---
_id: '24216'
abstract:
- lang: eng
text: In this article mixed analog/digital signal processing techniques based on
parallel spread-spectrum sequencing (PSSS) and radio frequency (RF) carrier synchronization
for ultra-broadband wireless communication are investigated on system and circuit
level.
author:
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
- first_name: Abdul Rehman
full_name: Javed, Abdul Rehman
last_name: Javed
- first_name: Eswara Rao
full_name: Bammidi, Eswara Rao
last_name: Bammidi
- first_name: Karthik
full_name: KrishneGowda, Karthik
last_name: KrishneGowda
- first_name: Ingmar
full_name: Kallfass, Ingmar
last_name: Kallfass
- first_name: Rolf
full_name: Kraemer, Rolf
last_name: Kraemer
citation:
ama: Scheytt C, Javed AR, Bammidi ER, KrishneGowda K, Kallfass I, Kraemer R. 100
Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing.
Frequenz* Journal of RF-Engineering and Telecommunications. 2017;71(9-10):399-414.
apa: Scheytt, C., Javed, A. R., Bammidi, E. R., KrishneGowda, K., Kallfass, I.,
& Kraemer, R. (2017). 100 Gbps Wireless System and Circuit Design Using Parallel
Spread-Spectrum Sequencing. Frequenz* Journal of RF-Engineering and Telecommunications,
71(9–10), 399–414.
bibtex: '@article{Scheytt_Javed_Bammidi_KrishneGowda_Kallfass_Kraemer_2017, title={100
Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum Sequencing},
volume={71}, number={9–10}, journal={Frequenz* Journal of RF-Engineering and Telecommunications},
author={Scheytt, Christoph and Javed, Abdul Rehman and Bammidi, Eswara Rao and
KrishneGowda, Karthik and Kallfass, Ingmar and Kraemer, Rolf}, year={2017}, pages={399–414}
}'
chicago: 'Scheytt, Christoph, Abdul Rehman Javed, Eswara Rao Bammidi, Karthik KrishneGowda,
Ingmar Kallfass, and Rolf Kraemer. “100 Gbps Wireless System and Circuit Design
Using Parallel Spread-Spectrum Sequencing.” Frequenz* Journal of RF-Engineering
and Telecommunications 71, no. 9–10 (2017): 399–414.'
ieee: C. Scheytt, A. R. Javed, E. R. Bammidi, K. KrishneGowda, I. Kallfass, and
R. Kraemer, “100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum
Sequencing,” Frequenz* Journal of RF-Engineering and Telecommunications,
vol. 71, no. 9–10, pp. 399–414, 2017.
mla: Scheytt, Christoph, et al. “100 Gbps Wireless System and Circuit Design Using
Parallel Spread-Spectrum Sequencing.” Frequenz* Journal of RF-Engineering and
Telecommunications, vol. 71, no. 9–10, 2017, pp. 399–414.
short: C. Scheytt, A.R. Javed, E.R. Bammidi, K. KrishneGowda, I. Kallfass, R. Kraemer,
Frequenz* Journal of RF-Engineering and Telecommunications 71 (2017) 399–414.
date_created: 2021-09-13T08:20:30Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
issue: 9-10
language:
- iso: eng
page: 399-414
publication: Frequenz* Journal of RF-Engineering and Telecommunications
related_material:
link:
- relation: confirmation
url: https://doi.org/10.1515/freq-2017-0174
status: public
title: 100 Gbps Wireless System and Circuit Design Using Parallel Spread-Spectrum
Sequencing
type: journal_article
user_id: '15931'
volume: '71 '
year: '2017'
...
---
_id: '24217'
abstract:
- lang: eng
text: Parallel Sequence Spread Spectrum (PSSS) is a physical layer (PHY) baseband
technology that is well suited for mixed-signal transceiver implementation for
high data rate wireless communication systems. Mixed signal baseband realization
allows for easier implementation of the channel equalization function and eliminates
the need for high speed data converters. System design and architecture of a mixed
signal baseband processor for 100 Gbps wireless communication is described that
reduces the implementation complexity and results in a consequent reduction in
power dissipation and chip area. An ultra-broadband analog correlator consisting
of a four-quadrant multiplier and a fast resettable integrator using only NPN
transistors was designed, fabricated, and measured. The correlator circuit is
the core component of the receiver baseband. To the best knowledge of the authors,
it is the fastest correlator circuit published so far.
author:
- first_name: Abdul Rehman
full_name: Javed, Abdul Rehman
last_name: Javed
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
- first_name: KrishneGowda
full_name: Karthik, KrishneGowda
last_name: Karthik
- first_name: Roland
full_name: Kramer, Roland
last_name: Kramer
citation:
ama: 'Javed AR, Scheytt C, Karthik K, Kramer R. System design of a mixed signal
PSSS transdeiver using a linear ultra-broadband analog correlator for the receiver
baseband designed in 130nm SiGe BiCMOS technology. In: IEEE EUROCON 2017-17th
International Conference on Smart Technologies. 17th International Conference
on Smart Technologies. ; 2017:228-233. doi:10.1109/EUROCON.2017.8011110'
apa: Javed, A. R., Scheytt, C., Karthik, K., & Kramer, R. (2017). System design
of a mixed signal PSSS transdeiver using a linear ultra-broadband analog correlator
for the receiver baseband designed in 130nm SiGe BiCMOS technology. IEEE EUROCON
2017-17th International Conference on Smart Technologies, 228–233. https://doi.org/10.1109/EUROCON.2017.8011110
bibtex: '@inproceedings{Javed_Scheytt_Karthik_Kramer_2017, series={17th International
Conference on Smart Technologies}, title={System design of a mixed signal PSSS
transdeiver using a linear ultra-broadband analog correlator for the receiver
baseband designed in 130nm SiGe BiCMOS technology}, DOI={10.1109/EUROCON.2017.8011110},
booktitle={IEEE EUROCON 2017-17th International Conference on Smart Technologies},
author={Javed, Abdul Rehman and Scheytt, Christoph and Karthik, KrishneGowda and
Kramer, Roland}, year={2017}, pages={228–233}, collection={17th International
Conference on Smart Technologies} }'
chicago: Javed, Abdul Rehman, Christoph Scheytt, KrishneGowda Karthik, and Roland
Kramer. “System Design of a Mixed Signal PSSS Transdeiver Using a Linear Ultra-Broadband
Analog Correlator for the Receiver Baseband Designed in 130nm SiGe BiCMOS Technology.”
In IEEE EUROCON 2017-17th International Conference on Smart Technologies,
228–33. 17th International Conference on Smart Technologies, 2017. https://doi.org/10.1109/EUROCON.2017.8011110.
ieee: 'A. R. Javed, C. Scheytt, K. Karthik, and R. Kramer, “System design of a mixed
signal PSSS transdeiver using a linear ultra-broadband analog correlator for the
receiver baseband designed in 130nm SiGe BiCMOS technology,” in IEEE EUROCON
2017-17th International Conference on Smart Technologies, 2017, pp. 228–233,
doi: 10.1109/EUROCON.2017.8011110.'
mla: Javed, Abdul Rehman, et al. “System Design of a Mixed Signal PSSS Transdeiver
Using a Linear Ultra-Broadband Analog Correlator for the Receiver Baseband Designed
in 130nm SiGe BiCMOS Technology.” IEEE EUROCON 2017-17th International Conference
on Smart Technologies, 2017, pp. 228–33, doi:10.1109/EUROCON.2017.8011110.
short: 'A.R. Javed, C. Scheytt, K. Karthik, R. Kramer, in: IEEE EUROCON 2017-17th
International Conference on Smart Technologies, 2017, pp. 228–233.'
date_created: 2021-09-13T08:20:31Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
doi: 10.1109/EUROCON.2017.8011110
language:
- iso: eng
page: 228-233
publication: IEEE EUROCON 2017-17th International Conference on Smart Technologies
publication_identifier:
eisbn:
- 978-1-5090-3843-5
isbn:
- 978-1-5090-3844-2
related_material:
link:
- relation: confirmation
url: https://ieeexplore.ieee.org/document/8011110
series_title: 17th International Conference on Smart Technologies
status: public
title: System design of a mixed signal PSSS transdeiver using a linear ultra-broadband
analog correlator for the receiver baseband designed in 130nm SiGe BiCMOS technology
type: conference
user_id: '15931'
year: '2017'
...
---
_id: '24218'
abstract:
- lang: ger
text: ' Die Erfindung betrifft eine Folge-Halte-Schaltung zum Konvertieren eines
analogen Eingangssignals in ein digitales Ausgangssignal mit einer Haltekapazitätseinheit,
mit einer Spannungsverstärkereinheit enthaltend einen Eingang, an dem ein analoges
Eingangsspannungssignal anlegbar ist, und enthaltend einen Ausgang, der mit der
Haltekapazitätseinheit verbunden ist, mit einer Arbeitspunkteinstelleinheit zur
Steuerung der Spannungsverstärkereinheit, wobei an einem Eingang der Arbeitspunkteinstelleinheit
ein Steuersignal anliegt, so dass in einem Folgebetrieb der Folge-Halte-Schaltung
eine an dem Ausgang der Spannungsverstärkereinheit anliegendes Ausgangssignal
einen an den Eingang der Spannungsverstärkereinheit anliegendes Eingangssignal
folgt, und in einem Haltebetrieb der Folge-Halte-Schaltung das Ausgangssignal
der Spannungsverstärkereinheit konstant ist, mit einer Taktsignalquelle zur Erzeugung
einer Folge von einem Eingang der Arbeitspunkteinstelleinheit anliegenden Taktsignalen,
wobei die Arbeitspunkteinstelleinheit elektrooptische Mittel zur Erzeugung des
Steuersignals aufweist, dass die Taktsignalquelle als eine optische Taktsignalquelle
ausgebildet ist, so dass als Taktsignal eine optische Impulsfolge mit hohen und
tiefen Taktsignalen an den Eingang der Arbeitspunkteinstelleinheit anliegt. '
application_date: 17.07.2017
application_number: '102017116001'
author:
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
citation:
ama: Scheytt C. Folge-Halte-Schaltung . Published online 2017.
apa: Scheytt, C. (2017). Folge-Halte-Schaltung .
bibtex: '@article{Scheytt_2017, title={Folge-Halte-Schaltung }, author={Scheytt,
Christoph}, year={2017} }'
chicago: Scheytt, Christoph. “Folge-Halte-Schaltung ,” 2017.
ieee: C. Scheytt, “Folge-Halte-Schaltung .” 2017.
mla: Scheytt, Christoph. Folge-Halte-Schaltung . 2017.
short: C. Scheytt, (2017).
date_created: 2021-09-13T08:20:32Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
ipc: H03K3/42
ipn: DE102017116001A1
publication_date: 17.01.2019
related_material:
link:
- relation: confirmation
url: https://depatisnet.dpma.de/DepatisNet/depatisnet?action=bibdat&docid=DE102017116001A1
status: public
title: 'Folge-Halte-Schaltung '
type: patent
user_id: '15931'
year: '2017'
...
---
_id: '24219'
abstract:
- lang: eng
text: In this paper we present theoretical, simulated and measured data for a reader
to tag communication RFID system at 5.8 GHz. First a theoretical link budget analysis
for a reader to tag architecture is shown for a wireless industrial application
at 1m distance. This includes a power budget of the passively powered transponder.
The received power level of the backscattered data for the theoretical link budget
is -52:5 dBm. For the first setup slot antennas are developed and measured in
the anechoic chamber. The measured gain is 4.0 dB. The power of the backscatter
data in setup 1 is -74:8 dBm. This corresponds to the theoretical link budget
since, all losses such as cable or lower antenna gain are taken into account.
Setup 2 is upgraded on the reader side with horn antennas. At 5.8 GHz, the gain
reaches the value of 10.8 dB. The second setup shows improvement in the receiving
backscattered power to a value of -62:4 dBm. Furthermore, as a solution to detect
those transponders not presented in the main slope of the antenna, a steerable
beam is introduced by means of a Rotman lens. On the topic of the passive transponder,
different harvesting topologies at 5.8 GHz are investigated, and the efficiency
simulation of the harvesting circuitry has been performed. The simulated efficiency
of the implemented technique is 68 %.
author:
- first_name: Peter
full_name: Kuhn, Peter
last_name: Kuhn
- first_name: Sanaz
full_name: Haddadian, Sanaz
id: '59648'
last_name: Haddadian
- first_name: Frederic
full_name: Meyer, Frederic
last_name: Meyer
- first_name: Marc
full_name: Hoffmann, Marc
last_name: Hoffmann
- first_name: Anton
full_name: Grabmaier, Anton
last_name: Grabmaier
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
- first_name: Thomas
full_name: Kaiser, Thomas
last_name: Kaiser
citation:
ama: 'Kuhn P, Haddadian S, Meyer F, et al. SHF RFID System for Automatic Process
Optimization with Intelligent Tools. In: Smart SysTech 2017; European Conference
on Smart Objects, Systems and Technologies. VDE ITG; 2017.'
apa: Kuhn, P., Haddadian, S., Meyer, F., Hoffmann, M., Grabmaier, A., Scheytt, C.,
& Kaiser, T. (2017). SHF RFID System for Automatic Process Optimization with
Intelligent Tools. Smart SysTech 2017; European Conference on Smart Objects,
Systems and Technologies.
bibtex: '@inproceedings{Kuhn_Haddadian_Meyer_Hoffmann_Grabmaier_Scheytt_Kaiser_2017,
place={München, Germany}, title={SHF RFID System for Automatic Process Optimization
with Intelligent Tools}, booktitle={Smart SysTech 2017; European Conference on
Smart Objects, Systems and Technologies}, publisher={VDE ITG}, author={Kuhn, Peter
and Haddadian, Sanaz and Meyer, Frederic and Hoffmann, Marc and Grabmaier, Anton
and Scheytt, Christoph and Kaiser, Thomas}, year={2017} }'
chicago: 'Kuhn, Peter, Sanaz Haddadian, Frederic Meyer, Marc Hoffmann, Anton Grabmaier,
Christoph Scheytt, and Thomas Kaiser. “SHF RFID System for Automatic Process Optimization
with Intelligent Tools.” In Smart SysTech 2017; European Conference on Smart
Objects, Systems and Technologies. München, Germany: VDE ITG, 2017.'
ieee: P. Kuhn et al., “SHF RFID System for Automatic Process Optimization
with Intelligent Tools,” 2017.
mla: Kuhn, Peter, et al. “SHF RFID System for Automatic Process Optimization with
Intelligent Tools.” Smart SysTech 2017; European Conference on Smart Objects,
Systems and Technologies, VDE ITG, 2017.
short: 'P. Kuhn, S. Haddadian, F. Meyer, M. Hoffmann, A. Grabmaier, C. Scheytt,
T. Kaiser, in: Smart SysTech 2017; European Conference on Smart Objects, Systems
and Technologies, VDE ITG, München, Germany, 2017.'
date_created: 2021-09-13T08:20:34Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
language:
- iso: eng
place: München, Germany
publication: Smart SysTech 2017; European Conference on Smart Objects, Systems and
Technologies
publication_identifier:
isbn:
- 978-3-8007-4428-2
publisher: VDE ITG
related_material:
link:
- relation: confirmation
url: https://ieeexplore.ieee.org/document/8085084
status: public
title: SHF RFID System for Automatic Process Optimization with Intelligent Tools
type: conference
user_id: '15931'
year: '2017'
...
---
_id: '24220'
author:
- first_name: Peer
full_name: Adelt, Peer
id: '5603'
last_name: Adelt
- first_name: Bastian
full_name: Koppelmann, Bastian
id: '25260'
last_name: Koppelmann
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
- first_name: Daniel
full_name: Mueller-Gritschneder, Daniel
last_name: Mueller-Gritschneder
- first_name: Bernd
full_name: Kleinjohann, Bernd
last_name: Kleinjohann
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
citation:
ama: 'Adelt P, Koppelmann B, Müller W, Mueller-Gritschneder D, Kleinjohann B, Scheytt
C. Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen
auf der Basis virtueller Plattformen. In: Tagungsband des Wissenschaftsforums
Intelligente Technische Systeme. Verlagsschriftenreihe des Heinz Nixdorf Instituts;
2017. doi:10.17619/UNIPB/1-93'
apa: Adelt, P., Koppelmann, B., Müller, W., Mueller-Gritschneder, D., Kleinjohann,
B., & Scheytt, C. (2017). Automatisierte Fehlerinjektion zur Entwicklung sicherer
Mikrocontrolleranwendungen auf der Basis virtueller Plattformen. Tagungsband
des Wissenschaftsforums Intelligente Technische Systeme. https://doi.org/10.17619/UNIPB/1-93
bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Mueller-Gritschneder_Kleinjohann_Scheytt_2017,
place={Germany, Paderborn}, title={Automatisierte Fehlerinjektion zur Entwicklung
sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen}, DOI={10.17619/UNIPB/1-93}, booktitle={Tagungsband
des Wissenschaftsforums Intelligente Technische Systeme}, publisher={Verlagsschriftenreihe
des Heinz Nixdorf Instituts}, author={Adelt, Peer and Koppelmann, Bastian and
Müller, Wolfgang and Mueller-Gritschneder, Daniel and Kleinjohann, Bernd and Scheytt,
Christoph}, year={2017} }'
chicago: 'Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Daniel Mueller-Gritschneder,
Bernd Kleinjohann, and Christoph Scheytt. “Automatisierte Fehlerinjektion zur
Entwicklung sicherer Mikrocontrolleranwendungen auf der Basis virtueller Plattformen.”
In Tagungsband des Wissenschaftsforums Intelligente Technische Systeme.
Germany, Paderborn: Verlagsschriftenreihe des Heinz Nixdorf Instituts, 2017. https://doi.org/10.17619/UNIPB/1-93.'
ieee: 'P. Adelt, B. Koppelmann, W. Müller, D. Mueller-Gritschneder, B. Kleinjohann,
and C. Scheytt, “Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen
auf der Basis virtueller Plattformen,” 2017, doi: 10.17619/UNIPB/1-93.'
mla: Adelt, Peer, et al. “Automatisierte Fehlerinjektion zur Entwicklung sicherer
Mikrocontrolleranwendungen auf der Basis virtueller Plattformen.” Tagungsband
des Wissenschaftsforums Intelligente Technische Systeme, Verlagsschriftenreihe
des Heinz Nixdorf Instituts, 2017, doi:10.17619/UNIPB/1-93.
short: 'P. Adelt, B. Koppelmann, W. Müller, D. Mueller-Gritschneder, B. Kleinjohann,
C. Scheytt, in: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme,
Verlagsschriftenreihe des Heinz Nixdorf Instituts, Germany, Paderborn, 2017.'
date_created: 2021-09-13T08:20:35Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
doi: 10.17619/UNIPB/1-93
language:
- iso: ger
place: Germany, Paderborn
publication: Tagungsband des Wissenschaftsforums Intelligente Technische Systeme
publication_identifier:
isbn:
- 978-3-942647-88-5
publication_status: published
publisher: Verlagsschriftenreihe des Heinz Nixdorf Instituts
related_material:
link:
- relation: confirmation
url: https://digital.ub.uni-paderborn.de/hs/content/titleinfo/2436759
status: public
title: Automatisierte Fehlerinjektion zur Entwicklung sicherer Mikrocontrolleranwendungen
auf der Basis virtueller Plattformen
type: conference
user_id: '15931'
year: '2017'
...
---
_id: '24221'
abstract:
- lang: ger
text: Das Wissenschaftsforum Intelligente Technische Systeme (WInTeSys) legt am
11. und 12. Mai 2017 in Paderborn den Schwerpunkt auf die Grundlagen und die Entwicklung
intelligenter technischer Systeme im Kontext Industrie 4.0. Etwa 40 begutachtete
hochkarätige Beiträge geben einen Überblick über Forschungsfelder, Technologien
und Anwendungen. Die Veranstaltung bietet den Teilnehmerinnen und Teilnehmern
eine ausgezeichnete Bühne für den Erfahrungsaustausch auf dem Weg in die Digitalisierung
von Produkten und Produktionssystemen. »Das Besondere ist der Dialog von Hochschulforschung
und industrieller Entwicklung, also das Aufeinandertreffen von »Science-Push«
und »Application-Pull«. Die Beiträge spiegeln die hervorragende Vernetzung in
der Region OWL und darüber hinaus wider«, sagt Veranstalter Prof. Jürgen Gausemeier
(Heinz Nixdorf Institut, Universität Paderborn).
author:
- first_name: Jürgen
full_name: Gausemeier, Jürgen
last_name: Gausemeier
- first_name: Eric
full_name: Bodden, Eric
id: '59256'
last_name: Bodden
orcid: 0000-0003-3470-3647
- first_name: Falko
full_name: Dressler, Falko
id: '48097'
last_name: Dressler
orcid: 0000-0002-1989-1750
- first_name: Roman
full_name: Dumitrescu, Roman
id: '16190'
last_name: Dumitrescu
- first_name: Friedhelm
full_name: Meyer auf der Heide, Friedhelm
id: '15523'
last_name: Meyer auf der Heide
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
- first_name: Ansgar
full_name: Trächtler, Ansgar
id: '552'
last_name: Trächtler
citation:
ama: Gausemeier J, Bodden E, Dressler F, et al. Wissenschaftsforum Intelligente
Technische Systeme (WInTeSys). Vol 369. Verlagsschriftenreihe des Heinz Nixdorf
Instituts, Paderborn; 2017. doi:10.17619/UNIPB/1-93
apa: Gausemeier, J., Bodden, E., Dressler, F., Dumitrescu, R., Meyer auf der Heide,
F., Scheytt, C., & Trächtler, A. (2017). Wissenschaftsforum Intelligente
Technische Systeme (WInTeSys) (Vol. 369). Verlagsschriftenreihe des Heinz
Nixdorf Instituts, Paderborn. https://doi.org/10.17619/UNIPB/1-93
bibtex: '@book{Gausemeier_Bodden_Dressler_Dumitrescu_Meyer auf der Heide_Scheytt_Trächtler_2017,
series={369}, title={Wissenschaftsforum Intelligente Technische Systeme (WInTeSys)},
volume={369}, DOI={10.17619/UNIPB/1-93},
publisher={Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn}, author={Gausemeier,
Jürgen and Bodden, Eric and Dressler, Falko and Dumitrescu, Roman and Meyer auf
der Heide, Friedhelm and Scheytt, Christoph and Trächtler, Ansgar}, year={2017},
collection={369} }'
chicago: Gausemeier, Jürgen, Eric Bodden, Falko Dressler, Roman Dumitrescu, Friedhelm
Meyer auf der Heide, Christoph Scheytt, and Ansgar Trächtler. Wissenschaftsforum
Intelligente Technische Systeme (WInTeSys). Vol. 369. 369. Verlagsschriftenreihe
des Heinz Nixdorf Instituts, Paderborn, 2017. https://doi.org/10.17619/UNIPB/1-93.
ieee: J. Gausemeier et al., Wissenschaftsforum Intelligente Technische
Systeme (WInTeSys), vol. 369. Verlagsschriftenreihe des Heinz Nixdorf Instituts,
Paderborn, 2017.
mla: Gausemeier, Jürgen, et al. Wissenschaftsforum Intelligente Technische Systeme
(WInTeSys). Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn,
2017, doi:10.17619/UNIPB/1-93.
short: J. Gausemeier, E. Bodden, F. Dressler, R. Dumitrescu, F. Meyer auf der Heide,
C. Scheytt, A. Trächtler, Wissenschaftsforum Intelligente Technische Systeme (WInTeSys),
Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2017.
date_created: 2021-09-13T08:20:36Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
doi: 10.17619/UNIPB/1-93
intvolume: ' 369'
language:
- iso: ger
publication_identifier:
isbn:
- 978-3-942647-88-5
publication_status: published
publisher: Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn
related_material:
link:
- relation: confirmation
url: https://digital.ub.uni-paderborn.de/hs/content/titleinfo/2436759
series_title: '369'
status: public
title: Wissenschaftsforum Intelligente Technische Systeme (WInTeSys)
type: book
user_id: '15931'
volume: 369
year: '2017'
...
---
_id: '24222'
abstract:
- lang: eng
text: "This paper focuses on the design of a high\r\nefficiency cross-connected
differential drive rectifier for\r\nnext-generation passive RFID tags. To provide
a\r\nrealistic estimation of the transponders’power and\r\nefficiency requirements
at 5.8 GHz, detailed\r\nlink/power-budget analysis for various blocks of the tag\r\nchip
is carried out. From link budget analysis realistic\r\nRF power levels
\ are obtained and a rectifier with high\r\nconversion efficiency at low
\ power levels is designed.\r\nSimulations based on a commercial 65nm CMOS\r\ntechnology
\ investigate the suitability of the harvesting\r\ncircuit for 5.8 GHz RFID
tags."
author:
- first_name: Sanaz
full_name: Haddadian, Sanaz
id: '59648'
last_name: Haddadian
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
- first_name: Roland
full_name: Kramer, Roland
last_name: Kramer
citation:
ama: 'Haddadian S, Scheytt C, Kramer R. Energy Harvesting Analysis for Next Generation
Passive RFID Tags. In: ANALOG 2017; 16th ITG/GMM-Symposium. Technische
Universität Berlin; 2017:18.'
apa: Haddadian, S., Scheytt, C., & Kramer, R. (2017). Energy Harvesting Analysis
for Next Generation Passive RFID Tags. ANALOG 2017; 16th ITG/GMM-Symposium,
18.
bibtex: '@inproceedings{Haddadian_Scheytt_Kramer_2017, place={Berlin, Germany},
title={Energy Harvesting Analysis for Next Generation Passive RFID Tags}, booktitle={ANALOG
2017; 16th ITG/GMM-Symposium}, publisher={Technische Universität Berlin}, author={Haddadian,
Sanaz and Scheytt, Christoph and Kramer, Roland}, year={2017}, pages={18} }'
chicago: 'Haddadian, Sanaz, Christoph Scheytt, and Roland Kramer. “Energy Harvesting
Analysis for Next Generation Passive RFID Tags.” In ANALOG 2017; 16th ITG/GMM-Symposium,
18. Berlin, Germany: Technische Universität Berlin, 2017.'
ieee: S. Haddadian, C. Scheytt, and R. Kramer, “Energy Harvesting Analysis for Next
Generation Passive RFID Tags,” in ANALOG 2017; 16th ITG/GMM-Symposium,
2017, p. 18.
mla: Haddadian, Sanaz, et al. “Energy Harvesting Analysis for Next Generation Passive
RFID Tags.” ANALOG 2017; 16th ITG/GMM-Symposium, Technische Universität
Berlin, 2017, p. 18.
short: 'S. Haddadian, C. Scheytt, R. Kramer, in: ANALOG 2017; 16th ITG/GMM-Symposium,
Technische Universität Berlin, Berlin, Germany, 2017, p. 18.'
date_created: 2021-09-13T08:20:37Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
language:
- iso: eng
page: '18'
place: Berlin, Germany
publication: ANALOG 2017; 16th ITG/GMM-Symposium
publisher: Technische Universität Berlin
related_material:
link:
- relation: confirmation
url: https://www.msc.tu-berlin.de/fileadmin/fg54/AnalogWorkshop/2017/AnalogWorkshop2017_Program_Final.pdf
status: public
title: Energy Harvesting Analysis for Next Generation Passive RFID Tags
type: conference
user_id: '15931'
year: '2017'
...
---
_id: '24223'
abstract:
- lang: eng
text: "This paper presents the design flow of using \r\nsampling technique for fault
injection on sche-\r\nmatic level. The parameters used in the docu-\r\nment to
calculate the likelihood could be modi-\r\nfied by using more realistic data from
the fab. \r\nWith the help of the fault simulator, the whole \r\ndesign flow of
the fault effect simulation can be \r\nrealized automatically."
author:
- first_name: Liang
full_name: Wu, Liang
id: '30401'
last_name: Wu
- first_name: Saed
full_name: Abughannam, Saed
id: '37628'
last_name: Abughannam
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
- first_name: Wolfgang
full_name: Ecker, Wolfgang
last_name: Ecker
citation:
ama: 'Wu L, Abughannam S, Müller W, Scheytt C, Ecker W. SPICE-Level Fault Injection
with Likelihood Weighted Random Sampling - A Case Study. In: 2nd Workshop on
Resiliency in Embedded Electronic Systems (REES). ; 2017:68.'
apa: Wu, L., Abughannam, S., Müller, W., Scheytt, C., & Ecker, W. (2017). SPICE-Level
Fault Injection with Likelihood Weighted Random Sampling - A Case Study. 2nd
Workshop on Resiliency in Embedded Electronic Systems (REES), 68.
bibtex: '@inproceedings{Wu_Abughannam_Müller_Scheytt_Ecker_2017, place={Lausanne,
Switzerland}, title={SPICE-Level Fault Injection with Likelihood Weighted Random
Sampling - A Case Study}, booktitle={2nd Workshop on Resiliency in Embedded Electronic
Systems (REES)}, author={Wu, Liang and Abughannam, Saed and Müller, Wolfgang and
Scheytt, Christoph and Ecker, Wolfgang}, year={2017}, pages={68} }'
chicago: Wu, Liang, Saed Abughannam, Wolfgang Müller, Christoph Scheytt, and Wolfgang
Ecker. “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling -
A Case Study.” In 2nd Workshop on Resiliency in Embedded Electronic Systems
(REES), 68. Lausanne, Switzerland, 2017.
ieee: L. Wu, S. Abughannam, W. Müller, C. Scheytt, and W. Ecker, “SPICE-Level Fault
Injection with Likelihood Weighted Random Sampling - A Case Study,” in 2nd
Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68.
mla: Wu, Liang, et al. “SPICE-Level Fault Injection with Likelihood Weighted Random
Sampling - A Case Study.” 2nd Workshop on Resiliency in Embedded Electronic
Systems (REES), 2017, p. 68.
short: 'L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop
on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017,
p. 68.'
date_created: 2021-09-13T08:20:39Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
language:
- iso: eng
page: '68'
place: Lausanne, Switzerland
publication: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES)
related_material:
link:
- relation: confirmation
url: https://past.date-conference.com/date17/conference/workshop-w05
status: public
title: SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case
Study
type: conference
user_id: '15931'
year: '2017'
...
---
_id: '24224'
author:
- first_name: Peer
full_name: Adelt, Peer
id: '5603'
last_name: Adelt
- first_name: Bastian
full_name: Koppelmann, Bastian
id: '25260'
last_name: Koppelmann
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
- first_name: Bernd
full_name: Kleinjohann, Bernd
last_name: Kleinjohann
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
citation:
ama: 'Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. ANALISA - A Tool
for Static Instruction Set Analysis. In: Design Automation and Testing in Europe
(DATE), University Booth Interactive Presentation. ; 2017.'
apa: Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., & Scheytt, C. (2017).
ANALISA - A Tool for Static Instruction Set Analysis. Design Automation and
Testing in Europe (DATE), University Booth Interactive Presentation.
bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne,
CH}, title={ANALISA - A Tool for Static Instruction Set Analysis}, booktitle={Design
Automation and Testing in Europe (DATE), University Booth Interactive Presentation},
author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Kleinjohann,
Bernd and Scheytt, Christoph}, year={2017} }'
chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and
Christoph Scheytt. “ANALISA - A Tool for Static Instruction Set Analysis.” In
Design Automation and Testing in Europe (DATE), University Booth Interactive
Presentation. Lausanne, CH, 2017.
ieee: P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “ANALISA
- A Tool for Static Instruction Set Analysis,” 2017.
mla: Adelt, Peer, et al. “ANALISA - A Tool for Static Instruction Set Analysis.”
Design Automation and Testing in Europe (DATE), University Booth Interactive
Presentation, 2017.
short: 'P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: Design
Automation and Testing in Europe (DATE), University Booth Interactive Presentation,
Lausanne, CH, 2017.'
conference:
end_date: 2017.03.31
start_date: 2017.03.27
date_created: 2021-09-13T08:20:40Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
language:
- iso: eng
place: Lausanne, CH
publication: Design Automation and Testing in Europe (DATE), University Booth Interactive
Presentation
related_material:
link:
- relation: confirmation
url: https://www.date-conference.com/content/date-2017-call-papers
status: public
title: ANALISA - A Tool for Static Instruction Set Analysis
type: conference
user_id: '15931'
year: '2017'
...
---
_id: '24225'
author:
- first_name: Peer
full_name: Adelt, Peer
id: '5603'
last_name: Adelt
- first_name: Bastian
full_name: Koppelmann, Bastian
id: '25260'
last_name: Koppelmann
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
- first_name: Bernd
full_name: Kleinjohann, Bernd
last_name: Kleinjohann
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
citation:
ama: 'Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. An Automatic Injection
Framework for Safety Assessements of Embedded Software Binaries. In: 2nd Workshop
on Resiliency in Embedded Electronic Systems (REES) . ; 2017:44.'
apa: Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., & Scheytt, C. (2017).
An Automatic Injection Framework for Safety Assessements of Embedded Software
Binaries. 2nd Workshop on Resiliency in Embedded Electronic Systems (REES)
, 44.
bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne,
Switzerland}, title={An Automatic Injection Framework for Safety Assessements
of Embedded Software Binaries}, booktitle={2nd Workshop on Resiliency in Embedded
Electronic Systems (REES) }, author={Adelt, Peer and Koppelmann, Bastian and Müller,
Wolfgang and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017}, pages={44}
}'
chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and
Christoph Scheytt. “An Automatic Injection Framework for Safety Assessements of
Embedded Software Binaries.” In 2nd Workshop on Resiliency in Embedded Electronic
Systems (REES) , 44. Lausanne, Switzerland, 2017.
ieee: P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “An Automatic
Injection Framework for Safety Assessements of Embedded Software Binaries,” in
2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 2017,
p. 44.
mla: Adelt, Peer, et al. “An Automatic Injection Framework for Safety Assessements
of Embedded Software Binaries.” 2nd Workshop on Resiliency in Embedded Electronic
Systems (REES) , 2017, p. 44.
short: 'P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd
Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland,
2017, p. 44.'
date_created: 2021-09-13T08:20:41Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
language:
- iso: eng
page: '44'
place: Lausanne, Switzerland
publication: '2nd Workshop on Resiliency in Embedded Electronic Systems (REES) '
related_material:
link:
- relation: confirmation
url: https://www.edacentrum.de/rees/program
status: public
title: An Automatic Injection Framework for Safety Assessements of Embedded Software
Binaries
type: conference
user_id: '15931'
year: '2017'
...