[{"title":"Creating and appropriating value in collaborative relationships","year":"2010","status":"public","author":[{"full_name":"Wagner, Stephan M","first_name":"Stephan M","last_name":"Wagner"},{"full_name":"Eggert, Andreas","last_name":"Eggert","first_name":"Andreas"},{"full_name":"Lindemann, Eckhard","last_name":"Lindemann","first_name":"Eckhard"}],"date_updated":"2022-01-06T07:01:27Z","page":"840--848","_id":"4859","user_id":"57352","publication":"Journal of business research","issue":"8","citation":{"mla":"Wagner, Stephan M., et al. “Creating and Appropriating Value in Collaborative Relationships.” <i>Journal of Business Research</i>, no. 8, 2010, pp. 840--848.","ama":"Wagner SM, Eggert A, Lindemann E. Creating and appropriating value in collaborative relationships. <i>Journal of business research</i>. 2010;(8):840--848.","bibtex":"@article{Wagner_Eggert_Lindemann_2010, title={Creating and appropriating value in collaborative relationships}, number={8}, journal={Journal of business research}, author={Wagner, Stephan M and Eggert, Andreas and Lindemann, Eckhard}, year={2010}, pages={840--848} }","apa":"Wagner, S. M., Eggert, A., &#38; Lindemann, E. (2010). Creating and appropriating value in collaborative relationships. <i>Journal of Business Research</i>, (8), 840--848.","ieee":"S. M. Wagner, A. Eggert, and E. Lindemann, “Creating and appropriating value in collaborative relationships,” <i>Journal of business research</i>, no. 8, pp. 840--848, 2010.","short":"S.M. Wagner, A. Eggert, E. Lindemann, Journal of Business Research (2010) 840--848.","chicago":"Wagner, Stephan M, Andreas Eggert, and Eckhard Lindemann. “Creating and Appropriating Value in Collaborative Relationships.” <i>Journal of Business Research</i>, no. 8 (2010): 840--848."},"date_created":"2018-10-25T09:49:32Z","type":"journal_article","department":[{"_id":"180"}]},{"publisher":"Gabler","_id":"4960","page":"191-208","doi":"10.1007/978-3-658-13650-5_7","user_id":"57352","author":[{"first_name":"Andreas","last_name":"Eggert","full_name":"Eggert, Andreas"},{"last_name":"Garnefeld","first_name":"Ina","full_name":"Garnefeld, Ina"}],"publication_identifier":{"isbn":["978-3-8349-1413-2"]},"year":"2010","title":"Kundenbindung auf Basis des Relationship Value","status":"public","date_updated":"2022-01-06T07:01:31Z","publication_status":"published","place":"Wiesbaden","date_created":"2018-10-26T10:51:12Z","department":[{"_id":"178"},{"_id":"180"}],"type":"book_chapter","citation":{"mla":"Eggert, Andreas, and Ina Garnefeld. “Kundenbindung Auf Basis Des Relationship Value.” <i>Handbuch Kundenbindungsmanagement</i>, Gabler, 2010, pp. 191–208, doi:<a href=\"https://doi.org/10.1007/978-3-658-13650-5_7\">10.1007/978-3-658-13650-5_7</a>.","bibtex":"@inbook{Eggert_Garnefeld_2010, place={Wiesbaden}, title={Kundenbindung auf Basis des Relationship Value}, DOI={<a href=\"https://doi.org/10.1007/978-3-658-13650-5_7\">10.1007/978-3-658-13650-5_7</a>}, booktitle={Handbuch Kundenbindungsmanagement}, publisher={Gabler}, author={Eggert, Andreas and Garnefeld, Ina}, year={2010}, pages={191–208} }","ama":"Eggert A, Garnefeld I. Kundenbindung auf Basis des Relationship Value. In: <i>Handbuch Kundenbindungsmanagement</i>. Wiesbaden: Gabler; 2010:191-208. doi:<a href=\"https://doi.org/10.1007/978-3-658-13650-5_7\">10.1007/978-3-658-13650-5_7</a>","ieee":"A. Eggert and I. Garnefeld, “Kundenbindung auf Basis des Relationship Value,” in <i>Handbuch Kundenbindungsmanagement</i>, Wiesbaden: Gabler, 2010, pp. 191–208.","apa":"Eggert, A., &#38; Garnefeld, I. (2010). Kundenbindung auf Basis des Relationship Value. In <i>Handbuch Kundenbindungsmanagement</i> (pp. 191–208). Wiesbaden: Gabler. <a href=\"https://doi.org/10.1007/978-3-658-13650-5_7\">https://doi.org/10.1007/978-3-658-13650-5_7</a>","short":"A. Eggert, I. Garnefeld, in: Handbuch Kundenbindungsmanagement, Gabler, Wiesbaden, 2010, pp. 191–208.","chicago":"Eggert, Andreas, and Ina Garnefeld. “Kundenbindung Auf Basis Des Relationship Value.” In <i>Handbuch Kundenbindungsmanagement</i>, 191–208. Wiesbaden: Gabler, 2010. <a href=\"https://doi.org/10.1007/978-3-658-13650-5_7\">https://doi.org/10.1007/978-3-658-13650-5_7</a>."},"publication":"Handbuch Kundenbindungsmanagement"},{"user_id":"69384","_id":"4974","page":"55--67","date_updated":"2022-01-06T07:01:32Z","author":[{"full_name":"Thommes, Kirsten","last_name":"Thommes","first_name":"Kirsten","id":"72497"},{"full_name":"Weiland, Katrin","last_name":"Weiland","first_name":"Katrin"}],"status":"public","title":"Explanatory factors for firms’ use of temporary agency work in Germany","year":"2010","department":[{"_id":"178"},{"_id":"184"}],"type":"journal_article","date_created":"2018-10-29T09:16:08Z","citation":{"ieee":"K. Thommes and K. Weiland, “Explanatory factors for firms’ use of temporary agency work in Germany,” <i>European Management Journal</i>, no. 1, pp. 55--67, 2010.","apa":"Thommes, K., &#38; Weiland, K. (2010). Explanatory factors for firms’ use of temporary agency work in Germany. <i>European Management Journal</i>, (1), 55--67.","short":"K. Thommes, K. Weiland, European Management Journal (2010) 55--67.","chicago":"Thommes, Kirsten, and Katrin Weiland. “Explanatory Factors for Firms’ Use of Temporary Agency Work in Germany.” <i>European Management Journal</i>, no. 1 (2010): 55--67.","mla":"Thommes, Kirsten, and Katrin Weiland. “Explanatory Factors for Firms’ Use of Temporary Agency Work in Germany.” <i>European Management Journal</i>, no. 1, 2010, pp. 55--67.","bibtex":"@article{Thommes_Weiland_2010, title={Explanatory factors for firms’ use of temporary agency work in Germany}, number={1}, journal={European Management Journal}, author={Thommes, Kirsten and Weiland, Katrin}, year={2010}, pages={55--67} }","ama":"Thommes K, Weiland K. Explanatory factors for firms’ use of temporary agency work in Germany. <i>European Management Journal</i>. 2010;(1):55--67."},"issue":"1","publication":"European Management Journal"},{"place":"Paderborn","date_created":"2019-01-25T12:35:42Z","type":"book_editor","department":[{"_id":"211"}],"citation":{"short":"H.-H. Kremer, A. Zoyke, eds., Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten , Paderborn, 2010.","chicago":"Kremer, H.-Hugo, and A. Zoyke, eds. <i>Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten </i>. Paderborn, 2010.","apa":"Kremer, H.-H., &#38; Zoyke, A. (Eds.). (2010). <i>Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten </i>. Paderborn.","ieee":"H.-H. Kremer and A. Zoyke, Eds., <i>Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten </i>. Paderborn, 2010.","ama":"Kremer H-H, Zoyke A, eds. <i>Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten </i>. Paderborn; 2010.","bibtex":"@book{Kremer_Zoyke_2010, place={Paderborn}, title={Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten }, year={2010} }","mla":"Kremer, H. Hugo, and A. Zoyke, editors. <i>Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten </i>. 2010."},"_id":"7001","language":[{"iso":"ger"}],"user_id":"74378","editor":[{"full_name":"Kremer, H.-Hugo","last_name":"Kremer","first_name":"H.-Hugo","id":"15280"},{"last_name":"Zoyke","first_name":"A.","full_name":"Zoyke, A."}],"year":"2010","title":"Individuelle Förderung in der beruflichen Bildung. Grundlegung und Annäherung im Kontext von Forschungs- und Entwicklungsprojekten ","status":"public","date_updated":"2022-01-06T07:03:26Z"},{"citation":{"mla":"Ishikawa, Atsushi, et al. “Extremely Low-Loss Slow-Light Modes in Plasmonic Dielectric Hybrid Systems.” <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>, edited by Mark I. Stockman, SPIE, 2010, doi:<a href=\"https://doi.org/10.1117/12.860190\">10.1117/12.860190</a>.","apa":"Ishikawa, A., Oulton, R. F., Zentgraf, T., &#38; Zhang, X. (2010). Extremely low-loss slow-light modes in plasmonic dielectric hybrid systems. In M. I. Stockman (Ed.), <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>. SPIE. <a href=\"https://doi.org/10.1117/12.860190\">https://doi.org/10.1117/12.860190</a>","ieee":"A. Ishikawa, R. F. Oulton, T. Zentgraf, and X. Zhang, “Extremely low-loss slow-light modes in plasmonic dielectric hybrid systems,” in <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>, 2010.","short":"A. Ishikawa, R.F. Oulton, T. Zentgraf, X. Zhang, in: M.I. Stockman (Ed.), Plasmonics: Metallic Nanostructures and Their Optical Properties VIII, SPIE, 2010.","ama":"Ishikawa A, Oulton RF, Zentgraf T, Zhang X. Extremely low-loss slow-light modes in plasmonic dielectric hybrid systems. In: Stockman MI, ed. <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>. SPIE; 2010. doi:<a href=\"https://doi.org/10.1117/12.860190\">10.1117/12.860190</a>","chicago":"Ishikawa, Atsushi, Rupert F. Oulton, Thomas Zentgraf, and Xiang Zhang. “Extremely Low-Loss Slow-Light Modes in Plasmonic Dielectric Hybrid Systems.” In <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>, edited by Mark I. Stockman. SPIE, 2010. <a href=\"https://doi.org/10.1117/12.860190\">https://doi.org/10.1117/12.860190</a>.","bibtex":"@inproceedings{Ishikawa_Oulton_Zentgraf_Zhang_2010, title={Extremely low-loss slow-light modes in plasmonic dielectric hybrid systems}, DOI={<a href=\"https://doi.org/10.1117/12.860190\">10.1117/12.860190</a>}, booktitle={Plasmonics: Metallic Nanostructures and Their Optical Properties VIII}, publisher={SPIE}, author={Ishikawa, Atsushi and Oulton, Rupert F. and Zentgraf, Thomas and Zhang, Xiang}, editor={Stockman, Mark I.Editor}, year={2010} }"},"publication":"Plasmonics: Metallic Nanostructures and Their Optical Properties VIII","department":[{"_id":"15"},{"_id":"230"}],"type":"conference","date_created":"2019-01-30T07:22:54Z","date_updated":"2022-01-06T07:03:30Z","publication_status":"published","author":[{"full_name":"Ishikawa, Atsushi","first_name":"Atsushi","last_name":"Ishikawa"},{"full_name":"Oulton, Rupert F.","first_name":"Rupert F.","last_name":"Oulton"},{"orcid":"0000-0002-8662-1101","first_name":"Thomas","last_name":"Zentgraf","full_name":"Zentgraf, Thomas","id":"30525"},{"last_name":"Zhang","first_name":"Xiang","full_name":"Zhang, Xiang"}],"year":"2010","status":"public","title":"Extremely low-loss slow-light modes in plasmonic dielectric hybrid systems","editor":[{"first_name":"Mark I.","last_name":"Stockman","full_name":"Stockman, Mark I."}],"doi":"10.1117/12.860190","user_id":"30525","publisher":"SPIE","_id":"7251","language":[{"iso":"eng"}]},{"citation":{"ieee":"V. J. Sorger <i>et al.</i>, “Semiconductor plasmon laser,” in <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>, 2010.","apa":"Sorger, V. J., Oulton, R. F., Zentgraf, T., Ma, R., Gladden, C., Dai, L., … Zhang, X. (2010). Semiconductor plasmon laser. In M. I. Stockman (Ed.), <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>. SPIE. <a href=\"https://doi.org/10.1117/12.859136\">https://doi.org/10.1117/12.859136</a>","chicago":"Sorger, Volker J., Rupert F. Oulton, Thomas Zentgraf, Renmin Ma, Christopher Gladden, Lun Dai, Guy Bartal, and Xiang Zhang. “Semiconductor Plasmon Laser.” In <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>, edited by Mark I. Stockman. SPIE, 2010. <a href=\"https://doi.org/10.1117/12.859136\">https://doi.org/10.1117/12.859136</a>.","short":"V.J. Sorger, R.F. Oulton, T. Zentgraf, R. Ma, C. Gladden, L. Dai, G. Bartal, X. Zhang, in: M.I. Stockman (Ed.), Plasmonics: Metallic Nanostructures and Their Optical Properties VIII, SPIE, 2010.","mla":"Sorger, Volker J., et al. “Semiconductor Plasmon Laser.” <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>, edited by Mark I. Stockman, SPIE, 2010, doi:<a href=\"https://doi.org/10.1117/12.859136\">10.1117/12.859136</a>.","bibtex":"@inproceedings{Sorger_Oulton_Zentgraf_Ma_Gladden_Dai_Bartal_Zhang_2010, title={Semiconductor plasmon laser}, DOI={<a href=\"https://doi.org/10.1117/12.859136\">10.1117/12.859136</a>}, booktitle={Plasmonics: Metallic Nanostructures and Their Optical Properties VIII}, publisher={SPIE}, author={Sorger, Volker J. and Oulton, Rupert F. and Zentgraf, Thomas and Ma, Renmin and Gladden, Christopher and Dai, Lun and Bartal, Guy and Zhang, Xiang}, editor={Stockman, Mark I.Editor}, year={2010} }","ama":"Sorger VJ, Oulton RF, Zentgraf T, et al. Semiconductor plasmon laser. In: Stockman MI, ed. <i>Plasmonics: Metallic Nanostructures and Their Optical Properties VIII</i>. SPIE; 2010. doi:<a href=\"https://doi.org/10.1117/12.859136\">10.1117/12.859136</a>"},"publication":"Plasmonics: Metallic Nanostructures and Their Optical Properties VIII","department":[{"_id":"15"},{"_id":"230"}],"type":"conference","date_created":"2019-01-30T07:24:06Z","date_updated":"2022-01-06T07:03:30Z","publication_status":"published","author":[{"first_name":"Volker J.","last_name":"Sorger","full_name":"Sorger, Volker J."},{"full_name":"Oulton, Rupert F.","first_name":"Rupert F.","last_name":"Oulton"},{"orcid":"0000-0002-8662-1101","first_name":"Thomas","last_name":"Zentgraf","full_name":"Zentgraf, Thomas","id":"30525"},{"full_name":"Ma, Renmin","first_name":"Renmin","last_name":"Ma"},{"first_name":"Christopher","last_name":"Gladden","full_name":"Gladden, Christopher"},{"full_name":"Dai, Lun","first_name":"Lun","last_name":"Dai"},{"last_name":"Bartal","first_name":"Guy","full_name":"Bartal, Guy"},{"first_name":"Xiang","last_name":"Zhang","full_name":"Zhang, Xiang"}],"title":"Semiconductor plasmon laser","year":"2010","status":"public","editor":[{"first_name":"Mark I.","last_name":"Stockman","full_name":"Stockman, Mark I."}],"doi":"10.1117/12.859136","user_id":"30525","_id":"7252","publisher":"SPIE","language":[{"iso":"eng"}]},{"user_id":"74378","_id":"7350","language":[{"iso":"ger"}],"date_updated":"2022-01-06T07:03:35Z","author":[{"id":"15280","last_name":"Kremer","first_name":"H.-Hugo","full_name":"Kremer, H.-Hugo"}],"year":"2010","status":"public","title":"Individuelle Bildungsgänge im Berufsbildungssystem ","department":[{"_id":"211"}],"type":"journal_article","date_created":"2019-01-31T12:49:03Z","citation":{"apa":"Kremer, H.-H. (2010). Individuelle Bildungsgänge im Berufsbildungssystem . <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>, (18).","ieee":"H.-H. Kremer, “Individuelle Bildungsgänge im Berufsbildungssystem ,” <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>, no. 18, 2010.","short":"H.-H. Kremer, bwp@ Berufs- und Wirtschaftspädagogik - online (2010).","chicago":"Kremer, H.-Hugo. “Individuelle Bildungsgänge im Berufsbildungssystem .” <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>, no. 18 (2010).","mla":"Kremer, H. Hugo. “Individuelle Bildungsgänge im Berufsbildungssystem .” <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>, no. 18, 2010.","ama":"Kremer H-H. Individuelle Bildungsgänge im Berufsbildungssystem . <i>bwp@ Berufs- und Wirtschaftspädagogik - online</i>. 2010;(18).","bibtex":"@article{Kremer_2010, title={Individuelle Bildungsgänge im Berufsbildungssystem }, number={18}, journal={bwp@ Berufs- und Wirtschaftspädagogik - online}, author={Kremer, H.-Hugo}, year={2010} }"},"issue":"18","publication":"bwp@ Berufs- und Wirtschaftspädagogik - online"},{"date_created":"2019-01-31T13:03:06Z","type":"journal_article","department":[{"_id":"66"}],"issue":"3","publication":"Softwaretechnik-Trends","citation":{"ama":"Löffler R, Güldali B, Geisen S. Towards Model-based Acceptance Testing for Scrum. <i>Softwaretechnik-Trends</i>. 2010;30(3):9-12.","bibtex":"@article{Löffler_Güldali_Geisen_2010, title={Towards Model-based Acceptance Testing for Scrum}, volume={30}, number={3}, journal={Softwaretechnik-Trends}, author={Löffler, Renate and Güldali, Baris and Geisen, Silke}, year={2010}, pages={9–12} }","mla":"Löffler, Renate, et al. “Towards Model-Based Acceptance Testing for Scrum.” <i>Softwaretechnik-Trends</i>, vol. 30, no. 3, 2010, pp. 9–12.","short":"R. Löffler, B. Güldali, S. Geisen, Softwaretechnik-Trends 30 (2010) 9–12.","chicago":"Löffler, Renate, Baris Güldali, and Silke Geisen. “Towards Model-Based Acceptance Testing for Scrum.” <i>Softwaretechnik-Trends</i> 30, no. 3 (2010): 9–12.","apa":"Löffler, R., Güldali, B., &#38; Geisen, S. (2010). Towards Model-based Acceptance Testing for Scrum. <i>Softwaretechnik-Trends</i>, <i>30</i>(3), 9–12.","ieee":"R. Löffler, B. Güldali, and S. Geisen, “Towards Model-based Acceptance Testing for Scrum,” <i>Softwaretechnik-Trends</i>, vol. 30, no. 3, pp. 9–12, 2010."},"page":"9-12","_id":"7356","language":[{"iso":"eng"}],"user_id":"52534","volume":30,"title":"Towards Model-based Acceptance Testing for Scrum","status":"public","year":"2010","author":[{"full_name":"Löffler, Renate","first_name":"Renate","last_name":"Löffler"},{"first_name":"Baris","last_name":"Güldali","full_name":"Güldali, Baris"},{"full_name":"Geisen, Silke","first_name":"Silke","last_name":"Geisen"}],"date_updated":"2022-01-06T07:03:35Z","intvolume":"        30"},{"issue":"3","publication":"OBJEKTspektrum","citation":{"ieee":"B. Güldali, S. Jungmayr, M. Mlynarski, S. Neumann, and M. Winter, “Starthilfe für modellbasiertes Testen,” <i>OBJEKTspektrum</i>, no. 3, pp. 63–69, 2010.","apa":"Güldali, B., Jungmayr, S., Mlynarski, M., Neumann, S., &#38; Winter, M. (2010). Starthilfe für modellbasiertes Testen. <i>OBJEKTspektrum</i>, (3), 63–69.","chicago":"Güldali, Baris, Stefan Jungmayr, Michael Mlynarski, Stefan Neumann, and Mario Winter. “Starthilfe Für Modellbasiertes Testen.” <i>OBJEKTspektrum</i>, no. 3 (2010): 63–69.","short":"B. Güldali, S. Jungmayr, M. Mlynarski, S. Neumann, M. Winter, OBJEKTspektrum (2010) 63–69.","mla":"Güldali, Baris, et al. “Starthilfe Für Modellbasiertes Testen.” <i>OBJEKTspektrum</i>, no. 3, 2010, pp. 63–69.","bibtex":"@article{Güldali_Jungmayr_Mlynarski_Neumann_Winter_2010, title={Starthilfe für modellbasiertes Testen}, number={3}, journal={OBJEKTspektrum}, author={Güldali, Baris and Jungmayr, Stefan and Mlynarski, Michael and Neumann, Stefan and Winter, Mario}, year={2010}, pages={63–69} }","ama":"Güldali B, Jungmayr S, Mlynarski M, Neumann S, Winter M. Starthilfe für modellbasiertes Testen. <i>OBJEKTspektrum</i>. 2010;(3):63-69."},"date_created":"2019-01-31T13:03:42Z","type":"journal_article","department":[{"_id":"66"}],"status":"public","year":"2010","title":"Starthilfe für modellbasiertes Testen","author":[{"first_name":"Baris","last_name":"Güldali","full_name":"Güldali, Baris"},{"full_name":"Jungmayr, Stefan","last_name":"Jungmayr","first_name":"Stefan"},{"full_name":"Mlynarski, Michael","first_name":"Michael","last_name":"Mlynarski"},{"last_name":"Neumann","first_name":"Stefan","full_name":"Neumann, Stefan"},{"full_name":"Winter, Mario","last_name":"Winter","first_name":"Mario"}],"date_updated":"2022-01-06T07:03:35Z","page":"63-69","_id":"7357","language":[{"iso":"eng"}],"user_id":"52534"},{"citation":{"ieee":"D. Beulen, B. Güldali, and M. Mlynarski, “Tabellarischer Vergleich der Prozessmodelle für modellbasiertes Testen aus Managementsicht,” <i>Softwaretechnik-Trends</i>, vol. 30, no. 2, pp. 6–9, 2010.","apa":"Beulen, D., Güldali, B., &#38; Mlynarski, M. (2010). Tabellarischer Vergleich der Prozessmodelle für modellbasiertes Testen aus Managementsicht. <i>Softwaretechnik-Trends</i>, <i>30</i>(2), 6–9.","short":"D. Beulen, B. Güldali, M. Mlynarski, Softwaretechnik-Trends 30 (2010) 6–9.","chicago":"Beulen, Dominik, Baris Güldali, and Michael Mlynarski. “Tabellarischer Vergleich Der Prozessmodelle Für Modellbasiertes Testen Aus Managementsicht.” <i>Softwaretechnik-Trends</i> 30, no. 2 (2010): 6–9.","mla":"Beulen, Dominik, et al. “Tabellarischer Vergleich Der Prozessmodelle Für Modellbasiertes Testen Aus Managementsicht.” <i>Softwaretechnik-Trends</i>, vol. 30, no. 2, 2010, pp. 6–9.","bibtex":"@article{Beulen_Güldali_Mlynarski_2010, title={Tabellarischer Vergleich der Prozessmodelle für modellbasiertes Testen aus Managementsicht}, volume={30}, number={2}, journal={Softwaretechnik-Trends}, author={Beulen, Dominik and Güldali, Baris and Mlynarski, Michael}, year={2010}, pages={6–9} }","ama":"Beulen D, Güldali B, Mlynarski M. Tabellarischer Vergleich der Prozessmodelle für modellbasiertes Testen aus Managementsicht. <i>Softwaretechnik-Trends</i>. 2010;30(2):6-9."},"publication":"Softwaretechnik-Trends","issue":"2","date_created":"2019-01-31T13:04:16Z","department":[{"_id":"66"}],"type":"journal_article","author":[{"full_name":"Beulen, Dominik","last_name":"Beulen","first_name":"Dominik"},{"full_name":"Güldali, Baris","first_name":"Baris","last_name":"Güldali"},{"last_name":"Mlynarski","first_name":"Michael","full_name":"Mlynarski, Michael"}],"year":"2010","status":"public","title":"Tabellarischer Vergleich der Prozessmodelle für modellbasiertes Testen aus Managementsicht","intvolume":"        30","date_updated":"2022-01-06T07:03:35Z","language":[{"iso":"eng"}],"_id":"7358","page":"6-9","volume":30,"user_id":"52534"},{"volume":30,"user_id":"52534","language":[{"iso":"eng"}],"_id":"7359","main_file_link":[{"url":"https://pdfs.semanticscholar.org/60f0/c7a91e57e1741a75581ecf5a48ba228669ec.pdf"}],"intvolume":"        30","date_updated":"2022-01-06T07:03:35Z","author":[{"first_name":"Melanie","last_name":"Späth","full_name":"Späth, Melanie"},{"full_name":"Mlynarski, Michael","last_name":"Mlynarski","first_name":"Michael"}],"status":"public","year":"2010","title":"Agiles Testen in Großprojekten mit TDD und Testaspekten: Beobachtungen und erste Erfahrungen","department":[{"_id":"66"}],"type":"journal_article","date_created":"2019-01-31T13:05:54Z","citation":{"mla":"Späth, Melanie, and Michael Mlynarski. “Agiles Testen in Großprojekten Mit TDD Und Testaspekten: Beobachtungen Und Erste Erfahrungen.” <i>Softwaretechnik-Trends</i>, vol. 30, 2010.","ama":"Späth M, Mlynarski M. Agiles Testen in Großprojekten mit TDD und Testaspekten: Beobachtungen und erste Erfahrungen. <i>Softwaretechnik-Trends</i>. 2010;30.","bibtex":"@article{Späth_Mlynarski_2010, title={Agiles Testen in Großprojekten mit TDD und Testaspekten: Beobachtungen und erste Erfahrungen}, volume={30}, journal={Softwaretechnik-Trends}, author={Späth, Melanie and Mlynarski, Michael}, year={2010} }","apa":"Späth, M., &#38; Mlynarski, M. (2010). Agiles Testen in Großprojekten mit TDD und Testaspekten: Beobachtungen und erste Erfahrungen. <i>Softwaretechnik-Trends</i>, <i>30</i>.","ieee":"M. Späth and M. Mlynarski, “Agiles Testen in Großprojekten mit TDD und Testaspekten: Beobachtungen und erste Erfahrungen,” <i>Softwaretechnik-Trends</i>, vol. 30, 2010.","chicago":"Späth, Melanie, and Michael Mlynarski. “Agiles Testen in Großprojekten Mit TDD Und Testaspekten: Beobachtungen Und Erste Erfahrungen.” <i>Softwaretechnik-Trends</i> 30 (2010).","short":"M. Späth, M. Mlynarski, Softwaretechnik-Trends 30 (2010)."},"publication":"Softwaretechnik-Trends"},{"type":"journal_article","department":[{"_id":"66"}],"date_created":"2019-01-31T15:17:37Z","abstract":[{"lang":"eng","text":"In the last years the software engineering community pays a strong interest in agile development methods. Those methods place software testing for example the Test-Driven Development method as an important task of the development process. Agile projects rely on good test automation tools. In this paper we evaluate five test automation tools for their usage in acceptance testing for web applications using Test-Driven Development."}],"publication":"Electrical Review","citation":{"ieee":"M. Jureczko and M. Mlynarski, “Automated acceptance testing tools for web applications using Test-Driven Development,” <i>Electrical Review</i>, vol. 86, pp. 198–202, 2010.","apa":"Jureczko, M., &#38; Mlynarski, M. (2010). Automated acceptance testing tools for web applications using Test-Driven Development. <i>Electrical Review</i>, <i>86</i>, 198–202.","short":"M. Jureczko, M. Mlynarski, Electrical Review 86 (2010) 198–202.","chicago":"Jureczko, Marian, and Michael Mlynarski. “Automated Acceptance Testing Tools for Web Applications Using Test-Driven Development.” <i>Electrical Review</i> 86 (2010): 198–202.","mla":"Jureczko, Marian, and Michael Mlynarski. “Automated Acceptance Testing Tools for Web Applications Using Test-Driven Development.” <i>Electrical Review</i>, vol. 86, 2010, pp. 198–202.","bibtex":"@article{Jureczko_Mlynarski_2010, title={Automated acceptance testing tools for web applications using Test-Driven Development}, volume={86}, journal={Electrical Review}, author={Jureczko, Marian and Mlynarski, Michael}, year={2010}, pages={198–202} }","ama":"Jureczko M, Mlynarski M. Automated acceptance testing tools for web applications using Test-Driven Development. <i>Electrical Review</i>. 2010;86:198-202."},"user_id":"52534","volume":86,"page":"198-202","language":[{"iso":"eng"}],"_id":"7364","date_updated":"2022-01-06T07:03:35Z","intvolume":"        86","year":"2010","title":"Automated acceptance testing tools for web applications using Test-Driven Development","status":"public","author":[{"last_name":"Jureczko","first_name":"Marian","full_name":"Jureczko, Marian"},{"last_name":"Mlynarski","first_name":"Michael","full_name":"Mlynarski, Michael"}]},{"user_id":"74378","volume":22,"editor":[{"first_name":"T.","last_name":"Tramm","full_name":"Tramm, T."},{"last_name":"Seeber","first_name":"S.","full_name":"Seeber, S."},{"first_name":"H.-H.","last_name":"Kremer","full_name":"Kremer, H.-H."}],"main_file_link":[{"url":"http://www.bwpat.de/ausgabe22/frehe_kremer_bwpat22.pdf"}],"_id":"7474","language":[{"iso":"ger"}],"date_updated":"2022-01-06T07:03:38Z","intvolume":"        22","title":"Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem","year":"2010","status":"public","author":[{"id":"5994","first_name":"Petra","last_name":"Frehe","full_name":"Frehe, Petra"},{"full_name":"Kremer, H.-Hugo","first_name":"H.-Hugo","last_name":"Kremer","id":"15280"}],"type":"book_chapter","department":[{"_id":"211"}],"date_created":"2019-02-04T13:29:21Z","publication":"Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich","citation":{"mla":"Frehe, Petra, and H. Hugo Kremer. “Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem.” <i>Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich</i>, edited by T. Tramm et al., vol. 22, 2010.","bibtex":"@inbook{Frehe_Kremer_2010, title={Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem}, volume={22}, booktitle={Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich}, author={Frehe, Petra and Kremer, H.-Hugo}, editor={Tramm, T. and Seeber, S. and Kremer, H.-H.Editors}, year={2010} }","ama":"Frehe P, Kremer H-H. Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem. In: Tramm T, Seeber S, Kremer H-H, eds. <i>Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich</i>. Vol 22. ; 2010.","ieee":"P. Frehe and H.-H. Kremer, “Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem,” in <i>Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich</i>, vol. 22, T. Tramm, S. Seeber, and H.-H. Kremer, Eds. 2010.","apa":"Frehe, P., &#38; Kremer, H.-H. (2010). Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem. In T. Tramm, S. Seeber, &#38; H.-H. Kremer (Eds.), <i>Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich</i> (Vol. 22).","short":"P. Frehe, H.-H. Kremer, in: T. Tramm, S. Seeber, H.-H. Kremer (Eds.), Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich, 2010.","chicago":"Frehe, Petra, and H.-Hugo Kremer. “Rollenbasierte Kompetenzbilanz - Potenziale und Herausforderungen für das berufsschulische Übergangssystem.” In <i>Funktionen und Erträge pädagogischer Diagnostik im wirtschafts- und berufspädagogischen Bereich</i>, edited by T. Tramm, S. Seeber, and H.-H. Kremer, Vol. 22, 2010."}},{"citation":{"apa":"Mehta, M., &#38; Meier, C. (2010). Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals. <i>Journal of The Electrochemical Society</i>, <i>158</i>(2). <a href=\"https://doi.org/10.1149/1.3519999\">https://doi.org/10.1149/1.3519999</a>","ieee":"M. Mehta and C. Meier, “Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals,” <i>Journal of The Electrochemical Society</i>, vol. 158, no. 2, 2010.","chicago":"Mehta, M., and Cedrik Meier. “Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals.” <i>Journal of The Electrochemical Society</i> 158, no. 2 (2010). <a href=\"https://doi.org/10.1149/1.3519999\">https://doi.org/10.1149/1.3519999</a>.","short":"M. Mehta, C. Meier, Journal of The Electrochemical Society 158 (2010).","mla":"Mehta, M., and Cedrik Meier. “Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals.” <i>Journal of The Electrochemical Society</i>, vol. 158, no. 2, H119, The Electrochemical Society, 2010, doi:<a href=\"https://doi.org/10.1149/1.3519999\">10.1149/1.3519999</a>.","ama":"Mehta M, Meier C. Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals. <i>Journal of The Electrochemical Society</i>. 2010;158(2). doi:<a href=\"https://doi.org/10.1149/1.3519999\">10.1149/1.3519999</a>","bibtex":"@article{Mehta_Meier_2010, title={Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals}, volume={158}, DOI={<a href=\"https://doi.org/10.1149/1.3519999\">10.1149/1.3519999</a>}, number={2H119}, journal={Journal of The Electrochemical Society}, publisher={The Electrochemical Society}, author={Mehta, M. and Meier, Cedrik}, year={2010} }"},"status":"public","user_id":"20798","volume":158,"publisher":"The Electrochemical Society","_id":"7494","publication":"Journal of The Electrochemical Society","issue":"2","type":"journal_article","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"},{"_id":"287"}],"date_created":"2019-02-04T14:35:22Z","publication_status":"published","date_updated":"2022-01-06T07:03:39Z","intvolume":"       158","title":"Controlled Etching Behavior of O-Polar and Zn-Polar ZnO Single Crystals","year":"2010","publication_identifier":{"issn":["0013-4651"]},"author":[{"first_name":"M.","last_name":"Mehta","full_name":"Mehta, M."},{"full_name":"Meier, Cedrik","first_name":"Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","last_name":"Meier","id":"20798"}],"doi":"10.1149/1.3519999","article_number":"H119","language":[{"iso":"eng"}]},{"citation":{"ieee":"J. Theis, M. Geller, A. Lorke, H. Wiggers, A. Wieck, and C. Meier, “Electroluminescence from silicon nanoparticles fabricated from the gas phase,” <i>Nanotechnology</i>, vol. 21, no. 45, 2010.","apa":"Theis, J., Geller, M., Lorke, A., Wiggers, H., Wieck, A., &#38; Meier, C. (2010). Electroluminescence from silicon nanoparticles fabricated from the gas phase. <i>Nanotechnology</i>, <i>21</i>(45). <a href=\"https://doi.org/10.1088/0957-4484/21/45/455201\">https://doi.org/10.1088/0957-4484/21/45/455201</a>","mla":"Theis, Jens, et al. “Electroluminescence from Silicon Nanoparticles Fabricated from the Gas Phase.” <i>Nanotechnology</i>, vol. 21, no. 45, 455201, IOP Publishing, 2010, doi:<a href=\"https://doi.org/10.1088/0957-4484/21/45/455201\">10.1088/0957-4484/21/45/455201</a>.","bibtex":"@article{Theis_Geller_Lorke_Wiggers_Wieck_Meier_2010, title={Electroluminescence from silicon nanoparticles fabricated from the gas phase}, volume={21}, DOI={<a href=\"https://doi.org/10.1088/0957-4484/21/45/455201\">10.1088/0957-4484/21/45/455201</a>}, number={45455201}, journal={Nanotechnology}, publisher={IOP Publishing}, author={Theis, Jens and Geller, Martin and Lorke, Axel and Wiggers, Hartmut and Wieck, Andreas and Meier, Cedrik}, year={2010} }","chicago":"Theis, Jens, Martin Geller, Axel Lorke, Hartmut Wiggers, Andreas Wieck, and Cedrik Meier. “Electroluminescence from Silicon Nanoparticles Fabricated from the Gas Phase.” <i>Nanotechnology</i> 21, no. 45 (2010). <a href=\"https://doi.org/10.1088/0957-4484/21/45/455201\">https://doi.org/10.1088/0957-4484/21/45/455201</a>.","short":"J. Theis, M. Geller, A. Lorke, H. Wiggers, A. Wieck, C. Meier, Nanotechnology 21 (2010).","ama":"Theis J, Geller M, Lorke A, Wiggers H, Wieck A, Meier C. Electroluminescence from silicon nanoparticles fabricated from the gas phase. <i>Nanotechnology</i>. 2010;21(45). doi:<a href=\"https://doi.org/10.1088/0957-4484/21/45/455201\">10.1088/0957-4484/21/45/455201</a>"},"status":"public","user_id":"20798","volume":21,"_id":"7496","publisher":"IOP Publishing","issue":"45","publication":"Nanotechnology","type":"journal_article","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"},{"_id":"287"}],"date_created":"2019-02-04T14:39:19Z","date_updated":"2022-01-06T07:03:39Z","publication_status":"published","intvolume":"        21","title":"Electroluminescence from silicon nanoparticles fabricated from the gas phase","year":"2010","publication_identifier":{"issn":["0957-4484","1361-6528"]},"author":[{"full_name":"Theis, Jens","last_name":"Theis","first_name":"Jens"},{"last_name":"Geller","first_name":"Martin","full_name":"Geller, Martin"},{"full_name":"Lorke, Axel","first_name":"Axel","last_name":"Lorke"},{"last_name":"Wiggers","first_name":"Hartmut","full_name":"Wiggers, Hartmut"},{"full_name":"Wieck, Andreas","last_name":"Wieck","first_name":"Andreas"},{"id":"20798","last_name":"Meier","orcid":"https://orcid.org/0000-0002-3787-3572","first_name":"Cedrik","full_name":"Meier, Cedrik"}],"doi":"10.1088/0957-4484/21/45/455201","article_number":"455201","language":[{"iso":"eng"}]},{"date_updated":"2022-01-06T07:03:39Z","author":[{"first_name":"Sebastian","last_name":"Oster","full_name":"Oster, Sebastian"},{"full_name":"Wübbeke, Andreas","last_name":"Wübbeke","first_name":"Andreas"},{"id":"107","first_name":"Gregor","last_name":"Engels","full_name":"Engels, Gregor"},{"first_name":"Andy","last_name":"Schürr","full_name":"Schürr, Andy"}],"status":"public","title":"Model-Based Software Product Lines Testing Survey","year":"2010","editor":[{"first_name":"P.","last_name":"Mosterman, I. Schieferdecker, J. Zander ","full_name":"Mosterman, I. Schieferdecker, J. Zander , P."}],"user_id":"52534","language":[{"iso":"eng"}],"_id":"7556","publisher":"CRC Press","series_title":"Computational Analysis, Synthesis, and Design of Dynamic Systems","page":"339-381","citation":{"ieee":"S. Oster, A. Wübbeke, G. Engels, and A. Schürr, “Model-Based Software Product Lines Testing Survey,” in <i>Model-Based Testing For Embedded Systems</i>, P. Mosterman, I. Schieferdecker, J. Zander , Ed. CRC Press, 2010, pp. 339–381.","apa":"Oster, S., Wübbeke, A., Engels, G., &#38; Schürr, A. (2010). Model-Based Software Product Lines Testing Survey. In P. Mosterman, I. Schieferdecker, J. Zander  (Ed.), <i>Model-Based Testing For Embedded Systems</i> (pp. 339–381). CRC Press.","chicago":"Oster, Sebastian, Andreas Wübbeke, Gregor Engels, and Andy Schürr. “Model-Based Software Product Lines Testing Survey.” In <i>Model-Based Testing For Embedded Systems</i>, edited by P. Mosterman, I. Schieferdecker, J. Zander , 339–81. Computational Analysis, Synthesis, and Design of Dynamic Systems. CRC Press, 2010.","short":"S. Oster, A. Wübbeke, G. Engels, A. Schürr, in: P. Mosterman, I. Schieferdecker, J. Zander  (Ed.), Model-Based Testing For Embedded Systems, CRC Press, 2010, pp. 339–381.","mla":"Oster, Sebastian, et al. “Model-Based Software Product Lines Testing Survey.” <i>Model-Based Testing For Embedded Systems</i>, edited by P. Mosterman, I. Schieferdecker, J. Zander , CRC Press, 2010, pp. 339–81.","bibtex":"@inbook{Oster_Wübbeke_Engels_Schürr_2010, series={Computational Analysis, Synthesis, and Design of Dynamic Systems}, title={Model-Based Software Product Lines Testing Survey}, booktitle={Model-Based Testing For Embedded Systems}, publisher={CRC Press}, author={Oster, Sebastian and Wübbeke, Andreas and Engels, Gregor and Schürr, Andy}, editor={Mosterman, I. Schieferdecker, J. Zander , P.Editor}, year={2010}, pages={339–381}, collection={Computational Analysis, Synthesis, and Design of Dynamic Systems} }","ama":"Oster S, Wübbeke A, Engels G, Schürr A. Model-Based Software Product Lines Testing Survey. In: Mosterman, I. Schieferdecker, J. Zander  P, ed. <i>Model-Based Testing For Embedded Systems</i>. Computational Analysis, Synthesis, and Design of Dynamic Systems. CRC Press; 2010:339-381."},"publication":"Model-Based Testing For Embedded Systems","department":[{"_id":"66"}],"type":"book_chapter","date_created":"2019-02-05T13:12:01Z"},{"date_created":"2019-02-06T14:20:25Z","department":[{"_id":"66"}],"type":"dissertation","citation":{"ama":"Wübbeke A. <i>Variabilitätsmanagement in Anforderungs- Und Testfallspezifikation Für Software-Produktlinien</i>.; 2010.","bibtex":"@book{Wübbeke_2010, title={Variabilitätsmanagement in Anforderungs- und Testfallspezifikation für Software-Produktlinien}, author={Wübbeke, Andreas}, year={2010} }","mla":"Wübbeke, Andreas. <i>Variabilitätsmanagement in Anforderungs- Und Testfallspezifikation Für Software-Produktlinien</i>. 2010.","short":"A. Wübbeke, Variabilitätsmanagement in Anforderungs- Und Testfallspezifikation Für Software-Produktlinien, 2010.","chicago":"Wübbeke, Andreas. <i>Variabilitätsmanagement in Anforderungs- Und Testfallspezifikation Für Software-Produktlinien</i>, 2010.","apa":"Wübbeke, A. (2010). <i>Variabilitätsmanagement in Anforderungs- und Testfallspezifikation für Software-Produktlinien</i>.","ieee":"A. Wübbeke, <i>Variabilitätsmanagement in Anforderungs- und Testfallspezifikation für Software-Produktlinien</i>. 2010."},"abstract":[{"lang":"eng","text":"Software Product Lines (SPL) are a development paradigm allowing the reduction of the software system development time while increasing their quality. To reach these goals, the artefacts being part of many or all software systems are developed only once and reused within the different software systems. The software systems developed by a software product line approach are called products. Like a thread the reuse of artefacts is woven into the software product line development process. As some artefacts are only used for the development of some products, these artefacts constitute the variability of the SPL. First of all, the modelling of variability has to be enabled in every artefact. Beside this, dependencies can arise between variable artefacts. The modelling of variability and dependencies also demands the redevelopment or adaption of specification techniques for these artefacts. This thesis focuses on the variability management concerning requirements and test case specification for Software Product Lines. For this purpose, existing modelling languages and specification techniques are augmented with variability instead of redeveloping similar software development artefacts over and over again. In order to augment the modelling languages by variability, a language construction process based on a meta model of the variability management is defined. In order to manage the dependencies between variable artefacts, a feature based variability management is introduced. Finally, the extension of specification techniques for requirements specifications based on use case descriptions and test specifications are described. The contribution of this thesis is substantiated by a prototypical tool support and an industrial case study."}],"language":[{"iso":"eng"}],"_id":"7573","user_id":"52534","author":[{"first_name":"Andreas","last_name":"Wübbeke","full_name":"Wübbeke, Andreas"}],"year":"2010","title":"Variabilitätsmanagement in Anforderungs- und Testfallspezifikation für Software-Produktlinien","status":"public","date_updated":"2022-01-06T07:03:40Z"},{"date_updated":"2022-01-06T07:03:55Z","intvolume":"        30","year":"2010","title":"Test-driven Language Derivation with Graph Transformation-based Dynamic Meta Modeling","status":"public","author":[{"last_name":"Engels","first_name":"Gregor","full_name":"Engels, Gregor","id":"107"},{"full_name":"Soltenborn, Christian","last_name":"Soltenborn","first_name":"Christian","orcid":"0000-0002-0342-8227","id":"1737"}],"user_id":"14955","volume":30,"page":"240-257","publisher":"European Association of Software Science and Technology","_id":"8437","series_title":"Electronic Communications of the EASST","language":[{"iso":"eng"}],"abstract":[{"text":"Deriving a new language L_B from an already existing one L_A is a typical task in domain-specific language engineering. Here, besides adjusting L_A's syntax, the language engineer has to modify the semantics of L_A to derive L_B's semantics. Particularly, in case of behavioral modeling languages, this is a difficult and error-prone task, as changing the behavior of language elements or adding behavior for new elements might have undesired side effects. Therefore, we propose a test-driven language derivation process. In a first step, the language engineer creates example models containing the changed or newly added elements in different contexts. For each of these models, the language engineer also precisely describes the expected behavior. In a second step, each example model and its description of behavior is transformed into an executable test case. Finally, these test cases are used when deriving the actual semantics of L_B - at any time, the language engineer can run the tests to verify whether the changes he performed on L_A's semantics indeed produce the desired behavior. In this paper, we illustrate the approach using our graph transformation-based semantics specification technique Dynamic Meta Modeling. This is once more an example where the graph transformation approach shows its strengths and appropriateness to support software engineering tasks as, e.g., model transformations, software specifications, or tool development.","lang":"eng"}],"publication":"Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)","citation":{"chicago":"Engels, Gregor, and Christian Soltenborn. “Test-Driven Language Derivation with Graph Transformation-Based Dynamic Meta Modeling.” In <i>Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)</i>, 30:240–57. Electronic Communications of the EASST. European Association of Software Science and Technology, 2010.","short":"G. Engels, C. Soltenborn, in: Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany), European Association of Software Science and Technology, 2010, pp. 240–257.","apa":"Engels, G., &#38; Soltenborn, C. (2010). Test-driven Language Derivation with Graph Transformation-based Dynamic Meta Modeling. In <i>Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)</i> (Vol. 30, pp. 240–257). European Association of Software Science and Technology.","ieee":"G. Engels and C. Soltenborn, “Test-driven Language Derivation with Graph Transformation-based Dynamic Meta Modeling,” in <i>Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)</i>, 2010, vol. 30, pp. 240–257.","ama":"Engels G, Soltenborn C. Test-driven Language Derivation with Graph Transformation-based Dynamic Meta Modeling. In: <i>Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)</i>. Vol 30. Electronic Communications of the EASST. European Association of Software Science and Technology; 2010:240-257.","bibtex":"@inproceedings{Engels_Soltenborn_2010, series={Electronic Communications of the EASST}, title={Test-driven Language Derivation with Graph Transformation-based Dynamic Meta Modeling}, volume={30}, booktitle={Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)}, publisher={European Association of Software Science and Technology}, author={Engels, Gregor and Soltenborn, Christian}, year={2010}, pages={240–257}, collection={Electronic Communications of the EASST} }","mla":"Engels, Gregor, and Christian Soltenborn. “Test-Driven Language Derivation with Graph Transformation-Based Dynamic Meta Modeling.” <i>Proceedings of the International Colloquium on Graph and Model Transformation (GraMoT 2010), Berlin (Germany)</i>, vol. 30, European Association of Software Science and Technology, 2010, pp. 240–57."},"type":"conference","department":[{"_id":"66"}],"date_created":"2019-03-06T16:20:33Z"},{"author":[{"full_name":"Güldali, Baris","first_name":"Baris","last_name":"Güldali"},{"full_name":"Mlynarski, Michael","first_name":"Michael","last_name":"Mlynarski"}],"title":"Agility vs. Model-based Testing: A fair Play?","status":"public","year":"2010","intvolume":"       646","date_updated":"2022-01-06T07:03:55Z","series_title":"CEUR Workshop Proceedings","_id":"8438","language":[{"iso":"eng"}],"main_file_link":[{"url":"http://ceur-ws.org/Vol-646/EMDT2010paper1.pdf"}],"page":"55-58 ","volume":646,"user_id":"52534","citation":{"mla":"Güldali, Baris, and Michael Mlynarski. “Agility vs. Model-Based Testing: A Fair Play?” <i>Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)</i>, vol. 646, 2010, pp. 55–58.","apa":"Güldali, B., &#38; Mlynarski, M. (2010). Agility vs. Model-based Testing: A fair Play? In <i>Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)</i> (Vol. 646, pp. 55–58).","ieee":"B. Güldali and M. Mlynarski, “Agility vs. Model-based Testing: A fair Play?,” in <i>Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)</i>, 2010, vol. 646, pp. 55–58.","short":"B. Güldali, M. Mlynarski, in: Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010), 2010, pp. 55–58.","ama":"Güldali B, Mlynarski M. Agility vs. Model-based Testing: A fair Play? In: <i>Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)</i>. Vol 646. CEUR Workshop Proceedings. ; 2010:55-58.","chicago":"Güldali, Baris, and Michael Mlynarski. “Agility vs. Model-Based Testing: A Fair Play?” In <i>Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)</i>, 646:55–58. CEUR Workshop Proceedings, 2010.","bibtex":"@inproceedings{Güldali_Mlynarski_2010, series={CEUR Workshop Proceedings}, title={Agility vs. Model-based Testing: A fair Play?}, volume={646}, booktitle={Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)}, author={Güldali, Baris and Mlynarski, Michael}, year={2010}, pages={55–58}, collection={CEUR Workshop Proceedings} }"},"publication":"Proceedings of the IWK2010 Workshops: The First International Workshop on Evolution Support for Model-Based Development and Testing (EMDT2010)","date_created":"2019-03-06T16:20:34Z","department":[{"_id":"66"}],"type":"conference"},{"date_created":"2019-03-06T16:20:35Z","type":"conference","department":[{"_id":"66"}],"publication":"Proceedings of Produktlinien im Kontext (PIK2010)","citation":{"ama":"Wübbeke A, Oster S. Verknüpfung von kombinatorischem Plattform- und individuellem Produkt-Test für Software-Produktlinien. In: <i>Proceedings of Produktlinien Im Kontext (PIK2010)</i>. ; 2010:to appear.","bibtex":"@inproceedings{Wübbeke_Oster_2010, title={Verknüpfung von kombinatorischem Plattform- und individuellem Produkt-Test für Software-Produktlinien}, booktitle={Proceedings of Produktlinien im Kontext (PIK2010)}, author={Wübbeke, Andreas and Oster, Sebastian}, year={2010}, pages={to appear} }","mla":"Wübbeke, Andreas, and Sebastian Oster. “Verknüpfung von Kombinatorischem Plattform- Und Individuellem Produkt-Test Für Software-Produktlinien.” <i>Proceedings of Produktlinien Im Kontext (PIK2010)</i>, 2010, p. to appear.","short":"A. Wübbeke, S. Oster, in: Proceedings of Produktlinien Im Kontext (PIK2010), 2010, p. to appear.","chicago":"Wübbeke, Andreas, and Sebastian Oster. “Verknüpfung von Kombinatorischem Plattform- Und Individuellem Produkt-Test Für Software-Produktlinien.” In <i>Proceedings of Produktlinien Im Kontext (PIK2010)</i>, to appear, 2010.","apa":"Wübbeke, A., &#38; Oster, S. (2010). Verknüpfung von kombinatorischem Plattform- und individuellem Produkt-Test für Software-Produktlinien. In <i>Proceedings of Produktlinien im Kontext (PIK2010)</i> (p. to appear).","ieee":"A. Wübbeke and S. Oster, “Verknüpfung von kombinatorischem Plattform- und individuellem Produkt-Test für Software-Produktlinien,” in <i>Proceedings of Produktlinien im Kontext (PIK2010)</i>, 2010, p. to appear."},"page":"to appear","_id":"8439","language":[{"iso":"eng"}],"user_id":"52534","status":"public","year":"2010","title":"Verknüpfung von kombinatorischem Plattform- und individuellem Produkt-Test für Software-Produktlinien","author":[{"last_name":"Wübbeke","first_name":"Andreas","full_name":"Wübbeke, Andreas"},{"first_name":"Sebastian","last_name":"Oster","full_name":"Oster, Sebastian"}],"date_updated":"2022-01-06T07:03:55Z"}]