[{"publication_identifier":{"issn":["2219-603X"]},"author":[{"full_name":"Allmer, Thomas","first_name":"Thomas","last_name":"Allmer","id":"98373"}],"year":"2011","title":"Towards a Critical Theory of Surveillance Studies","status":"public","date_updated":"2023-03-14T09:39:43Z","publication_status":"published","_id":"42969","language":[{"iso":"eng"}],"user_id":"71124","citation":{"ama":"Allmer T. <i>Towards a Critical Theory of Surveillance Studies</i>.; 2011.","bibtex":"@book{Allmer_2011, place={Vienna}, title={Towards a Critical Theory of Surveillance Studies}, author={Allmer, Thomas}, year={2011} }","mla":"Allmer, Thomas. <i>Towards a Critical Theory of Surveillance Studies</i>. 2011.","chicago":"Allmer, Thomas. <i>Towards a Critical Theory of Surveillance Studies</i>. Vienna, 2011.","short":"T. Allmer, Towards a Critical Theory of Surveillance Studies, Vienna, 2011.","apa":"Allmer, T. (2011). <i>Towards a Critical Theory of Surveillance Studies</i>.","ieee":"T. Allmer, <i>Towards a Critical Theory of Surveillance Studies</i>. Vienna, 2011."},"place":"Vienna","date_created":"2023-03-13T15:14:11Z","department":[{"_id":"136"}],"type":"report"},{"extern":"1","citation":{"short":"T. Allmer, TripleC  9 (2011) 566–592.","chicago":"Allmer, Thomas. “Critical Surveillance Studies in the Information Society.” <i>TripleC </i> 9, no. 2 (2011): 566–92. <a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>.","apa":"Allmer, T. (2011). Critical Surveillance Studies in the Information Society. <i>TripleC </i>, <i>9</i>(2), 566–592. <a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>","ieee":"T. Allmer, “Critical Surveillance Studies in the Information Society,” <i>tripleC </i>, vol. 9, no. 2, pp. 566–592, 2011, doi: <a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>.","ama":"Allmer T. Critical Surveillance Studies in the Information Society. <i>tripleC </i>. 2011;9(2):566-592. doi:<a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>","bibtex":"@article{Allmer_2011, title={Critical Surveillance Studies in the Information Society}, volume={9}, DOI={<a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>}, number={2}, journal={tripleC }, author={Allmer, Thomas}, year={2011}, pages={566–592} }","mla":"Allmer, Thomas. “Critical Surveillance Studies in the Information Society.” <i>TripleC </i>, vol. 9, no. 2, 2011, pp. 566–92, doi:<a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>."},"issue":"2","publication":"tripleC ","department":[{"_id":"136"}],"type":"journal_article","date_created":"2023-03-14T09:08:29Z","intvolume":"         9","publication_status":"published","date_updated":"2023-03-14T09:41:20Z","author":[{"id":"98373","first_name":"Thomas","last_name":"Allmer","full_name":"Allmer, Thomas"}],"year":"2011","title":"Critical Surveillance Studies in the Information Society","status":"public","volume":9,"user_id":"71124","doi":"https://doi.org/10.31269/triplec.v9i2.266","_id":"43008","language":[{"iso":"eng"}],"page":"566-592"},{"date_created":"2023-03-10T08:47:49Z","place":"Münster","department":[{"_id":"136"}],"type":"book_editor","citation":{"ama":"Sandoval  M, Sevignani S, Rehbogen A, Allmer T, Hager M, Kreilinger V, eds. <i>Bildung MACHT Gesellschaft</i>. Westfälisches Dampfboot.; 2011.","bibtex":"@book{Sandoval _Sevignani_Rehbogen_Allmer_Hager_Kreilinger_2011, place={Münster}, title={Bildung MACHT Gesellschaft}, publisher={Westfälisches Dampfboot.}, year={2011} }","mla":"Sandoval , Marisol, et al., editors. <i>Bildung MACHT Gesellschaft</i>. Westfälisches Dampfboot., 2011.","chicago":"Sandoval , Marisol, Sebastian Sevignani, Alexander  Rehbogen, Thomas Allmer, Matthias  Hager, and Verena Kreilinger, eds. <i>Bildung MACHT Gesellschaft</i>. Münster: Westfälisches Dampfboot., 2011.","short":"M. Sandoval , S. Sevignani, A. Rehbogen, T. Allmer, M. Hager, V. Kreilinger, eds., Bildung MACHT Gesellschaft, Westfälisches Dampfboot., Münster, 2011.","apa":"Sandoval , M., Sevignani, S., Rehbogen, A., Allmer, T., Hager, M., &#38; Kreilinger, V. (Eds.). (2011). <i>Bildung MACHT Gesellschaft</i>. Westfälisches Dampfboot.","ieee":"M. Sandoval , S. Sevignani, A. Rehbogen, T. Allmer, M. Hager, and V. Kreilinger, Eds., <i>Bildung MACHT Gesellschaft</i>. Münster: Westfälisches Dampfboot., 2011."},"extern":"1","_id":"42946","language":[{"iso":"ger"}],"publisher":"Westfälisches Dampfboot.","editor":[{"full_name":"Sandoval , Marisol","last_name":"Sandoval ","first_name":"Marisol"},{"first_name":"Sebastian","last_name":"Sevignani","full_name":"Sevignani, Sebastian"},{"first_name":"Alexander ","last_name":"Rehbogen","full_name":"Rehbogen, Alexander "},{"first_name":"Thomas","last_name":"Allmer","full_name":"Allmer, Thomas","id":"98373"},{"first_name":"Matthias ","last_name":"Hager","full_name":"Hager, Matthias "},{"first_name":"Verena","last_name":"Kreilinger","full_name":"Kreilinger, Verena"}],"user_id":"71124","title":"Bildung MACHT Gesellschaft","status":"public","year":"2011","publication_status":"published","date_updated":"2023-03-14T09:42:51Z"},{"citation":{"ama":"Vidor FF, Wirth GI, Wolff K, Hilleringmann U. Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. <i>ECS Transactions</i>. 2011;39(1):109-115. doi:<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>","bibtex":"@article{Vidor_Wirth_Wolff_Hilleringmann_2011, title={Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors}, volume={39}, DOI={<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>}, number={1}, journal={ECS Transactions}, publisher={The Electrochemical Society}, author={Vidor, Fábio Fedrizzi and Wirth, Gilson Inácio and Wolff, Karsten and Hilleringmann, Ulrich}, year={2011}, pages={109–115} }","mla":"Vidor, Fábio Fedrizzi, et al. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” <i>ECS Transactions</i>, vol. 39, no. 1, The Electrochemical Society, 2011, pp. 109–15, doi:<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>.","chicago":"Vidor, Fábio Fedrizzi, Gilson Inácio Wirth, Karsten Wolff, and Ulrich Hilleringmann. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” <i>ECS Transactions</i> 39, no. 1 (2011): 109–15. <a href=\"https://doi.org/10.1149/1.3615183\">https://doi.org/10.1149/1.3615183</a>.","short":"F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.","apa":"Vidor, F. F., Wirth, G. I., Wolff, K., &#38; Hilleringmann, U. (2011). Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. <i>ECS Transactions</i>, <i>39</i>(1), 109–115. <a href=\"https://doi.org/10.1149/1.3615183\">https://doi.org/10.1149/1.3615183</a>","ieee":"F. F. Vidor, G. I. Wirth, K. Wolff, and U. Hilleringmann, “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors,” <i>ECS Transactions</i>, vol. 39, no. 1, pp. 109–115, 2011, doi: <a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>."},"publisher":"The Electrochemical Society","_id":"39533","page":"109-115","volume":39,"user_id":"20179","status":"public","date_created":"2023-01-24T12:01:16Z","department":[{"_id":"59"}],"keyword":["General Medicine"],"type":"journal_article","issue":"1","publication":"ECS Transactions","abstract":[{"lang":"eng","text":"<jats:p>Due to the electrical, sensory and optical properties the interest on ZnO-based devices including thin-film transistors (TFT) aroused. The main concerns, when using ZnO nanoparticles (NP-ZnO) in TFT, are the low charge carrier mobility and the hysteresis when poly(4-vinylphenol) (PVP) is used as gate dielectric. It is well-known that the mobility in NP-ZnO films can be enhanced by the subsequent hydrothermal decomposition of zinc salts. The electrical behavior as a function of time and temperature is investigated, taking the NP-ZnO without addition of zinc acetate as reference. The addition of zinc acetate leads to a device with better performance, with increased drain current level and without the presence of the hysteresis in the transfer characteristic.  The formation reaction was performed at a temperature of 200°C, which enables process compatibility to some plastic substrates.</jats:p>"}],"language":[{"iso":"eng"}],"doi":"10.1149/1.3615183","author":[{"full_name":"Vidor, Fábio Fedrizzi","last_name":"Vidor","first_name":"Fábio Fedrizzi"},{"first_name":"Gilson Inácio","last_name":"Wirth","full_name":"Wirth, Gilson Inácio"},{"full_name":"Wolff, Karsten","last_name":"Wolff","first_name":"Karsten"},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"}],"publication_identifier":{"issn":["1938-5862","1938-6737"]},"year":"2011","title":"Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors","intvolume":"        39","date_updated":"2023-03-21T10:21:23Z","publication_status":"published"},{"citation":{"apa":"Wolff, K., &#38; Hilleringmann, U. (2011). Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. <i>Solid-State Electronics</i>, <i>62</i>(1), 110–114. <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">https://doi.org/10.1016/j.sse.2011.01.046</a>","ieee":"K. Wolff and U. Hilleringmann, “Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric,” <i>Solid-State Electronics</i>, vol. 62, no. 1, pp. 110–114, 2011, doi: <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>.","short":"K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.","chicago":"Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” <i>Solid-State Electronics</i> 62, no. 1 (2011): 110–14. <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">https://doi.org/10.1016/j.sse.2011.01.046</a>.","mla":"Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” <i>Solid-State Electronics</i>, vol. 62, no. 1, Elsevier BV, 2011, pp. 110–14, doi:<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>.","ama":"Wolff K, Hilleringmann U. Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. <i>Solid-State Electronics</i>. 2011;62(1):110-114. doi:<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>","bibtex":"@article{Wolff_Hilleringmann_2011, title={Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric}, volume={62}, DOI={<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>}, number={1}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wolff, K. and Hilleringmann, Ulrich}, year={2011}, pages={110–114} }"},"user_id":"20179","volume":62,"page":"110-114","_id":"39527","publisher":"Elsevier BV","status":"public","type":"journal_article","keyword":["Materials Chemistry","Electrical and Electronic Engineering","Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"department":[{"_id":"59"}],"date_created":"2023-01-24T11:57:07Z","publication":"Solid-State Electronics","issue":"1","doi":"10.1016/j.sse.2011.01.046","language":[{"iso":"eng"}],"date_updated":"2023-03-21T10:20:24Z","publication_status":"published","intvolume":"        62","year":"2011","title":"Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric","publication_identifier":{"issn":["0038-1101"]},"author":[{"full_name":"Wolff, K.","last_name":"Wolff","first_name":"K."},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich","id":"20179"}]},{"citation":{"mla":"Frers, Torsten, et al. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>.","bibtex":"@inproceedings{Frers_Hett_Hilleringmann_Berth_Widhalm_Zrenner_2011, title={Characterization of SiON integrated waveguides via FTIR and AFM measurements}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Frers, Torsten and Hett, Thomas and Hilleringmann, Ulrich and Berth, Gerhard and Widhalm, Alex and Zrenner, Artur}, year={2011} }","ama":"Frers T, Hett T, Hilleringmann U, Berth G, Widhalm A, Zrenner A. Characterization of SiON integrated waveguides via FTIR and AFM measurements. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>","ieee":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, and A. Zrenner, “Characterization of SiON integrated waveguides via FTIR and AFM measurements,” 2011, doi: <a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>.","apa":"Frers, T., Hett, T., Hilleringmann, U., Berth, G., Widhalm, A., &#38; Zrenner, A. (2011). Characterization of SiON integrated waveguides via FTIR and AFM measurements. <i>2011 Semiconductor Conference Dresden</i>. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>","chicago":"Frers, Torsten, Thomas Hett, Ulrich Hilleringmann, Gerhard Berth, Alex Widhalm, and Artur Zrenner. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>.","short":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011."},"publication":"2011 Semiconductor Conference Dresden","date_created":"2023-01-24T12:03:46Z","department":[{"_id":"59"}],"type":"conference","author":[{"first_name":"Torsten","last_name":"Frers","full_name":"Frers, Torsten"},{"last_name":"Hett","first_name":"Thomas","full_name":"Hett, Thomas"},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"},{"full_name":"Berth, Gerhard","last_name":"Berth","first_name":"Gerhard"},{"full_name":"Widhalm, Alex","first_name":"Alex","last_name":"Widhalm"},{"first_name":"Artur","last_name":"Zrenner","full_name":"Zrenner, Artur"}],"title":"Characterization of SiON integrated waveguides via FTIR and AFM measurements","year":"2011","status":"public","date_updated":"2023-03-21T10:21:37Z","publication_status":"published","_id":"39536","publisher":"IEEE","language":[{"iso":"eng"}],"doi":"10.1109/scd.2011.6068744","user_id":"20179"},{"_id":"39528","language":[{"iso":"eng"}],"publisher":"IEEE","doi":"10.1109/scd.2011.6068711","user_id":"20179","author":[{"full_name":"Wiegand, C.","first_name":"C.","last_name":"Wiegand"},{"first_name":"C.","last_name":"Hangmann","full_name":"Hangmann, C."},{"full_name":"Hedayat, C.","last_name":"Hedayat","first_name":"C."},{"full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","last_name":"Hilleringmann","id":"20179"}],"year":"2011","status":"public","title":"Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops","date_updated":"2023-03-21T10:20:37Z","publication_status":"published","date_created":"2023-01-24T11:57:35Z","department":[{"_id":"59"}],"type":"conference","citation":{"chicago":"Wiegand, C., C. Hangmann, C. Hedayat, and Ulrich Hilleringmann. “Modeling and Simulation of Arbitrary Ordered Nonlinear Charge-Pump Phase-Locked Loops.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068711\">https://doi.org/10.1109/scd.2011.6068711</a>.","short":"C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.","ieee":"C. Wiegand, C. Hangmann, C. Hedayat, and U. Hilleringmann, “Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops,” 2011, doi: <a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>.","apa":"Wiegand, C., Hangmann, C., Hedayat, C., &#38; Hilleringmann, U. (2011). Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops. <i>2011 Semiconductor Conference Dresden</i>. <a href=\"https://doi.org/10.1109/scd.2011.6068711\">https://doi.org/10.1109/scd.2011.6068711</a>","bibtex":"@inproceedings{Wiegand_Hangmann_Hedayat_Hilleringmann_2011, title={Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Wiegand, C. and Hangmann, C. and Hedayat, C. and Hilleringmann, Ulrich}, year={2011} }","ama":"Wiegand C, Hangmann C, Hedayat C, Hilleringmann U. Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>","mla":"Wiegand, C., et al. “Modeling and Simulation of Arbitrary Ordered Nonlinear Charge-Pump Phase-Locked Loops.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>."},"publication":"2011 Semiconductor Conference Dresden"},{"publication":"IEEE Africon '11","citation":{"ieee":"U. Hilleringmann, K. Wolff, F. Assion, F. F. Vidor, and G. I. Wirth, “Semiconductor nanoparticles for electronic device integration on foils,” 2011, doi: <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>.","apa":"Hilleringmann, U., Wolff, K., Assion, F., Vidor, F. F., &#38; Wirth, G. I. (2011). Semiconductor nanoparticles for electronic device integration on foils. <i>IEEE Africon ’11</i>. <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">https://doi.org/10.1109/afrcon.2011.6071983</a>","chicago":"Hilleringmann, Ulrich, K. Wolff, F. Assion, F. F. Vidor, and G. I. Wirth. “Semiconductor Nanoparticles for Electronic Device Integration on Foils.” In <i>IEEE Africon ’11</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">https://doi.org/10.1109/afrcon.2011.6071983</a>.","short":"U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.","mla":"Hilleringmann, Ulrich, et al. “Semiconductor Nanoparticles for Electronic Device Integration on Foils.” <i>IEEE Africon ’11</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>.","bibtex":"@inproceedings{Hilleringmann_Wolff_Assion_Vidor_Wirth_2011, title={Semiconductor nanoparticles for electronic device integration on foils}, DOI={<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>}, booktitle={IEEE Africon ’11}, publisher={IEEE}, author={Hilleringmann, Ulrich and Wolff, K. and Assion, F. and Vidor, F. F. and Wirth, G. I.}, year={2011} }","ama":"Hilleringmann U, Wolff K, Assion F, Vidor FF, Wirth GI. Semiconductor nanoparticles for electronic device integration on foils. In: <i>IEEE Africon ’11</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>"},"type":"conference","department":[{"_id":"59"}],"date_created":"2023-01-24T11:58:40Z","date_updated":"2023-03-21T10:20:55Z","publication_status":"published","year":"2011","status":"public","title":"Semiconductor nanoparticles for electronic device integration on foils","author":[{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich","id":"20179"},{"full_name":"Wolff, K.","first_name":"K.","last_name":"Wolff"},{"first_name":"F.","last_name":"Assion","full_name":"Assion, F."},{"last_name":"Vidor","first_name":"F. F.","full_name":"Vidor, F. F."},{"last_name":"Wirth","first_name":"G. I.","full_name":"Wirth, G. I."}],"doi":"10.1109/afrcon.2011.6071983","user_id":"20179","_id":"39530","publisher":"IEEE","language":[{"iso":"eng"}]},{"date_created":"2023-01-24T12:04:25Z","type":"conference","department":[{"_id":"59"}],"publication":"Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011","citation":{"apa":"Reinhold, C., Hangmann, C., Mager, T., Hedayat, C., &#38; Hilleringmann, U. (2011). Plane wave spectrum expansion from near-field measurements on no-planar lattices. <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 1–4.","ieee":"C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, and U. Hilleringmann, “Plane wave spectrum expansion from near-field measurements on no-planar lattices,” in <i>Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011</i>, 2011, pp. 1–4.","short":"C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, U. Hilleringmann, in: Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011, 2011, pp. 1–4.","chicago":"Reinhold, C, C Hangmann, T Mager, C Hedayat, and Ulrich Hilleringmann. “Plane Wave Spectrum Expansion from Near-Field Measurements on No-Planar Lattices.” In <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 1–4, 2011.","mla":"Reinhold, C., et al. “Plane Wave Spectrum Expansion from Near-Field Measurements on No-Planar Lattices.” <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 2011, pp. 1–4.","ama":"Reinhold C, Hangmann C, Mager T, Hedayat C, Hilleringmann U. Plane wave spectrum expansion from near-field measurements on no-planar lattices. In: <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>. ; 2011:1–4.","bibtex":"@inproceedings{Reinhold_Hangmann_Mager_Hedayat_Hilleringmann_2011, title={Plane wave spectrum expansion from near-field measurements on no-planar lattices}, booktitle={Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011}, author={Reinhold, C and Hangmann, C and Mager, T and Hedayat, C and Hilleringmann, Ulrich}, year={2011}, pages={1–4} }"},"page":"1–4","language":[{"iso":"eng"}],"_id":"39537","user_id":"20179","title":"Plane wave spectrum expansion from near-field measurements on no-planar lattices","year":"2011","status":"public","author":[{"first_name":"C","last_name":"Reinhold","full_name":"Reinhold, C"},{"last_name":"Hangmann","first_name":"C","full_name":"Hangmann, C"},{"first_name":"T","last_name":"Mager","full_name":"Mager, T"},{"last_name":"Hedayat","first_name":"C","full_name":"Hedayat, C"},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"}],"date_updated":"2023-03-21T10:21:51Z"},{"publication":"Autorschaft. 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Neun Responsorien Auf Das Praktisch-Theologische Interesse an Den Oberflächen.” <i>Lebenswissenschaft Praktische Theologie?</i>, edited by Thomas Klie et al., 2011, pp. 163–74.","ama":"Schroeter-Wittke H. Den Schein wahren. Neun Responsorien auf das praktisch-theologische Interesse an den Oberflächen. In: Klie T, Kumlehn M, Kunz R, Schlag T, eds. <i>Lebenswissenschaft Praktische Theologie?</i>. ; 2011:163-174.","bibtex":"@inbook{Schroeter-Wittke_2011, place={Berlin/New York}, title={Den Schein wahren. Neun Responsorien auf das praktisch-theologische Interesse an den Oberflächen}, booktitle={Lebenswissenschaft Praktische Theologie?}, author={Schroeter-Wittke, Harald}, editor={Klie, Thomas and Kumlehn, Martina and Kunz, Ralph and Schlag, Thomas}, year={2011}, pages={163–174} }","apa":"Schroeter-Wittke, H. (2011). Den Schein wahren. Neun Responsorien auf das praktisch-theologische Interesse an den Oberflächen. In T. Klie, M. Kumlehn, R. Kunz, &#38; T. Schlag (Eds.), <i>Lebenswissenschaft Praktische Theologie?</i> (pp. 163–174).","ieee":"H. Schroeter-Wittke, “Den Schein wahren. Neun Responsorien auf das praktisch-theologische Interesse an den Oberflächen,” in <i>Lebenswissenschaft Praktische Theologie?</i>, T. Klie, M. Kumlehn, R. Kunz, and T. Schlag, Eds. Berlin/New York, 2011, pp. 163–174.","chicago":"Schroeter-Wittke, Harald. “Den Schein Wahren. Neun Responsorien Auf Das Praktisch-Theologische Interesse an Den Oberflächen.” In <i>Lebenswissenschaft Praktische Theologie?</i>, edited by Thomas Klie, Martina Kumlehn, Ralph Kunz, and Thomas Schlag, 163–74. Berlin/New York, 2011.","short":"H. Schroeter-Wittke, in: T. Klie, M. Kumlehn, R. Kunz, T. 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