[{"year":"2014","citation":{"chicago":"Drude, Dennis, Katharina Brassat, Christoph Brodehl, Thomas Riedl, and Jörg Lindner. “Numerical Analysis of Defects in Colloidal Nanosphere Masks,” 2014.","ieee":"D. Drude, K. Brassat, C. Brodehl, T. Riedl, and J. Lindner, “Numerical analysis of defects in colloidal nanosphere masks,” presented at the European Materials Research Society Fall Meeting 2014, Warsaw (Poland), 2014.","ama":"Drude D, Brassat K, Brodehl C, Riedl T, Lindner J. Numerical analysis of defects in colloidal nanosphere masks. In: ; 2014.","apa":"Drude, D., Brassat, K., Brodehl, C., Riedl, T., &#38; Lindner, J. (2014). Numerical analysis of defects in colloidal nanosphere masks. Presented at the European Materials Research Society Fall Meeting 2014, Warsaw (Poland).","bibtex":"@inproceedings{Drude_Brassat_Brodehl_Riedl_Lindner_2014, title={Numerical analysis of defects in colloidal nanosphere masks}, author={Drude, Dennis and Brassat, Katharina and Brodehl, Christoph and Riedl, Thomas and Lindner, Jörg}, year={2014} }","mla":"Drude, Dennis, et al. <i>Numerical Analysis of Defects in Colloidal Nanosphere Masks</i>. 2014.","short":"D. Drude, K. Brassat, C. Brodehl, T. Riedl, J. Lindner, in: 2014."},"title":"Numerical analysis of defects in colloidal nanosphere masks","conference":{"location":"Warsaw (Poland)","end_date":"2014-09-19","start_date":"2014-09-15","name":"European Materials Research Society Fall Meeting 2014"},"date_updated":"2022-01-06T07:00:11Z","author":[{"first_name":"Dennis","full_name":"Drude, Dennis","last_name":"Drude"},{"last_name":"Brassat","full_name":"Brassat, Katharina","id":"11305","first_name":"Katharina"},{"first_name":"Christoph","full_name":"Brodehl, Christoph","id":"30380","last_name":"Brodehl"},{"last_name":"Riedl","full_name":"Riedl, Thomas","id":"36950","first_name":"Thomas"},{"full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner","first_name":"Jörg"}],"date_created":"2018-08-22T12:13:23Z","status":"public","type":"conference","language":[{"iso":"eng"}],"_id":"4062","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706"},{"type":"conference","status":"public","department":[{"_id":"15"},{"_id":"286"},{"_id":"289"}],"user_id":"55706","_id":"4063","language":[{"iso":"eng"}],"citation":{"short":"A. Ezhova, J. Lindner, M. Muldarisnur, T. Zentgraf, K. Huber, in: 2014.","bibtex":"@inproceedings{Ezhova_Lindner_Muldarisnur_Zentgraf_Huber_2014, title={Ag‐nanoparticles in PA-templates}, author={Ezhova, A. and Lindner, Jörg and Muldarisnur, M. and Zentgraf, Thomas and Huber, K.}, year={2014} }","mla":"Ezhova, A., et al. <i>Ag‐nanoparticles in PA-Templates</i>. 2014.","apa":"Ezhova, A., Lindner, J., Muldarisnur, M., Zentgraf, T., &#38; Huber, K. (2014). Ag‐nanoparticles in PA-templates. Presented at the Europhotonics Spring School 2014, Porquerolles (France).","ieee":"A. Ezhova, J. Lindner, M. Muldarisnur, T. Zentgraf, and K. Huber, “Ag‐nanoparticles in PA-templates,” presented at the Europhotonics Spring School 2014, Porquerolles (France), 2014.","chicago":"Ezhova, A., Jörg Lindner, M. Muldarisnur, Thomas Zentgraf, and K. Huber. “Ag‐nanoparticles in PA-Templates,” 2014.","ama":"Ezhova A, Lindner J, Muldarisnur M, Zentgraf T, Huber K. Ag‐nanoparticles in PA-templates. In: ; 2014."},"year":"2014","author":[{"last_name":"Ezhova","full_name":"Ezhova, A.","first_name":"A."},{"full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner","first_name":"Jörg"},{"last_name":"Muldarisnur","full_name":"Muldarisnur, M.","first_name":"M."},{"full_name":"Zentgraf, Thomas","id":"30525","orcid":"0000-0002-8662-1101","last_name":"Zentgraf","first_name":"Thomas"},{"full_name":"Huber, K.","last_name":"Huber","first_name":"K."}],"date_created":"2018-08-22T12:16:17Z","date_updated":"2022-01-06T07:00:11Z","conference":{"name":"Europhotonics Spring School 2014","start_date":"2014-03-31","end_date":"2014-04-03","location":"Porquerolles (France)"},"title":"Ag‐nanoparticles in PA-templates"},{"year":"2014","citation":{"ama":"Kemper RM, Kovacs A, Riedl T, et al. Influence of growth area reduction on cubic GaN heteroepitaxial layer growth on 3C-SiC(001). In: ; 2014.","ieee":"R. M. Kemper <i>et al.</i>, “Influence of growth area reduction on cubic GaN heteroepitaxial layer growth on 3C-SiC(001),” presented at the European Materials Research Society Spring Meeting 2014, Lille (France), 2014.","chicago":"Kemper, R.M., A.  Kovacs, Thomas Riedl, D. Meertens, K. Tillmann, D. As, and Jörg Lindner. “Influence of Growth Area Reduction on Cubic GaN Heteroepitaxial Layer Growth on 3C-SiC(001),” 2014.","bibtex":"@inproceedings{Kemper_Kovacs_Riedl_Meertens_Tillmann_As_Lindner_2014, title={Influence of growth area reduction on cubic GaN heteroepitaxial layer growth on 3C-SiC(001)}, author={Kemper, R.M. and Kovacs, A.  and Riedl, Thomas and Meertens, D. and Tillmann, K. and As, D. and Lindner, Jörg}, year={2014} }","mla":"Kemper, R. M., et al. <i>Influence of Growth Area Reduction on Cubic GaN Heteroepitaxial Layer Growth on 3C-SiC(001)</i>. 2014.","short":"R.M. Kemper, A. Kovacs, T. Riedl, D. Meertens, K. Tillmann, D. As, J. Lindner, in: 2014.","apa":"Kemper, R. M., Kovacs, A., Riedl, T., Meertens, D., Tillmann, K., As, D., &#38; Lindner, J. (2014). Influence of growth area reduction on cubic GaN heteroepitaxial layer growth on 3C-SiC(001). Presented at the European Materials Research Society Spring Meeting 2014, Lille (France)."},"date_updated":"2022-01-06T07:00:12Z","author":[{"last_name":"Kemper","full_name":"Kemper, R.M.","first_name":"R.M."},{"last_name":"Kovacs","full_name":"Kovacs, A. ","first_name":"A. "},{"full_name":"Riedl, Thomas","id":"36950","last_name":"Riedl","first_name":"Thomas"},{"last_name":"Meertens","full_name":"Meertens, D.","first_name":"D."},{"last_name":"Tillmann","full_name":"Tillmann, K.","first_name":"K."},{"first_name":"D.","full_name":"As, D.","last_name":"As"},{"first_name":"Jörg","last_name":"Lindner","full_name":"Lindner, Jörg","id":"20797"}],"date_created":"2018-08-22T12:24:45Z","title":"Influence of growth area reduction on cubic GaN heteroepitaxial layer growth on 3C-SiC(001)","conference":{"name":"European Materials Research Society Spring Meeting 2014","start_date":"2014-05-26","end_date":"2014-05-30","location":"Lille (France)"},"type":"conference","status":"public","_id":"4068","user_id":"55706","department":[{"_id":"15"},{"_id":"286"}],"language":[{"iso":"eng"}]},{"year":"2014","citation":{"ama":"Kemper RM, Veit P, Mietze C, et al. STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells. In: ; 2014.","ieee":"R. M. Kemper <i>et al.</i>, “STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells,” presented at the European Materials Research Society Spring Meeting 2014, Lille (France), 2014.","chicago":"Kemper, R.M., P. Veit, C.  Mietze, A. Dempewolf, T.  Wecker, J. Christen, D. As, and Jörg Lindner. “STEM-CL Investigations on the Influence of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum Wells,” 2014.","apa":"Kemper, R. M., Veit, P., Mietze, C., Dempewolf, A., Wecker, T., Christen, J., … Lindner, J. (2014). STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells. Presented at the European Materials Research Society Spring Meeting 2014, Lille (France).","bibtex":"@inproceedings{Kemper_Veit_Mietze_Dempewolf_Wecker_Christen_As_Lindner_2014, title={STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells}, author={Kemper, R.M. and Veit, P. and Mietze, C.  and Dempewolf, A. and Wecker, T.  and Christen, J. and As, D. and Lindner, Jörg}, year={2014} }","short":"R.M. Kemper, P. Veit, C. Mietze, A. Dempewolf, T. Wecker, J. Christen, D. As, J. Lindner, in: 2014.","mla":"Kemper, R. M., et al. <i>STEM-CL Investigations on the Influence of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum Wells</i>. 2014."},"title":"STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells","conference":{"end_date":"2014-05-30","location":"Lille (France)","name":"European Materials Research Society Spring Meeting 2014","start_date":"2014-05-26"},"date_updated":"2022-01-06T07:00:12Z","author":[{"first_name":"R.M.","last_name":"Kemper","full_name":"Kemper, R.M."},{"full_name":"Veit, P.","last_name":"Veit","first_name":"P."},{"first_name":"C. ","last_name":"Mietze","full_name":"Mietze, C. "},{"first_name":"A.","last_name":"Dempewolf","full_name":"Dempewolf, A."},{"first_name":"T. ","last_name":"Wecker","full_name":"Wecker, T. "},{"first_name":"J.","full_name":"Christen, J.","last_name":"Christen"},{"last_name":"As","full_name":"As, D.","first_name":"D."},{"first_name":"Jörg","last_name":"Lindner","full_name":"Lindner, Jörg","id":"20797"}],"date_created":"2018-08-22T12:26:49Z","status":"public","type":"conference","language":[{"iso":"eng"}],"_id":"4069","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706"},{"ddc":["040"],"file_date_updated":"2018-03-16T11:36:04Z","_id":"407","project":[{"_id":"1","name":"SFB 901"},{"name":"SFB 901 - Subprojekt B2","_id":"10"},{"_id":"3","name":"SFB 901 - Project Area B"}],"user_id":"15504","abstract":[{"lang":"eng","text":"Automated programming aims at automatically assembling a new software artifact from existing software modules. Although automated programming was revitalized through automated software composition in the last decade, the problem cannot be considered solved. Automated software composition is widely accepted as being a planning task, but the problem is that it has very special properties that other planning problems do not have and that are commonly overseen. These properties usually imply that the composition problem cannot be solved with standard planning tools. This paper gives a brief and intuitive description of the planning problem that most approaches are based on. It points out special properties of this problem and explains why it is not adequate to solve the problem with classical planning tools as done by most existing approaches."}],"status":"public","file":[{"file_name":"407-ASE14.pdf","access_level":"closed","file_id":"1365","file_size":443283,"creator":"florida","date_created":"2018-03-16T11:36:04Z","date_updated":"2018-03-16T11:36:04Z","relation":"main_file","success":1,"content_type":"application/pdf"}],"publication":"Proceedings of the 29th International Conference on Automated Software Engineering (ASE)","type":"conference","title":"Issues of Automated Software Composition in AI Planning","doi":"10.1145/2642937.2653470","date_updated":"2022-01-06T07:00:12Z","author":[{"full_name":"Mohr, Felix","last_name":"Mohr","first_name":"Felix"}],"date_created":"2017-10-17T12:42:11Z","year":"2014","page":" 895--898","citation":{"apa":"Mohr, F. (2014). Issues of Automated Software Composition in AI Planning. In <i>Proceedings of the 29th International Conference on Automated Software Engineering (ASE)</i> (pp. 895--898). <a href=\"https://doi.org/10.1145/2642937.2653470\">https://doi.org/10.1145/2642937.2653470</a>","short":"F. Mohr, in: Proceedings of the 29th International Conference on Automated Software Engineering (ASE), 2014, pp. 895--898.","bibtex":"@inproceedings{Mohr_2014, title={Issues of Automated Software Composition in AI Planning}, DOI={<a href=\"https://doi.org/10.1145/2642937.2653470\">10.1145/2642937.2653470</a>}, booktitle={Proceedings of the 29th International Conference on Automated Software Engineering (ASE)}, author={Mohr, Felix}, year={2014}, pages={895--898} }","mla":"Mohr, Felix. “Issues of Automated Software Composition in AI Planning.” <i>Proceedings of the 29th International Conference on Automated Software Engineering (ASE)</i>, 2014, pp. 895--898, doi:<a href=\"https://doi.org/10.1145/2642937.2653470\">10.1145/2642937.2653470</a>.","ieee":"F. Mohr, “Issues of Automated Software Composition in AI Planning,” in <i>Proceedings of the 29th International Conference on Automated Software Engineering (ASE)</i>, 2014, pp. 895--898.","chicago":"Mohr, Felix. “Issues of Automated Software Composition in AI Planning.” In <i>Proceedings of the 29th International Conference on Automated Software Engineering (ASE)</i>, 895--898, 2014. <a href=\"https://doi.org/10.1145/2642937.2653470\">https://doi.org/10.1145/2642937.2653470</a>.","ama":"Mohr F. Issues of Automated Software Composition in AI Planning. In: <i>Proceedings of the 29th International Conference on Automated Software Engineering (ASE)</i>. ; 2014:895--898. doi:<a href=\"https://doi.org/10.1145/2642937.2653470\">10.1145/2642937.2653470</a>"},"has_accepted_license":"1"},{"title":"Cubic GaN/AlN multi-quantum wells grown on pre-patterned 3C-SiC/Si (001)","publisher":"Wiley","date_created":"2018-08-22T12:28:15Z","year":"2014","issue":"2","ddc":["530"],"language":[{"iso":"eng"}],"abstract":[{"text":"We report for the first time on the growth of cubic AlN/GaN multi‐quantum wells (MQWs) on pre‐patterned 3C‐SiC/Si (001) substrates. The sample structure consists of 10 periods of 2 nm c‐AlN barriers with a 4 nm c‐GaN layer in between, which were grown on 3C‐SiC post shaped structures by means of molecular beam epitaxy. Substrate patterning has been realized by electron beam lithography and a reactive ion etching process. The 3C‐SiC posts have a length of about 550 nm and a height of about 700 nm. (Scanning) transmission electron microscopy studies show that the morphology of the MQWs is clearly influenced by {111} stacking faults, modulating the local growth rate. Further, the growth at the edges of the surface pattern is investigated. The MQW layers cover the 90° edges by developing low‐index facets rather than by forming a conformal system of 90° angled layers. ","lang":"eng"}],"file":[{"content_type":"application/pdf","success":1,"relation":"main_file","date_updated":"2018-08-22T12:30:12Z","creator":"hclaudia","date_created":"2018-08-22T12:30:12Z","file_size":3777577,"file_id":"4071","access_level":"closed","file_name":"Cubic GaN-AlN multi-quantum wells grown on pre-patterned 3C SiC Si 001.pdf"}],"publication":"physica status solidi (c)","doi":"10.1002/pssc.201300292","date_updated":"2022-01-06T07:00:13Z","volume":11,"author":[{"last_name":"Kemper","full_name":"Kemper, R. M.","first_name":"R. M."},{"last_name":"Mietze","full_name":"Mietze, C.","first_name":"C."},{"first_name":"L.","full_name":"Hiller, L.","last_name":"Hiller"},{"first_name":"T.","full_name":"Stauden, T.","last_name":"Stauden"},{"last_name":"Pezoldt","full_name":"Pezoldt, J.","first_name":"J."},{"last_name":"Meertens","full_name":"Meertens, D.","first_name":"D."},{"first_name":"M.","full_name":"Luysberg, M.","last_name":"Luysberg"},{"last_name":"As","full_name":"As, D. J.","first_name":"D. J."},{"first_name":"Jörg","last_name":"Lindner","full_name":"Lindner, Jörg","id":"20797"}],"page":"265-268","intvolume":"        11","citation":{"mla":"Kemper, R. M., et al. “Cubic GaN/AlN Multi-Quantum Wells Grown on Pre-Patterned 3C-SiC/Si (001).” <i>Physica Status Solidi (C)</i>, vol. 11, no. 2, Wiley, 2014, pp. 265–68, doi:<a href=\"https://doi.org/10.1002/pssc.201300292\">10.1002/pssc.201300292</a>.","bibtex":"@article{Kemper_Mietze_Hiller_Stauden_Pezoldt_Meertens_Luysberg_As_Lindner_2014, title={Cubic GaN/AlN multi-quantum wells grown on pre-patterned 3C-SiC/Si (001)}, volume={11}, DOI={<a href=\"https://doi.org/10.1002/pssc.201300292\">10.1002/pssc.201300292</a>}, number={2}, journal={physica status solidi (c)}, publisher={Wiley}, author={Kemper, R. M. and Mietze, C. and Hiller, L. and Stauden, T. and Pezoldt, J. and Meertens, D. and Luysberg, M. and As, D. J. and Lindner, Jörg}, year={2014}, pages={265–268} }","short":"R.M. Kemper, C. Mietze, L. Hiller, T. Stauden, J. Pezoldt, D. Meertens, M. Luysberg, D.J. As, J. Lindner, Physica Status Solidi (C) 11 (2014) 265–268.","apa":"Kemper, R. M., Mietze, C., Hiller, L., Stauden, T., Pezoldt, J., Meertens, D., … Lindner, J. (2014). Cubic GaN/AlN multi-quantum wells grown on pre-patterned 3C-SiC/Si (001). <i>Physica Status Solidi (C)</i>, <i>11</i>(2), 265–268. <a href=\"https://doi.org/10.1002/pssc.201300292\">https://doi.org/10.1002/pssc.201300292</a>","ieee":"R. M. Kemper <i>et al.</i>, “Cubic GaN/AlN multi-quantum wells grown on pre-patterned 3C-SiC/Si (001),” <i>physica status solidi (c)</i>, vol. 11, no. 2, pp. 265–268, 2014.","chicago":"Kemper, R. M., C. Mietze, L. Hiller, T. Stauden, J. Pezoldt, D. Meertens, M. Luysberg, D. J. As, and Jörg Lindner. “Cubic GaN/AlN Multi-Quantum Wells Grown on Pre-Patterned 3C-SiC/Si (001).” <i>Physica Status Solidi (C)</i> 11, no. 2 (2014): 265–68. <a href=\"https://doi.org/10.1002/pssc.201300292\">https://doi.org/10.1002/pssc.201300292</a>.","ama":"Kemper RM, Mietze C, Hiller L, et al. Cubic GaN/AlN multi-quantum wells grown on pre-patterned 3C-SiC/Si (001). <i>physica status solidi (c)</i>. 2014;11(2):265-268. doi:<a href=\"https://doi.org/10.1002/pssc.201300292\">10.1002/pssc.201300292</a>"},"publication_identifier":{"issn":["1862-6351"]},"has_accepted_license":"1","publication_status":"published","article_type":"original","file_date_updated":"2018-08-22T12:30:12Z","_id":"4070","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706","status":"public","type":"journal_article"},{"status":"public","type":"journal_article","article_type":"original","file_date_updated":"2018-08-22T12:32:42Z","_id":"4072","user_id":"55706","department":[{"_id":"15"},{"_id":"286"}],"citation":{"apa":"Riedl, T., &#38; Lindner, J. (2014). Self-organized fabrication of periodic arrays of vertical, ultra-thin nanopillars on GaAs surfaces. <i>Physica Status Solidi (A)</i>, <i>211</i>(12), 2871–2877. <a href=\"https://doi.org/10.1002/pssa.201431474\">https://doi.org/10.1002/pssa.201431474</a>","mla":"Riedl, Thomas, and Jörg Lindner. “Self-Organized Fabrication of Periodic Arrays of Vertical, Ultra-Thin Nanopillars on GaAs Surfaces.” <i>Physica Status Solidi (A)</i>, vol. 211, no. 12, Wiley, 2014, pp. 2871–77, doi:<a href=\"https://doi.org/10.1002/pssa.201431474\">10.1002/pssa.201431474</a>.","short":"T. Riedl, J. Lindner, Physica Status Solidi (A) 211 (2014) 2871–2877.","bibtex":"@article{Riedl_Lindner_2014, title={Self-organized fabrication of periodic arrays of vertical, ultra-thin nanopillars on GaAs surfaces}, volume={211}, DOI={<a href=\"https://doi.org/10.1002/pssa.201431474\">10.1002/pssa.201431474</a>}, number={12}, journal={physica status solidi (a)}, publisher={Wiley}, author={Riedl, Thomas and Lindner, Jörg}, year={2014}, pages={2871–2877} }","ieee":"T. Riedl and J. Lindner, “Self-organized fabrication of periodic arrays of vertical, ultra-thin nanopillars on GaAs surfaces,” <i>physica status solidi (a)</i>, vol. 211, no. 12, pp. 2871–2877, 2014.","chicago":"Riedl, Thomas, and Jörg Lindner. “Self-Organized Fabrication of Periodic Arrays of Vertical, Ultra-Thin Nanopillars on GaAs Surfaces.” <i>Physica Status Solidi (A)</i> 211, no. 12 (2014): 2871–77. <a href=\"https://doi.org/10.1002/pssa.201431474\">https://doi.org/10.1002/pssa.201431474</a>.","ama":"Riedl T, Lindner J. Self-organized fabrication of periodic arrays of vertical, ultra-thin nanopillars on GaAs surfaces. <i>physica status solidi (a)</i>. 2014;211(12):2871-2877. doi:<a href=\"https://doi.org/10.1002/pssa.201431474\">10.1002/pssa.201431474</a>"},"intvolume":"       211","page":"2871-2877","publication_status":"published","publication_identifier":{"issn":["1862-6300"]},"has_accepted_license":"1","doi":"10.1002/pssa.201431474","date_updated":"2022-01-06T07:00:13Z","author":[{"id":"36950","full_name":"Riedl, Thomas","last_name":"Riedl","first_name":"Thomas"},{"first_name":"Jörg","full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner"}],"volume":211,"abstract":[{"lang":"eng","text":"This paper presents a low‐cost procedure that allows for self‐organized fabrication of periodically arranged, sub‐50 nm diameter, vertical‐sidewall GaAs nanopillars on GaAs surfaces based on nanosphere lithography, and reactive ion etching (RIE). Monodispersed polystyrene (PS) sphere double layers are deposited from a colloidal suspension on pre‐treated, hydrophilized GaAs substrates. Ni is thermally evaporated to act as a hard mask for subsequent RIE. Scanning electron microscopy reveals that the Ni nanoparticles left on the substrate after PS sphere removal have polygon‐shaped in‐plane cross‐sections corresponding to the shape of the double layer mask openings. RIE using SiCl4 at low pressure and high power density leads to the formation of vertical nanopillars with circular to oval cross‐sections, whose diameters are reduced by ∼1/3 compared to those of the Ni nanoparticles. These findings can be explained by plasma‐enhanced surface diffusion and sputtering processes during RIE. The obtained GaAs nanopillars have an average diameter of only ∼23 nm, exhibit an excellent verticality with a sidewall angle of 88.9 ± 0.4° and planar top faces, as visible in transmission electron microscopy images. "}],"file":[{"access_level":"closed","file_id":"4073","file_name":"Self-organized fabrication of periodic arrays of vertical, ultra-thin nanopillars on GaAs surfaces.pdf","file_size":989885,"creator":"hclaudia","date_created":"2018-08-22T12:32:42Z","date_updated":"2018-08-22T12:32:42Z","relation":"main_file","success":1,"content_type":"application/pdf"}],"publication":"physica status solidi (a)","ddc":["530"],"language":[{"iso":"eng"}],"year":"2014","issue":"12","title":"Self-organized fabrication of periodic arrays of vertical, ultra-thin nanopillars on GaAs surfaces","publisher":"Wiley","date_created":"2018-08-22T12:31:17Z"},{"type":"journal_article","publication":"MRS Proceedings","status":"public","abstract":[{"text":"An experimental analysis of the morphology changes of hexagonally close packed polystyrene sphere monolayers induced by annealing in air is presented. The triangular interstices between each triple of spheres, which are frequently used as nanoscale mask openings in colloidal lithography, are observed to gradually shrink in size and change in shape upon annealing. Top view scanning electron microscopy images reveal that different stages are involved in the closure of monolayer interstices at annealing temperatures in the range between 110°C and 120°C. In the early stages shrinkage of the triangular interstices is dominated by material transport to and thus shortening of their corners, in the late stages interstice area reduction via displacement of the triangle edges becomes significant. At intermediate annealing times the rate of interstice area reduction displays a maximum before a stabilized state characterized by a rounded isosceles triangular shape forms.","lang":"eng"}],"user_id":"55706","department":[{"_id":"15"},{"_id":"286"}],"_id":"4074","language":[{"iso":"eng"}],"article_number":"mrsf13-1663-ww03-75","article_type":"original","publication_status":"published","publication_identifier":{"issn":["1946-4274"]},"citation":{"bibtex":"@article{Riedl_Strake_Sievers_Lindner_2014, title={Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers}, volume={1663}, DOI={<a href=\"https://doi.org/10.1557/opl.2014.312\">10.1557/opl.2014.312</a>}, number={mrsf13-1663-ww03-75}, journal={MRS Proceedings}, publisher={Cambridge University Press (CUP)}, author={Riedl, Thomas and Strake, Matthias and Sievers, Werner and Lindner, Jörg}, year={2014} }","short":"T. Riedl, M. Strake, W. Sievers, J. Lindner, MRS Proceedings 1663 (2014).","mla":"Riedl, Thomas, et al. “Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers.” <i>MRS Proceedings</i>, vol. 1663, mrsf13-1663-ww03-75, Cambridge University Press (CUP), 2014, doi:<a href=\"https://doi.org/10.1557/opl.2014.312\">10.1557/opl.2014.312</a>.","apa":"Riedl, T., Strake, M., Sievers, W., &#38; Lindner, J. (2014). Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers. <i>MRS Proceedings</i>, <i>1663</i>. <a href=\"https://doi.org/10.1557/opl.2014.312\">https://doi.org/10.1557/opl.2014.312</a>","ama":"Riedl T, Strake M, Sievers W, Lindner J. Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers. <i>MRS Proceedings</i>. 2014;1663. doi:<a href=\"https://doi.org/10.1557/opl.2014.312\">10.1557/opl.2014.312</a>","ieee":"T. Riedl, M. Strake, W. Sievers, and J. Lindner, “Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers,” <i>MRS Proceedings</i>, vol. 1663, 2014.","chicago":"Riedl, Thomas, Matthias Strake, Werner Sievers, and Jörg Lindner. “Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers.” <i>MRS Proceedings</i> 1663 (2014). <a href=\"https://doi.org/10.1557/opl.2014.312\">https://doi.org/10.1557/opl.2014.312</a>."},"intvolume":"      1663","year":"2014","author":[{"last_name":"Riedl","id":"36950","full_name":"Riedl, Thomas","first_name":"Thomas"},{"last_name":"Strake","full_name":"Strake, Matthias","first_name":"Matthias"},{"first_name":"Werner","last_name":"Sievers","full_name":"Sievers, Werner"},{"first_name":"Jörg","id":"20797","full_name":"Lindner, Jörg","last_name":"Lindner"}],"date_created":"2018-08-22T12:34:02Z","volume":1663,"publisher":"Cambridge University Press (CUP)","date_updated":"2022-01-06T07:00:13Z","doi":"10.1557/opl.2014.312","conference":{"start_date":"2013-12-01","name":"MRS Fall Meeting ","location":"Boston (USA)","end_date":"2013-12-06"},"title":"Thermal Modification of Nanoscale Mask Openings in Polystyrene Sphere Layers"},{"year":"2014","citation":{"apa":"Riedl, T., &#38; Lindner, J. (2014). Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures. In <i>Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties </i>. Boston (USA): MRS Online Proceedings. <a href=\"https://doi.org/10.1557/opl.2014.325 \">https://doi.org/10.1557/opl.2014.325 </a>","bibtex":"@inproceedings{Riedl_Lindner_2014, title={Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures}, DOI={<a href=\"https://doi.org/10.1557/opl.2014.325 \">10.1557/opl.2014.325 </a>}, number={1664}, booktitle={Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties }, publisher={MRS Online Proceedings}, author={Riedl, Thomas and Lindner, Jörg}, year={2014} }","mla":"Riedl, Thomas, and Jörg Lindner. “Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures.” <i>Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties </i>, no. 1664, MRS Online Proceedings, 2014, doi:<a href=\"https://doi.org/10.1557/opl.2014.325 \">10.1557/opl.2014.325 </a>.","short":"T. Riedl, J. Lindner, in: Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties , MRS Online Proceedings, 2014.","ama":"Riedl T, Lindner J. Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures. In: <i>Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties </i>. MRS Online Proceedings; 2014. doi:<a href=\"https://doi.org/10.1557/opl.2014.325 \">10.1557/opl.2014.325 </a>","chicago":"Riedl, Thomas, and Jörg Lindner. “Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures.” In <i>Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties </i>. MRS Online Proceedings, 2014. <a href=\"https://doi.org/10.1557/opl.2014.325 \">https://doi.org/10.1557/opl.2014.325 </a>.","ieee":"T. Riedl and J. Lindner, “Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures,” in <i>Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties </i>, Boston (USA), 2014, no. 1664."},"publication_status":"published","issue":"1664","title":"Comparison of Theoretical Approaches Predicting the Coherent-Semicoherent Transition in Nanoscale Axial Heterostructures","doi":"10.1557/opl.2014.325 ","conference":{"end_date":"2013-12-06","location":"Boston (USA)","name":"MRS Materials Research Society Fall Meeting 2014","start_date":"2013-12-01"},"publisher":"MRS Online Proceedings","date_updated":"2022-01-06T07:00:13Z","date_created":"2018-08-22T12:43:39Z","author":[{"first_name":"Thomas","last_name":"Riedl","id":"36950","full_name":"Riedl, Thomas"},{"full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner","first_name":"Jörg"}],"abstract":[{"text":"The formation of misfit dislocations is an important issue for the performance of heteroepitaxial micro- and optoelectronic devices. We analyze three approaches that quantify the stability of misfit dislocations in axial-heteroepitaxial nanowires with respect to applicability and predictions of critical nanowire dimensions. The “nanoheteroepitaxy” approach of Zubia and Hersee proves suitable for determination of strain partitioning in the presence of an elastic mismatch. Concerning the critical thickness and diameter however the descriptions of Ertekin et al. and Glas respectively yield more reliable results, owing to the consideration of the total coherent and dislocation related energies plus the residual strain energy. In contrast to the model of Ertekin et al., which refers to infinitely long nanowires, the other two mentioned approaches allow predictions of the critical thickness of mismatched deposits on the nanowire axial face.","lang":"eng"}],"status":"public","publication":"Symposium YY – Elastic Strain Engineering for Unprecedented Materials Properties ","type":"conference","language":[{"iso":"eng"}],"_id":"4075","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706"},{"file":[{"success":1,"relation":"main_file","content_type":"application/pdf","file_size":1377255,"file_id":"4077","file_name":"Reliability of high-resolution electron backscatter diffraction determination of strain an totation variations using phase-only and cross correlation.pdf","access_level":"closed","date_updated":"2018-08-22T12:45:58Z","creator":"hclaudia","date_created":"2018-08-22T12:45:58Z"}],"abstract":[{"text":"This contribution analyzes the reliability of strain and rotation variation determination using cross‐ as well as phase‐only correlation of experimental wide‐angle electron backscatter diffraction (EBSD) patterns. For both rotation and three‐point bending the resulting displacement gradient tensor components are examined in terms of magnitude and statistical scatter as a function of various correlation procedure parameters and signal‐to‐noise ratio. It is shown that on the one hand the Fourier filter width has a major impact on the strain results. At higher noise level a smaller filter width has to be applied for obtaining maximum precision. On the other hand, the influence of the degree of overlap of the regions of interest positioned in the patterns is less important. For both rotation and bending experiments the cross‐correlation variant yields a smaller standard deviation with respect to phase‐only correlation, in particular for elevated noise level. The difference is attributed to the stronger propagation of noise effects in the course of phase‐only correlation function calculation and fitting. In the rotation experiment a standard deviation of ∼1.0 × 10^−4, averaged over the displacement gradient tensor components, and a rotational precision of ∼1.5 × 10^−4 rad have been achieved by using optimized evaluation settings. ","lang":"eng"}],"publication":"Crystal Research and Technology","language":[{"iso":"eng"}],"ddc":["530"],"year":"2014","issue":"4","title":"Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation","date_created":"2018-08-22T12:45:23Z","publisher":"Wiley","status":"public","type":"journal_article","file_date_updated":"2018-08-22T12:45:58Z","article_type":"original","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706","_id":"4076","page":"195-203","intvolume":"        49","citation":{"ama":"Riedl T, Wendrock H. Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation. <i>Crystal Research and Technology</i>. 2014;49(4):195-203. doi:<a href=\"https://doi.org/10.1002/crat.201300217\">10.1002/crat.201300217</a>","chicago":"Riedl, Thomas, and H. Wendrock. “Reliability of High-Resolution Electron Backscatter Diffraction Determination of Strain and Rotation Variations Using Phase-Only and Cross Correlation.” <i>Crystal Research and Technology</i> 49, no. 4 (2014): 195–203. <a href=\"https://doi.org/10.1002/crat.201300217\">https://doi.org/10.1002/crat.201300217</a>.","ieee":"T. Riedl and H. Wendrock, “Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation,” <i>Crystal Research and Technology</i>, vol. 49, no. 4, pp. 195–203, 2014.","apa":"Riedl, T., &#38; Wendrock, H. (2014). Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation. <i>Crystal Research and Technology</i>, <i>49</i>(4), 195–203. <a href=\"https://doi.org/10.1002/crat.201300217\">https://doi.org/10.1002/crat.201300217</a>","bibtex":"@article{Riedl_Wendrock_2014, title={Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation}, volume={49}, DOI={<a href=\"https://doi.org/10.1002/crat.201300217\">10.1002/crat.201300217</a>}, number={4}, journal={Crystal Research and Technology}, publisher={Wiley}, author={Riedl, Thomas and Wendrock, H.}, year={2014}, pages={195–203} }","mla":"Riedl, Thomas, and H. Wendrock. “Reliability of High-Resolution Electron Backscatter Diffraction Determination of Strain and Rotation Variations Using Phase-Only and Cross Correlation.” <i>Crystal Research and Technology</i>, vol. 49, no. 4, Wiley, 2014, pp. 195–203, doi:<a href=\"https://doi.org/10.1002/crat.201300217\">10.1002/crat.201300217</a>.","short":"T. Riedl, H. Wendrock, Crystal Research and Technology 49 (2014) 195–203."},"has_accepted_license":"1","publication_identifier":{"issn":["0232-1300"]},"publication_status":"published","doi":"10.1002/crat.201300217","volume":49,"author":[{"first_name":"Thomas","last_name":"Riedl","full_name":"Riedl, Thomas","id":"36950"},{"first_name":"H.","full_name":"Wendrock, H.","last_name":"Wendrock"}],"date_updated":"2022-01-06T07:00:13Z"},{"status":"public","type":"conference","language":[{"iso":"eng"}],"_id":"4078","user_id":"55706","department":[{"_id":"286"}],"year":"2014","citation":{"chicago":"Riedl, Thomas, A. Kovács, D. Meertens, and Jörg Lindner. “Structure and Surface Chemistry Analysis of Ultra-Thin Reactive Ion Etched GaAs (111) Nanopillars,” 2014.","ieee":"T. Riedl, A. Kovács, D. Meertens, and J. Lindner, “Structure and surface chemistry analysis of ultra-thin reactive ion etched GaAs (111) nanopillars,” presented at the European Materials Research Society Fall Meeting 2014, Warsaw (Poland), 2014.","ama":"Riedl T, Kovács A, Meertens D, Lindner J. Structure and surface chemistry analysis of ultra-thin reactive ion etched GaAs (111) nanopillars. In: ; 2014.","apa":"Riedl, T., Kovács, A., Meertens, D., &#38; Lindner, J. (2014). Structure and surface chemistry analysis of ultra-thin reactive ion etched GaAs (111) nanopillars. Presented at the European Materials Research Society Fall Meeting 2014, Warsaw (Poland).","mla":"Riedl, Thomas, et al. <i>Structure and Surface Chemistry Analysis of Ultra-Thin Reactive Ion Etched GaAs (111) Nanopillars</i>. 2014.","bibtex":"@inproceedings{Riedl_Kovács_Meertens_Lindner_2014, title={Structure and surface chemistry analysis of ultra-thin reactive ion etched GaAs (111) nanopillars}, author={Riedl, Thomas and Kovács, A. and Meertens, D. and Lindner, Jörg}, year={2014} }","short":"T. Riedl, A. Kovács, D. Meertens, J. Lindner, in: 2014."},"title":"Structure and surface chemistry analysis of ultra-thin reactive ion etched GaAs (111) nanopillars","conference":{"location":"Warsaw (Poland)","end_date":"2014-09-19","start_date":"2014-09-15","name":"European Materials Research Society Fall Meeting 2014"},"date_updated":"2022-01-06T07:00:13Z","date_created":"2018-08-22T12:48:37Z","author":[{"first_name":"Thomas","id":"36950","full_name":"Riedl, Thomas","last_name":"Riedl"},{"last_name":"Kovács","full_name":"Kovács, A.","first_name":"A."},{"first_name":"D.","full_name":"Meertens, D.","last_name":"Meertens"},{"full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner","first_name":"Jörg"}]},{"citation":{"bibtex":"@inproceedings{Rüsing_Merten_Reinert_Rogalla_Becker_Lindner_2014, title={RBS of gold-coated polystyrene nanospheres}, author={Rüsing, M. and Merten, L. and Reinert, P. and Rogalla, D. and Becker, H.-W. and Lindner, Jörg}, year={2014} }","mla":"Rüsing, M., et al. <i>RBS of Gold-Coated Polystyrene Nanospheres</i>. 2014.","short":"M. Rüsing, L. Merten, P. Reinert, D. Rogalla, H.-W. Becker, J. Lindner, in: 2014.","apa":"Rüsing, M., Merten, L., Reinert, P., Rogalla, D., Becker, H.-W., &#38; Lindner, J. (2014). RBS of gold-coated polystyrene nanospheres. Presented at the Workshop Ionenstrahlen und Nanostrukturen, Paderborn.","ama":"Rüsing M, Merten L, Reinert P, Rogalla D, Becker H-W, Lindner J. RBS of gold-coated polystyrene nanospheres. In: ; 2014.","ieee":"M. Rüsing, L. Merten, P. Reinert, D. Rogalla, H.-W. Becker, and J. Lindner, “RBS of gold-coated polystyrene nanospheres,” presented at the Workshop Ionenstrahlen und Nanostrukturen, Paderborn, 2014.","chicago":"Rüsing, M., L. Merten, P. Reinert, D. Rogalla, H.-W. Becker, and Jörg Lindner. “RBS of Gold-Coated Polystyrene Nanospheres,” 2014."},"year":"2014","conference":{"name":"Workshop Ionenstrahlen und Nanostrukturen","start_date":"2014-07-20","end_date":"2014-07-22","location":"Paderborn"},"title":"RBS of gold-coated polystyrene nanospheres","date_created":"2018-08-22T12:50:31Z","author":[{"first_name":"M.","full_name":"Rüsing, M.","last_name":"Rüsing"},{"full_name":"Merten, L.","last_name":"Merten","first_name":"L."},{"first_name":"P.","full_name":"Reinert, P.","last_name":"Reinert"},{"first_name":"D.","full_name":"Rogalla, D.","last_name":"Rogalla"},{"first_name":"H.-W.","full_name":"Becker, H.-W.","last_name":"Becker"},{"first_name":"Jörg","last_name":"Lindner","id":"20797","full_name":"Lindner, Jörg"}],"date_updated":"2022-01-06T07:00:13Z","status":"public","type":"conference","language":[{"iso":"eng"}],"user_id":"55706","department":[{"_id":"15"},{"_id":"286"}],"_id":"4079"},{"file":[{"date_updated":"2018-03-16T11:35:28Z","date_created":"2018-03-16T11:35:28Z","creator":"florida","file_size":561325,"file_id":"1364","access_level":"closed","file_name":"408-jakobs14_ifm.pdf","content_type":"application/pdf","success":1,"relation":"main_file"}],"status":"public","editor":[{"first_name":"Elvira","last_name":"Albert","full_name":"Albert, Elvira"},{"last_name":"Sekerinski","full_name":"Sekerinski, Emil","first_name":"Emil"}],"abstract":[{"lang":"eng","text":"Verification of hardware and software usually proceeds separately, software analysis relying on the correctness of processors executing instructions. This assumption is valid as long as the software runs on standard CPUs that have been extensively validated and are in wide use. However, for processors exploiting custom instruction set extensions to meet performance and energy constraints the validation might be less extensive, challenging the correctness assumption.In this paper we present an approach for integrating software analyses with hardware verification, specifically targeting custom instruction set extensions. We propose three different techniques for deriving the properties to be proven for the hardware implementation of a custom instruction in order to support software analyses. The techniques are designed to explore the trade-off between generality and efficiency and span from proving functional equivalence over checking the rules of a particular analysis domain to verifying actual pre and post conditions resulting from program analysis. We demonstrate and compare the three techniques on example programs with custom instructions, using stateof-the-art software and hardware verification techniques."}],"type":"conference","publication":"Proceedings of the 11th International Conference on Integrated Formal Methods (iFM)","language":[{"iso":"eng"}],"file_date_updated":"2018-03-16T11:35:28Z","ddc":["040"],"series_title":"LNCS","user_id":"477","department":[{"_id":"77"},{"_id":"78"}],"project":[{"name":"SFB 901","_id":"1"},{"name":"SFB 901 - Subprojekt B4","_id":"12"},{"name":"SFB 901 - Project Area B","_id":"3"}],"_id":"408","citation":{"chicago":"Jakobs, Marie-Christine, Marco Platzner, Tobias Wiersema, and Heike Wehrheim. “Integrating Software and Hardware Verification.” In <i>Proceedings of the 11th International Conference on Integrated Formal Methods (IFM)</i>, edited by Elvira Albert and Emil Sekerinski, 307–22. LNCS, 2014. <a href=\"https://doi.org/10.1007/978-3-319-10181-1_19\">https://doi.org/10.1007/978-3-319-10181-1_19</a>.","ieee":"M.-C. Jakobs, M. Platzner, T. Wiersema, and H. Wehrheim, “Integrating Software and Hardware Verification,” in <i>Proceedings of the 11th International Conference on Integrated Formal Methods (iFM)</i>, 2014, pp. 307–322.","ama":"Jakobs M-C, Platzner M, Wiersema T, Wehrheim H. Integrating Software and Hardware Verification. In: Albert E, Sekerinski E, eds. <i>Proceedings of the 11th International Conference on Integrated Formal Methods (IFM)</i>. LNCS. ; 2014:307-322. doi:<a href=\"https://doi.org/10.1007/978-3-319-10181-1_19\">10.1007/978-3-319-10181-1_19</a>","apa":"Jakobs, M.-C., Platzner, M., Wiersema, T., &#38; Wehrheim, H. (2014). Integrating Software and Hardware Verification. In E. Albert &#38; E. Sekerinski (Eds.), <i>Proceedings of the 11th International Conference on Integrated Formal Methods (iFM)</i> (pp. 307–322). <a href=\"https://doi.org/10.1007/978-3-319-10181-1_19\">https://doi.org/10.1007/978-3-319-10181-1_19</a>","short":"M.-C. Jakobs, M. Platzner, T. Wiersema, H. Wehrheim, in: E. Albert, E. Sekerinski (Eds.), Proceedings of the 11th International Conference on Integrated Formal Methods (IFM), 2014, pp. 307–322.","bibtex":"@inproceedings{Jakobs_Platzner_Wiersema_Wehrheim_2014, series={LNCS}, title={Integrating Software and Hardware Verification}, DOI={<a href=\"https://doi.org/10.1007/978-3-319-10181-1_19\">10.1007/978-3-319-10181-1_19</a>}, booktitle={Proceedings of the 11th International Conference on Integrated Formal Methods (iFM)}, author={Jakobs, Marie-Christine and Platzner, Marco and Wiersema, Tobias and Wehrheim, Heike}, editor={Albert, Elvira and Sekerinski, EmilEditors}, year={2014}, pages={307–322}, collection={LNCS} }","mla":"Jakobs, Marie-Christine, et al. “Integrating Software and Hardware Verification.” <i>Proceedings of the 11th International Conference on Integrated Formal Methods (IFM)</i>, edited by Elvira Albert and Emil Sekerinski, 2014, pp. 307–22, doi:<a href=\"https://doi.org/10.1007/978-3-319-10181-1_19\">10.1007/978-3-319-10181-1_19</a>."},"page":"307-322","year":"2014","has_accepted_license":"1","doi":"10.1007/978-3-319-10181-1_19","title":"Integrating Software and Hardware Verification","date_created":"2017-10-17T12:42:11Z","author":[{"full_name":"Jakobs, Marie-Christine","last_name":"Jakobs","first_name":"Marie-Christine"},{"full_name":"Platzner, Marco","id":"398","last_name":"Platzner","first_name":"Marco"},{"id":"3118","full_name":"Wiersema, Tobias","last_name":"Wiersema","first_name":"Tobias"},{"first_name":"Heike","last_name":"Wehrheim","full_name":"Wehrheim, Heike","id":"573"}],"date_updated":"2022-01-06T07:00:14Z"},{"type":"conference","status":"public","user_id":"55706","department":[{"_id":"15"},{"_id":"286"}],"_id":"4080","language":[{"iso":"eng"}],"citation":{"ama":"Lindner J. TEM investigations on the nanoheteroepitaxy of semiconductors . In: ; 2014.","ieee":"J. Lindner, “TEM investigations on the nanoheteroepitaxy of semiconductors ,” presented at the 16th Scientific Seminar of the Dresden Fraunhofer Cluster Nanoanalysis in collaboration with the Dresden Center for Nanoanalysis, Dresden (Germany), 2014.","chicago":"Lindner, Jörg. “TEM Investigations on the Nanoheteroepitaxy of Semiconductors ,” 2014.","apa":"Lindner, J. (2014). TEM investigations on the nanoheteroepitaxy of semiconductors . Presented at the 16th Scientific Seminar of the Dresden Fraunhofer Cluster Nanoanalysis in collaboration with the Dresden Center for Nanoanalysis, Dresden (Germany).","bibtex":"@inproceedings{Lindner_2014, title={TEM investigations on the nanoheteroepitaxy of semiconductors }, author={Lindner, Jörg}, year={2014} }","mla":"Lindner, Jörg. <i>TEM Investigations on the Nanoheteroepitaxy of Semiconductors </i>. 2014.","short":"J. Lindner, in: 2014."},"year":"2014","date_created":"2018-08-22T12:51:57Z","author":[{"full_name":"Lindner, Jörg","last_name":"Lindner","first_name":"Jörg"}],"date_updated":"2022-01-06T07:00:14Z","conference":{"end_date":"2014-12-04","location":"Dresden (Germany)","name":"16th Scientific Seminar of the Dresden Fraunhofer Cluster Nanoanalysis in collaboration with the Dresden Center for Nanoanalysis","start_date":"2014-12-04"},"title":"TEM investigations on the nanoheteroepitaxy of semiconductors "},{"language":[{"iso":"eng"}],"_id":"4082","user_id":"55706","department":[{"_id":"15"},{"_id":"286"}],"status":"public","type":"conference","title":"Microscopic studies of plasmonic nanostructures II","conference":{"name":"Europhotonics Spring School 2014","start_date":"2014-03-31","end_date":"2014-04-03","location":"Porquerolles (France)"},"date_updated":"2022-01-06T07:00:14Z","author":[{"full_name":"Lindner, Jörg","last_name":"Lindner","first_name":"Jörg"}],"date_created":"2018-08-22T12:53:13Z","year":"2014","citation":{"bibtex":"@inproceedings{Lindner_2014, title={Microscopic studies of plasmonic nanostructures II}, author={Lindner, Jörg}, year={2014} }","short":"J. Lindner, in: 2014.","mla":"Lindner, Jörg. <i>Microscopic Studies of Plasmonic Nanostructures II</i>. 2014.","apa":"Lindner, J. (2014). Microscopic studies of plasmonic nanostructures II. Presented at the Europhotonics Spring School 2014, Porquerolles (France).","chicago":"Lindner, Jörg. “Microscopic Studies of Plasmonic Nanostructures II,” 2014.","ieee":"J. Lindner, “Microscopic studies of plasmonic nanostructures II,” presented at the Europhotonics Spring School 2014, Porquerolles (France), 2014.","ama":"Lindner J. Microscopic studies of plasmonic nanostructures II. In: ; 2014."}},{"type":"conference","status":"public","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706","_id":"4083","language":[{"iso":"eng"}],"citation":{"apa":"Lindner, J. (2014). Nanostrukturierte Oberflächen, nicht nur zum Spass. Presented at the Kolloquium der Friedrich-Schiller-Universität, Jena (Germany).","short":"J. Lindner, in: 2014.","bibtex":"@inproceedings{Lindner_2014, title={Nanostrukturierte Oberflächen, nicht nur zum Spass}, author={Lindner, Jörg}, year={2014} }","mla":"Lindner, Jörg. <i>Nanostrukturierte Oberflächen, Nicht Nur Zum Spass</i>. 2014.","ieee":"J. Lindner, “Nanostrukturierte Oberflächen, nicht nur zum Spass,” presented at the Kolloquium der Friedrich-Schiller-Universität, Jena (Germany), 2014.","chicago":"Lindner, Jörg. “Nanostrukturierte Oberflächen, Nicht Nur Zum Spass,” 2014.","ama":"Lindner J. Nanostrukturierte Oberflächen, nicht nur zum Spass. In: ; 2014."},"year":"2014","date_created":"2018-08-22T12:54:24Z","author":[{"full_name":"Lindner, Jörg","id":"20797","last_name":"Lindner","first_name":"Jörg"}],"date_updated":"2022-01-06T07:00:14Z","conference":{"start_date":"2014-04-25","name":"Kolloquium der Friedrich-Schiller-Universität","location":"Jena (Germany)","end_date":"2014-04-25"},"title":"Nanostrukturierte Oberflächen, nicht nur zum Spass"},{"page":"210-217","citation":{"bibtex":"@inproceedings{Platenius_Becker_Schäfer_2014, series={LNCS}, title={Integrating Service Matchers into a Service Market Architecture}, DOI={<a href=\"https://doi.org/10.1007/978-3-319-09970-5_19\">10.1007/978-3-319-09970-5_19</a>}, booktitle={Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)}, author={Platenius, Marie Christin and Becker, Steffen and Schäfer, Wilhelm}, editor={Avgeriou, Paris and Zdun, UweEditors}, year={2014}, pages={210–217}, collection={LNCS} }","mla":"Platenius, Marie Christin, et al. “Integrating Service Matchers into a Service Market Architecture.” <i>Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)</i>, edited by Paris Avgeriou and Uwe Zdun, 2014, pp. 210–17, doi:<a href=\"https://doi.org/10.1007/978-3-319-09970-5_19\">10.1007/978-3-319-09970-5_19</a>.","short":"M.C. Platenius, S. Becker, W. Schäfer, in: P. Avgeriou, U. Zdun (Eds.), Proceedings of the 8th European Conference on Software Architecture (ECSA 2014), 2014, pp. 210–217.","apa":"Platenius, M. C., Becker, S., &#38; Schäfer, W. (2014). Integrating Service Matchers into a Service Market Architecture. In P. Avgeriou &#38; U. Zdun (Eds.), <i>Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)</i> (pp. 210–217). <a href=\"https://doi.org/10.1007/978-3-319-09970-5_19\">https://doi.org/10.1007/978-3-319-09970-5_19</a>","ama":"Platenius MC, Becker S, Schäfer W. Integrating Service Matchers into a Service Market Architecture. In: Avgeriou P, Zdun U, eds. <i>Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)</i>. LNCS. ; 2014:210-217. doi:<a href=\"https://doi.org/10.1007/978-3-319-09970-5_19\">10.1007/978-3-319-09970-5_19</a>","ieee":"M. C. Platenius, S. Becker, and W. Schäfer, “Integrating Service Matchers into a Service Market Architecture,” in <i>Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)</i>, 2014, pp. 210–217.","chicago":"Platenius, Marie Christin, Steffen Becker, and Wilhelm Schäfer. “Integrating Service Matchers into a Service Market Architecture.” In <i>Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)</i>, edited by Paris Avgeriou and Uwe Zdun, 210–17. LNCS, 2014. <a href=\"https://doi.org/10.1007/978-3-319-09970-5_19\">https://doi.org/10.1007/978-3-319-09970-5_19</a>."},"has_accepted_license":"1","doi":"10.1007/978-3-319-09970-5_19","date_updated":"2022-01-06T07:00:15Z","author":[{"first_name":"Marie Christin","last_name":"Platenius","full_name":"Platenius, Marie Christin"},{"last_name":"Becker","full_name":"Becker, Steffen","first_name":"Steffen"},{"first_name":"Wilhelm","full_name":"Schäfer, Wilhelm","last_name":"Schäfer"}],"editor":[{"first_name":"Paris","last_name":"Avgeriou","full_name":"Avgeriou, Paris"},{"first_name":"Uwe","last_name":"Zdun","full_name":"Zdun, Uwe"}],"status":"public","type":"conference","file_date_updated":"2018-03-16T11:34:58Z","_id":"409","project":[{"_id":"1","name":"SFB 901"},{"name":"SFB 901 - Subprojekt B1","_id":"9"},{"name":"SFB 901 - Subproject B3","_id":"11"},{"name":"SFB 901 - Project Area B","_id":"3"}],"department":[{"_id":"76"}],"series_title":"LNCS","user_id":"477","year":"2014","title":"Integrating Service Matchers into a Service Market Architecture","date_created":"2017-10-17T12:42:11Z","abstract":[{"lang":"eng","text":"Service markets provide software components in the formof services. In order to enable a service discovery that satisfies servicerequesters and providers best, markets need automatic service matching:approaches for comparing whether a provided service satisfies a servicerequest. Current markets, e.g., app markets, are limited to basic keywordbasedsearch although many better suitable matching approaches aredescribed in literature. However, necessary architectural decisions forthe integration of matchers have a huge impact on quality propertieslike performance or security.Architectural decisions wrt. servicematchers have rarely been discussed,yet, and systematic approaches for their integration into service marketsare missing. In this paper, we present a systematic integration approachincluding the definition of requirements and a discussion on architecturaltactics. As a benefit, the decision-making process of integrating servicematchers is supported and the overall market success can be improved."}],"file":[{"content_type":"application/pdf","relation":"main_file","success":1,"date_created":"2018-03-16T11:34:58Z","creator":"florida","date_updated":"2018-03-16T11:34:58Z","access_level":"closed","file_name":"409-ecsa14.pdf","file_id":"1363","file_size":395884}],"publication":"Proceedings of the 8th European Conference on Software Architecture (ECSA 2014)","ddc":["040"],"language":[{"iso":"eng"}]},{"user_id":"13235","_id":"41","status":"public","type":"conference","publication":"Proceedings of the 9th International Workshop on Ontology Matching collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva del Garda, Trentino, Italy, October 20, 2014.","main_file_link":[{"url":"http://ceur-ws.org/Vol-1317/oaei14_paper8.pdf"}],"title":"RSDL workbench results for OAEI 2014","date_created":"2017-08-11T12:08:20Z","author":[{"id":"13235","full_name":"Schwichtenberg, Simon","last_name":"Schwichtenberg","first_name":"Simon"},{"full_name":"Gerth, Christian","last_name":"Gerth","first_name":"Christian"},{"first_name":"Gregor","last_name":"Engels","full_name":"Engels, Gregor"}],"volume":1317,"date_updated":"2022-01-06T07:00:16Z","publisher":"CEUR-WS.org","citation":{"ieee":"S. Schwichtenberg, C. Gerth, and G. Engels, “RSDL workbench results for OAEI 2014,” in <i>Proceedings of the 9th International Workshop on Ontology Matching collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva del Garda, Trentino, Italy, October 20, 2014.</i>, 2014, vol. 1317, pp. 155--162.","chicago":"Schwichtenberg, Simon, Christian Gerth, and Gregor Engels. “RSDL Workbench Results for OAEI 2014.” In <i>Proceedings of the 9th International Workshop on Ontology Matching Collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva Del Garda, Trentino, Italy, October 20, 2014.</i>, 1317:155--162. CEUR-WS.org, 2014.","ama":"Schwichtenberg S, Gerth C, Engels G. RSDL workbench results for OAEI 2014. In: <i>Proceedings of the 9th International Workshop on Ontology Matching Collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva Del Garda, Trentino, Italy, October 20, 2014.</i> Vol 1317. CEUR-WS.org; 2014:155--162.","mla":"Schwichtenberg, Simon, et al. “RSDL Workbench Results for OAEI 2014.” <i>Proceedings of the 9th International Workshop on Ontology Matching Collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva Del Garda, Trentino, Italy, October 20, 2014.</i>, vol. 1317, CEUR-WS.org, 2014, pp. 155--162.","short":"S. Schwichtenberg, C. Gerth, G. Engels, in: Proceedings of the 9th International Workshop on Ontology Matching Collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva Del Garda, Trentino, Italy, October 20, 2014., CEUR-WS.org, 2014, pp. 155--162.","bibtex":"@inproceedings{Schwichtenberg_Gerth_Engels_2014, title={RSDL workbench results for OAEI 2014}, volume={1317}, booktitle={Proceedings of the 9th International Workshop on Ontology Matching collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva del Garda, Trentino, Italy, October 20, 2014.}, publisher={CEUR-WS.org}, author={Schwichtenberg, Simon and Gerth, Christian and Engels, Gregor}, year={2014}, pages={155--162} }","apa":"Schwichtenberg, S., Gerth, C., &#38; Engels, G. (2014). RSDL workbench results for OAEI 2014. In <i>Proceedings of the 9th International Workshop on Ontology Matching collocated with the 13th International Semantic Web Conference (ISWC 2014), Riva del Garda, Trentino, Italy, October 20, 2014.</i> (Vol. 1317, pp. 155--162). CEUR-WS.org."},"intvolume":"      1317","page":"155--162","year":"2014"},{"status":"public","type":"journal_article","file_date_updated":"2018-03-16T11:34:28Z","department":[{"_id":"205"}],"user_id":"65453","_id":"410","project":[{"_id":"1","name":"SFB 901"},{"name":"SFB 901 - Subprojekt A3","_id":"7"},{"_id":"10","name":"SFB 901 - Subprojekt B2"},{"_id":"13","name":"SFB 901 - Subprojekt C1"},{"_id":"2","name":"SFB 901 - Project Area A"},{"_id":"4","name":"SFB 901 - Project Area C"},{"name":"SFB 901 - Project Area B","_id":"3"}],"page":"572--594","intvolume":"         7","citation":{"short":"A. Jungmann, S. Brangewitz, R. Petrlic, M.C. Platenius, International Journal On Advances in Intelligent Systems (IntSys) 7 (2014) 572--594.","mla":"Jungmann, Alexander, et al. “Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services.” <i>International Journal On Advances in Intelligent Systems (IntSys)</i>, vol. 7, no. 3&#38;4, IARIA, 2014, pp. 572--594.","bibtex":"@article{Jungmann_Brangewitz_Petrlic_Platenius_2014, title={Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services}, volume={7}, number={3&#38;4}, journal={International Journal On Advances in Intelligent Systems (IntSys)}, publisher={IARIA}, author={Jungmann, Alexander and Brangewitz, Sonja and Petrlic, Ronald and Platenius, Marie Christin}, year={2014}, pages={572--594} }","apa":"Jungmann, A., Brangewitz, S., Petrlic, R., &#38; Platenius, M. C. (2014). Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services. <i>International Journal On Advances in Intelligent Systems (IntSys)</i>, <i>7</i>(3&#38;4), 572--594.","ama":"Jungmann A, Brangewitz S, Petrlic R, Platenius MC. Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services. <i>International Journal On Advances in Intelligent Systems (IntSys)</i>. 2014;7(3&#38;4):572--594.","ieee":"A. Jungmann, S. Brangewitz, R. Petrlic, and M. C. Platenius, “Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services,” <i>International Journal On Advances in Intelligent Systems (IntSys)</i>, vol. 7, no. 3&#38;4, pp. 572--594, 2014.","chicago":"Jungmann, Alexander, Sonja Brangewitz, Ronald Petrlic, and Marie Christin Platenius. “Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services.” <i>International Journal On Advances in Intelligent Systems (IntSys)</i> 7, no. 3&#38;4 (2014): 572--594."},"has_accepted_license":"1","main_file_link":[{"url":"http://www.iariajournals.org/intelligent_systems/intsys_v7_n34_2014_paged.pdf"}],"volume":7,"author":[{"first_name":"Alexander","full_name":"Jungmann, Alexander","last_name":"Jungmann"},{"first_name":"Sonja","last_name":"Brangewitz","full_name":"Brangewitz, Sonja"},{"full_name":"Petrlic, Ronald","last_name":"Petrlic","first_name":"Ronald"},{"last_name":"Platenius","full_name":"Platenius, Marie Christin","first_name":"Marie Christin"}],"date_updated":"2022-01-06T07:00:17Z","file":[{"content_type":"application/pdf","relation":"main_file","success":1,"date_created":"2018-03-16T11:34:28Z","creator":"florida","date_updated":"2018-03-16T11:34:28Z","file_name":"410-intsys_v7_n34_2014_18.pdf","access_level":"closed","file_id":"1362","file_size":2590608}],"abstract":[{"lang":"eng","text":"One goal of service-oriented computing is to realize future markets of composed services. In such markets, service providers offer services that can be flexibly combined with each other. However, although crucial for decision-making, market participants are usually not able to individually estimate the quality of traded services in advance. To overcome this problem, we present a conceptual design for a reputation system that collects and processes user feedback on transactions, and provides this information as a signal for quality to participants in the market. Based on our proposed concept, we describe the incorporation of reputation information into distinct decision-making processes that are crucial in such service markets. In this context, we present a fuzzy service matching approach that takes reputation information into account. Furthermore, we introduce an adaptive service composition approach, and investigate the impact of exchanging immediate user feedback by reputation information. Last but not least, we describe the importance of reputation information for economic decisions of different market participants. The overall output of this paper is a comprehensive view on managing and exploiting reputation information in markets of composed services using the example of On-The-Fly Computing."}],"publication":"International Journal On Advances in Intelligent Systems (IntSys)","language":[{"iso":"eng"}],"ddc":["040"],"year":"2014","issue":"3&4","title":"Incorporating Reputation Information into Decision-Making Processes in Markets of Composed Services","date_created":"2017-10-17T12:42:11Z","publisher":"IARIA"},{"title":"Improving Service Specifications for the Service Matching on a Service Market","publisher":"Universität Paderborn","date_updated":"2022-01-06T07:00:18Z","date_created":"2017-10-17T12:42:12Z","author":[{"first_name":"Vahide","full_name":"Taherinajafabadi, Vahide","last_name":"Taherinajafabadi"}],"year":"2014","citation":{"apa":"Taherinajafabadi, V. (2014). <i>Improving Service Specifications for the Service Matching on a Service Market</i>. Universität Paderborn.","short":"V. Taherinajafabadi, Improving Service Specifications for the Service Matching on a Service Market, Universität Paderborn, 2014.","mla":"Taherinajafabadi, Vahide. <i>Improving Service Specifications for the Service Matching on a Service Market</i>. Universität Paderborn, 2014.","bibtex":"@book{Taherinajafabadi_2014, title={Improving Service Specifications for the Service Matching on a Service Market}, publisher={Universität Paderborn}, author={Taherinajafabadi, Vahide}, year={2014} }","ama":"Taherinajafabadi V. <i>Improving Service Specifications for the Service Matching on a Service Market</i>. Universität Paderborn; 2014.","chicago":"Taherinajafabadi, Vahide. <i>Improving Service Specifications for the Service Matching on a Service Market</i>. Universität Paderborn, 2014.","ieee":"V. Taherinajafabadi, <i>Improving Service Specifications for the Service Matching on a Service Market</i>. Universität Paderborn, 2014."},"_id":"411","project":[{"_id":"1","name":"SFB 901"},{"_id":"9","name":"SFB 901 - Subprojekt B1"},{"_id":"3","name":"SFB 901 - Project Area B"}],"user_id":"15504","status":"public","type":"mastersthesis"}]