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IEEE; 2013. doi:<a href=\"https://doi.org/10.1109/icit.2013.6505770\">10.1109/icit.2013.6505770</a>","bibtex":"@inproceedings{Hilleringmann_Ohms_Kleine_2013, title={Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes}, DOI={<a href=\"https://doi.org/10.1109/icit.2013.6505770\">10.1109/icit.2013.6505770</a>}, booktitle={2013 IEEE International Conference on Industrial Technology (ICIT)}, publisher={IEEE}, author={Hilleringmann, Ulrich and Ohms, B. and Kleine, A.}, year={2013} }","mla":"Hilleringmann, Ulrich, et al. “Resistivity Reduction in Flexible Dye Sensitized Solar Cells by UV Irradiation and Carbon Nanotubes.” <i>2013 IEEE International Conference on Industrial Technology (ICIT)</i>, IEEE, 2013, doi:<a href=\"https://doi.org/10.1109/icit.2013.6505770\">10.1109/icit.2013.6505770</a>."},"_id":"39509","language":[{"iso":"eng"}],"publisher":"IEEE","user_id":"20179","doi":"10.1109/icit.2013.6505770","year":"2013","status":"public","title":"Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes","author":[{"last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179"},{"last_name":"Ohms","first_name":"B.","full_name":"Ohms, B."},{"full_name":"Kleine, A.","last_name":"Kleine","first_name":"A."}],"publication_status":"published","date_updated":"2023-03-21T10:17:58Z"},{"issue":"3","publication":"IEEE Transactions on Nanotechnology","date_created":"2023-01-24T11:46:28Z","keyword":["Electrical and Electronic Engineering","Computer Science Applications"],"type":"journal_article","department":[{"_id":"59"}],"year":"2013","title":"Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor","publication_identifier":{"issn":["1536-125X","1941-0085"]},"author":[{"first_name":"F. 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Wolff, and Ulrich Hilleringmann. “Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor.” <i>IEEE Transactions on Nanotechnology</i> 12, no. 3 (2013): 296–303. <a href=\"https://doi.org/10.1109/tnano.2012.2236891\">https://doi.org/10.1109/tnano.2012.2236891</a>."},"status":"public","page":"296-303","_id":"39504","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","user_id":"20179","volume":12},{"author":[{"last_name":"Kanwar","first_name":"K.","full_name":"Kanwar, K."},{"full_name":"Geneiss, V.","first_name":"V.","last_name":"Geneiss"},{"full_name":"Mager, T.","last_name":"Mager","first_name":"T."},{"first_name":"S.","last_name":"Scheele","full_name":"Scheele, S."},{"full_name":"Ballhausen, U.","first_name":"U.","last_name":"Ballhausen"},{"last_name":"Hedayat","first_name":"C.","full_name":"Hedayat, C."},{"id":"20179","last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"}],"status":"public","title":"Design and analysis of UHF RFID tag for a rubber transmission belt based on 3D electrical model","year":"2013","date_updated":"2023-03-22T10:18:21Z","publication_status":"published","_id":"39516","language":[{"iso":"eng"}],"publisher":"IEEE","doi":"10.1109/softcom.2013.6671864","user_id":"20179","citation":{"ieee":"K. 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S., et al. “Design and Implementation of a High Temperature Control Monitoring Applied to Micro Thermoelectric Generators.” <i>Renewable Energy and Power Quality Journal</i>, AEDERMACP (European Association for the Development of Renewable Energies and Power Quality), 2013, pp. 712–17, doi:<a href=\"https://doi.org/10.24084/repqj11.425\">10.24084/repqj11.425</a>.","short":"S.C.S. Jucá, P.C.M. Carvalho, R.I.S. Pereira, D. Petrov, U. Hilleringmann, Renewable Energy and Power Quality Journal (2013) 712–717.","chicago":"Jucá, S.C.S., P.C.M. Carvalho, R.I.S. Pereira, Dmitry Petrov, and Ulrich Hilleringmann. “Design and Implementation of a High Temperature Control Monitoring Applied to Micro Thermoelectric Generators.” <i>Renewable Energy and Power Quality Journal</i>, 2013, 712–17. <a href=\"https://doi.org/10.24084/repqj11.425\">https://doi.org/10.24084/repqj11.425</a>.","apa":"Jucá, S. C. S., Carvalho, P. C. M., Pereira, R. I. S., Petrov, D., &#38; Hilleringmann, U. (2013). Design and Implementation of a High Temperature Control Monitoring Applied to Micro Thermoelectric Generators. <i>Renewable Energy and Power Quality Journal</i>, 712–717. <a href=\"https://doi.org/10.24084/repqj11.425\">https://doi.org/10.24084/repqj11.425</a>","ieee":"S. C. S. Jucá, P. C. M. Carvalho, R. I. S. Pereira, D. Petrov, and U. Hilleringmann, “Design and Implementation of a High Temperature Control Monitoring Applied to Micro Thermoelectric Generators,” <i>Renewable Energy and Power Quality Journal</i>, pp. 712–717, 2013, doi: <a href=\"https://doi.org/10.24084/repqj11.425\">10.24084/repqj11.425</a>."},"publication":"Renewable Energy and Power Quality Journal","date_created":"2023-01-24T11:47:52Z","department":[{"_id":"59"},{"_id":"977"}],"keyword":["Electrical and Electronic Engineering","Energy Engineering and Power Technology","Renewable Energy","Sustainability and the Environment"],"type":"journal_article"},{"status":"public","volume":1490,"user_id":"8282","publisher":"Springer Science and Business Media LLC","_id":"39514","page":"191-196","citation":{"bibtex":"@article{Petrov_Assion_Hilleringmann_2013, title={Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators}, volume={1490}, DOI={<a href=\"https://doi.org/10.1557/opl.2013.318\">10.1557/opl.2013.318</a>}, journal={MRS Proceedings}, publisher={Springer Science and Business Media LLC}, author={Petrov, Dmitry and Assion, Fabian and Hilleringmann, Ulrich}, year={2013}, pages={191–196} }","ama":"Petrov D, Assion F, Hilleringmann U. Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators. <i>MRS Proceedings</i>. 2013;1490:191-196. doi:<a href=\"https://doi.org/10.1557/opl.2013.318\">10.1557/opl.2013.318</a>","mla":"Petrov, Dmitry, et al. “Design and Implementation of a Measurement System for Automatically Measurement of Electrical Parameters of Thermoelectric Generators.” <i>MRS Proceedings</i>, vol. 1490, Springer Science and Business Media LLC, 2013, pp. 191–96, doi:<a href=\"https://doi.org/10.1557/opl.2013.318\">10.1557/opl.2013.318</a>.","short":"D. Petrov, F. Assion, U. Hilleringmann, MRS Proceedings 1490 (2013) 191–196.","chicago":"Petrov, Dmitry, Fabian Assion, and Ulrich Hilleringmann. “Design and Implementation of a Measurement System for Automatically Measurement of Electrical Parameters of Thermoelectric Generators.” <i>MRS Proceedings</i> 1490 (2013): 191–96. <a href=\"https://doi.org/10.1557/opl.2013.318\">https://doi.org/10.1557/opl.2013.318</a>.","ieee":"D. Petrov, F. Assion, and U. Hilleringmann, “Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators,” <i>MRS Proceedings</i>, vol. 1490, pp. 191–196, 2013, doi: <a href=\"https://doi.org/10.1557/opl.2013.318\">10.1557/opl.2013.318</a>.","apa":"Petrov, D., Assion, F., &#38; Hilleringmann, U. (2013). Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators. <i>MRS Proceedings</i>, <i>1490</i>, 191–196. <a href=\"https://doi.org/10.1557/opl.2013.318\">https://doi.org/10.1557/opl.2013.318</a>"},"intvolume":"      1490","publication_status":"published","date_updated":"2026-02-24T19:12:07Z","publication_identifier":{"issn":["0272-9172","1946-4274"]},"author":[{"id":"8282","full_name":"Petrov, Dmitry","first_name":"Dmitry","last_name":"Petrov"},{"full_name":"Assion, Fabian","last_name":"Assion","first_name":"Fabian"},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich","id":"20179"}],"title":"Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators","year":"2013","doi":"10.1557/opl.2013.318","language":[{"iso":"eng"}],"abstract":[{"text":"<jats:title>ABSTRACT</jats:title><jats:p>The continues development of thermoelectric generators causes a permanent improvement of their characteristics. New types of thermoelectric generators can work at temperatures up to 1000 K. With this, special measurement equipment is needed to control the electrical parameters of the new developed specimens. The devices must be tested over the whole range of operating temperatures. For each temperature value a series of electrical measurements has to be performed. To establish the maximal output power of the thermoelectric generators, a load resistor with variable resistance has to be connected to the output of thermoelectric generator. The measurement system should measure the electrical current through the load resistor and the voltage over this resistor to determine the device parameters. A large amount of measurement data have to be collected and processed to evaluate the electrical characteristics of the specimen and to present them in graphical form, suitable for the comparison with others specimens.</jats:p>","lang":"eng"}],"publication":"MRS Proceedings","department":[{"_id":"59"},{"_id":"977"}],"type":"journal_article","keyword":["General Engineering"],"date_created":"2023-01-24T11:52:02Z"},{"department":[{"_id":"59"}],"keyword":["Electrical and Electronic Engineering","Mechanical Engineering","Mechanics of Materials","Electronic","Optical and Magnetic Materials"],"type":"journal_article","date_created":"2023-01-24T11:54:26Z","publication":"Journal of Micromechanics and Microengineering","issue":"12","doi":"10.1088/0960-1317/22/12/125012","language":[{"iso":"eng"}],"article_number":"125012","intvolume":"        22","publication_status":"published","date_updated":"2023-03-21T10:19:17Z","publication_identifier":{"issn":["0960-1317","1361-6439"]},"author":[{"last_name":"Brockmeier","first_name":"A","full_name":"Brockmeier, A"},{"full_name":"Rodriguez, F J Santos","last_name":"Rodriguez","first_name":"F J Santos"},{"full_name":"Harrison, M","first_name":"M","last_name":"Harrison"},{"id":"20179","last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"}],"year":"2012","title":"Surface tension and its role for vertical wet etching of silicon","citation":{"mla":"Brockmeier, A., et al. “Surface Tension and Its Role for Vertical Wet Etching of Silicon.” <i>Journal of Micromechanics and Microengineering</i>, vol. 22, no. 12, 125012, IOP Publishing, 2012, doi:<a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>.","ama":"Brockmeier A, Rodriguez FJS, Harrison M, Hilleringmann U. Surface tension and its role for vertical wet etching of silicon. <i>Journal of Micromechanics and Microengineering</i>. 2012;22(12). doi:<a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>","bibtex":"@article{Brockmeier_Rodriguez_Harrison_Hilleringmann_2012, title={Surface tension and its role for vertical wet etching of silicon}, volume={22}, DOI={<a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>}, number={12125012}, journal={Journal of Micromechanics and Microengineering}, publisher={IOP Publishing}, author={Brockmeier, A and Rodriguez, F J Santos and Harrison, M and Hilleringmann, Ulrich}, year={2012} }","apa":"Brockmeier, A., Rodriguez, F. J. S., Harrison, M., &#38; Hilleringmann, U. (2012). Surface tension and its role for vertical wet etching of silicon. <i>Journal of Micromechanics and Microengineering</i>, <i>22</i>(12), Article 125012. <a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">https://doi.org/10.1088/0960-1317/22/12/125012</a>","ieee":"A. Brockmeier, F. J. S. Rodriguez, M. Harrison, and U. Hilleringmann, “Surface tension and its role for vertical wet etching of silicon,” <i>Journal of Micromechanics and Microengineering</i>, vol. 22, no. 12, Art. no. 125012, 2012, doi: <a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>.","short":"A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).","chicago":"Brockmeier, A, F J Santos Rodriguez, M Harrison, and Ulrich Hilleringmann. “Surface Tension and Its Role for Vertical Wet Etching of Silicon.” <i>Journal of Micromechanics and Microengineering</i> 22, no. 12 (2012). <a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">https://doi.org/10.1088/0960-1317/22/12/125012</a>."},"volume":22,"user_id":"20179","_id":"39520","publisher":"IOP Publishing","status":"public"},{"status":"public","user_id":"20179","volume":22,"_id":"39522","publisher":"IOP Publishing","citation":{"mla":"Brockmeier, A., et al. “Surface Tension and Its Role for Vertical Wet Etching of Silicon.” <i>Journal of Micromechanics and Microengineering</i>, vol. 22, no. 12, 125012, IOP Publishing, 2012, doi:<a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>.","ama":"Brockmeier A, Rodriguez FJS, Harrison M, Hilleringmann U. Surface tension and its role for vertical wet etching of silicon. <i>Journal of Micromechanics and Microengineering</i>. 2012;22(12). doi:<a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>","bibtex":"@article{Brockmeier_Rodriguez_Harrison_Hilleringmann_2012, title={Surface tension and its role for vertical wet etching of silicon}, volume={22}, DOI={<a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>}, number={12125012}, journal={Journal of Micromechanics and Microengineering}, publisher={IOP Publishing}, author={Brockmeier, A and Rodriguez, F J Santos and Harrison, M and Hilleringmann, Ulrich}, year={2012} }","apa":"Brockmeier, A., Rodriguez, F. J. S., Harrison, M., &#38; Hilleringmann, U. (2012). Surface tension and its role for vertical wet etching of silicon. <i>Journal of Micromechanics and Microengineering</i>, <i>22</i>(12), Article 125012. <a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">https://doi.org/10.1088/0960-1317/22/12/125012</a>","ieee":"A. Brockmeier, F. J. S. Rodriguez, M. Harrison, and U. Hilleringmann, “Surface tension and its role for vertical wet etching of silicon,” <i>Journal of Micromechanics and Microengineering</i>, vol. 22, no. 12, Art. no. 125012, 2012, doi: <a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">10.1088/0960-1317/22/12/125012</a>.","chicago":"Brockmeier, A, F J Santos Rodriguez, M Harrison, and Ulrich Hilleringmann. “Surface Tension and Its Role for Vertical Wet Etching of Silicon.” <i>Journal of Micromechanics and Microengineering</i> 22, no. 12 (2012). <a href=\"https://doi.org/10.1088/0960-1317/22/12/125012\">https://doi.org/10.1088/0960-1317/22/12/125012</a>.","short":"A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012)."},"publication_status":"published","date_updated":"2023-03-21T10:19:32Z","intvolume":"        22","title":"Surface tension and its role for vertical wet etching of silicon","year":"2012","publication_identifier":{"issn":["0960-1317","1361-6439"]},"author":[{"last_name":"Brockmeier","first_name":"A","full_name":"Brockmeier, A"},{"last_name":"Rodriguez","first_name":"F J Santos","full_name":"Rodriguez, F J Santos"},{"full_name":"Harrison, M","first_name":"M","last_name":"Harrison"},{"first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179"}],"doi":"10.1088/0960-1317/22/12/125012","article_number":"125012","language":[{"iso":"eng"}],"publication":"Journal of Micromechanics and Microengineering","issue":"12","keyword":["Electrical and Electronic Engineering","Mechanical Engineering","Mechanics of Materials","Electronic","Optical and Magnetic Materials"],"type":"journal_article","department":[{"_id":"59"}],"date_created":"2023-01-24T11:54:56Z"},{"place":"Wiesbaden","date_created":"2023-01-24T11:51:21Z","department":[{"_id":"59"}],"type":"book","citation":{"ieee":"U. Hilleringmann, <i>Mikrosystemtechnik auf Silizium</i>. Wiesbaden: Vieweg+Teubner Verlag, 2012.","apa":"Hilleringmann, U. (2012). <i>Mikrosystemtechnik auf Silizium</i>. Vieweg+Teubner Verlag. <a href=\"https://doi.org/10.1007/978-3-322-92766-8\">https://doi.org/10.1007/978-3-322-92766-8</a>","mla":"Hilleringmann, Ulrich. <i>Mikrosystemtechnik Auf Silizium</i>. Vieweg+Teubner Verlag, 2012, doi:<a href=\"https://doi.org/10.1007/978-3-322-92766-8\">10.1007/978-3-322-92766-8</a>.","bibtex":"@book{Hilleringmann_2012, place={Wiesbaden}, title={Mikrosystemtechnik auf Silizium}, DOI={<a href=\"https://doi.org/10.1007/978-3-322-92766-8\">10.1007/978-3-322-92766-8</a>}, publisher={Vieweg+Teubner Verlag}, author={Hilleringmann, Ulrich}, year={2012} }","short":"U. Hilleringmann, Mikrosystemtechnik Auf Silizium, Vieweg+Teubner Verlag, Wiesbaden, 2012.","ama":"Hilleringmann U. <i>Mikrosystemtechnik Auf Silizium</i>. Vieweg+Teubner Verlag; 2012. doi:<a href=\"https://doi.org/10.1007/978-3-322-92766-8\">10.1007/978-3-322-92766-8</a>","chicago":"Hilleringmann, Ulrich. <i>Mikrosystemtechnik Auf Silizium</i>. Wiesbaden: Vieweg+Teubner Verlag, 2012. <a href=\"https://doi.org/10.1007/978-3-322-92766-8\">https://doi.org/10.1007/978-3-322-92766-8</a>."},"_id":"39512","language":[{"iso":"eng"}],"publisher":"Vieweg+Teubner Verlag","doi":"10.1007/978-3-322-92766-8","user_id":"20179","publication_identifier":{"isbn":["9783519061588","9783322927668"]},"author":[{"full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","last_name":"Hilleringmann","id":"20179"}],"title":"Mikrosystemtechnik auf Silizium","status":"public","year":"2012","date_updated":"2023-03-21T10:18:32Z","publication_status":"published"},{"date_created":"2018-09-20T11:44:50Z","type":"conference","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"publication":"2011 Semiconductor Conference Dresden","citation":{"short":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.","ama":"Frers T, Hett T, Hilleringmann U, Berth G, Widhalm A, Zrenner A. Characterization of SiON integrated waveguides via FTIR and AFM measurements. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>","chicago":"Frers, Torsten, Thomas Hett, Ulrich Hilleringmann, Gerhard Berth, Alex Widhalm, and Artur Zrenner. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>.","bibtex":"@inproceedings{Frers_Hett_Hilleringmann_Berth_Widhalm_Zrenner_2011, title={Characterization of SiON integrated waveguides via FTIR and AFM measurements}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Frers, Torsten and Hett, Thomas and Hilleringmann, Ulrich and Berth, Gerhard and Widhalm, Alex and Zrenner, Artur}, year={2011} }","apa":"Frers, T., Hett, T., Hilleringmann, U., Berth, G., Widhalm, A., &#38; Zrenner, A. (2011). Characterization of SiON integrated waveguides via FTIR and AFM measurements. In <i>2011 Semiconductor Conference Dresden</i>. Dresden, Germany: IEEE. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>","mla":"Frers, Torsten, et al. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>.","ieee":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, and A. Zrenner, “Characterization of SiON integrated waveguides via FTIR and AFM measurements,” in <i>2011 Semiconductor Conference Dresden</i>, Dresden, Germany, 2011."},"abstract":[{"lang":"eng","text":"Silicon oxynitride (SiON) layers for telecommunication device application are grown by Plasma Enhanced Chemical Vapor Deposition (PECVD) for various gas compositions of SiH4, N2O and NH3. Processing and annealing effects on the oxynitride films were studied by Fourier Transform Infrared Spectroscopy (FTIR) and Atomic Force Microscopy (AFM) measurements. By reduction of the silane (SiH4) gas flow and enhancement of the PECVD deposition temperature, the absorption loss due to NH bands can be nearly completely erased. Furthermore the surface roughness can be reduced by decreasing the gas flow and rising the deposition temperature. First waveguide structures are introduced and their characterization is presented."}],"_id":"4546","language":[{"iso":"eng"}],"publisher":"IEEE","doi":"10.1109/scd.2011.6068744","user_id":"49428","title":"Characterization of SiON integrated waveguides via FTIR and AFM measurements","year":"2011","status":"public","conference":{"start_date":"2011-09-27","name":"2011 Semiconductor Conference Dresden","location":"Dresden, Germany","end_date":"2011-09-28"},"publication_identifier":{"isbn":["9781457704314"]},"author":[{"full_name":"Frers, Torsten","first_name":"Torsten","last_name":"Frers"},{"last_name":"Hett","first_name":"Thomas","full_name":"Hett, Thomas"},{"last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"},{"full_name":"Berth, Gerhard","last_name":"Berth","first_name":"Gerhard","id":"53"},{"full_name":"Widhalm, Alex","first_name":"Alex","last_name":"Widhalm"},{"orcid":"0000-0002-5190-0944","last_name":"Zrenner","first_name":"Artur","full_name":"Zrenner, Artur","id":"606"}],"date_updated":"2022-01-06T07:01:09Z","publication_status":"published"},{"publisher":"The Electrochemical Society","_id":"39533","page":"109-115","volume":39,"user_id":"20179","status":"public","citation":{"mla":"Vidor, Fábio Fedrizzi, et al. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” <i>ECS Transactions</i>, vol. 39, no. 1, The Electrochemical Society, 2011, pp. 109–15, doi:<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>.","ama":"Vidor FF, Wirth GI, Wolff K, Hilleringmann U. Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. <i>ECS Transactions</i>. 2011;39(1):109-115. doi:<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>","bibtex":"@article{Vidor_Wirth_Wolff_Hilleringmann_2011, title={Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors}, volume={39}, DOI={<a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>}, number={1}, journal={ECS Transactions}, publisher={The Electrochemical Society}, author={Vidor, Fábio Fedrizzi and Wirth, Gilson Inácio and Wolff, Karsten and Hilleringmann, Ulrich}, year={2011}, pages={109–115} }","apa":"Vidor, F. F., Wirth, G. I., Wolff, K., &#38; Hilleringmann, U. (2011). Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors. <i>ECS Transactions</i>, <i>39</i>(1), 109–115. <a href=\"https://doi.org/10.1149/1.3615183\">https://doi.org/10.1149/1.3615183</a>","ieee":"F. F. Vidor, G. I. Wirth, K. Wolff, and U. Hilleringmann, “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors,” <i>ECS Transactions</i>, vol. 39, no. 1, pp. 109–115, 2011, doi: <a href=\"https://doi.org/10.1149/1.3615183\">10.1149/1.3615183</a>.","chicago":"Vidor, Fábio Fedrizzi, Gilson Inácio Wirth, Karsten Wolff, and Ulrich Hilleringmann. “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors.” <i>ECS Transactions</i> 39, no. 1 (2011): 109–15. <a href=\"https://doi.org/10.1149/1.3615183\">https://doi.org/10.1149/1.3615183</a>.","short":"F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115."},"language":[{"iso":"eng"}],"doi":"10.1149/1.3615183","publication_identifier":{"issn":["1938-5862","1938-6737"]},"author":[{"full_name":"Vidor, Fábio Fedrizzi","first_name":"Fábio Fedrizzi","last_name":"Vidor"},{"full_name":"Wirth, Gilson Inácio","first_name":"Gilson Inácio","last_name":"Wirth"},{"full_name":"Wolff, Karsten","first_name":"Karsten","last_name":"Wolff"},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"}],"year":"2011","title":"Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors","intvolume":"        39","publication_status":"published","date_updated":"2023-03-21T10:21:23Z","date_created":"2023-01-24T12:01:16Z","department":[{"_id":"59"}],"type":"journal_article","keyword":["General Medicine"],"issue":"1","publication":"ECS Transactions","abstract":[{"text":"<jats:p>Due to the electrical, sensory and optical properties the interest on ZnO-based devices including thin-film transistors (TFT) aroused. The main concerns, when using ZnO nanoparticles (NP-ZnO) in TFT, are the low charge carrier mobility and the hysteresis when poly(4-vinylphenol) (PVP) is used as gate dielectric. It is well-known that the mobility in NP-ZnO films can be enhanced by the subsequent hydrothermal decomposition of zinc salts. The electrical behavior as a function of time and temperature is investigated, taking the NP-ZnO without addition of zinc acetate as reference. The addition of zinc acetate leads to a device with better performance, with increased drain current level and without the presence of the hysteresis in the transfer characteristic.  The formation reaction was performed at a temperature of 200°C, which enables process compatibility to some plastic substrates.</jats:p>","lang":"eng"}]},{"_id":"39527","publisher":"Elsevier BV","page":"110-114","volume":62,"user_id":"20179","status":"public","citation":{"ieee":"K. Wolff and U. Hilleringmann, “Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric,” <i>Solid-State Electronics</i>, vol. 62, no. 1, pp. 110–114, 2011, doi: <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>.","apa":"Wolff, K., &#38; Hilleringmann, U. (2011). Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. <i>Solid-State Electronics</i>, <i>62</i>(1), 110–114. <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">https://doi.org/10.1016/j.sse.2011.01.046</a>","chicago":"Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” <i>Solid-State Electronics</i> 62, no. 1 (2011): 110–14. <a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">https://doi.org/10.1016/j.sse.2011.01.046</a>.","short":"K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.","mla":"Wolff, K., and Ulrich Hilleringmann. “Solution Processed Inverter Based on Zinc Oxide Nanoparticle Thin-Film Transistors with Poly(4-Vinylphenol) Gate Dielectric.” <i>Solid-State Electronics</i>, vol. 62, no. 1, Elsevier BV, 2011, pp. 110–14, doi:<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>.","bibtex":"@article{Wolff_Hilleringmann_2011, title={Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric}, volume={62}, DOI={<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>}, number={1}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wolff, K. and Hilleringmann, Ulrich}, year={2011}, pages={110–114} }","ama":"Wolff K, Hilleringmann U. Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric. <i>Solid-State Electronics</i>. 2011;62(1):110-114. doi:<a href=\"https://doi.org/10.1016/j.sse.2011.01.046\">10.1016/j.sse.2011.01.046</a>"},"language":[{"iso":"eng"}],"doi":"10.1016/j.sse.2011.01.046","publication_identifier":{"issn":["0038-1101"]},"author":[{"full_name":"Wolff, K.","first_name":"K.","last_name":"Wolff"},{"last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179"}],"year":"2011","title":"Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric","intvolume":"        62","date_updated":"2023-03-21T10:20:24Z","publication_status":"published","date_created":"2023-01-24T11:57:07Z","department":[{"_id":"59"}],"keyword":["Materials Chemistry","Electrical and Electronic Engineering","Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"type":"journal_article","issue":"1","publication":"Solid-State Electronics"},{"date_updated":"2023-03-21T10:21:37Z","publication_status":"published","author":[{"last_name":"Frers","first_name":"Torsten","full_name":"Frers, Torsten"},{"full_name":"Hett, Thomas","last_name":"Hett","first_name":"Thomas"},{"id":"20179","full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","last_name":"Hilleringmann"},{"full_name":"Berth, Gerhard","last_name":"Berth","first_name":"Gerhard"},{"full_name":"Widhalm, Alex","last_name":"Widhalm","first_name":"Alex"},{"first_name":"Artur","last_name":"Zrenner","full_name":"Zrenner, Artur"}],"year":"2011","status":"public","title":"Characterization of SiON integrated waveguides via FTIR and AFM measurements","doi":"10.1109/scd.2011.6068744","user_id":"20179","language":[{"iso":"eng"}],"_id":"39536","publisher":"IEEE","citation":{"apa":"Frers, T., Hett, T., Hilleringmann, U., Berth, G., Widhalm, A., &#38; Zrenner, A. (2011). Characterization of SiON integrated waveguides via FTIR and AFM measurements. <i>2011 Semiconductor Conference Dresden</i>. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>","ieee":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, and A. Zrenner, “Characterization of SiON integrated waveguides via FTIR and AFM measurements,” 2011, doi: <a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>.","chicago":"Frers, Torsten, Thomas Hett, Ulrich Hilleringmann, Gerhard Berth, Alex Widhalm, and Artur Zrenner. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068744\">https://doi.org/10.1109/scd.2011.6068744</a>.","short":"T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.","mla":"Frers, Torsten, et al. “Characterization of SiON Integrated Waveguides via FTIR and AFM Measurements.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>.","ama":"Frers T, Hett T, Hilleringmann U, Berth G, Widhalm A, Zrenner A. Characterization of SiON integrated waveguides via FTIR and AFM measurements. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>","bibtex":"@inproceedings{Frers_Hett_Hilleringmann_Berth_Widhalm_Zrenner_2011, title={Characterization of SiON integrated waveguides via FTIR and AFM measurements}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068744\">10.1109/scd.2011.6068744</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Frers, Torsten and Hett, Thomas and Hilleringmann, Ulrich and Berth, Gerhard and Widhalm, Alex and Zrenner, Artur}, year={2011} }"},"publication":"2011 Semiconductor Conference Dresden","department":[{"_id":"59"}],"type":"conference","date_created":"2023-01-24T12:03:46Z"},{"publication_status":"published","date_updated":"2023-03-21T10:20:37Z","title":"Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops","year":"2011","status":"public","author":[{"first_name":"C.","last_name":"Wiegand","full_name":"Wiegand, C."},{"full_name":"Hangmann, C.","first_name":"C.","last_name":"Hangmann"},{"first_name":"C.","last_name":"Hedayat","full_name":"Hedayat, C."},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"user_id":"20179","doi":"10.1109/scd.2011.6068711","language":[{"iso":"eng"}],"_id":"39528","publisher":"IEEE","publication":"2011 Semiconductor Conference Dresden","citation":{"apa":"Wiegand, C., Hangmann, C., Hedayat, C., &#38; Hilleringmann, U. (2011). Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops. <i>2011 Semiconductor Conference Dresden</i>. <a href=\"https://doi.org/10.1109/scd.2011.6068711\">https://doi.org/10.1109/scd.2011.6068711</a>","ieee":"C. Wiegand, C. Hangmann, C. Hedayat, and U. Hilleringmann, “Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops,” 2011, doi: <a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>.","short":"C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.","chicago":"Wiegand, C., C. Hangmann, C. Hedayat, and Ulrich Hilleringmann. “Modeling and Simulation of Arbitrary Ordered Nonlinear Charge-Pump Phase-Locked Loops.” In <i>2011 Semiconductor Conference Dresden</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/scd.2011.6068711\">https://doi.org/10.1109/scd.2011.6068711</a>.","mla":"Wiegand, C., et al. “Modeling and Simulation of Arbitrary Ordered Nonlinear Charge-Pump Phase-Locked Loops.” <i>2011 Semiconductor Conference Dresden</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>.","ama":"Wiegand C, Hangmann C, Hedayat C, Hilleringmann U. Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops. In: <i>2011 Semiconductor Conference Dresden</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>","bibtex":"@inproceedings{Wiegand_Hangmann_Hedayat_Hilleringmann_2011, title={Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops}, DOI={<a href=\"https://doi.org/10.1109/scd.2011.6068711\">10.1109/scd.2011.6068711</a>}, booktitle={2011 Semiconductor Conference Dresden}, publisher={IEEE}, author={Wiegand, C. and Hangmann, C. and Hedayat, C. and Hilleringmann, Ulrich}, year={2011} }"},"type":"conference","department":[{"_id":"59"}],"date_created":"2023-01-24T11:57:35Z"},{"type":"conference","department":[{"_id":"59"}],"date_created":"2023-01-24T11:58:40Z","publication":"IEEE Africon '11","citation":{"mla":"Hilleringmann, Ulrich, et al. “Semiconductor Nanoparticles for Electronic Device Integration on Foils.” <i>IEEE Africon ’11</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>.","ama":"Hilleringmann U, Wolff K, Assion F, Vidor FF, Wirth GI. Semiconductor nanoparticles for electronic device integration on foils. In: <i>IEEE Africon ’11</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>","bibtex":"@inproceedings{Hilleringmann_Wolff_Assion_Vidor_Wirth_2011, title={Semiconductor nanoparticles for electronic device integration on foils}, DOI={<a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>}, booktitle={IEEE Africon ’11}, publisher={IEEE}, author={Hilleringmann, Ulrich and Wolff, K. and Assion, F. and Vidor, F. F. and Wirth, G. I.}, year={2011} }","apa":"Hilleringmann, U., Wolff, K., Assion, F., Vidor, F. F., &#38; Wirth, G. I. (2011). Semiconductor nanoparticles for electronic device integration on foils. <i>IEEE Africon ’11</i>. <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">https://doi.org/10.1109/afrcon.2011.6071983</a>","ieee":"U. Hilleringmann, K. Wolff, F. Assion, F. F. Vidor, and G. I. Wirth, “Semiconductor nanoparticles for electronic device integration on foils,” 2011, doi: <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">10.1109/afrcon.2011.6071983</a>.","short":"U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.","chicago":"Hilleringmann, Ulrich, K. Wolff, F. Assion, F. F. Vidor, and G. I. Wirth. “Semiconductor Nanoparticles for Electronic Device Integration on Foils.” In <i>IEEE Africon ’11</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/afrcon.2011.6071983\">https://doi.org/10.1109/afrcon.2011.6071983</a>."},"user_id":"20179","doi":"10.1109/afrcon.2011.6071983","publisher":"IEEE","_id":"39530","language":[{"iso":"eng"}],"publication_status":"published","date_updated":"2023-03-21T10:20:55Z","status":"public","year":"2011","title":"Semiconductor nanoparticles for electronic device integration on foils","author":[{"id":"20179","last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"},{"first_name":"K.","last_name":"Wolff","full_name":"Wolff, K."},{"full_name":"Assion, F.","last_name":"Assion","first_name":"F."},{"full_name":"Vidor, F. F.","last_name":"Vidor","first_name":"F. F."},{"full_name":"Wirth, G. I.","last_name":"Wirth","first_name":"G. I."}]},{"author":[{"last_name":"Reinhold","first_name":"C","full_name":"Reinhold, C"},{"full_name":"Hangmann, C","first_name":"C","last_name":"Hangmann"},{"first_name":"T","last_name":"Mager","full_name":"Mager, T"},{"full_name":"Hedayat, C","last_name":"Hedayat","first_name":"C"},{"id":"20179","full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","last_name":"Hilleringmann"}],"year":"2011","title":"Plane wave spectrum expansion from near-field measurements on no-planar lattices","status":"public","date_updated":"2023-03-21T10:21:51Z","_id":"39537","language":[{"iso":"eng"}],"page":"1–4","user_id":"20179","citation":{"ama":"Reinhold C, Hangmann C, Mager T, Hedayat C, Hilleringmann U. Plane wave spectrum expansion from near-field measurements on no-planar lattices. In: <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>. ; 2011:1–4.","bibtex":"@inproceedings{Reinhold_Hangmann_Mager_Hedayat_Hilleringmann_2011, title={Plane wave spectrum expansion from near-field measurements on no-planar lattices}, booktitle={Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011}, author={Reinhold, C and Hangmann, C and Mager, T and Hedayat, C and Hilleringmann, Ulrich}, year={2011}, pages={1–4} }","mla":"Reinhold, C., et al. “Plane Wave Spectrum Expansion from Near-Field Measurements on No-Planar Lattices.” <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 2011, pp. 1–4.","chicago":"Reinhold, C, C Hangmann, T Mager, C Hedayat, and Ulrich Hilleringmann. “Plane Wave Spectrum Expansion from Near-Field Measurements on No-Planar Lattices.” In <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 1–4, 2011.","short":"C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, U. Hilleringmann, in: Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011, 2011, pp. 1–4.","apa":"Reinhold, C., Hangmann, C., Mager, T., Hedayat, C., &#38; Hilleringmann, U. (2011). Plane wave spectrum expansion from near-field measurements on no-planar lattices. <i>Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011</i>, 1–4.","ieee":"C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, and U. Hilleringmann, “Plane wave spectrum expansion from near-field measurements on no-planar lattices,” in <i>Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011</i>, 2011, pp. 1–4."},"publication":"Proc. 5th Int. Conf. on electromagnetic Near-field Characterization and Imaging (ICONIC) 2011","date_created":"2023-01-24T12:04:25Z","department":[{"_id":"59"}],"type":"conference"},{"publication_status":"published","date_updated":"2023-03-22T10:31:58Z","author":[{"full_name":"Meyer zu Hoberge, S.","first_name":"S.","last_name":"Meyer zu Hoberge"},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"},{"full_name":"Jochheim, C.","last_name":"Jochheim","first_name":"C."},{"full_name":"Liebich, M.","last_name":"Liebich","first_name":"M."}],"title":"Piezoelectric sensor array with evaluation electronic for counting grains in seed drills","year":"2011","status":"public","user_id":"20179","doi":"10.1109/afrcon.2011.6072063","language":[{"iso":"eng"}],"_id":"39529","publisher":"IEEE","citation":{"apa":"Meyer zu Hoberge, S., Hilleringmann, U., Jochheim, C., &#38; Liebich, M. (2011). Piezoelectric sensor array with evaluation electronic for counting grains in seed drills. <i>IEEE Africon ’11</i>. <a href=\"https://doi.org/10.1109/afrcon.2011.6072063\">https://doi.org/10.1109/afrcon.2011.6072063</a>","mla":"Meyer zu Hoberge, S., et al. “Piezoelectric Sensor Array with Evaluation Electronic for Counting Grains in Seed Drills.” <i>IEEE Africon ’11</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6072063\">10.1109/afrcon.2011.6072063</a>.","ieee":"S. Meyer zu Hoberge, U. Hilleringmann, C. Jochheim, and M. Liebich, “Piezoelectric sensor array with evaluation electronic for counting grains in seed drills,” 2011, doi: <a href=\"https://doi.org/10.1109/afrcon.2011.6072063\">10.1109/afrcon.2011.6072063</a>.","chicago":"Meyer zu Hoberge, S., Ulrich Hilleringmann, C. Jochheim, and M. Liebich. “Piezoelectric Sensor Array with Evaluation Electronic for Counting Grains in Seed Drills.” In <i>IEEE Africon ’11</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/afrcon.2011.6072063\">https://doi.org/10.1109/afrcon.2011.6072063</a>.","short":"S. Meyer zu Hoberge, U. Hilleringmann, C. Jochheim, M. Liebich, in: IEEE Africon ’11, IEEE, 2011.","ama":"Meyer zu Hoberge S, Hilleringmann U, Jochheim C, Liebich M. Piezoelectric sensor array with evaluation electronic for counting grains in seed drills. In: <i>IEEE Africon ’11</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/afrcon.2011.6072063\">10.1109/afrcon.2011.6072063</a>","bibtex":"@inproceedings{Meyer zu Hoberge_Hilleringmann_Jochheim_Liebich_2011, title={Piezoelectric sensor array with evaluation electronic for counting grains in seed drills}, DOI={<a href=\"https://doi.org/10.1109/afrcon.2011.6072063\">10.1109/afrcon.2011.6072063</a>}, booktitle={IEEE Africon ’11}, publisher={IEEE}, author={Meyer zu Hoberge, S. and Hilleringmann, Ulrich and Jochheim, C. and Liebich, M.}, year={2011} }"},"publication":"IEEE Africon '11","department":[{"_id":"59"}],"type":"conference","date_created":"2023-01-24T11:58:19Z"},{"doi":"10.5194/ars-1-131-2003","language":[{"iso":"eng"}],"intvolume":"         1","date_updated":"2023-03-21T10:00:23Z","publication_status":"published","publication_identifier":{"issn":["1684-9973"]},"author":[{"last_name":"Dierkes","first_name":"M.","full_name":"Dierkes, M."},{"first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179"}],"year":"2010","title":"Telemetric surface acoustic wave sensor for humidity","department":[{"_id":"59"}],"type":"journal_article","date_created":"2023-01-25T09:03:30Z","abstract":[{"text":"<jats:p>Abstract. Surface acoustic wave sensors consist of a piezoelectric substrate with metal interdigital transducers (IDT) on top. The acoustic waves are generated on the surface of the substrate by a radio wave, as it is well known in band pass filters. The devices can be used as wireless telemetric sensors for temperature and humidity, transmitting the sensed signal as a shift of the sensor’s resonance frequency.\r\n                    </jats:p>","lang":"eng"}],"publication":"Advances in Radio Science","volume":1,"user_id":"20179","publisher":"Copernicus GmbH","_id":"39871","page":"131-133","status":"public","citation":{"short":"M. Dierkes, U. Hilleringmann, Advances in Radio Science 1 (2010) 131–133.","chicago":"Dierkes, M., and Ulrich Hilleringmann. “Telemetric Surface Acoustic Wave Sensor for Humidity.” <i>Advances in Radio Science</i> 1 (2010): 131–33. <a href=\"https://doi.org/10.5194/ars-1-131-2003\">https://doi.org/10.5194/ars-1-131-2003</a>.","apa":"Dierkes, M., &#38; Hilleringmann, U. (2010). Telemetric surface acoustic wave sensor for humidity. <i>Advances in Radio Science</i>, <i>1</i>, 131–133. <a href=\"https://doi.org/10.5194/ars-1-131-2003\">https://doi.org/10.5194/ars-1-131-2003</a>","ieee":"M. Dierkes and U. Hilleringmann, “Telemetric surface acoustic wave sensor for humidity,” <i>Advances in Radio Science</i>, vol. 1, pp. 131–133, 2010, doi: <a href=\"https://doi.org/10.5194/ars-1-131-2003\">10.5194/ars-1-131-2003</a>.","ama":"Dierkes M, Hilleringmann U. Telemetric surface acoustic wave sensor for humidity. <i>Advances in Radio Science</i>. 2010;1:131-133. doi:<a href=\"https://doi.org/10.5194/ars-1-131-2003\">10.5194/ars-1-131-2003</a>","bibtex":"@article{Dierkes_Hilleringmann_2010, title={Telemetric surface acoustic wave sensor for humidity}, volume={1}, DOI={<a href=\"https://doi.org/10.5194/ars-1-131-2003\">10.5194/ars-1-131-2003</a>}, journal={Advances in Radio Science}, publisher={Copernicus GmbH}, author={Dierkes, M. and Hilleringmann, Ulrich}, year={2010}, pages={131–133} }","mla":"Dierkes, M., and Ulrich Hilleringmann. “Telemetric Surface Acoustic Wave Sensor for Humidity.” <i>Advances in Radio Science</i>, vol. 1, Copernicus GmbH, 2010, pp. 131–33, doi:<a href=\"https://doi.org/10.5194/ars-1-131-2003\">10.5194/ars-1-131-2003</a>."}},{"language":[{"iso":"eng"}],"doi":"10.5194/ars-8-161-2010","year":"2010","title":"Non-linear behaviour of charge-pump phase-locked loops","author":[{"first_name":"C.","last_name":"Wiegand","full_name":"Wiegand, C."},{"last_name":"Hedayat","first_name":"C.","full_name":"Hedayat, C."},{"last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179"}],"publication_identifier":{"issn":["1684-9973"]},"date_updated":"2023-03-21T10:22:05Z","publication_status":"published","intvolume":"         8","date_created":"2023-01-24T12:04:57Z","type":"journal_article","department":[{"_id":"59"}],"publication":"Advances in Radio Science","abstract":[{"lang":"eng","text":"<jats:p>Abstract. The analysis of the mixed analogue and digital structure of charge-pump phase-locked loops (CP-PLL) is a challenge in modelling and simulation. In most cases the system is designed and characterized using its continuous linear model or its discrete linear model neglecting its non-linear switching behaviour. I.e., the time-varying model is approximated by a time-invariant representation using its average dynamics. Depending on what kind of phase detector is used, the scopes of validity of these approximations are different. Here, a preeminent characterization and simulation technique based on the systems event-driven feature is presented, merging the logical and analogue inherent characteristics of the system. In particular, the high-grade non-linear locking process and the dead-zone are analyzed.\r\n                    </jats:p>"}],"page":"161-166","_id":"39539","publisher":"Copernicus GmbH","user_id":"20179","volume":8,"status":"public","citation":{"apa":"Wiegand, C., Hedayat, C., &#38; Hilleringmann, U. (2010). Non-linear behaviour of charge-pump phase-locked loops. <i>Advances in Radio Science</i>, <i>8</i>, 161–166. <a href=\"https://doi.org/10.5194/ars-8-161-2010\">https://doi.org/10.5194/ars-8-161-2010</a>","ieee":"C. Wiegand, C. Hedayat, and U. Hilleringmann, “Non-linear behaviour of charge-pump phase-locked loops,” <i>Advances in Radio Science</i>, vol. 8, pp. 161–166, 2010, doi: <a href=\"https://doi.org/10.5194/ars-8-161-2010\">10.5194/ars-8-161-2010</a>.","short":"C. Wiegand, C. Hedayat, U. Hilleringmann, Advances in Radio Science 8 (2010) 161–166.","chicago":"Wiegand, C., C. Hedayat, and Ulrich Hilleringmann. “Non-Linear Behaviour of Charge-Pump Phase-Locked Loops.” <i>Advances in Radio Science</i> 8 (2010): 161–66. <a href=\"https://doi.org/10.5194/ars-8-161-2010\">https://doi.org/10.5194/ars-8-161-2010</a>.","mla":"Wiegand, C., et al. “Non-Linear Behaviour of Charge-Pump Phase-Locked Loops.” <i>Advances in Radio Science</i>, vol. 8, Copernicus GmbH, 2010, pp. 161–66, doi:<a href=\"https://doi.org/10.5194/ars-8-161-2010\">10.5194/ars-8-161-2010</a>.","ama":"Wiegand C, Hedayat C, Hilleringmann U. Non-linear behaviour of charge-pump phase-locked loops. <i>Advances in Radio Science</i>. 2010;8:161-166. doi:<a href=\"https://doi.org/10.5194/ars-8-161-2010\">10.5194/ars-8-161-2010</a>","bibtex":"@article{Wiegand_Hedayat_Hilleringmann_2010, title={Non-linear behaviour of charge-pump phase-locked loops}, volume={8}, DOI={<a href=\"https://doi.org/10.5194/ars-8-161-2010\">10.5194/ars-8-161-2010</a>}, journal={Advances in Radio Science}, publisher={Copernicus GmbH}, author={Wiegand, C. and Hedayat, C. and Hilleringmann, Ulrich}, year={2010}, pages={161–166} }"}}]