--- _id: '24216' abstract: - lang: eng text: In this article mixed analog/digital signal processing techniques based on parallel spread-spectrum sequencing (PSSS) and radio frequency (RF) carrier synchronization for ultra-broadband wireless communication are investigated on system and circuit level. author: - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt - first_name: Abdul Rehman full_name: Javed, Abdul Rehman last_name: Javed - first_name: Eswara Rao full_name: Bammidi, Eswara Rao last_name: Bammidi - first_name: Karthik full_name: KrishneGowda, Karthik last_name: KrishneGowda - first_name: Ingmar full_name: Kallfass, Ingmar last_name: Kallfass - first_name: Rolf full_name: Kraemer, Rolf last_name: Kraemer citation: ama: Scheytt C, Javed AR, Bammidi ER, KrishneGowda K, Kallfass I, Kraemer R. 100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing. Frequenz* Journal of RF-Engineering and Telecommunications. 2017;71(9-10):399-414. apa: Scheytt, C., Javed, A. R., Bammidi, E. R., KrishneGowda, K., Kallfass, I., & Kraemer, R. (2017). 100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing. Frequenz* Journal of RF-Engineering and Telecommunications, 71(9–10), 399–414. bibtex: '@article{Scheytt_Javed_Bammidi_KrishneGowda_Kallfass_Kraemer_2017, title={100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing}, volume={71}, number={9–10}, journal={Frequenz* Journal of RF-Engineering and Telecommunications}, author={Scheytt, Christoph and Javed, Abdul Rehman and Bammidi, Eswara Rao and KrishneGowda, Karthik and Kallfass, Ingmar and Kraemer, Rolf}, year={2017}, pages={399–414} }' chicago: 'Scheytt, Christoph, Abdul Rehman Javed, Eswara Rao Bammidi, Karthik KrishneGowda, Ingmar Kallfass, and Rolf Kraemer. “100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing.” Frequenz* Journal of RF-Engineering and Telecommunications 71, no. 9–10 (2017): 399–414.' ieee: C. Scheytt, A. R. Javed, E. R. Bammidi, K. KrishneGowda, I. Kallfass, and R. Kraemer, “100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing,” Frequenz* Journal of RF-Engineering and Telecommunications, vol. 71, no. 9–10, pp. 399–414, 2017. mla: Scheytt, Christoph, et al. “100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing.” Frequenz* Journal of RF-Engineering and Telecommunications, vol. 71, no. 9–10, 2017, pp. 399–414. short: C. Scheytt, A.R. Javed, E.R. Bammidi, K. KrishneGowda, I. Kallfass, R. Kraemer, Frequenz* Journal of RF-Engineering and Telecommunications 71 (2017) 399–414. date_created: 2021-09-13T08:20:30Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' issue: 9-10 language: - iso: eng page: 399-414 publication: Frequenz* Journal of RF-Engineering and Telecommunications related_material: link: - relation: confirmation url: https://doi.org/10.1515/freq-2017-0174 status: public title: 100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing type: journal_article user_id: '15931' volume: '71 ' year: '2017' ... --- _id: '24217' abstract: - lang: eng text: Parallel Sequence Spread Spectrum (PSSS) is a physical layer (PHY) baseband technology that is well suited for mixed-signal transceiver implementation for high data rate wireless communication systems. Mixed signal baseband realization allows for easier implementation of the channel equalization function and eliminates the need for high speed data converters. System design and architecture of a mixed signal baseband processor for 100 Gbps wireless communication is described that reduces the implementation complexity and results in a consequent reduction in power dissipation and chip area. An ultra-broadband analog correlator consisting of a four-quadrant multiplier and a fast resettable integrator using only NPN transistors was designed, fabricated, and measured. The correlator circuit is the core component of the receiver baseband. To the best knowledge of the authors, it is the fastest correlator circuit published so far. author: - first_name: Abdul Rehman full_name: Javed, Abdul Rehman last_name: Javed - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt - first_name: KrishneGowda full_name: Karthik, KrishneGowda last_name: Karthik - first_name: Roland full_name: Kramer, Roland last_name: Kramer citation: ama: 'Javed AR, Scheytt C, Karthik K, Kramer R. System design of a mixed signal PSSS transdeiver using a linear ultra-broadband analog correlator for the receiver baseband designed in 130nm SiGe BiCMOS technology. In: IEEE EUROCON 2017-17th International Conference on Smart Technologies. 17th International Conference on Smart Technologies. ; 2017:228-233. doi:10.1109/EUROCON.2017.8011110' apa: Javed, A. R., Scheytt, C., Karthik, K., & Kramer, R. (2017). System design of a mixed signal PSSS transdeiver using a linear ultra-broadband analog correlator for the receiver baseband designed in 130nm SiGe BiCMOS technology. IEEE EUROCON 2017-17th International Conference on Smart Technologies, 228–233. https://doi.org/10.1109/EUROCON.2017.8011110 bibtex: '@inproceedings{Javed_Scheytt_Karthik_Kramer_2017, series={17th International Conference on Smart Technologies}, title={System design of a mixed signal PSSS transdeiver using a linear ultra-broadband analog correlator for the receiver baseband designed in 130nm SiGe BiCMOS technology}, DOI={10.1109/EUROCON.2017.8011110}, booktitle={IEEE EUROCON 2017-17th International Conference on Smart Technologies}, author={Javed, Abdul Rehman and Scheytt, Christoph and Karthik, KrishneGowda and Kramer, Roland}, year={2017}, pages={228–233}, collection={17th International Conference on Smart Technologies} }' chicago: Javed, Abdul Rehman, Christoph Scheytt, KrishneGowda Karthik, and Roland Kramer. “System Design of a Mixed Signal PSSS Transdeiver Using a Linear Ultra-Broadband Analog Correlator for the Receiver Baseband Designed in 130nm SiGe BiCMOS Technology.” In IEEE EUROCON 2017-17th International Conference on Smart Technologies, 228–33. 17th International Conference on Smart Technologies, 2017. https://doi.org/10.1109/EUROCON.2017.8011110. ieee: 'A. R. Javed, C. Scheytt, K. Karthik, and R. Kramer, “System design of a mixed signal PSSS transdeiver using a linear ultra-broadband analog correlator for the receiver baseband designed in 130nm SiGe BiCMOS technology,” in IEEE EUROCON 2017-17th International Conference on Smart Technologies, 2017, pp. 228–233, doi: 10.1109/EUROCON.2017.8011110.' mla: Javed, Abdul Rehman, et al. “System Design of a Mixed Signal PSSS Transdeiver Using a Linear Ultra-Broadband Analog Correlator for the Receiver Baseband Designed in 130nm SiGe BiCMOS Technology.” IEEE EUROCON 2017-17th International Conference on Smart Technologies, 2017, pp. 228–33, doi:10.1109/EUROCON.2017.8011110. short: 'A.R. Javed, C. Scheytt, K. Karthik, R. Kramer, in: IEEE EUROCON 2017-17th International Conference on Smart Technologies, 2017, pp. 228–233.' date_created: 2021-09-13T08:20:31Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' doi: 10.1109/EUROCON.2017.8011110 language: - iso: eng page: 228-233 publication: IEEE EUROCON 2017-17th International Conference on Smart Technologies publication_identifier: eisbn: - 978-1-5090-3843-5 isbn: - 978-1-5090-3844-2 related_material: link: - relation: confirmation url: https://ieeexplore.ieee.org/document/8011110 series_title: 17th International Conference on Smart Technologies status: public title: System design of a mixed signal PSSS transdeiver using a linear ultra-broadband analog correlator for the receiver baseband designed in 130nm SiGe BiCMOS technology type: conference user_id: '15931' year: '2017' ... --- _id: '24218' abstract: - lang: ger text: ' Die Erfindung betrifft eine Folge-Halte-Schaltung zum Konvertieren eines analogen Eingangssignals in ein digitales Ausgangssignal mit einer Haltekapazitätseinheit, mit einer Spannungsverstärkereinheit enthaltend einen Eingang, an dem ein analoges Eingangsspannungssignal anlegbar ist, und enthaltend einen Ausgang, der mit der Haltekapazitätseinheit verbunden ist, mit einer Arbeitspunkteinstelleinheit zur Steuerung der Spannungsverstärkereinheit, wobei an einem Eingang der Arbeitspunkteinstelleinheit ein Steuersignal anliegt, so dass in einem Folgebetrieb der Folge-Halte-Schaltung eine an dem Ausgang der Spannungsverstärkereinheit anliegendes Ausgangssignal einen an den Eingang der Spannungsverstärkereinheit anliegendes Eingangssignal folgt, und in einem Haltebetrieb der Folge-Halte-Schaltung das Ausgangssignal der Spannungsverstärkereinheit konstant ist, mit einer Taktsignalquelle zur Erzeugung einer Folge von einem Eingang der Arbeitspunkteinstelleinheit anliegenden Taktsignalen, wobei die Arbeitspunkteinstelleinheit elektrooptische Mittel zur Erzeugung des Steuersignals aufweist, dass die Taktsignalquelle als eine optische Taktsignalquelle ausgebildet ist, so dass als Taktsignal eine optische Impulsfolge mit hohen und tiefen Taktsignalen an den Eingang der Arbeitspunkteinstelleinheit anliegt. ' application_date: 17.07.2017 application_number: '102017116001' author: - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt citation: ama: Scheytt C. Folge-Halte-Schaltung . Published online 2017. apa: Scheytt, C. (2017). Folge-Halte-Schaltung . bibtex: '@article{Scheytt_2017, title={Folge-Halte-Schaltung }, author={Scheytt, Christoph}, year={2017} }' chicago: Scheytt, Christoph. “Folge-Halte-Schaltung ,” 2017. ieee: C. Scheytt, “Folge-Halte-Schaltung .” 2017. mla: Scheytt, Christoph. Folge-Halte-Schaltung . 2017. short: C. Scheytt, (2017). date_created: 2021-09-13T08:20:32Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' ipc: H03K3/42 ipn: DE102017116001A1 publication_date: 17.01.2019 related_material: link: - relation: confirmation url: https://depatisnet.dpma.de/DepatisNet/depatisnet?action=bibdat&docid=DE102017116001A1 status: public title: 'Folge-Halte-Schaltung ' type: patent user_id: '15931' year: '2017' ... --- _id: '24219' abstract: - lang: eng text: In this paper we present theoretical, simulated and measured data for a reader to tag communication RFID system at 5.8 GHz. First a theoretical link budget analysis for a reader to tag architecture is shown for a wireless industrial application at 1m distance. This includes a power budget of the passively powered transponder. The received power level of the backscattered data for the theoretical link budget is -52:5 dBm. For the first setup slot antennas are developed and measured in the anechoic chamber. The measured gain is 4.0 dB. The power of the backscatter data in setup 1 is -74:8 dBm. This corresponds to the theoretical link budget since, all losses such as cable or lower antenna gain are taken into account. Setup 2 is upgraded on the reader side with horn antennas. At 5.8 GHz, the gain reaches the value of 10.8 dB. The second setup shows improvement in the receiving backscattered power to a value of -62:4 dBm. Furthermore, as a solution to detect those transponders not presented in the main slope of the antenna, a steerable beam is introduced by means of a Rotman lens. On the topic of the passive transponder, different harvesting topologies at 5.8 GHz are investigated, and the efficiency simulation of the harvesting circuitry has been performed. The simulated efficiency of the implemented technique is 68 %. author: - first_name: Peter full_name: Kuhn, Peter last_name: Kuhn - first_name: Sanaz full_name: Haddadian, Sanaz id: '59648' last_name: Haddadian - first_name: Frederic full_name: Meyer, Frederic last_name: Meyer - first_name: Marc full_name: Hoffmann, Marc last_name: Hoffmann - first_name: Anton full_name: Grabmaier, Anton last_name: Grabmaier - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt - first_name: Thomas full_name: Kaiser, Thomas last_name: Kaiser citation: ama: 'Kuhn P, Haddadian S, Meyer F, et al. SHF RFID System for Automatic Process Optimization with Intelligent Tools. In: Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies. VDE ITG; 2017.' apa: Kuhn, P., Haddadian, S., Meyer, F., Hoffmann, M., Grabmaier, A., Scheytt, C., & Kaiser, T. (2017). SHF RFID System for Automatic Process Optimization with Intelligent Tools. Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies. bibtex: '@inproceedings{Kuhn_Haddadian_Meyer_Hoffmann_Grabmaier_Scheytt_Kaiser_2017, place={München, Germany}, title={SHF RFID System for Automatic Process Optimization with Intelligent Tools}, booktitle={Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies}, publisher={VDE ITG}, author={Kuhn, Peter and Haddadian, Sanaz and Meyer, Frederic and Hoffmann, Marc and Grabmaier, Anton and Scheytt, Christoph and Kaiser, Thomas}, year={2017} }' chicago: 'Kuhn, Peter, Sanaz Haddadian, Frederic Meyer, Marc Hoffmann, Anton Grabmaier, Christoph Scheytt, and Thomas Kaiser. “SHF RFID System for Automatic Process Optimization with Intelligent Tools.” In Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies. München, Germany: VDE ITG, 2017.' ieee: P. Kuhn et al., “SHF RFID System for Automatic Process Optimization with Intelligent Tools,” 2017. mla: Kuhn, Peter, et al. “SHF RFID System for Automatic Process Optimization with Intelligent Tools.” Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies, VDE ITG, 2017. short: 'P. Kuhn, S. Haddadian, F. Meyer, M. Hoffmann, A. Grabmaier, C. Scheytt, T. Kaiser, in: Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies, VDE ITG, München, Germany, 2017.' date_created: 2021-09-13T08:20:34Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' language: - iso: eng place: München, Germany publication: Smart SysTech 2017; European Conference on Smart Objects, Systems and Technologies publication_identifier: isbn: - 978-3-8007-4428-2 publisher: VDE ITG related_material: link: - relation: confirmation url: https://ieeexplore.ieee.org/document/8085084 status: public title: SHF RFID System for Automatic Process Optimization with Intelligent Tools type: conference user_id: '15931' year: '2017' ... --- _id: '24220' author: - first_name: Peer full_name: Adelt, Peer id: '5603' last_name: Adelt - first_name: Bastian full_name: Koppelmann, Bastian id: '25260' last_name: Koppelmann - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller - first_name: Daniel full_name: Mueller-Gritschneder, Daniel last_name: Mueller-Gritschneder - first_name: Bernd full_name: Kleinjohann, Bernd last_name: Kleinjohann - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt citation: ama: 'Adelt P, Koppelmann B, Müller W, Mueller-Gritschneder D, Kleinjohann B, Scheytt C. Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen. In: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme. Verlagsschriftenreihe des Heinz Nixdorf Instituts; 2017. doi:10.17619/UNIPB/1-93' apa: Adelt, P., Koppelmann, B., Müller, W., Mueller-Gritschneder, D., Kleinjohann, B., & Scheytt, C. (2017). Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen. Tagungsband des Wissenschaftsforums Intelligente Technische Systeme. https://doi.org/10.17619/UNIPB/1-93 bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Mueller-Gritschneder_Kleinjohann_Scheytt_2017, place={Germany, Paderborn}, title={Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen}, DOI={10.17619/UNIPB/1-93}, booktitle={Tagungsband des Wissenschaftsforums Intelligente Technische Systeme}, publisher={Verlagsschriftenreihe des Heinz Nixdorf Instituts}, author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Mueller-Gritschneder, Daniel and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017} }' chicago: 'Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Daniel Mueller-Gritschneder, Bernd Kleinjohann, and Christoph Scheytt. “Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen.” In Tagungsband des Wissenschaftsforums Intelligente Technische Systeme. Germany, Paderborn: Verlagsschriftenreihe des Heinz Nixdorf Instituts, 2017. https://doi.org/10.17619/UNIPB/1-93.' ieee: 'P. Adelt, B. Koppelmann, W. Müller, D. Mueller-Gritschneder, B. Kleinjohann, and C. Scheytt, “Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen,” 2017, doi: 10.17619/UNIPB/1-93.' mla: Adelt, Peer, et al. “Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen.” Tagungsband des Wissenschaftsforums Intelligente Technische Systeme, Verlagsschriftenreihe des Heinz Nixdorf Instituts, 2017, doi:10.17619/UNIPB/1-93. short: 'P. Adelt, B. Koppelmann, W. Müller, D. Mueller-Gritschneder, B. Kleinjohann, C. Scheytt, in: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme, Verlagsschriftenreihe des Heinz Nixdorf Instituts, Germany, Paderborn, 2017.' date_created: 2021-09-13T08:20:35Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' doi: 10.17619/UNIPB/1-93 language: - iso: ger place: Germany, Paderborn publication: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme publication_identifier: isbn: - 978-3-942647-88-5 publication_status: published publisher: Verlagsschriftenreihe des Heinz Nixdorf Instituts related_material: link: - relation: confirmation url: https://digital.ub.uni-paderborn.de/hs/content/titleinfo/2436759 status: public title: Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen type: conference user_id: '15931' year: '2017' ... --- _id: '24221' abstract: - lang: ger text: Das Wissenschaftsforum Intelligente Technische Systeme (WInTeSys) legt am 11. und 12. Mai 2017 in Paderborn den Schwerpunkt auf die Grundlagen und die Entwicklung intelligenter technischer Systeme im Kontext Industrie 4.0. Etwa 40 begutachtete hochkarätige Beiträge geben einen Überblick über Forschungsfelder, Technologien und Anwendungen. Die Veranstaltung bietet den Teilnehmerinnen und Teilnehmern eine ausgezeichnete Bühne für den Erfahrungsaustausch auf dem Weg in die Digitalisierung von Produkten und Produktionssystemen. »Das Besondere ist der Dialog von Hochschulforschung und industrieller Entwicklung, also das Aufeinandertreffen von »Science-Push« und »Application-Pull«. Die Beiträge spiegeln die hervorragende Vernetzung in der Region OWL und darüber hinaus wider«, sagt Veranstalter Prof. Jürgen Gausemeier (Heinz Nixdorf Institut, Universität Paderborn). author: - first_name: Jürgen full_name: Gausemeier, Jürgen last_name: Gausemeier - first_name: Eric full_name: Bodden, Eric id: '59256' last_name: Bodden orcid: 0000-0003-3470-3647 - first_name: Falko full_name: Dressler, Falko id: '48097' last_name: Dressler orcid: 0000-0002-1989-1750 - first_name: Roman full_name: Dumitrescu, Roman id: '16190' last_name: Dumitrescu - first_name: Friedhelm full_name: Meyer auf der Heide, Friedhelm id: '15523' last_name: Meyer auf der Heide - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt - first_name: Ansgar full_name: Trächtler, Ansgar id: '552' last_name: Trächtler citation: ama: Gausemeier J, Bodden E, Dressler F, et al. Wissenschaftsforum Intelligente Technische Systeme (WInTeSys). Vol 369. Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn; 2017. doi:10.17619/UNIPB/1-93 apa: Gausemeier, J., Bodden, E., Dressler, F., Dumitrescu, R., Meyer auf der Heide, F., Scheytt, C., & Trächtler, A. (2017). Wissenschaftsforum Intelligente Technische Systeme (WInTeSys) (Vol. 369). Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn. https://doi.org/10.17619/UNIPB/1-93 bibtex: '@book{Gausemeier_Bodden_Dressler_Dumitrescu_Meyer auf der Heide_Scheytt_Trächtler_2017, series={369}, title={Wissenschaftsforum Intelligente Technische Systeme (WInTeSys)}, volume={369}, DOI={10.17619/UNIPB/1-93}, publisher={Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn}, author={Gausemeier, Jürgen and Bodden, Eric and Dressler, Falko and Dumitrescu, Roman and Meyer auf der Heide, Friedhelm and Scheytt, Christoph and Trächtler, Ansgar}, year={2017}, collection={369} }' chicago: Gausemeier, Jürgen, Eric Bodden, Falko Dressler, Roman Dumitrescu, Friedhelm Meyer auf der Heide, Christoph Scheytt, and Ansgar Trächtler. Wissenschaftsforum Intelligente Technische Systeme (WInTeSys). Vol. 369. 369. Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2017. https://doi.org/10.17619/UNIPB/1-93. ieee: J. Gausemeier et al., Wissenschaftsforum Intelligente Technische Systeme (WInTeSys), vol. 369. Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2017. mla: Gausemeier, Jürgen, et al. Wissenschaftsforum Intelligente Technische Systeme (WInTeSys). Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2017, doi:10.17619/UNIPB/1-93. short: J. Gausemeier, E. Bodden, F. Dressler, R. Dumitrescu, F. Meyer auf der Heide, C. Scheytt, A. Trächtler, Wissenschaftsforum Intelligente Technische Systeme (WInTeSys), Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2017. date_created: 2021-09-13T08:20:36Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' doi: 10.17619/UNIPB/1-93 intvolume: ' 369' language: - iso: ger publication_identifier: isbn: - 978-3-942647-88-5 publication_status: published publisher: Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn related_material: link: - relation: confirmation url: https://digital.ub.uni-paderborn.de/hs/content/titleinfo/2436759 series_title: '369' status: public title: Wissenschaftsforum Intelligente Technische Systeme (WInTeSys) type: book user_id: '15931' volume: 369 year: '2017' ... --- _id: '24222' abstract: - lang: eng text: "This paper focuses on the design of a high\r\nefficiency cross-connected differential drive rectifier for\r\nnext-generation passive RFID tags. To provide a\r\nrealistic estimation of the transponders’power and\r\nefficiency requirements at 5.8 GHz, detailed\r\nlink/power-budget analysis for various blocks of the tag\r\nchip is carried out. From link budget analysis realistic\r\nRF power levels \ are obtained and a rectifier with high\r\nconversion efficiency at low \ power levels is designed.\r\nSimulations based on a commercial 65nm CMOS\r\ntechnology \ investigate the suitability of the harvesting\r\ncircuit for 5.8 GHz RFID tags." author: - first_name: Sanaz full_name: Haddadian, Sanaz id: '59648' last_name: Haddadian - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt - first_name: Roland full_name: Kramer, Roland last_name: Kramer citation: ama: 'Haddadian S, Scheytt C, Kramer R. Energy Harvesting Analysis for Next Generation Passive RFID Tags. In: ANALOG 2017; 16th ITG/GMM-Symposium. Technische Universität Berlin; 2017:18.' apa: Haddadian, S., Scheytt, C., & Kramer, R. (2017). Energy Harvesting Analysis for Next Generation Passive RFID Tags. ANALOG 2017; 16th ITG/GMM-Symposium, 18. bibtex: '@inproceedings{Haddadian_Scheytt_Kramer_2017, place={Berlin, Germany}, title={Energy Harvesting Analysis for Next Generation Passive RFID Tags}, booktitle={ANALOG 2017; 16th ITG/GMM-Symposium}, publisher={Technische Universität Berlin}, author={Haddadian, Sanaz and Scheytt, Christoph and Kramer, Roland}, year={2017}, pages={18} }' chicago: 'Haddadian, Sanaz, Christoph Scheytt, and Roland Kramer. “Energy Harvesting Analysis for Next Generation Passive RFID Tags.” In ANALOG 2017; 16th ITG/GMM-Symposium, 18. Berlin, Germany: Technische Universität Berlin, 2017.' ieee: S. Haddadian, C. Scheytt, and R. Kramer, “Energy Harvesting Analysis for Next Generation Passive RFID Tags,” in ANALOG 2017; 16th ITG/GMM-Symposium, 2017, p. 18. mla: Haddadian, Sanaz, et al. “Energy Harvesting Analysis for Next Generation Passive RFID Tags.” ANALOG 2017; 16th ITG/GMM-Symposium, Technische Universität Berlin, 2017, p. 18. short: 'S. Haddadian, C. Scheytt, R. Kramer, in: ANALOG 2017; 16th ITG/GMM-Symposium, Technische Universität Berlin, Berlin, Germany, 2017, p. 18.' date_created: 2021-09-13T08:20:37Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' language: - iso: eng page: '18' place: Berlin, Germany publication: ANALOG 2017; 16th ITG/GMM-Symposium publisher: Technische Universität Berlin related_material: link: - relation: confirmation url: https://www.msc.tu-berlin.de/fileadmin/fg54/AnalogWorkshop/2017/AnalogWorkshop2017_Program_Final.pdf status: public title: Energy Harvesting Analysis for Next Generation Passive RFID Tags type: conference user_id: '15931' year: '2017' ... --- _id: '24223' abstract: - lang: eng text: "This paper presents the design flow of using \r\nsampling technique for fault injection on sche-\r\nmatic level. The parameters used in the docu-\r\nment to calculate the likelihood could be modi-\r\nfied by using more realistic data from the fab. \r\nWith the help of the fault simulator, the whole \r\ndesign flow of the fault effect simulation can be \r\nrealized automatically." author: - first_name: Liang full_name: Wu, Liang id: '30401' last_name: Wu - first_name: Saed full_name: Abughannam, Saed id: '37628' last_name: Abughannam - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt - first_name: Wolfgang full_name: Ecker, Wolfgang last_name: Ecker citation: ama: 'Wu L, Abughannam S, Müller W, Scheytt C, Ecker W. SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study. In: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES). ; 2017:68.' apa: Wu, L., Abughannam, S., Müller, W., Scheytt, C., & Ecker, W. (2017). SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study. 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 68. bibtex: '@inproceedings{Wu_Abughannam_Müller_Scheytt_Ecker_2017, place={Lausanne, Switzerland}, title={SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES)}, author={Wu, Liang and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}, year={2017}, pages={68} }' chicago: Wu, Liang, Saed Abughannam, Wolfgang Müller, Christoph Scheytt, and Wolfgang Ecker. “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study.” In 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 68. Lausanne, Switzerland, 2017. ieee: L. Wu, S. Abughannam, W. Müller, C. Scheytt, and W. Ecker, “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study,” in 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68. mla: Wu, Liang, et al. “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study.” 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68. short: 'L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68.' date_created: 2021-09-13T08:20:39Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' language: - iso: eng page: '68' place: Lausanne, Switzerland publication: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) related_material: link: - relation: confirmation url: https://past.date-conference.com/date17/conference/workshop-w05 status: public title: SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study type: conference user_id: '15931' year: '2017' ... --- _id: '24224' author: - first_name: Peer full_name: Adelt, Peer id: '5603' last_name: Adelt - first_name: Bastian full_name: Koppelmann, Bastian id: '25260' last_name: Koppelmann - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller - first_name: Bernd full_name: Kleinjohann, Bernd last_name: Kleinjohann - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt citation: ama: 'Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. ANALISA - A Tool for Static Instruction Set Analysis. In: Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation. ; 2017.' apa: Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., & Scheytt, C. (2017). ANALISA - A Tool for Static Instruction Set Analysis. Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation. bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne, CH}, title={ANALISA - A Tool for Static Instruction Set Analysis}, booktitle={Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation}, author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017} }' chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and Christoph Scheytt. “ANALISA - A Tool for Static Instruction Set Analysis.” In Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation. Lausanne, CH, 2017. ieee: P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “ANALISA - A Tool for Static Instruction Set Analysis,” 2017. mla: Adelt, Peer, et al. “ANALISA - A Tool for Static Instruction Set Analysis.” Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation, 2017. short: 'P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation, Lausanne, CH, 2017.' conference: end_date: 2017.03.31 start_date: 2017.03.27 date_created: 2021-09-13T08:20:40Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' language: - iso: eng place: Lausanne, CH publication: Design Automation and Testing in Europe (DATE), University Booth Interactive Presentation related_material: link: - relation: confirmation url: https://www.date-conference.com/content/date-2017-call-papers status: public title: ANALISA - A Tool for Static Instruction Set Analysis type: conference user_id: '15931' year: '2017' ... --- _id: '24225' author: - first_name: Peer full_name: Adelt, Peer id: '5603' last_name: Adelt - first_name: Bastian full_name: Koppelmann, Bastian id: '25260' last_name: Koppelmann - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller - first_name: Bernd full_name: Kleinjohann, Bernd last_name: Kleinjohann - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt citation: ama: 'Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries. In: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) . ; 2017:44.' apa: Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., & Scheytt, C. (2017). An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries. 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 44. bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne, Switzerland}, title={An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES) }, author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017}, pages={44} }' chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and Christoph Scheytt. “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries.” In 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 44. Lausanne, Switzerland, 2017. ieee: P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries,” in 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 2017, p. 44. mla: Adelt, Peer, et al. “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries.” 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 2017, p. 44. short: 'P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland, 2017, p. 44.' date_created: 2021-09-13T08:20:41Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' language: - iso: eng page: '44' place: Lausanne, Switzerland publication: '2nd Workshop on Resiliency in Embedded Electronic Systems (REES) ' related_material: link: - relation: confirmation url: https://www.edacentrum.de/rees/program status: public title: An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries type: conference user_id: '15931' year: '2017' ...