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Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>. ; 2010.","ieee":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” 2010.","apa":"Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>.","short":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), Chicago, IL, USA, 2010.","chicago":"Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>. Chicago, IL, USA, 2010."},"language":[{"iso":"eng"}],"_id":"13049","user_id":"209","year":"2010","title":"Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits","status":"public","author":[{"full_name":"Becker, Bernd","last_name":"Becker","first_name":"Bernd"},{"id":"209","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"full_name":"Polian, Ilia","first_name":"Ilia","last_name":"Polian"},{"full_name":"Straube, Bernd","first_name":"Bernd","last_name":"Straube"},{"full_name":"Vermeiren, Wolfgang","first_name":"Wolfgang","last_name":"Vermeiren"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"date_updated":"2022-05-11T16:26:18Z"}]