[{"publisher":"Berger-Levrault","date_updated":"2023-03-17T10:28:27Z","date_created":"2021-11-30T16:44:29Z","author":[{"first_name":"Tobias","id":"65695","full_name":"Matzner, Tobias","last_name":"Matzner"}],"title":"La vie privée à l’ère numerique. Perspectives “arendtiennes”","place":"Boulogne-Billancourt","year":"2018","citation":{"ieee":"T. Matzner, “La vie privée à l’ère numerique. Perspectives ‘arendtiennes,’” in <i>La confiance à l’ère numérique</i>, J. Domenicucci and M. Doueihi, Eds. Boulogne-Billancourt: Berger-Levrault, 2018.","chicago":"Matzner, Tobias. “La vie privée à l’ère numerique. Perspectives ‘arendtiennes.’” In <i>La confiance à l’ère numérique</i>, edited by Jacopo Domenicucci and Milad Doueihi. Boulogne-Billancourt: Berger-Levrault, 2018.","ama":"Matzner T. La vie privée à l’ère numerique. Perspectives “arendtiennes.” In: Domenicucci J, Doueihi M, eds. <i>La confiance à l’ère numérique</i>. Berger-Levrault; 2018.","apa":"Matzner, T. (2018). La vie privée à l’ère numerique. Perspectives “arendtiennes.” In J. Domenicucci &#38; M. Doueihi (Eds.), <i>La confiance à l’ère numérique</i>. Berger-Levrault.","bibtex":"@inbook{Matzner_2018, place={Boulogne-Billancourt}, title={La vie privée à l’ère numerique. Perspectives “arendtiennes”}, booktitle={La confiance à l’ère numérique}, publisher={Berger-Levrault}, author={Matzner, Tobias}, editor={Domenicucci, Jacopo and Doueihi, Milad}, year={2018} }","mla":"Matzner, Tobias. “La vie privée à l’ère numerique. Perspectives ‘arendtiennes.’” <i>La confiance à l’ère numérique</i>, edited by Jacopo Domenicucci and Milad Doueihi, Berger-Levrault, 2018.","short":"T. Matzner, in: J. Domenicucci, M. Doueihi (Eds.), La confiance à l’ère numérique, Berger-Levrault, Boulogne-Billancourt, 2018."},"_id":"28160","department":[{"_id":"757"}],"user_id":"49063","language":[{"iso":"fre"}],"publication":"La confiance à l’ère numérique","type":"book_chapter","editor":[{"first_name":"Jacopo","full_name":"Domenicucci, Jacopo","last_name":"Domenicucci"},{"first_name":"Milad","last_name":"Doueihi","full_name":"Doueihi, Milad"}],"status":"public"},{"date_created":"2023-01-25T09:19:59Z","author":[{"full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann","first_name":"Ulrich"}],"publisher":"Springer Fachmedien Wiesbaden","date_updated":"2023-03-21T09:54:10Z","doi":"10.1007/978-3-658-23444-7","title":"Silizium-Halbleitertechnologie","publication_status":"published","publication_identifier":{"isbn":["9783658234430","9783658234447"]},"citation":{"apa":"Hilleringmann, U. (2018). <i>Silizium-Halbleitertechnologie</i>. 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Wiesbaden: Springer Fachmedien Wiesbaden, 2018.","chicago":"Hilleringmann, Ulrich. <i>Silizium-Halbleitertechnologie</i>. Wiesbaden: Springer Fachmedien Wiesbaden, 2018. <a href=\"https://doi.org/10.1007/978-3-658-23444-7\">https://doi.org/10.1007/978-3-658-23444-7</a>."},"year":"2018","place":"Wiesbaden","user_id":"20179","department":[{"_id":"59"}],"_id":"39898","alternative_title":["Grundlagen mikroelektronischer Integrationstechnik"],"language":[{"iso":"eng"}],"type":"book","status":"public"},{"publication_status":"published","publication_identifier":{"isbn":["9783658234430","9783658234447"]},"year":"2018","place":"Wiesbaden","citation":{"chicago":"Hilleringmann, Ulrich. “Ätztechnik.” In <i>Silizium-Halbleitertechnologie</i>. Wiesbaden: Springer Fachmedien Wiesbaden, 2018. <a href=\"https://doi.org/10.1007/978-3-658-23444-7_5\">https://doi.org/10.1007/978-3-658-23444-7_5</a>.","ieee":"U. Hilleringmann, “Ätztechnik,” in <i>Silizium-Halbleitertechnologie</i>, Wiesbaden: Springer Fachmedien Wiesbaden, 2018.","ama":"Hilleringmann U. Ätztechnik. In: <i>Silizium-Halbleitertechnologie</i>. Springer Fachmedien Wiesbaden; 2018. doi:<a href=\"https://doi.org/10.1007/978-3-658-23444-7_5\">10.1007/978-3-658-23444-7_5</a>","apa":"Hilleringmann, U. (2018). Ätztechnik. In <i>Silizium-Halbleitertechnologie</i>. Springer Fachmedien Wiesbaden. <a href=\"https://doi.org/10.1007/978-3-658-23444-7_5\">https://doi.org/10.1007/978-3-658-23444-7_5</a>","bibtex":"@inbook{Hilleringmann_2018, place={Wiesbaden}, title={Ätztechnik}, DOI={<a href=\"https://doi.org/10.1007/978-3-658-23444-7_5\">10.1007/978-3-658-23444-7_5</a>}, booktitle={Silizium-Halbleitertechnologie}, publisher={Springer Fachmedien Wiesbaden}, author={Hilleringmann, Ulrich}, year={2018} }","mla":"Hilleringmann, Ulrich. “Ätztechnik.” <i>Silizium-Halbleitertechnologie</i>, Springer Fachmedien Wiesbaden, 2018, doi:<a href=\"https://doi.org/10.1007/978-3-658-23444-7_5\">10.1007/978-3-658-23444-7_5</a>.","short":"U. Hilleringmann, in: Silizium-Halbleitertechnologie, Springer Fachmedien Wiesbaden, Wiesbaden, 2018."},"publisher":"Springer Fachmedien Wiesbaden","date_updated":"2023-03-21T10:10:52Z","date_created":"2023-01-24T10:42:26Z","author":[{"last_name":"Hilleringmann","id":"20179","full_name":"Hilleringmann, Ulrich","first_name":"Ulrich"}],"title":"Ätztechnik","doi":"10.1007/978-3-658-23444-7_5","type":"book_chapter","publication":"Silizium-Halbleitertechnologie","status":"public","_id":"39428","user_id":"20179","department":[{"_id":"59"}],"language":[{"iso":"eng"}]},{"publication_status":"published","citation":{"apa":"Becker, T. E., Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., &#38; Hilleringmann, U. (2018). Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>. <a href=\"https://doi.org/10.1109/latw.2018.8349695\">https://doi.org/10.1109/latw.2018.8349695</a>","short":"T.E. Becker, F.F. Vidor, G.I. Wirth, T. Meyers, J. Reker, U. Hilleringmann, in: 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018.","bibtex":"@inproceedings{Becker_Vidor_Wirth_Meyers_Reker_Hilleringmann_2018, title={Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors}, DOI={<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>}, booktitle={2018 IEEE 19th Latin-American Test Symposium (LATS)}, publisher={IEEE}, author={Becker, Thales E. and Vidor, Fabio F. and Wirth, Gilson I. and Meyers, Thorsten and Reker, Julia and Hilleringmann, Ulrich}, year={2018} }","mla":"Becker, Thales E., et al. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>, IEEE, 2018, doi:<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>.","ieee":"T. E. Becker, F. F. Vidor, G. I. Wirth, T. Meyers, J. Reker, and U. 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IEEE; 2018. doi:<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>"},"year":"2018","author":[{"first_name":"Thales E.","full_name":"Becker, Thales E.","last_name":"Becker"},{"last_name":"Vidor","full_name":"Vidor, Fabio F.","first_name":"Fabio F."},{"first_name":"Gilson I.","last_name":"Wirth","full_name":"Wirth, Gilson I."},{"last_name":"Meyers","full_name":"Meyers, Thorsten","first_name":"Thorsten"},{"first_name":"Julia","last_name":"Reker","full_name":"Reker, Julia"},{"first_name":"Ulrich","id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann"}],"date_created":"2023-01-24T10:50:35Z","publisher":"IEEE","date_updated":"2023-03-21T10:15:23Z","doi":"10.1109/latw.2018.8349695","title":"Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors","type":"conference","publication":"2018 IEEE 19th Latin-American Test Symposium (LATS)","status":"public","user_id":"20179","department":[{"_id":"59"}],"_id":"39436","language":[{"iso":"eng"}]},{"_id":"39437","user_id":"20179","department":[{"_id":"59"}],"language":[{"iso":"eng"}],"type":"conference","publication":"2018 IEEE 19th Latin-American Test Symposium (LATS)","status":"public","publisher":"IEEE","date_updated":"2023-03-22T10:16:54Z","author":[{"full_name":"Becker, Thales E.","last_name":"Becker","first_name":"Thales E."},{"full_name":"Vidor, Fabio F.","last_name":"Vidor","first_name":"Fabio F."},{"first_name":"Gilson I.","last_name":"Wirth","full_name":"Wirth, Gilson I."},{"full_name":"Meyers, Thorsten","last_name":"Meyers","first_name":"Thorsten"},{"first_name":"Julia","full_name":"Reker, Julia","last_name":"Reker"},{"first_name":"Ulrich","last_name":"Hilleringmann","id":"20179","full_name":"Hilleringmann, Ulrich"}],"date_created":"2023-01-24T10:51:28Z","title":"Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors","doi":"10.1109/latw.2018.8349695","publication_status":"published","year":"2018","citation":{"mla":"Becker, Thales E., et al. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>, IEEE, 2018, doi:<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>.","short":"T.E. Becker, F.F. Vidor, G.I. Wirth, T. Meyers, J. Reker, U. Hilleringmann, in: 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018.","bibtex":"@inproceedings{Becker_Vidor_Wirth_Meyers_Reker_Hilleringmann_2018, title={Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors}, DOI={<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>}, booktitle={2018 IEEE 19th Latin-American Test Symposium (LATS)}, publisher={IEEE}, author={Becker, Thales E. and Vidor, Fabio F. and Wirth, Gilson I. and Meyers, Thorsten and Reker, Julia and Hilleringmann, Ulrich}, year={2018} }","apa":"Becker, T. E., Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., &#38; Hilleringmann, U. (2018). 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Wiesbaden: Springer Fachmedien Wiesbaden, 2018. <a href=\"https://doi.org/10.1007/978-3-658-23444-7_3\">https://doi.org/10.1007/978-3-658-23444-7_3</a>.","ieee":"U. Hilleringmann, “Oxidation des Siliziums,” in <i>Silizium-Halbleitertechnologie</i>, Wiesbaden: Springer Fachmedien Wiesbaden, 2018.","apa":"Hilleringmann, U. (2018). Oxidation des Siliziums. In <i>Silizium-Halbleitertechnologie</i>. Springer Fachmedien Wiesbaden. <a href=\"https://doi.org/10.1007/978-3-658-23444-7_3\">https://doi.org/10.1007/978-3-658-23444-7_3</a>","short":"U. 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Elektrochemische Korrosionsprüfung. <i>adhäsion KLEBEN &#38;amp; DICHTEN</i>. 2018;62(7-8):32-39. doi:<a href=\"https://doi.org/10.1007/s35145-018-0052-z\">10.1007/s35145-018-0052-z</a>","chicago":"Ditz, Michael, Gerson Meschut, Richard Grothe, Guido Grundmeier, Marcel Windoffer, and Gerhard Kötting. “Elektrochemische Korrosionsprüfung.” <i>adhäsion KLEBEN &#38;amp; DICHTEN</i> 62, no. 7–8 (2018): 32–39. <a href=\"https://doi.org/10.1007/s35145-018-0052-z\">https://doi.org/10.1007/s35145-018-0052-z</a>.","ieee":"M. Ditz, G. Meschut, R. Grothe, G. Grundmeier, M. Windoffer, and G. Kötting, “Elektrochemische Korrosionsprüfung,” <i>adhäsion KLEBEN &#38;amp; DICHTEN</i>, vol. 62, no. 7–8, pp. 32–39, 2018, doi: <a href=\"https://doi.org/10.1007/s35145-018-0052-z\">10.1007/s35145-018-0052-z</a>.","mla":"Ditz, Michael, et al. “Elektrochemische Korrosionsprüfung.” <i>adhäsion KLEBEN &#38;amp; DICHTEN</i>, vol. 62, no. 7–8, Springer Science and Business Media LLC, 2018, pp. 32–39, doi:<a href=\"https://doi.org/10.1007/s35145-018-0052-z\">10.1007/s35145-018-0052-z</a>.","bibtex":"@article{Ditz_Meschut_Grothe_Grundmeier_Windoffer_Kötting_2018, title={Elektrochemische Korrosionsprüfung}, volume={62}, DOI={<a href=\"https://doi.org/10.1007/s35145-018-0052-z\">10.1007/s35145-018-0052-z</a>}, number={7–8}, journal={adhäsion KLEBEN &#38;amp; DICHTEN}, publisher={Springer Science and Business Media LLC}, author={Ditz, Michael and Meschut, Gerson and Grothe, Richard and Grundmeier, Guido and Windoffer, Marcel and Kötting, Gerhard}, year={2018}, pages={32–39} }","short":"M. Ditz, G. Meschut, R. Grothe, G. Grundmeier, M. Windoffer, G. Kötting, adhäsion KLEBEN &#38;amp; DICHTEN 62 (2018) 32–39.","apa":"Ditz, M., Meschut, G., Grothe, R., Grundmeier, G., Windoffer, M., &#38; Kötting, G. (2018). Elektrochemische Korrosionsprüfung. <i>adhäsion KLEBEN &#38;amp; DICHTEN</i>, <i>62</i>(7–8), 32–39. <a href=\"https://doi.org/10.1007/s35145-018-0052-z\">https://doi.org/10.1007/s35145-018-0052-z</a>"},"year":"2018"},{"publication":"onlinejournal kultur & geschlecht","type":"journal_article","status":"public","department":[{"_id":"11"}],"user_id":"14932","_id":"35170","language":[{"iso":"eng"}],"extern":"1","issue":"21","page":"1–7","citation":{"apa":"Degeling, J., Deuber-Mankowsky, A., Horn, S., &#38; Shnayien, M. (2018). Einleitung: Die „jüngere Queerfeminist*in“ spricht. <i>Onlinejournal Kultur &#38; Geschlecht</i>, <i>21</i>, 1–7.","bibtex":"@article{Degeling_Deuber-Mankowsky_Horn_Shnayien_2018, title={Einleitung: Die „jüngere Queerfeminist*in“ spricht.}, number={21}, journal={onlinejournal kultur &#38; geschlecht}, author={Degeling, Jasmin and Deuber-Mankowsky, Astrid and Horn, Sarah and Shnayien, Mary}, year={2018}, pages={1–7} }","mla":"Degeling, Jasmin, et al. “Einleitung: Die „jüngere Queerfeminist*in“ Spricht.” <i>Onlinejournal Kultur &#38; Geschlecht</i>, no. 21, 2018, pp. 1–7.","short":"J. Degeling, A. Deuber-Mankowsky, S. Horn, M. Shnayien, Onlinejournal Kultur &#38; Geschlecht (2018) 1–7.","ama":"Degeling J, Deuber-Mankowsky A, Horn S, Shnayien M. Einleitung: Die „jüngere Queerfeminist*in“ spricht. <i>onlinejournal kultur &#38; geschlecht</i>. 2018;(21):1–7.","ieee":"J. Degeling, A. Deuber-Mankowsky, S. Horn, and M. Shnayien, “Einleitung: Die „jüngere Queerfeminist*in“ spricht.,” <i>onlinejournal kultur &#38; geschlecht</i>, no. 21, pp. 1–7, 2018.","chicago":"Degeling, Jasmin, Astrid Deuber-Mankowsky, Sarah Horn, and Mary Shnayien. “Einleitung: Die „jüngere Queerfeminist*in“ Spricht.” <i>Onlinejournal Kultur &#38; Geschlecht</i>, no. 21 (2018): 1–7."},"year":"2018","author":[{"full_name":"Degeling, Jasmin","last_name":"Degeling","first_name":"Jasmin"},{"full_name":"Deuber-Mankowsky, Astrid","last_name":"Deuber-Mankowsky","first_name":"Astrid"},{"last_name":"Horn","full_name":"Horn, Sarah","first_name":"Sarah"},{"first_name":"Mary","full_name":"Shnayien, Mary","id":"97841","orcid":"0000-0001-5202-1813","last_name":"Shnayien"}],"date_created":"2023-01-04T08:49:46Z","oa":"1","date_updated":"2023-03-29T11:01:22Z","main_file_link":[{"url":"https://kulturundgeschlecht.blogs.ruhr-uni-bochum.de/wp-content/uploads/2018/06/Einleitung.pdf","open_access":"1"}],"title":"Einleitung: Die „jüngere Queerfeminist*in“ spricht."},{"extern":"1","language":[{"iso":"eng"}],"_id":"42788","department":[{"_id":"102"}],"user_id":"93826","abstract":[{"text":"We classify all one-class genera of admissible lattice chains of length at least 2 in hermitian spaces over number fields. If L is a lattice in the chain and p the prime ideal dividing the index of the lattices in the chain, then the {p}-arithmetic group Aut(L{p}) acts chamber transitively on the corresponding Bruhat-Tits building. So our classification provides a step forward to a complete classification of these chamber transitive groups which has been announced 1987 (without a detailed proof) by Kantor, Liebler and Tits. In fact we find all their groups over number fields and one additional building with a discrete chamber transitive group.","lang":"eng"}],"status":"public","publication":"Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory","type":"book_chapter","title":"One Class Genera of Lattice Chains Over Number Fields","doi":"10.1007/978-3-319-70566-8_22","publisher":"Springer International Publishing","date_updated":"2023-04-04T09:08:19Z","author":[{"id":"82258","full_name":"Kirschmer, Markus","last_name":"Kirschmer","first_name":"Markus"},{"last_name":"Nebe","full_name":"Nebe, Gabriele","first_name":"Gabriele"}],"date_created":"2023-03-07T08:23:48Z","year":"2018","place":"Cham","citation":{"ama":"Kirschmer M, Nebe G. One Class Genera of Lattice Chains Over Number Fields. In: <i>Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory</i>. Springer International Publishing; 2018. doi:<a href=\"https://doi.org/10.1007/978-3-319-70566-8_22\">10.1007/978-3-319-70566-8_22</a>","chicago":"Kirschmer, Markus, and Gabriele Nebe. “One Class Genera of Lattice Chains Over Number Fields.” In <i>Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory</i>. Cham: Springer International Publishing, 2018. <a href=\"https://doi.org/10.1007/978-3-319-70566-8_22\">https://doi.org/10.1007/978-3-319-70566-8_22</a>.","ieee":"M. Kirschmer and G. Nebe, “One Class Genera of Lattice Chains Over Number Fields,” in <i>Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory</i>, Cham: Springer International Publishing, 2018.","short":"M. Kirschmer, G. Nebe, in: Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory, Springer International Publishing, Cham, 2018.","bibtex":"@inbook{Kirschmer_Nebe_2018, place={Cham}, title={One Class Genera of Lattice Chains Over Number Fields}, DOI={<a href=\"https://doi.org/10.1007/978-3-319-70566-8_22\">10.1007/978-3-319-70566-8_22</a>}, booktitle={Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory}, publisher={Springer International Publishing}, author={Kirschmer, Markus and Nebe, Gabriele}, year={2018} }","mla":"Kirschmer, Markus, and Gabriele Nebe. “One Class Genera of Lattice Chains Over Number Fields.” <i>Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory</i>, Springer International Publishing, 2018, doi:<a href=\"https://doi.org/10.1007/978-3-319-70566-8_22\">10.1007/978-3-319-70566-8_22</a>.","apa":"Kirschmer, M., &#38; Nebe, G. (2018). One Class Genera of Lattice Chains Over Number Fields. In <i>Algorithmic and Experimental Methods in Algebra, Geometry, and Number Theory</i>. Springer International Publishing. <a href=\"https://doi.org/10.1007/978-3-319-70566-8_22\">https://doi.org/10.1007/978-3-319-70566-8_22</a>"},"publication_identifier":{"isbn":["9783319705651","9783319705668"]},"publication_status":"published"},{"language":[{"iso":"eng"}],"extern":"1","keyword":["Algebra and Number Theory"],"user_id":"93826","department":[{"_id":"102"}],"_id":"42790","status":"public","abstract":[{"lang":"eng","text":"We show that exceptional algebraic groups over number fields do not admit one-class genera of parahoric groups, except in the case G₂ . For the group G₂, we enumerate all such one-class genera for the usual seven-dimensional representation."}],"type":"journal_article","publication":"Journal de Théorie des Nombres de Bordeaux","doi":"10.5802/jtnb.1052","title":"One-class genera of exceptional groups over number fields","date_created":"2023-03-07T08:27:36Z","author":[{"last_name":"Kirschmer","full_name":"Kirschmer, Markus","id":"82258","first_name":"Markus"}],"volume":30,"publisher":"Cellule MathDoc/CEDRAM","date_updated":"2023-04-04T09:07:32Z","citation":{"bibtex":"@article{Kirschmer_2018, title={One-class genera of exceptional groups over number fields}, volume={30}, DOI={<a href=\"https://doi.org/10.5802/jtnb.1052\">10.5802/jtnb.1052</a>}, number={3}, journal={Journal de Théorie des Nombres de Bordeaux}, publisher={Cellule MathDoc/CEDRAM}, author={Kirschmer, Markus}, year={2018}, pages={847–857} }","short":"M. Kirschmer, Journal de Théorie Des Nombres de Bordeaux 30 (2018) 847–857.","mla":"Kirschmer, Markus. “One-Class Genera of Exceptional Groups over Number Fields.” <i>Journal de Théorie Des Nombres de Bordeaux</i>, vol. 30, no. 3, Cellule MathDoc/CEDRAM, 2018, pp. 847–57, doi:<a href=\"https://doi.org/10.5802/jtnb.1052\">10.5802/jtnb.1052</a>.","apa":"Kirschmer, M. (2018). One-class genera of exceptional groups over number fields. <i>Journal de Théorie Des Nombres de Bordeaux</i>, <i>30</i>(3), 847–857. <a href=\"https://doi.org/10.5802/jtnb.1052\">https://doi.org/10.5802/jtnb.1052</a>","ama":"Kirschmer M. One-class genera of exceptional groups over number fields. <i>Journal de Théorie des Nombres de Bordeaux</i>. 2018;30(3):847-857. doi:<a href=\"https://doi.org/10.5802/jtnb.1052\">10.5802/jtnb.1052</a>","ieee":"M. Kirschmer, “One-class genera of exceptional groups over number fields,” <i>Journal de Théorie des Nombres de Bordeaux</i>, vol. 30, no. 3, pp. 847–857, 2018, doi: <a href=\"https://doi.org/10.5802/jtnb.1052\">10.5802/jtnb.1052</a>.","chicago":"Kirschmer, Markus. “One-Class Genera of Exceptional Groups over Number Fields.” <i>Journal de Théorie Des Nombres de Bordeaux</i> 30, no. 3 (2018): 847–57. <a href=\"https://doi.org/10.5802/jtnb.1052\">https://doi.org/10.5802/jtnb.1052</a>."},"page":"847-857","intvolume":"        30","year":"2018","issue":"3","publication_status":"published","publication_identifier":{"issn":["1246-7405","2118-8572"]}},{"type":"book_chapter","publication":"Raumbildungen. Erkundungen zur christlichen Religionspraxis. FS Stephan Weyer-Menkhoff zum 65. 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In <i>Biographisch-Bibliographisches Kirchenlexikon</i> (Vol. 39, pp. 605–607).","bibtex":"@inbook{Schroeter-Wittke_2018, title={Heyne, Bodo }, volume={39}, booktitle={Biographisch-Bibliographisches Kirchenlexikon}, author={Schroeter-Wittke, Harald}, year={2018}, pages={605–607} }","mla":"Schroeter-Wittke, Harald. “Heyne, Bodo .” <i>Biographisch-Bibliographisches Kirchenlexikon</i>, vol. 39, 2018, pp. 605–07.","short":"H. Schroeter-Wittke, in: Biographisch-Bibliographisches Kirchenlexikon, 2018, pp. 605–607."},"year":"2018","user_id":"480","_id":"43983","language":[{"iso":"eng"}],"publication":"Biographisch-Bibliographisches Kirchenlexikon","type":"encyclopedia_article","status":"public"}]