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A 28-Gb/s 27.2mW NRZ Full-Rate Bang-Bang Clock and Data Recovery in 22 nm FD-SOI CMOS Technology. In: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS). ; 2023. doi:10.1109/BCICTS54660.2023.10310954","apa":"Iftekhar, M., Gowda, H., Kneuper, P., Sadiye, B., Müller, W., & Scheytt, C. (2023). A 28-Gb/s 27.2mW NRZ Full-Rate Bang-Bang Clock and Data Recovery in 22 nm FD-SOI CMOS Technology. 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS). 2023 IEEE BiCMOS und Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Monterey, CA, USA. https://doi.org/10.1109/BCICTS54660.2023.10310954","chicago":"Iftekhar, Mohammed, Harshan Gowda, Pascal Kneuper, Babak Sadiye, Wolfgang Müller, and Christoph Scheytt. “A 28-Gb/s 27.2mW NRZ Full-Rate Bang-Bang Clock and Data Recovery in 22 Nm FD-SOI CMOS Technology.” In 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2023. https://doi.org/10.1109/BCICTS54660.2023.10310954."},"year":"2023","doi":"10.1109/BCICTS54660.2023.10310954","date_updated":"2023-11-16T11:15:41Z","_id":"48961","conference":{"location":"Monterey, CA, USA","start_date":"2023-10-16","name":"2023 IEEE BiCMOS und Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","end_date":"2023-10-18"},"status":"public","date_created":"2023-11-16T11:04:41Z","publication_identifier":{"eisbn":["979-8-3503-0764-1"]},"author":[{"id":"47944","last_name":"Iftekhar","full_name":"Iftekhar, Mohammed","first_name":"Mohammed"},{"last_name":"Gowda","full_name":"Gowda, Harshan","first_name":"Harshan"},{"id":"47367","last_name":"Kneuper","full_name":"Kneuper, Pascal","first_name":"Pascal"},{"last_name":"Sadiye","id":"93634","first_name":"Babak","full_name":"Sadiye, Babak"},{"id":"16243","last_name":"Müller","full_name":"Müller, Wolfgang","first_name":"Wolfgang"},{"last_name":"Scheytt","id":"37144","first_name":"Christoph","orcid":"0000-0002-5950-6618 ","full_name":"Scheytt, Christoph"}],"publication":"2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","department":[{"_id":"58"}],"user_id":"15931","related_material":{"link":[{"relation":"confirmation","url":"https://ieeexplore.ieee.org/document/10310954"}]},"title":"A 28-Gb/s 27.2mW NRZ Full-Rate Bang-Bang Clock and Data Recovery in 22 nm FD-SOI CMOS Technology"},{"user_id":"79820","title":"A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay.","department":[{"_id":"18"},{"_id":"434"}],"publisher":"Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d","author":[{"full_name":"Kraft, Kerstin","first_name":"Kerstin","id":"22433","last_name":"Kraft"}],"date_created":"2024-03-13T08:45:26Z","status":"public","_id":"52527","date_updated":"2024-03-13T08:59:02Z","language":[{"iso":"eng"}],"citation":{"mla":"Kraft, Kerstin. A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d, 2023.","bibtex":"@book{Kraft_2023, title={A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay.}, publisher={Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d}, author={Kraft, Kerstin}, year={2023} }","chicago":"Kraft, Kerstin. A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d, 2023.","ama":"Kraft K. A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d; 2023.","apa":"Kraft, K. (2023). A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d.","ieee":"K. Kraft, A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d, 2023.","short":"K. Kraft, A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay., Kraft K. & Schmitt S. 2023. Almost Fragrant Pseudobotany: A Bouquet of Encounters With Faux Flora Across Time – A Visual Essay. In: Philippopoulos-Mihalopoulos, A et al (eds.), SMELL. London: University of Westminster Press. DOI: https://doi.org/10.16997/book68.d, 2023."},"type":"misc","year":"2023"},{"year":"2023","type":"conference","citation":{"ama":"Böhnke M, Bielak CR, Friedlein J, et al. A calibration method for failure modeling in clinching process simulations. In: Materials Research Proceedings. Materials Research Forum LLC; 2023. doi:10.21741/9781644902417-34","apa":"Böhnke, M., Bielak, C. R., Friedlein, J., Bobbert, M., Mergheim, J., Steinmann, P., & Meschut, G. (2023). A calibration method for failure modeling in clinching process simulations. Materials Research Proceedings. https://doi.org/10.21741/9781644902417-34","chicago":"Böhnke, Max, Christian Roman Bielak, Johannes Friedlein, Mathias Bobbert, Julia Mergheim, Paul Steinmann, and Gerson Meschut. “A Calibration Method for Failure Modeling in Clinching Process Simulations.” In Materials Research Proceedings. Materials Research Forum LLC, 2023. https://doi.org/10.21741/9781644902417-34.","bibtex":"@inproceedings{Böhnke_Bielak_Friedlein_Bobbert_Mergheim_Steinmann_Meschut_2023, title={A calibration method for failure modeling in clinching process simulations}, DOI={10.21741/9781644902417-34}, booktitle={Materials Research Proceedings}, publisher={Materials Research Forum LLC}, author={Böhnke, Max and Bielak, Christian Roman and Friedlein, Johannes and Bobbert, Mathias and Mergheim, Julia and Steinmann, Paul and Meschut, Gerson}, year={2023} }","mla":"Böhnke, Max, et al. “A Calibration Method for Failure Modeling in Clinching Process Simulations.” Materials Research Proceedings, Materials Research Forum LLC, 2023, doi:10.21741/9781644902417-34.","short":"M. Böhnke, C.R. Bielak, J. Friedlein, M. Bobbert, J. Mergheim, P. Steinmann, G. Meschut, in: Materials Research Proceedings, Materials Research Forum LLC, 2023.","ieee":"M. Böhnke et al., “A calibration method for failure modeling in clinching process simulations,” 2023, doi: 10.21741/9781644902417-34."},"language":[{"iso":"eng"}],"date_updated":"2024-03-11T08:14:53Z","_id":"43462","doi":"10.21741/9781644902417-34","publication":"Materials Research Proceedings","department":[{"_id":"157"}],"publisher":"Materials Research Forum LLC","author":[{"id":"45779","last_name":"Böhnke","full_name":"Böhnke, Max","first_name":"Max"},{"id":"34782","last_name":"Bielak","full_name":"Bielak, Christian Roman","first_name":"Christian Roman"},{"full_name":"Friedlein, Johannes","first_name":"Johannes","last_name":"Friedlein"},{"first_name":"Mathias","full_name":"Bobbert, Mathias","last_name":"Bobbert","id":"7850"},{"last_name":"Mergheim","full_name":"Mergheim, Julia","first_name":"Julia"},{"full_name":"Steinmann, Paul","first_name":"Paul","last_name":"Steinmann"},{"first_name":"Gerson","full_name":"Meschut, Gerson","orcid":"0000-0002-2763-1246","last_name":"Meschut","id":"32056"}],"quality_controlled":"1","publication_status":"published","publication_identifier":{"issn":["2474-395X"]},"date_created":"2023-04-13T07:42:53Z","project":[{"grant_number":"418701707","name":"TRR 285: TRR 285","_id":"130"},{"name":"TRR 285 - A: TRR 285 - Project Area A","_id":"131"},{"name":"TRR 285 – A01: TRR 285 - Subproject A01","_id":"135"},{"name":"TRR 285 – A05: TRR 285 - Subproject A05","_id":"139"}],"status":"public","abstract":[{"lang":"eng","text":"Abstract. In the numerical simulation of mechanical joining technologies such as clinching, the material modeling of the joining parts is of major importance. This includes modeling the damage and failure behavior of the materials in accordance with varying occurring stress states. This paper presents a calibration method of three different fracture models. The calibration of the models is done by use of experimental data from a modified punch test, tensile test and bulge test in order to map the occurring stress states from clinching processes and to precisely model the resulting failure behavior. Experimental investigations were carried out for an aluminum alloy EN AW-6014 in temper T4 and compared with the simulative results generated in LS-DYNA. The comparison of force-displacement curves and failure initiation shows that the Hosford–Coulomb model predicts the failure behavior for the material used and the tests applied with the best accuracy. "}],"title":"A calibration method for failure modeling in clinching process simulations","user_id":"45779"}]