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Delayed (de-)activation in servers with a sleep mode. <i>Sustainable Computing: Informatics and Systems</i>, <i>10</i>, 48–55. <a href=\"https://doi.org/10.1016/j.suscom.2016.04.002\">https://doi.org/10.1016/j.suscom.2016.04.002</a>","chicago":"Herlich, Matthias, Nico Bredenbals, and Holger Karl. “Delayed (de-)Activation in Servers with a Sleep Mode.” <i>Sustainable Computing: Informatics and Systems</i> 10 (2016): 48–55. <a href=\"https://doi.org/10.1016/j.suscom.2016.04.002\">https://doi.org/10.1016/j.suscom.2016.04.002</a>.","short":"M. Herlich, N. Bredenbals, H. Karl, Sustainable Computing: Informatics and Systems 10 (2016) 48–55.","mla":"Herlich, Matthias, et al. “Delayed (de-)Activation in Servers with a Sleep Mode.” <i>Sustainable Computing: Informatics and Systems</i>, vol. 10, Elsevier BV, 2016, pp. 48–55, doi:<a href=\"https://doi.org/10.1016/j.suscom.2016.04.002\">10.1016/j.suscom.2016.04.002</a>.","bibtex":"@article{Herlich_Bredenbals_Karl_2016, title={Delayed (de-)activation in servers with a sleep mode}, volume={10}, DOI={<a href=\"https://doi.org/10.1016/j.suscom.2016.04.002\">10.1016/j.suscom.2016.04.002</a>}, journal={Sustainable Computing: Informatics and Systems}, publisher={Elsevier BV}, author={Herlich, Matthias and Bredenbals, Nico and Karl, Holger}, year={2016}, pages={48–55} }","ama":"Herlich M, Bredenbals N, Karl H. Delayed (de-)activation in servers with a sleep mode. <i>Sustainable Computing: Informatics and Systems</i>. 2016;10:48-55. doi:<a href=\"https://doi.org/10.1016/j.suscom.2016.04.002\">10.1016/j.suscom.2016.04.002</a>"},"publication":"Sustainable Computing: Informatics and Systems","date_created":"2018-03-19T13:29:17Z","department":[{"_id":"75"}],"type":"journal_article"},{"place":"Tallin, Estonia","date_created":"2021-09-13T09:44:30Z","department":[{"_id":"58"}],"type":"conference","citation":{"mla":"Adelt, Peer, et al. “Fast Dynamic Fault Injection for Virtual Microcontroller Platforms.” <i>Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>, 2016, doi:<a href=\"https://doi.org/10.1109/VLSI-SoC.2016.7753545\">10.1109/VLSI-SoC.2016.7753545</a>.","bibtex":"@inproceedings{Adelt_Koppelmann_Müller_Becker_Kleinjohann_Scheytt_2016, place={Tallin, Estonia}, title={Fast Dynamic Fault Injection for Virtual Microcontroller Platforms}, DOI={<a href=\"https://doi.org/10.1109/VLSI-SoC.2016.7753545\">10.1109/VLSI-SoC.2016.7753545</a>}, booktitle={Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)}, author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Becker, Markus and Kleinjohann, Bernd and Scheytt, Christoph}, year={2016} }","ama":"Adelt P, Koppelmann B, Müller W, Becker M, Kleinjohann B, Scheytt C. Fast Dynamic Fault Injection for Virtual Microcontroller Platforms. In: <i>Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>. ; 2016. doi:<a href=\"https://doi.org/10.1109/VLSI-SoC.2016.7753545\">10.1109/VLSI-SoC.2016.7753545</a>","ieee":"P. Adelt, B. Koppelmann, W. Müller, M. Becker, B. Kleinjohann, and C. Scheytt, “Fast Dynamic Fault Injection for Virtual Microcontroller Platforms,” 2016, doi: <a href=\"https://doi.org/10.1109/VLSI-SoC.2016.7753545\">10.1109/VLSI-SoC.2016.7753545</a>.","apa":"Adelt, P., Koppelmann, B., Müller, W., Becker, M., Kleinjohann, B., &#38; Scheytt, C. (2016). Fast Dynamic Fault Injection for Virtual Microcontroller Platforms. <i>Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>. <a href=\"https://doi.org/10.1109/VLSI-SoC.2016.7753545\">https://doi.org/10.1109/VLSI-SoC.2016.7753545</a>","short":"P. Adelt, B. Koppelmann, W. Müller, M. Becker, B. Kleinjohann, C. Scheytt, in: Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC), Tallin, Estonia, 2016.","chicago":"Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Markus Becker, Bernd Kleinjohann, and Christoph Scheytt. “Fast Dynamic Fault Injection for Virtual Microcontroller Platforms.” In <i>Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>. Tallin, Estonia, 2016. <a href=\"https://doi.org/10.1109/VLSI-SoC.2016.7753545\">https://doi.org/10.1109/VLSI-SoC.2016.7753545</a>."},"publication":"Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)","abstract":[{"lang":"eng","text":"Electronic systems, like they are embedded in road vehicles, have to be compliant to functional safety standards like ISO 26262 [1], which limit the impacts of malfunctions for safety critical systems. ISO 26262, for instance, defines different safety levels for road vehicles, which require different means and measures for a safety compliant system and its development process like risk analysis and fault effect simulation. For fault effect simulation it is important to investigate the impact of physical and hardware related effects to the correct function of a system. This article first studies code and model mutations for fault injection in the context of fault effect simulation through different system abstraction levels. It demonstrates how high level mutations correlate to bit flips of software binaries by examples from the TriCore™ instruction set and finally presents a virtual platform based implementation for automated injection of bit flip based mutations into software binaries. Experimental results demonstrate the efficiency of the implemented approach."}],"related_material":{"link":[{"relation":"confirmation","url":"https://ieeexplore.ieee.org/document/7753545"}]},"_id":"24264","language":[{"iso":"eng"}],"doi":"10.1109/VLSI-SoC.2016.7753545","user_id":"15931","conference":{"end_date":"2016.09.28","start_date":"2016.09.26"},"publication_identifier":{"eissn":["2324-8440"]},"author":[{"id":"5603","first_name":"Peer","last_name":"Adelt","full_name":"Adelt, Peer"},{"full_name":"Koppelmann, Bastian","last_name":"Koppelmann","first_name":"Bastian","id":"25260"},{"last_name":"Müller","first_name":"Wolfgang","full_name":"Müller, Wolfgang","id":"16243"},{"full_name":"Becker, Markus","first_name":"Markus","last_name":"Becker"},{"full_name":"Kleinjohann, Bernd","last_name":"Kleinjohann","first_name":"Bernd"},{"last_name":"Scheytt","first_name":"Christoph","full_name":"Scheytt, Christoph","id":"37144"}],"title":"Fast Dynamic Fault Injection for Virtual Microcontroller Platforms","status":"public","year":"2016","date_updated":"2022-02-17T13:57:45Z"},{"place":"Taipei, Taiwan","date_created":"2021-09-13T09:44:31Z","department":[{"_id":"58"}],"type":"conference","citation":{"short":"Y. Mao, K. Schmalz, C. Scheytt, E. Shiju, in: IEEE International Symposium on Radio-Frequency Integration Technology, Taipei, Taiwan, 2016.","chicago":"Mao, Yanfei, Klaus Schmalz, Christoph Scheytt, and E. Shiju. “An All-Transmission-Line 220 GHz Differential LNA in SiGe BiCMOS.” In <i>IEEE International Symposium on Radio-Frequency Integration Technology</i>. Taipei, Taiwan, 2016. <a href=\"https://doi.org/10.1109/RFIT.2016.7578132\">https://doi.org/10.1109/RFIT.2016.7578132</a>.","ieee":"Y. Mao, K. Schmalz, C. Scheytt, and E. Shiju, “An all-transmission-line 220 GHz differential LNA in SiGe BiCMOS,” 2016, doi: <a href=\"https://doi.org/10.1109/RFIT.2016.7578132\">10.1109/RFIT.2016.7578132</a>.","apa":"Mao, Y., Schmalz, K., Scheytt, C., &#38; Shiju, E. (2016). An all-transmission-line 220 GHz differential LNA in SiGe BiCMOS. <i>IEEE International Symposium on Radio-Frequency Integration Technology</i>. <a href=\"https://doi.org/10.1109/RFIT.2016.7578132\">https://doi.org/10.1109/RFIT.2016.7578132</a>","bibtex":"@inproceedings{Mao_Schmalz_Scheytt_Shiju_2016, place={Taipei, Taiwan}, title={An all-transmission-line 220 GHz differential LNA in SiGe BiCMOS}, DOI={<a href=\"https://doi.org/10.1109/RFIT.2016.7578132\">10.1109/RFIT.2016.7578132</a>}, booktitle={IEEE International Symposium on Radio-Frequency Integration Technology}, author={Mao, Yanfei and Schmalz, Klaus and Scheytt, Christoph and Shiju, E.}, year={2016} }","ama":"Mao Y, Schmalz K, Scheytt C, Shiju E. An all-transmission-line 220 GHz differential LNA in SiGe BiCMOS. In: <i>IEEE International Symposium on Radio-Frequency Integration Technology</i>. ; 2016. doi:<a href=\"https://doi.org/10.1109/RFIT.2016.7578132\">10.1109/RFIT.2016.7578132</a>","mla":"Mao, Yanfei, et al. “An All-Transmission-Line 220 GHz Differential LNA in SiGe BiCMOS.” <i>IEEE International Symposium on Radio-Frequency Integration Technology</i>, 2016, doi:<a href=\"https://doi.org/10.1109/RFIT.2016.7578132\">10.1109/RFIT.2016.7578132</a>."},"publication":"IEEE International Symposium on Radio-Frequency Integration Technology","related_material":{"link":[{"url":"https://ieeexplore.ieee.org/document/7578132","relation":"confirmation"}]},"abstract":[{"lang":"eng","text":"This paper presents a four stage all-transmission-line 220 GHz differential LNA in SiGe BiCMOS technology. Cascode topology is chosen for each stage. The amplifier takes advantage of microstrip transmission lines to realize the inductive load, Marshand balun, input, output, and inter-stage matching of the LNA. The LNA has a gain of 21 dB at 224 GHz, a 3 dB bandwidth of more than 6 GHz. It has a supply voltage of 3V and power dissipation of 234 mW. The amplifier is intended for the use in communication, security scanning, imaging and remote sensing at 220 GHz."}],"language":[{"iso":"eng"}],"_id":"24265","doi":"10.1109/RFIT.2016.7578132","user_id":"15931","conference":{"start_date":"2016.08.24","end_date":"2016.08.26"},"publication_identifier":{"eisbn":["978-1-5090-1235-0"]},"author":[{"full_name":"Mao, Yanfei","last_name":"Mao","first_name":"Yanfei"},{"full_name":"Schmalz, Klaus","first_name":"Klaus","last_name":"Schmalz"},{"first_name":"Christoph","last_name":"Scheytt","full_name":"Scheytt, Christoph","id":"37144"},{"last_name":"Shiju","first_name":"E.","full_name":"Shiju, E."}],"title":"An all-transmission-line 220 GHz differential LNA in SiGe BiCMOS","status":"public","year":"2016","date_updated":"2022-02-17T14:00:40Z"}]