[{"_id":"42969","user_id":"71124","department":[{"_id":"136"}],"language":[{"iso":"eng"}],"type":"report","status":"public","date_updated":"2023-03-14T09:39:43Z","date_created":"2023-03-13T15:14:11Z","author":[{"first_name":"Thomas","id":"98373","full_name":"Allmer, Thomas","last_name":"Allmer"}],"title":"Towards a Critical Theory of Surveillance Studies","publication_status":"published","publication_identifier":{"issn":["2219-603X"]},"place":"Vienna","year":"2011","citation":{"chicago":"Allmer, Thomas. <i>Towards a Critical Theory of Surveillance Studies</i>. Vienna, 2011.","ieee":"T. Allmer, <i>Towards a Critical Theory of Surveillance Studies</i>. Vienna, 2011.","ama":"Allmer T. <i>Towards a Critical Theory of Surveillance Studies</i>.; 2011.","apa":"Allmer, T. (2011). <i>Towards a Critical Theory of Surveillance Studies</i>.","mla":"Allmer, Thomas. <i>Towards a Critical Theory of Surveillance Studies</i>. 2011.","bibtex":"@book{Allmer_2011, place={Vienna}, title={Towards a Critical Theory of Surveillance Studies}, author={Allmer, Thomas}, year={2011} }","short":"T. Allmer, Towards a Critical Theory of Surveillance Studies, Vienna, 2011."}},{"extern":"1","language":[{"iso":"eng"}],"_id":"43008","department":[{"_id":"136"}],"user_id":"71124","status":"public","publication":"tripleC ","type":"journal_article","title":"Critical Surveillance Studies in the Information Society","doi":"https://doi.org/10.31269/triplec.v9i2.266","date_updated":"2023-03-14T09:41:20Z","volume":9,"date_created":"2023-03-14T09:08:29Z","author":[{"last_name":"Allmer","full_name":"Allmer, Thomas","id":"98373","first_name":"Thomas"}],"year":"2011","page":"566-592","intvolume":"         9","citation":{"mla":"Allmer, Thomas. “Critical Surveillance Studies in the Information Society.” <i>TripleC </i>, vol. 9, no. 2, 2011, pp. 566–92, doi:<a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>.","bibtex":"@article{Allmer_2011, title={Critical Surveillance Studies in the Information Society}, volume={9}, DOI={<a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>}, number={2}, journal={tripleC }, author={Allmer, Thomas}, year={2011}, pages={566–592} }","short":"T. Allmer, TripleC  9 (2011) 566–592.","apa":"Allmer, T. (2011). Critical Surveillance Studies in the Information Society. <i>TripleC </i>, <i>9</i>(2), 566–592. <a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>","ama":"Allmer T. Critical Surveillance Studies in the Information Society. <i>tripleC </i>. 2011;9(2):566-592. doi:<a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>","ieee":"T. Allmer, “Critical Surveillance Studies in the Information Society,” <i>tripleC </i>, vol. 9, no. 2, pp. 566–592, 2011, doi: <a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>.","chicago":"Allmer, Thomas. “Critical Surveillance Studies in the Information Society.” <i>TripleC </i> 9, no. 2 (2011): 566–92. <a href=\"https://doi.org/10.31269/triplec.v9i2.266\">https://doi.org/10.31269/triplec.v9i2.266</a>."},"publication_status":"published","issue":"2"},{"date_created":"2023-03-10T08:47:49Z","date_updated":"2023-03-14T09:42:51Z","publisher":"Westfälisches Dampfboot.","title":"Bildung MACHT Gesellschaft","publication_status":"published","citation":{"chicago":"Sandoval , Marisol, Sebastian Sevignani, Alexander  Rehbogen, Thomas Allmer, Matthias  Hager, and Verena Kreilinger, eds. <i>Bildung MACHT Gesellschaft</i>. Münster: Westfälisches Dampfboot., 2011.","ieee":"M. Sandoval , S. Sevignani, A. Rehbogen, T. Allmer, M. Hager, and V. Kreilinger, Eds., <i>Bildung MACHT Gesellschaft</i>. Münster: Westfälisches Dampfboot., 2011.","ama":"Sandoval  M, Sevignani S, Rehbogen A, Allmer T, Hager M, Kreilinger V, eds. <i>Bildung MACHT Gesellschaft</i>. Westfälisches Dampfboot.; 2011.","apa":"Sandoval , M., Sevignani, S., Rehbogen, A., Allmer, T., Hager, M., &#38; Kreilinger, V. (Eds.). (2011). <i>Bildung MACHT Gesellschaft</i>. Westfälisches Dampfboot.","bibtex":"@book{Sandoval _Sevignani_Rehbogen_Allmer_Hager_Kreilinger_2011, place={Münster}, title={Bildung MACHT Gesellschaft}, publisher={Westfälisches Dampfboot.}, year={2011} }","mla":"Sandoval , Marisol, et al., editors. <i>Bildung MACHT Gesellschaft</i>. Westfälisches Dampfboot., 2011.","short":"M. Sandoval , S. Sevignani, A. Rehbogen, T. Allmer, M. Hager, V. Kreilinger, eds., Bildung MACHT Gesellschaft, Westfälisches Dampfboot., Münster, 2011."},"place":"Münster","year":"2011","user_id":"71124","department":[{"_id":"136"}],"_id":"42946","language":[{"iso":"ger"}],"extern":"1","type":"book_editor","status":"public","editor":[{"first_name":"Marisol","full_name":"Sandoval , Marisol","last_name":"Sandoval "},{"last_name":"Sevignani","full_name":"Sevignani, Sebastian","first_name":"Sebastian"},{"first_name":"Alexander ","full_name":"Rehbogen, Alexander ","last_name":"Rehbogen"},{"first_name":"Thomas","last_name":"Allmer","full_name":"Allmer, Thomas","id":"98373"},{"full_name":"Hager, Matthias ","last_name":"Hager","first_name":"Matthias "},{"full_name":"Kreilinger, Verena","last_name":"Kreilinger","first_name":"Verena"}]},{"keyword":["General Medicine"],"language":[{"iso":"eng"}],"_id":"39533","user_id":"20179","department":[{"_id":"59"}],"abstract":[{"text":"<jats:p>Due to the electrical, sensory and optical properties the interest on ZnO-based devices including thin-film transistors (TFT) aroused. The main concerns, when using ZnO nanoparticles (NP-ZnO) in TFT, are the low charge carrier mobility and the hysteresis when poly(4-vinylphenol) (PVP) is used as gate dielectric. It is well-known that the mobility in NP-ZnO films can be enhanced by the subsequent hydrothermal decomposition of zinc salts. The electrical behavior as a function of time and temperature is investigated, taking the NP-ZnO without addition of zinc acetate as reference. The addition of zinc acetate leads to a device with better performance, with increased drain current level and without the presence of the hysteresis in the transfer characteristic.  The formation reaction was performed at a temperature of 200°C, which enables process compatibility to some plastic substrates.</jats:p>","lang":"eng"}],"status":"public","type":"journal_article","publication":"ECS Transactions","title":"Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors","doi":"10.1149/1.3615183","date_updated":"2023-03-21T10:21:23Z","publisher":"The Electrochemical Society","author":[{"full_name":"Vidor, Fábio Fedrizzi","last_name":"Vidor","first_name":"Fábio Fedrizzi"},{"first_name":"Gilson Inácio","full_name":"Wirth, Gilson Inácio","last_name":"Wirth"},{"first_name":"Karsten","last_name":"Wolff","full_name":"Wolff, Karsten"},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"date_created":"2023-01-24T12:01:16Z","volume":39,"year":"2011","citation":{"apa":"Vidor, F. F., Wirth, G. I., Wolff, K., &#38; Hilleringmann, U. (2011). Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. <i>ECS Transactions</i>, <i>39</i>(1), 109–115. <a href=\"https://doi.org/10.1149/1.3615183\">https://doi.org/10.1149/1.3615183</a>","mla":"Vidor, Fábio Fedrizzi, et al. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” <i>ECS Transactions</i>, vol. 39, no. 1, The Electrochemical Society, 2011, pp. 109–15, doi:<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>.","short":"F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.","bibtex":"@article{Vidor_Wirth_Wolff_Hilleringmann_2011, title={Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors}, volume={39}, DOI={<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>}, number={1}, journal={ECS Transactions}, publisher={The Electrochemical Society}, author={Vidor, Fábio Fedrizzi and Wirth, Gilson Inácio and Wolff, Karsten and Hilleringmann, Ulrich}, year={2011}, pages={109–115} }","ama":"Vidor FF, Wirth GI, Wolff K, Hilleringmann U. Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. <i>ECS Transactions</i>. 2011;39(1):109-115. doi:<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>","ieee":"F. F. Vidor, G. I. Wirth, K. Wolff, and U. Hilleringmann, “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors,” <i>ECS Transactions</i>, vol. 39, no. 1, pp. 109–115, 2011, doi: <a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>.","chicago":"Vidor, Fábio Fedrizzi, Gilson Inácio Wirth, Karsten Wolff, and Ulrich Hilleringmann. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” <i>ECS Transactions</i> 39, no. 1 (2011): 109–15. <a href=\"https://doi.org/10.1149/1.3615183\">https://doi.org/10.1149/1.3615183</a>."},"page":"109-115","intvolume":"        39","publication_status":"published","publication_identifier":{"issn":["1938-5862","1938-6737"]},"issue":"1"},{"year":"2011","issue":"1","title":"Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric","publisher":"Elsevier BV","date_created":"2023-01-24T11:57:07Z","publication":"Solid-State Electronics","keyword":["Materials Chemistry","Electrical and Electronic Engineering","Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"language":[{"iso":"eng"}],"intvolume":"        62","page":"110-114","citation":{"apa":"Wolff, K., &#38; Hilleringmann, U. (2011). Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. <i>Solid-State Electronics</i>, <i>62</i>(1), 110–114. <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">https://doi.org/10.1016/j.sse.2011.01.046</a>","mla":"Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” <i>Solid-State Electronics</i>, vol. 62, no. 1, Elsevier BV, 2011, pp. 110–14, doi:<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>.","short":"K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.","bibtex":"@article{Wolff_Hilleringmann_2011, title={Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric}, volume={62}, DOI={<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>}, number={1}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wolff, K. and Hilleringmann, Ulrich}, year={2011}, pages={110–114} }","ieee":"K. Wolff and U. Hilleringmann, “Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric,” <i>Solid-State Electronics</i>, vol. 62, no. 1, pp. 110–114, 2011, doi: <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>.","chicago":"Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” <i>Solid-State Electronics</i> 62, no. 1 (2011): 110–14. <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">https://doi.org/10.1016/j.sse.2011.01.046</a>.","ama":"Wolff K, Hilleringmann U. Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. <i>Solid-State Electronics</i>. 2011;62(1):110-114. doi:<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>"},"publication_identifier":{"issn":["0038-1101"]},"publication_status":"published","doi":"10.1016/j.sse.2011.01.046","date_updated":"2023-03-21T10:20:24Z","volume":62,"author":[{"full_name":"Wolff, K.","last_name":"Wolff","first_name":"K."},{"first_name":"Ulrich","id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann"}],"status":"public","type":"journal_article","_id":"39527","department":[{"_id":"59"}],"user_id":"20179"},{"language":[{"iso":"eng"}],"_id":"39536","user_id":"20179","department":[{"_id":"59"}],"status":"public","type":"conference","publication":"2011 Semiconductor Conference Dresden","title":"Characterization of SiON integrated waveguides via FTIR and AFM measurements","doi":"10.1109/scd.2011.6068744","date_updated":"2023-03-21T10:21:37Z","publisher":"IEEE","date_created":"2023-01-24T12:03:46Z","author":[{"first_name":"Torsten","full_name":"Frers, Torsten","last_name":"Frers"},{"full_name":"Hett, Thomas","last_name":"Hett","first_name":"Thomas"},{"first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann"},{"first_name":"Gerhard","last_name":"Berth","full_name":"Berth, Gerhard"},{"first_name":"Alex","last_name":"Widhalm","full_name":"Widhalm, Alex"},{"full_name":"Zrenner, Artur","last_name":"Zrenner","first_name":"Artur"}],"year":"2011","citation":{"apa":"Frers, T., Hett, T., Hilleringmann, U., Berth, G., Widhalm, A., &#38; Zrenner, A. (2011). Characterization of SiON integrated waveguides via FTIR and AFM measurements. <i>2011 Semiconductor Conference Dresden</i>. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>","bibtex":"@inproceedings{Frers_Hett_Hilleringmann_Berth_Widhalm_Zrenner_2011, title={Characterization of SiON integrated waveguides via FTIR and AFM measurements}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Frers, Torsten and Hett, Thomas and Hilleringmann, Ulrich and Berth, Gerhard and Widhalm, Alex and Zrenner, Artur}, year={2011} }","mla":"Frers, Torsten, et al. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>.","short":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.","ama":"Frers T, Hett T, Hilleringmann U, Berth G, Widhalm A, Zrenner A. Characterization of SiON integrated waveguides via FTIR and AFM measurements. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>","chicago":"Frers, Torsten, Thomas Hett, Ulrich Hilleringmann, Gerhard Berth, Alex Widhalm, and Artur Zrenner. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>.","ieee":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, and A. Zrenner, “Characterization of SiON integrated waveguides via FTIR and AFM measurements,” 2011, doi: <a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>."},"publication_status":"published"},{"title":"Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops","doi":"10.1109/scd.2011.6068711","publisher":"IEEE","date_updated":"2023-03-21T10:20:37Z","date_created":"2023-01-24T11:57:35Z","author":[{"first_name":"C.","last_name":"Wiegand","full_name":"Wiegand, C."},{"first_name":"C.","full_name":"Hangmann, C.","last_name":"Hangmann"},{"first_name":"C.","full_name":"Hedayat, C.","last_name":"Hedayat"},{"full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann","first_name":"Ulrich"}],"year":"2011","citation":{"apa":"Wiegand, C., Hangmann, C., Hedayat, C., &#38; Hilleringmann, U. (2011). Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops. <i>2011 Semiconductor Conference Dresden</i>. <a href=\"https://doi.org/10.1109/scd.2011.6068711\">https://doi.org/10.1109/scd.2011.6068711</a>","mla":"Wiegand, C., et al. “Modeling and Simulation of Arbitrary Ordered Nonlinear Charge-Pump Phase-Locked Loops.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>.","short":"C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.","bibtex":"@inproceedings{Wiegand_Hangmann_Hedayat_Hilleringmann_2011, title={Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Wiegand, C. and Hangmann, C. and Hedayat, C. and Hilleringmann, Ulrich}, year={2011} }","chicago":"Wiegand, C., C. Hangmann, C. Hedayat, and Ulrich Hilleringmann. “Modeling and Simulation of Arbitrary Ordered Nonlinear Charge-Pump Phase-Locked Loops.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068711\">https://doi.org/10.1109/scd.2011.6068711</a>.","ieee":"C. Wiegand, C. Hangmann, C. Hedayat, and U. Hilleringmann, “Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops,” 2011, doi: <a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>.","ama":"Wiegand C, Hangmann C, Hedayat C, Hilleringmann U. Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>"},"publication_status":"published","language":[{"iso":"eng"}],"_id":"39528","user_id":"20179","department":[{"_id":"59"}],"status":"public","type":"conference","publication":"2011 Semiconductor Conference Dresden"},{"title":"Semiconductor nanoparticles for electronic device integration on foils","doi":"10.1109/afrcon.2011.6071983","publisher":"IEEE","date_updated":"2023-03-21T10:20:55Z","author":[{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"},{"first_name":"K.","full_name":"Wolff, K.","last_name":"Wolff"},{"full_name":"Assion, F.","last_name":"Assion","first_name":"F."},{"first_name":"F. F.","last_name":"Vidor","full_name":"Vidor, F. F."},{"full_name":"Wirth, G. I.","last_name":"Wirth","first_name":"G. I."}],"date_created":"2023-01-24T11:58:40Z","year":"2011","citation":{"chicago":"Hilleringmann, Ulrich, K. Wolff, F. Assion, F. F. Vidor, and G. I. Wirth. “Semiconductor Nanoparticles for Electronic Device Integration on Foils.” In <i>IEEE Africon ’11</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">https://doi.org/10.1109/afrcon.2011.6071983</a>.","ieee":"U. Hilleringmann, K. Wolff, F. Assion, F. F. Vidor, and G. I. Wirth, “Semiconductor nanoparticles for electronic device integration on foils,” 2011, doi: <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>.","ama":"Hilleringmann U, Wolff K, Assion F, Vidor FF, Wirth GI. Semiconductor nanoparticles for electronic device integration on foils. In: <i>IEEE Africon ’11</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>","bibtex":"@inproceedings{Hilleringmann_Wolff_Assion_Vidor_Wirth_2011, title={Semiconductor nanoparticles for electronic device integration on foils}, DOI={<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>}, booktitle={IEEE Africon ’11}, publisher={IEEE}, author={Hilleringmann, Ulrich and Wolff, K. and Assion, F. and Vidor, F. F. and Wirth, G. I.}, year={2011} }","short":"U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.","mla":"Hilleringmann, Ulrich, et al. “Semiconductor Nanoparticles for Electronic Device Integration on Foils.” <i>IEEE Africon ’11</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>.","apa":"Hilleringmann, U., Wolff, K., Assion, F., Vidor, F. F., &#38; Wirth, G. I. (2011). Semiconductor nanoparticles for electronic device integration on foils. <i>IEEE Africon ’11</i>. <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">https://doi.org/10.1109/afrcon.2011.6071983</a>"},"publication_status":"published","language":[{"iso":"eng"}],"_id":"39530","department":[{"_id":"59"}],"user_id":"20179","status":"public","publication":"IEEE Africon '11","type":"conference"},{"type":"conference","publication":"Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011","status":"public","user_id":"20179","department":[{"_id":"59"}],"_id":"39537","language":[{"iso":"eng"}],"citation":{"ama":"Reinhold C, Hangmann C, Mager T, Hedayat C, Hilleringmann U. Plane wave spectrum expansion from near-field measurements on no-planar lattices. In: <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>. ; 2011:1–4.","ieee":"C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, and U. Hilleringmann, “Plane wave spectrum expansion from near-field measurements on no-planar lattices,” in <i>Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011</i>, 2011, pp. 1–4.","chicago":"Reinhold, C, C Hangmann, T Mager, C Hedayat, and Ulrich Hilleringmann. “Plane Wave Spectrum Expansion from Near-Field Measurements on No-Planar Lattices.” In <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 1–4, 2011.","mla":"Reinhold, C., et al. “Plane Wave Spectrum Expansion from Near-Field Measurements on No-Planar Lattices.” <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 2011, pp. 1–4.","bibtex":"@inproceedings{Reinhold_Hangmann_Mager_Hedayat_Hilleringmann_2011, title={Plane wave spectrum expansion from near-field measurements on no-planar lattices}, booktitle={Proc. 5th Int. 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