</i>, <i>24</i>(07), 2179–2184. <a href="https://doi.org/10.1557/jmr.2009.0293">https://doi.org/10.1557/jmr.2009.0293</a>
  bibtex: '@article{Lei_Notthoff_Offer_Meier_Lorke_Jagadish_Wieck_2009, title={Electron
    energy structure of self-assembled In(Ga)As nanostructures probed by capacitance-voltage
    spectroscopy and one-dimensional numerical simulation}, volume={24}, DOI={<a href="https://doi.org/10.1557/jmr.2009.0293">10.1557/jmr.2009.0293</a>},
    number={07}, journal={Journal of Materials Research}, publisher={Cambridge University
    Press (CUP)}, author={Lei, Wen and Notthoff, Christian and Offer, Matthias and
    Meier, Cedrik and Lorke, Axel and Jagadish, Chennupati and Wieck, Andreas D.},
    year={2009}, pages={2179–2184} }'
  chicago: 'Lei, Wen, Christian Notthoff, Matthias Offer, Cedrik Meier, Axel Lorke,
    Chennupati Jagadish, and Andreas D. Wieck. “Electron Energy Structure of Self-Assembled
    In(Ga)As Nanostructures Probed by Capacitance-Voltage Spectroscopy and One-Dimensional
    Numerical Simulation.” <i>Journal of Materials Research</i> 24, no. 07 (2009):
    2179–84. <a href="https://doi.org/10.1557/jmr.2009.0293">https://doi.org/10.1557/jmr.2009.0293</a>.'
  ieee: W. Lei <i>et al.</i>, “Electron energy structure of self-assembled In(Ga)As
    nanostructures probed by capacitance-voltage spectroscopy and one-dimensional
    numerical simulation,” <i>Journal of Materials Research</i>, vol. 24, no. 07,
    pp. 2179–2184, 2009.
  mla: Lei, Wen, et al. “Electron Energy Structure of Self-Assembled In(Ga)As Nanostructures
    Probed by Capacitance-Voltage Spectroscopy and One-Dimensional Numerical Simulation.”
    <i>Journal of Materials Research</i>, vol. 24, no. 07, Cambridge University Press
    (CUP), 2009, pp. 2179–84, doi:<a href="https://doi.org/10.1557/jmr.2009.0293">10.1557/jmr.2009.0293</a>.
  short: W. Lei, C. Notthoff, M. Offer, C. Meier, A. Lorke, C. Jagadish, A.D. Wieck,
    Journal of Materials Research 24 (2009) 2179–2184.
date_created: 2019-02-04T14:46:14Z
date_updated: 2022-01-06T07:03:39Z
department:
- _id: '15'
- _id: '230'
- _id: '287'
- _id: '35'
doi: 10.1557/jmr.2009.0293
intvolume: '        24'
issue: '07'
language:
- iso: eng
page: 2179-2184
publication: Journal of Materials Research
publication_identifier:
  issn:
  - 0884-2914
  - 2044-5326
publication_status: published
publisher: Cambridge University Press (CUP)
status: public
title: Electron energy structure of self-assembled In(Ga)As nanostructures probed
  by capacitance-voltage spectroscopy and one-dimensional numerical simulation
type: journal_article
user_id: '20798'
volume: 24
year: '2009'
...
---
_id: '7499'
author:
- first_name: K.
  full_name: Huba, K.
  last_name: Huba
- first_name: D.
  full_name: Krix, D.
  last_name: Krix
- first_name: Cedrik
  full_name: Meier, Cedrik
  id: '20798'
  last_name: Meier
  orcid: https://orcid.org/0000-0002-3787-3572
- first_name: H.
  full_name: Nienhaus, H.
  last_name: Nienhaus
citation:
  ama: 'Huba K, Krix D, Meier C, Nienhaus H. Ultrathin K∕p-Si(001) Schottky diodes
    as detectors of chemically generated hot charge carriers. <i>Journal of Vacuum
    Science &#38; Technology A: Vacuum, Surfaces, and Films</i>. 2009;27(4):889-894.
    doi:<a href="https://doi.org/10.1116/1.3100218">10.1116/1.3100218</a>'
  apa: 'Huba, K., Krix, D., Meier, C., &#38; Nienhaus, H. (2009). Ultrathin K∕p-Si(001)
    Schottky diodes as detectors of chemically generated hot charge carriers. <i>Journal
    of Vacuum Science &#38; Technology A: Vacuum, Surfaces, and Films</i>, <i>27</i>(4),
    889–894. <a href="https://doi.org/10.1116/1.3100218">https://doi.org/10.1116/1.3100218</a>'
  bibtex: '@article{Huba_Krix_Meier_Nienhaus_2009, title={Ultrathin K∕p-Si(001) Schottky
    diodes as detectors of chemically generated hot charge carriers}, volume={27},
    DOI={<a href="https://doi.org/10.1116/1.3100218">10.1116/1.3100218</a>}, number={4},
    journal={Journal of Vacuum Science &#38; Technology A: Vacuum, Surfaces, and Films},
    publisher={American Vacuum Society}, author={Huba, K. and Krix, D. and Meier,
    Cedrik and Nienhaus, H.}, year={2009}, pages={889–894} }'
  chicago: 'Huba, K., D. Krix, Cedrik Meier, and H. Nienhaus. “Ultrathin K∕p-Si(001)
    Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” <i>Journal
    of Vacuum Science &#38; Technology A: Vacuum, Surfaces, and Films</i> 27, no.
    4 (2009): 889–94. <a href="https://doi.org/10.1116/1.3100218">https://doi.org/10.1116/1.3100218</a>.'
  ieee: 'K. Huba, D. Krix, C. Meier, and H. Nienhaus, “Ultrathin K∕p-Si(001) Schottky
    diodes as detectors of chemically generated hot charge carriers,” <i>Journal of
    Vacuum Science &#38; Technology A: Vacuum, Surfaces, and Films</i>, vol. 27, no.
    4, pp. 889–894, 2009.'
  mla: 'Huba, K., et al. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically
    Generated Hot Charge Carriers.” <i>Journal of Vacuum Science &#38; Technology
    A: Vacuum, Surfaces, and Films</i>, vol. 27, no. 4, American Vacuum Society, 2009,
    pp. 889–94, doi:<a href="https://doi.org/10.1116/1.3100218">10.1116/1.3100218</a>.'
  short: 'K. Huba, D. Krix, C. Meier, H. Nienhaus, Journal of Vacuum Science &#38;
    Technology A: Vacuum, Surfaces, and Films 27 (2009) 889–894.'
date_created: 2019-02-04T14:47:36Z
date_updated: 2022-01-06T07:03:39Z
department:
- _id: '15'
- _id: '230'
- _id: '287'
- _id: '35'
doi: 10.1116/1.3100218
intvolume: '        27'
issue: '4'
language:
- iso: eng
page: 889-894
publication: 'Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films'
publication_identifier:
  issn:
  - 0734-2101
  - 1520-8559
publication_status: published
publisher: American Vacuum Society
status: public
title: Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated
  hot charge carriers
type: journal_article
user_id: '20798'
volume: 27
year: '2009'
...
---
_id: '7574'
abstract:
- lang: eng
  text: The Model Quality Plan (MQP) approach provided by us allows for the systematic
    and efficient development of quality plans that serve as a basis for the assessment
    of software models. MQP emphasizes the context of a software model as a major
    factor of influence for the whole quality planning activity. In order to adjust
    a quality plan to project specific requirements, quality goals are derived from
    a characterization of that context. We achieve a differentiated description of
    quality goals by introducing structured goals and questions in combination with
    a defined quality model. Afterwards, metrics and indicators are identified for
    checking the fulfillment of the quality goals. The result of our approach consists
    of a context sensitive quality plan for software models. Conceptually, we combine
    a metamodel for formulating relevant contents, a process that serves as a guideline
    for defining quality plans, and a rule concept for packaging and reusing experience
    into an integrated framework. We show its feasibility by three case studies that
    include a quality plan for analysis models, design models, and test models, respectively.
    For that, we provide tool support for the definition and application of quality
    plans.
author:
- first_name: Hendrik
  full_name: Voigt, Hendrik
  last_name: Voigt
citation:
  ama: Voigt H. <i>Kontextsensitive Qualitätsplanung von Softwaremodellen</i>.; 2009.
  apa: Voigt, H. (2009). <i>Kontextsensitive Qualitätsplanung von Softwaremodellen</i>.
  bibtex: '@book{Voigt_2009, title={Kontextsensitive Qualitätsplanung von Softwaremodellen},
    author={Voigt, Hendrik}, year={2009} }'
  chicago: Voigt, Hendrik. <i>Kontextsensitive Qualitätsplanung von Softwaremodellen</i>,
    2009.
  ieee: H. Voigt, <i>Kontextsensitive Qualitätsplanung von Softwaremodellen</i>. 2009.
  mla: Voigt, Hendrik. <i>Kontextsensitive Qualitätsplanung von Softwaremodellen</i>.
    2009.
  short: H. Voigt, Kontextsensitive Qualitätsplanung von Softwaremodellen, 2009.
date_created: 2019-02-06T14:21:13Z
date_updated: 2022-01-06T07:03:40Z
department:
- _id: '66'
language:
- iso: eng
status: public
title: Kontextsensitive Qualitätsplanung von Softwaremodellen
type: dissertation
user_id: '52534'
year: '2009'
...
---
_id: '7575'
author:
- first_name: Tim
  full_name: Schattkowsky, Tim
  last_name: Schattkowsky
citation:
  ama: Schattkowsky T. <i>Platform Independent Modeling of Synthesizable Software
    Systems Using UML 2</i>.; 2009.
  apa: Schattkowsky, T. (2009). <i>Platform independent modeling of synthesizable
    software systems using UML 2</i>.
  bibtex: '@book{Schattkowsky_2009, title={Platform independent modeling of synthesizable
    software systems using UML 2}, author={Schattkowsky, Tim}, year={2009} }'
  chicago: Schattkowsky, Tim. <i>Platform Independent Modeling of Synthesizable Software
    Systems Using UML 2</i>, 2009.
  ieee: T. Schattkowsky, <i>Platform independent modeling of synthesizable software
    systems using UML 2</i>. 2009.
  mla: Schattkowsky, Tim. <i>Platform Independent Modeling of Synthesizable Software
    Systems Using UML 2</i>. 2009.
  short: T. Schattkowsky, Platform Independent Modeling of Synthesizable Software
    Systems Using UML 2, 2009.
date_created: 2019-02-06T14:22:06Z
date_updated: 2022-01-06T07:03:40Z
department:
- _id: '66'
language:
- iso: eng
status: public
title: Platform independent modeling of synthesizable software systems using UML 2
type: dissertation
user_id: '52534'
year: '2009'
...
---
_id: '7577'
author:
- first_name: Alexander
  full_name: Förster, Alexander
  last_name: Förster
citation:
  ama: Förster A. <i>Pattern Based Business Process Design and Verification</i>.;
    2009.
  apa: Förster, A. (2009). <i>Pattern based business process design and verification</i>.
  bibtex: '@book{Förster_2009, title={Pattern based business process design and verification},
    author={Förster, Alexander}, year={2009} }'
  chicago: Förster, Alexander. <i>Pattern Based Business Process Design and Verification</i>,
    2009.
  ieee: A. Förster, <i>Pattern based business process design and verification</i>.
    2009.
  mla: Förster, Alexander. <i>Pattern Based Business Process Design and Verification</i>.
    2009.
  short: A. Förster, Pattern Based Business Process Design and Verification, 2009.
date_created: 2019-02-06T14:22:40Z
date_updated: 2022-01-06T07:03:40Z
department:
- _id: '66'
language:
- iso: eng
status: public
title: Pattern based business process design and verification
type: dissertation
user_id: '52534'
year: '2009'
...
---
_id: '7578'
abstract:
- lang: eng
  text: Enterprise Architecture (EA) has undergone many changes since the IT has found
    its way into the world of enterprises. The introduction of Service-Oriented Architecture
    (SOA) is such a change with major consequences. The introduction of an SOA increases
    the flexibility and thus the productivity of an enterprise architecture, but unfortunately
    also its complexity. This makes the transformation of an enterprise architecture
    to an SOA-like enterprise architecture to a challenging and risky task. To overcome
    the change- and complexity-related problems when introducing SOA, Enterprise Architecture
    Management (EAM) systems are required. The approach of this thesis suggests a
    method on how to establish Enterprise Architecture Management that is especially
    suited for an SOA introduction. This thesis suggests a variant of an EAM system
    that is especially suited for the introduction of an SOA. The presented method
    on creating such an EAM system includes guidance on how to define a meta model
    for Service-Oriented Enterprise Architecture (SOEA), which is harmonized with
    the respective enterprise architecture. The SOA introduction is especially supported
    by defining SOA quality criteria and corresponding metrics. Some metrics have
    to be ascertained by experts. Other metrics have their measuring points within
    the SOEA models (instances of the SOEA meta model) and their calculation is automatable.
    Creating and maintaining SOEA models as well as applying the automatable metrics
    are supported by an eclipse-based tool. As metrics only produce measures that
    are hard to interpret, indicators are introduced. They allow interpreting the
    measures concerning the quality criteria. With the help of this EAM system, the
    transformation of an enterprise to a service-oriented enterprise can be planned
    and the level of goal-achievement (SOA-conformance of the EA) can be monitored
    steadily. By this, the contribution of this work aims at the reduction of the
    risk when introducing an SOA.
author:
- first_name: Martin
  full_name: Assmann, Martin
  last_name: Assmann
citation:
  ama: Assmann M. <i>Model-Based Evaluation of Service-Oriented Enterprise Architectures</i>.;
    2009.
  apa: Assmann, M. (2009). <i>Model-based evaluation of service-oriented enterprise
    architectures</i>.
  bibtex: '@book{Assmann_2009, title={Model-based evaluation of service-oriented enterprise
    architectures}, author={Assmann, Martin}, year={2009} }'
  chicago: Assmann, Martin. <i>Model-Based Evaluation of Service-Oriented Enterprise
    Architectures</i>, 2009.
  ieee: M. Assmann, <i>Model-based evaluation of service-oriented enterprise architectures</i>.
    2009.
  mla: Assmann, Martin. <i>Model-Based Evaluation of Service-Oriented Enterprise Architectures</i>.
    2009.
  short: M. Assmann, Model-Based Evaluation of Service-Oriented Enterprise Architectures,
    2009.
date_created: 2019-02-06T14:23:06Z
date_updated: 2022-01-06T07:03:40Z
department:
- _id: '66'
language:
- iso: eng
status: public
title: Model-based evaluation of service-oriented enterprise architectures
type: dissertation
user_id: '52534'
year: '2009'
...
---
_id: '7605'
author:
- first_name: H.
  full_name: Ertl, H.
  last_name: Ertl
- first_name: H.-Hugo
  full_name: Kremer, H.-Hugo
  id: '15280'
  last_name: Kremer
citation:
  ama: 'Ertl H, Kremer H-H. Innovation and Reform in College-based VET Contexts: An
    outline of research in England and Germany. <i>SKOPE</i>. 2009;(87).'
  apa: 'Ertl, H., &#38; Kremer, H.-H. (2009). Innovation and Reform in College-based
    VET Contexts: An outline of research in England and Germany. <i>SKOPE</i>, (87).'
  bibtex: '@article{Ertl_Kremer_2009, title={Innovation and Reform in College-based
    VET Contexts: An outline of research in England and Germany}, number={87}, journal={SKOPE},
    author={Ertl, H. and Kremer, H.-Hugo}, year={2009} }'
  chicago: 'Ertl, H., and H.-Hugo Kremer. “Innovation and Reform in College-Based
    VET Contexts: An Outline of Research in England and Germany.” <i>SKOPE</i>, no.
    87 (2009).'
  ieee: 'H. Ertl and H.-H. Kremer, “Innovation and Reform in College-based VET Contexts:
    An outline of research in England and Germany,” <i>SKOPE</i>, no. 87, 2009.'
  mla: 'Ertl, H., and H. Hugo Kremer. “Innovation and Reform in College-Based VET
    Contexts: An Outline of Research in England and Germany.” <i>SKOPE</i>, no. 87,
    2009.'
  short: H. Ertl, H.-H. Kremer, SKOPE (2009).
date_created: 2019-02-08T09:39:43Z
date_updated: 2022-01-06T07:03:40Z
department:
- _id: '211'
issue: '87'
language:
- iso: eng
main_file_link:
- url: http://www.skope.ox.ac.uk/wp-content/uploads/2014/04/SKOPEWP87.pdf
publication: SKOPE
status: public
title: 'Innovation and Reform in College-based VET Contexts: An outline of research
  in England and Germany'
type: journal_article
user_id: '74378'
year: '2009'
...
---
_id: '8349'
author:
- first_name: J.
  full_name: Kissel, J.
  last_name: Kissel
- first_name: Rolf
  full_name: Hanitsch, Rolf
  last_name: Hanitsch
- first_name: Stefan
  full_name: Krauter, Stefan
  id: '28836'
  last_name: Krauter
  orcid: 0000-0002-3594-260X
citation:
  ama: Kissel J, Hanitsch R, Krauter S. Cornerstones of a renewable energy law for
    emerging markets in South America. <i>Energy Policy</i>. 2009;37(9/September 2009):3621-3626.
  apa: Kissel, J., Hanitsch, R., &#38; Krauter, S. (2009). Cornerstones of a renewable
    energy law for emerging markets in South America. <i>Energy Policy</i>, <i>37</i>(9/September
    2009), 3621–3626.
  bibtex: '@article{Kissel_Hanitsch_Krauter_2009, title={Cornerstones of a renewable
    energy law for emerging markets in South America}, volume={37}, number={9/September
    2009}, journal={Energy Policy}, author={Kissel, J. and Hanitsch, Rolf and Krauter,
    Stefan}, year={2009}, pages={3621–3626} }'
  chicago: 'Kissel, J., Rolf Hanitsch, and Stefan Krauter. “Cornerstones of a Renewable
    Energy Law for Emerging Markets in South America.” <i>Energy Policy</i> 37, no.
    9/September 2009 (2009): 3621–26.'
  ieee: J. Kissel, R. Hanitsch, and S. Krauter, “Cornerstones of a renewable energy
    law for emerging markets in South America,” <i>Energy Policy</i>, vol. 37, no.
    9/September 2009, pp. 3621–3626, 2009.
  mla: Kissel, J., et al. “Cornerstones of a Renewable Energy Law for Emerging Markets
    in South America.” <i>Energy Policy</i>, vol. 37, no. 9/September 2009, 2009,
    pp. 3621–26.
  short: J. Kissel, R. Hanitsch, S. Krauter, Energy Policy 37 (2009) 3621–3626.
date_created: 2019-03-05T13:38:09Z
date_updated: 2022-01-06T07:03:53Z
department:
- _id: '53'
extern: '1'
intvolume: '        37'
issue: 9/September 2009
language:
- iso: eng
page: 3621-3626
publication: Energy Policy
status: public
title: Cornerstones of a renewable energy law for emerging markets in South America
type: journal_article
user_id: '16148'
volume: 37
year: '2009'
...
---
_id: '8350'
author:
- first_name: A.
  full_name: Preiss, A.
  last_name: Preiss
- first_name: Stefan
  full_name: Krauter, Stefan
  id: '28836'
  last_name: Krauter
  orcid: 0000-0002-3594-260X
citation:
  ama: 'Preiss A, Krauter S. Yield prediction and comparison of a-Si modules. In:
    <i>Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition,
    Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849</i>. ; 2009.'
  apa: Preiss, A., &#38; Krauter, S. (2009). Yield prediction and comparison of a-Si
    modules. In <i>Proceedings of the 24th European Photovoltaic Solar Energy Conference
    and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849</i>.
  bibtex: '@inproceedings{Preiss_Krauter_2009, title={Yield prediction and comparison
    of a-Si modules}, booktitle={Proceedings of the 24th European Photovoltaic Solar
    Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September 2009,
    S. 2846–2849}, author={Preiss, A. and Krauter, Stefan}, year={2009} }'
  chicago: Preiss, A., and Stefan Krauter. “Yield Prediction and Comparison of A-Si
    Modules.” In <i>Proceedings of the 24th European Photovoltaic Solar Energy Conference
    and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849</i>,
    2009.
  ieee: A. Preiss and S. Krauter, “Yield prediction and comparison of a-Si modules,”
    in <i>Proceedings of the 24th European Photovoltaic Solar Energy Conference and
    Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849</i>, 2009.
  mla: Preiss, A., and Stefan Krauter. “Yield Prediction and Comparison of A-Si Modules.”
    <i>Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition,
    Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849</i>, 2009.
  short: 'A. Preiss, S. Krauter, in: Proceedings of the 24th European Photovoltaic
    Solar Energy Conference and Exhibition, Hamburg (Deutschland), 21.–25. September
    2009, S. 2846–2849, 2009.'
conference:
  name: 24th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg
    (Deutschland), 21.–25. September 2009
date_created: 2019-03-05T13:40:46Z
date_updated: 2022-01-06T07:03:53Z
department:
- _id: '53'
extern: '1'
language:
- iso: eng
publication: Proceedings of the 24th European Photovoltaic Solar Energy Conference
  and Exhibition, Hamburg (Deutschland), 21.–25. September 2009, S. 2846–2849
status: public
title: Yield prediction and comparison of a-Si modules
type: conference
user_id: '16148'
year: '2009'
...
---
_id: '8431'
author:
- first_name: Michael
  full_name: Mlynarski, Michael
  last_name: Mlynarski
- first_name: Baris
  full_name: Güldali, Baris
  last_name: Güldali
- first_name: Melanie
  full_name: Späth, Melanie
  last_name: Späth
- first_name: Gregor
  full_name: Engels, Gregor
  id: '107'
  last_name: Engels
citation:
  ama: 'Mlynarski M, Güldali B, Späth M, Engels G. From Design Models to Test Models
    by Means of Test Ideas. In: <i>MoDeVVa ’09: Proceedings of the 6th International
    Workshop on Model-Driven Engineering, Verification and Validation</i>. New York,
    NY, USA: ACM; 2009:1-10. doi:<a href="http://doi.acm.org/10.1145/1656485.1656492">http://doi.acm.org/10.1145/1656485.1656492</a>'
  apa: 'Mlynarski, M., Güldali, B., Späth, M., &#38; Engels, G. (2009). From Design
    Models to Test Models by Means of Test Ideas. In <i>MoDeVVa ’09: Proceedings of
    the 6th International Workshop on Model-Driven Engineering, Verification and Validation</i>
    (pp. 1–10). New York, NY, USA: ACM. <a href="http://doi.acm.org/10.1145/1656485.1656492">http://doi.acm.org/10.1145/1656485.1656492</a>'
  bibtex: '@inproceedings{Mlynarski_Güldali_Späth_Engels_2009, place={New York, NY,
    USA}, title={From Design Models to Test Models by Means of Test Ideas}, DOI={<a
    href="http://doi.acm.org/10.1145/1656485.1656492">http://doi.acm.org/10.1145/1656485.1656492</a>},
    booktitle={MoDeVVa ’09: Proceedings of the 6th International Workshop on Model-Driven
    Engineering, Verification and Validation}, publisher={ACM}, author={Mlynarski,
    Michael and Güldali, Baris and Späth, Melanie and Engels, Gregor}, year={2009},
    pages={1–10} }'
  chicago: 'Mlynarski, Michael, Baris Güldali, Melanie Späth, and Gregor Engels. “From
    Design Models to Test Models by Means of Test Ideas.” In <i>MoDeVVa ’09: Proceedings
    of the 6th International Workshop on Model-Driven Engineering, Verification and
    Validation</i>, 1–10. New York, NY, USA: ACM, 2009. <a href="http://doi.acm.org/10.1145/1656485.1656492">http://doi.acm.org/10.1145/1656485.1656492</a>.'
  ieee: 'M. Mlynarski, B. Güldali, M. Späth, and G. Engels, “From Design Models to
    Test Models by Means of Test Ideas,” in <i>MoDeVVa ’09: Proceedings of the 6th
    International Workshop on Model-Driven Engineering, Verification and Validation</i>,
    2009, pp. 1–10.'
  mla: 'Mlynarski, Michael, et al. “From Design Models to Test Models by Means of
    Test Ideas.” <i>MoDeVVa ’09: Proceedings of the 6th International Workshop on
    Model-Driven Engineering, Verification and Validation</i>, ACM, 2009, pp. 1–10,
    doi:<a href="http://doi.acm.org/10.1145/1656485.1656492">http://doi.acm.org/10.1145/1656485.1656492</a>.'
  short: 'M. Mlynarski, B. Güldali, M. Späth, G. Engels, in: MoDeVVa ’09: Proceedings
    of the 6th International Workshop on Model-Driven Engineering, Verification and
    Validation, ACM, New York, NY, USA, 2009, pp. 1–10.'
date_created: 2019-03-06T16:20:26Z
date_updated: 2022-01-06T07:03:55Z
department:
- _id: '66'
doi: http://doi.acm.org/10.1145/1656485.1656492
language:
- iso: eng
page: 1-10
place: New York, NY, USA
publication: 'MoDeVVa ''09: Proceedings of the 6th International Workshop on Model-Driven
  Engineering, Verification and Validation'
publisher: ACM
status: public
title: From Design Models to Test Models by Means of Test Ideas
type: conference
user_id: '52534'
year: '2009'
...
---
_id: '8432'
author:
- first_name: Gregor
  full_name: Engels, Gregor
  id: '107'
  last_name: Engels
citation:
  ama: 'Engels G. Automatic Generation of Behavioral Code - too ambitious or even
    unwanted? In: <i>First European Workshop on Behaviour Modelling in Model Driven
    Architecture (BM-MDA)</i>. New York, NY, USA: ACM Press (New York, NY, USA); 2009:5.'
  apa: 'Engels, G. (2009). Automatic Generation of Behavioral Code - too ambitious
    or even unwanted? In <i>First European Workshop on Behaviour Modelling in Model
    Driven Architecture (BM-MDA)</i> (p. 5). New York, NY, USA: ACM Press (New York,
    NY, USA).'
  bibtex: '@inproceedings{Engels_2009, place={New York, NY, USA}, title={Automatic
    Generation of Behavioral Code - too ambitious or even unwanted?}, booktitle={First
    European Workshop on Behaviour Modelling in Model Driven Architecture (BM-MDA)},
    publisher={ACM Press (New York, NY, USA)}, author={Engels, Gregor}, year={2009},
    pages={5} }'
  chicago: 'Engels, Gregor. “Automatic Generation of Behavioral Code - Too Ambitious
    or Even Unwanted?” In <i>First European Workshop on Behaviour Modelling in Model
    Driven Architecture (BM-MDA)</i>, 5. New York, NY, USA: ACM Press (New York, NY,
    USA), 2009.'
  ieee: G. Engels, “Automatic Generation of Behavioral Code - too ambitious or even
    unwanted?,” in <i>First European Workshop on Behaviour Modelling in Model Driven
    Architecture (BM-MDA)</i>, 2009, p. 5.
  mla: Engels, Gregor. “Automatic Generation of Behavioral Code - Too Ambitious or
    Even Unwanted?” <i>First European Workshop on Behaviour Modelling in Model Driven
    Architecture (BM-MDA)</i>, ACM Press (New York, NY, USA), 2009, p. 5.
  short: 'G. Engels, in: First European Workshop on Behaviour Modelling in Model Driven
    Architecture (BM-MDA), ACM Press (New York, NY, USA), New York, NY, USA, 2009,
    p. 5.'
date_created: 2019-03-06T16:20:27Z
date_updated: 2022-01-06T07:03:55Z
department:
- _id: '66'
language:
- iso: eng
page: '5'
place: New York, NY, USA
publication: First European Workshop on Behaviour Modelling in Model Driven Architecture
  (BM-MDA)
publisher: ACM Press (New York, NY, USA)
status: public
title: Automatic Generation of Behavioral Code - too ambitious or even unwanted?
type: conference
user_id: '52534'
year: '2009'
...