[{"date_created":"2022-06-22T09:56:51Z","title":"Ruelle-Taylor resonances of Anosov actions","issue":"8","year":"2024","ddc":["510"],"language":[{"iso":"eng"}],"publication":"J. Europ. Math. Soc.","file":[{"content_type":"application/pdf","relation":"main_file","creator":"weich","date_created":"2022-06-22T09:56:47Z","date_updated":"2022-06-22T09:56:47Z","access_level":"open_access","file_name":"2007.14275.pdf","file_id":"32102","file_size":796410}],"date_updated":"2026-02-18T10:33:34Z","oa":"1","volume":27,"author":[{"first_name":"Tobias","full_name":"Weich, Tobias","id":"49178","orcid":"0000-0002-9648-6919","last_name":"Weich"},{"full_name":"Guedes Bonthonneau, Yannick","last_name":"Guedes Bonthonneau","first_name":"Yannick"},{"full_name":"Guillarmou, Colin","last_name":"Guillarmou","first_name":"Colin"},{"full_name":"Hilgert, Joachim","id":"220","last_name":"Hilgert","first_name":"Joachim"}],"doi":"https://doi.org/10.4171/JEMS/1428","has_accepted_license":"1","publication_status":"published","intvolume":"        27","page":"3085–3147","citation":{"short":"T. Weich, Y. Guedes Bonthonneau, C. Guillarmou, J. Hilgert, J. Europ. Math. Soc. 27 (2024) 3085–3147.","mla":"Weich, Tobias, et al. “Ruelle-Taylor Resonances of Anosov Actions.” <i>J. Europ. Math. Soc.</i>, vol. 27, no. 8, 2024, pp. 3085–3147, doi:<a href=\"https://doi.org/10.4171/JEMS/1428\">https://doi.org/10.4171/JEMS/1428</a>.","bibtex":"@article{Weich_Guedes Bonthonneau_Guillarmou_Hilgert_2024, title={Ruelle-Taylor resonances of Anosov actions}, volume={27}, DOI={<a href=\"https://doi.org/10.4171/JEMS/1428\">https://doi.org/10.4171/JEMS/1428</a>}, number={8}, journal={J. Europ. Math. Soc.}, author={Weich, Tobias and Guedes Bonthonneau, Yannick and Guillarmou, Colin and Hilgert, Joachim}, year={2024}, pages={3085–3147} }","apa":"Weich, T., Guedes Bonthonneau, Y., Guillarmou, C., &#38; Hilgert, J. (2024). Ruelle-Taylor resonances of Anosov actions. <i>J. Europ. Math. Soc.</i>, <i>27</i>(8), 3085–3147. <a href=\"https://doi.org/10.4171/JEMS/1428\">https://doi.org/10.4171/JEMS/1428</a>","ieee":"T. Weich, Y. Guedes Bonthonneau, C. Guillarmou, and J. Hilgert, “Ruelle-Taylor resonances of Anosov actions,” <i>J. Europ. Math. Soc.</i>, vol. 27, no. 8, pp. 3085–3147, 2024, doi: <a href=\"https://doi.org/10.4171/JEMS/1428\">https://doi.org/10.4171/JEMS/1428</a>.","chicago":"Weich, Tobias, Yannick Guedes Bonthonneau, Colin Guillarmou, and Joachim Hilgert. “Ruelle-Taylor Resonances of Anosov Actions.” <i>J. Europ. Math. Soc.</i> 27, no. 8 (2024): 3085–3147. <a href=\"https://doi.org/10.4171/JEMS/1428\">https://doi.org/10.4171/JEMS/1428</a>.","ama":"Weich T, Guedes Bonthonneau Y, Guillarmou C, Hilgert J. Ruelle-Taylor resonances of Anosov actions. <i>J Europ Math Soc</i>. 2024;27(8):3085–3147. doi:<a href=\"https://doi.org/10.4171/JEMS/1428\">https://doi.org/10.4171/JEMS/1428</a>"},"_id":"32101","department":[{"_id":"10"},{"_id":"623"},{"_id":"548"},{"_id":"91"}],"user_id":"49178","file_date_updated":"2022-06-22T09:56:47Z","type":"journal_article","status":"public"},{"publication":"Stochastic Processes and their Applications","type":"journal_article","status":"public","abstract":[{"lang":"eng","text":"A layered graph G^× is the Cartesian product of a graph G = (V, E) with the linear graph Z, e.g. Z^× is the 2D square lattice Z^2. For Bernoulli percolation with parameter p ∈ [0, 1] on G^× one intuitively would expect that P_p((o, 0) ↔ (v, n)) ≥ P_p((o, 0) ↔ (v, n + 1)) for all o, v ∈ V and n ≥ 0. This is reminiscent of the better known bunkbed conjecture. Here\r\nwe introduce an approach to the above monotonicity conjecture that makes use of a Markov chain building the percolation pattern layer by layer. In case of finite G we thus can show that for some N ≥ 0 the above holds\r\nfor all n ≥ N o, v ∈ V and p ∈ [0, 1]. One might hope that this Markov chain approach could be useful for other problems concerning Bernoulli percolation on layered graphs"}],"user_id":"62054","_id":"64213","language":[{"iso":"eng"}],"article_number":"104549","publication_identifier":{"issn":["0304-4149"]},"publication_status":"published","intvolume":"       181","citation":{"mla":"König, Philipp, and Thomas Richthammer. “Monotonicity Properties for Bernoulli Percolation on Layered Graphs— A Markov Chain Approach.” <i>Stochastic Processes and Their Applications</i>, vol. 181, 104549, Elsevier BV, 2024, doi:<a href=\"https://doi.org/10.1016/j.spa.2024.104549\">10.1016/j.spa.2024.104549</a>.","short":"P. König, T. Richthammer, Stochastic Processes and Their Applications 181 (2024).","bibtex":"@article{König_Richthammer_2024, title={Monotonicity properties for Bernoulli percolation on layered graphs— A Markov chain approach}, volume={181}, DOI={<a href=\"https://doi.org/10.1016/j.spa.2024.104549\">10.1016/j.spa.2024.104549</a>}, number={104549}, journal={Stochastic Processes and their Applications}, publisher={Elsevier BV}, author={König, Philipp and Richthammer, Thomas}, year={2024} }","apa":"König, P., &#38; Richthammer, T. (2024). Monotonicity properties for Bernoulli percolation on layered graphs— A Markov chain approach. <i>Stochastic Processes and Their Applications</i>, <i>181</i>, Article 104549. <a href=\"https://doi.org/10.1016/j.spa.2024.104549\">https://doi.org/10.1016/j.spa.2024.104549</a>","ama":"König P, Richthammer T. Monotonicity properties for Bernoulli percolation on layered graphs— A Markov chain approach. <i>Stochastic Processes and their Applications</i>. 2024;181. doi:<a href=\"https://doi.org/10.1016/j.spa.2024.104549\">10.1016/j.spa.2024.104549</a>","ieee":"P. König and T. Richthammer, “Monotonicity properties for Bernoulli percolation on layered graphs— A Markov chain approach,” <i>Stochastic Processes and their Applications</i>, vol. 181, Art. no. 104549, 2024, doi: <a href=\"https://doi.org/10.1016/j.spa.2024.104549\">10.1016/j.spa.2024.104549</a>.","chicago":"König, Philipp, and Thomas Richthammer. “Monotonicity Properties for Bernoulli Percolation on Layered Graphs— A Markov Chain Approach.” <i>Stochastic Processes and Their Applications</i> 181 (2024). <a href=\"https://doi.org/10.1016/j.spa.2024.104549\">https://doi.org/10.1016/j.spa.2024.104549</a>."},"year":"2024","volume":181,"author":[{"full_name":"König, Philipp","last_name":"König","first_name":"Philipp"},{"full_name":"Richthammer, Thomas","id":"62054","last_name":"Richthammer","first_name":"Thomas"}],"date_created":"2026-02-18T12:06:28Z","publisher":"Elsevier BV","date_updated":"2026-02-18T12:32:13Z","doi":"10.1016/j.spa.2024.104549","title":"Monotonicity properties for Bernoulli percolation on layered graphs— A Markov chain approach"},{"citation":{"bibtex":"@article{Kovács_Lantelme_2024, title={A posteriori error estimates for parabolic partial differential equations on stationary surfaces}, journal={arXiv:2407.02101}, author={Kovács, Balázs and Lantelme, Michael Frederik Raúl}, year={2024} }","mla":"Kovács, Balázs, and Michael Frederik Raúl Lantelme. “A Posteriori Error Estimates for Parabolic Partial Differential Equations on Stationary Surfaces.” <i>ArXiv:2407.02101</i>, 2024.","short":"B. Kovács, M.F.R. Lantelme, ArXiv:2407.02101 (2024).","apa":"Kovács, B., &#38; Lantelme, M. F. R. (2024). A posteriori error estimates for parabolic partial differential equations on stationary surfaces. In <i>arXiv:2407.02101</i>.","ama":"Kovács B, Lantelme MFR. A posteriori error estimates for parabolic partial differential equations on stationary surfaces. <i>arXiv:240702101</i>. Published online 2024.","ieee":"B. Kovács and M. F. R. Lantelme, “A posteriori error estimates for parabolic partial differential equations on stationary surfaces,” <i>arXiv:2407.02101</i>. 2024.","chicago":"Kovács, Balázs, and Michael Frederik Raúl Lantelme. “A Posteriori Error Estimates for Parabolic Partial Differential Equations on Stationary Surfaces.” <i>ArXiv:2407.02101</i>, 2024."},"year":"2024","author":[{"id":"100441","full_name":"Kovács, Balázs","last_name":"Kovács","orcid":"0000-0001-9872-3474","first_name":"Balázs"},{"full_name":"Lantelme, Michael Frederik Raúl","id":"102867","last_name":"Lantelme","first_name":"Michael Frederik Raúl"}],"date_created":"2024-07-04T12:53:47Z","date_updated":"2026-02-18T14:45:36Z","title":"A posteriori error estimates for parabolic partial differential equations on stationary surfaces","publication":"arXiv:2407.02101","type":"preprint","status":"public","abstract":[{"lang":"eng","text":"This paper develops and discusses a residual-based a posteriori error\r\nestimate and a space--time adaptive algorithm for solving parabolic surface\r\npartial differential equations on closed stationary surfaces. The full\r\ndiscretization uses the surface finite element method in space and the backward\r\nEuler method in time. The proposed error indicator bounds the error quantities\r\nglobally in space from above and below, and globally in time from above and\r\nlocally from below. A space--time adaptive algorithm is proposed using the\r\nderived error indicator. Numerical experiments illustrate and complement the\r\ntheory."}],"department":[{"_id":"841"}],"user_id":"100441","external_id":{"arxiv":["2407.02101"]},"_id":"55078","language":[{"iso":"eng"}]},{"status":"public","type":"journal_article","publication":"IEEE Transactions on Technology and Society","language":[{"iso":"eng"}],"user_id":"97123","_id":"64193","citation":{"ama":"Xu Y, Terhörst P, Pedersen M, Raja K. Analyzing Fairness in Deepfake Detection With Massively Annotated Databases. <i>IEEE Transactions on Technology and Society</i>. 2024;5(1):93-106. doi:<a href=\"https://doi.org/10.1109/tts.2024.3365421\">10.1109/tts.2024.3365421</a>","ieee":"Y. Xu, P. Terhörst, M. Pedersen, and K. Raja, “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases,” <i>IEEE Transactions on Technology and Society</i>, vol. 5, no. 1, pp. 93–106, 2024, doi: <a href=\"https://doi.org/10.1109/tts.2024.3365421\">10.1109/tts.2024.3365421</a>.","chicago":"Xu, Ying, Philipp Terhörst, Marius Pedersen, and Kiran Raja. “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases.” <i>IEEE Transactions on Technology and Society</i> 5, no. 1 (2024): 93–106. <a href=\"https://doi.org/10.1109/tts.2024.3365421\">https://doi.org/10.1109/tts.2024.3365421</a>.","bibtex":"@article{Xu_Terhörst_Pedersen_Raja_2024, title={Analyzing Fairness in Deepfake Detection With Massively Annotated Databases}, volume={5}, DOI={<a href=\"https://doi.org/10.1109/tts.2024.3365421\">10.1109/tts.2024.3365421</a>}, number={1}, journal={IEEE Transactions on Technology and Society}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Xu, Ying and Terhörst, Philipp and Pedersen, Marius and Raja, Kiran}, year={2024}, pages={93–106} }","short":"Y. Xu, P. Terhörst, M. Pedersen, K. Raja, IEEE Transactions on Technology and Society 5 (2024) 93–106.","mla":"Xu, Ying, et al. “Analyzing Fairness in Deepfake Detection With Massively Annotated Databases.” <i>IEEE Transactions on Technology and Society</i>, vol. 5, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2024, pp. 93–106, doi:<a href=\"https://doi.org/10.1109/tts.2024.3365421\">10.1109/tts.2024.3365421</a>.","apa":"Xu, Y., Terhörst, P., Pedersen, M., &#38; Raja, K. (2024). Analyzing Fairness in Deepfake Detection With Massively Annotated Databases. <i>IEEE Transactions on Technology and Society</i>, <i>5</i>(1), 93–106. <a href=\"https://doi.org/10.1109/tts.2024.3365421\">https://doi.org/10.1109/tts.2024.3365421</a>"},"intvolume":"         5","page":"93-106","year":"2024","issue":"1","publication_status":"published","publication_identifier":{"issn":["2637-6415"]},"doi":"10.1109/tts.2024.3365421","title":"Analyzing Fairness in Deepfake Detection With Massively Annotated Databases","author":[{"first_name":"Ying","full_name":"Xu, Ying","last_name":"Xu"},{"first_name":"Philipp","last_name":"Terhörst","full_name":"Terhörst, Philipp","id":"97123"},{"last_name":"Pedersen","full_name":"Pedersen, Marius","first_name":"Marius"},{"full_name":"Raja, Kiran","last_name":"Raja","first_name":"Kiran"}],"date_created":"2026-02-18T09:32:05Z","volume":5,"date_updated":"2026-02-19T07:50:47Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)"},{"user_id":"97123","_id":"64192","language":[{"iso":"eng"}],"publication":"2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)","type":"conference","status":"public","date_created":"2026-02-18T09:31:44Z","author":[{"first_name":"Revoti Prasad","last_name":"Bora","full_name":"Bora, Revoti Prasad"},{"first_name":"Philipp","last_name":"Terhörst","full_name":"Terhörst, Philipp","id":"97123"},{"first_name":"Raymond","full_name":"Veldhuis, Raymond","last_name":"Veldhuis"},{"first_name":"Raghavendra","full_name":"Ramachandra, Raghavendra","last_name":"Ramachandra"},{"full_name":"Raja, Kiran","last_name":"Raja","first_name":"Kiran"}],"date_updated":"2026-02-19T07:50:40Z","publisher":"IEEE","doi":"10.1109/cvpr52733.2024.01045","title":"SLICE: Stabilized LIME for Consistent Explanations for Image Classification","publication_status":"published","citation":{"mla":"Bora, Revoti Prasad, et al. “SLICE: Stabilized LIME for Consistent Explanations for Image Classification.” <i>2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/cvpr52733.2024.01045\">10.1109/cvpr52733.2024.01045</a>.","short":"R.P. Bora, P. Terhörst, R. Veldhuis, R. Ramachandra, K. Raja, in: 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2024.","bibtex":"@inproceedings{Bora_Terhörst_Veldhuis_Ramachandra_Raja_2024, title={SLICE: Stabilized LIME for Consistent Explanations for Image Classification}, DOI={<a href=\"https://doi.org/10.1109/cvpr52733.2024.01045\">10.1109/cvpr52733.2024.01045</a>}, booktitle={2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)}, publisher={IEEE}, author={Bora, Revoti Prasad and Terhörst, Philipp and Veldhuis, Raymond and Ramachandra, Raghavendra and Raja, Kiran}, year={2024} }","ama":"Bora RP, Terhörst P, Veldhuis R, Ramachandra R, Raja K. SLICE: Stabilized LIME for Consistent Explanations for Image Classification. In: <i>2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/cvpr52733.2024.01045\">10.1109/cvpr52733.2024.01045</a>","apa":"Bora, R. P., Terhörst, P., Veldhuis, R., Ramachandra, R., &#38; Raja, K. (2024). SLICE: Stabilized LIME for Consistent Explanations for Image Classification. <i>2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)</i>. <a href=\"https://doi.org/10.1109/cvpr52733.2024.01045\">https://doi.org/10.1109/cvpr52733.2024.01045</a>","ieee":"R. P. Bora, P. Terhörst, R. Veldhuis, R. Ramachandra, and K. Raja, “SLICE: Stabilized LIME for Consistent Explanations for Image Classification,” 2024, doi: <a href=\"https://doi.org/10.1109/cvpr52733.2024.01045\">10.1109/cvpr52733.2024.01045</a>.","chicago":"Bora, Revoti Prasad, Philipp Terhörst, Raymond Veldhuis, Raghavendra Ramachandra, and Kiran Raja. “SLICE: Stabilized LIME for Consistent Explanations for Image Classification.” In <i>2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/cvpr52733.2024.01045\">https://doi.org/10.1109/cvpr52733.2024.01045</a>."},"year":"2024"},{"_id":"64191","user_id":"97123","language":[{"iso":"eng"}],"publication":"2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)","type":"conference","status":"public","publisher":"IEEE","date_updated":"2026-02-19T07:50:31Z","author":[{"first_name":"Marco","last_name":"Huber","full_name":"Huber, Marco"},{"full_name":"Luu, Anh Thi","last_name":"Luu","first_name":"Anh Thi"},{"full_name":"Terhörst, Philipp","id":"97123","last_name":"Terhörst","first_name":"Philipp"},{"full_name":"Damer, Naser","last_name":"Damer","first_name":"Naser"}],"date_created":"2026-02-18T09:29:48Z","title":"Efficient Explainable Face Verification based on Similarity Score Argument Backpropagation","doi":"10.1109/wacv57701.2024.00467","publication_status":"published","year":"2024","citation":{"bibtex":"@inproceedings{Huber_Luu_Terhörst_Damer_2024, title={Efficient Explainable Face Verification based on Similarity Score Argument Backpropagation}, DOI={<a href=\"https://doi.org/10.1109/wacv57701.2024.00467\">10.1109/wacv57701.2024.00467</a>}, booktitle={2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)}, publisher={IEEE}, author={Huber, Marco and Luu, Anh Thi and Terhörst, Philipp and Damer, Naser}, year={2024} }","short":"M. Huber, A.T. Luu, P. Terhörst, N. Damer, in: 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), IEEE, 2024.","mla":"Huber, Marco, et al. “Efficient Explainable Face Verification Based on Similarity Score Argument Backpropagation.” <i>2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/wacv57701.2024.00467\">10.1109/wacv57701.2024.00467</a>.","apa":"Huber, M., Luu, A. T., Terhörst, P., &#38; Damer, N. (2024). Efficient Explainable Face Verification based on Similarity Score Argument Backpropagation. <i>2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>. <a href=\"https://doi.org/10.1109/wacv57701.2024.00467\">https://doi.org/10.1109/wacv57701.2024.00467</a>","ama":"Huber M, Luu AT, Terhörst P, Damer N. Efficient Explainable Face Verification based on Similarity Score Argument Backpropagation. In: <i>2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/wacv57701.2024.00467\">10.1109/wacv57701.2024.00467</a>","ieee":"M. Huber, A. T. Luu, P. Terhörst, and N. Damer, “Efficient Explainable Face Verification based on Similarity Score Argument Backpropagation,” 2024, doi: <a href=\"https://doi.org/10.1109/wacv57701.2024.00467\">10.1109/wacv57701.2024.00467</a>.","chicago":"Huber, Marco, Anh Thi Luu, Philipp Terhörst, and Naser Damer. “Efficient Explainable Face Verification Based on Similarity Score Argument Backpropagation.” In <i>2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV)</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/wacv57701.2024.00467\">https://doi.org/10.1109/wacv57701.2024.00467</a>."}},{"_id":"55663","user_id":"97123","language":[{"iso":"eng"}],"type":"conference","publication":"2023 IEEE International Joint Conference on Biometrics (IJCB)","status":"public","publisher":"IEEE","date_updated":"2026-02-19T07:50:05Z","date_created":"2024-08-21T07:04:10Z","author":[{"last_name":"Biagi","full_name":"Biagi, Clara","first_name":"Clara"},{"full_name":"Rethfeld, Louis","last_name":"Rethfeld","first_name":"Louis"},{"full_name":"Kuijper, Arjan","last_name":"Kuijper","first_name":"Arjan"},{"full_name":"Terhörst, Philipp","last_name":"Terhörst","first_name":"Philipp"}],"title":"Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment","doi":"10.1109/ijcb57857.2023.10448905","publication_status":"published","year":"2024","citation":{"short":"C. Biagi, L. Rethfeld, A. Kuijper, P. Terhörst, in: 2023 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2024.","bibtex":"@inproceedings{Biagi_Rethfeld_Kuijper_Terhörst_2024, title={Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment}, DOI={<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>}, booktitle={2023 IEEE International Joint Conference on Biometrics (IJCB)}, publisher={IEEE}, author={Biagi, Clara and Rethfeld, Louis and Kuijper, Arjan and Terhörst, Philipp}, year={2024} }","mla":"Biagi, Clara, et al. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>, IEEE, 2024, doi:<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>.","apa":"Biagi, C., Rethfeld, L., Kuijper, A., &#38; Terhörst, P. (2024). Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">https://doi.org/10.1109/ijcb57857.2023.10448905</a>","ama":"Biagi C, Rethfeld L, Kuijper A, Terhörst P. Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment. In: <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. IEEE; 2024. doi:<a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">10.1109/ijcb57857.2023.10448905</a>","chicago":"Biagi, Clara, Louis Rethfeld, Arjan Kuijper, and Philipp Terhörst. “Explaining Face Recognition Through SHAP-Based Pixel-Level Face Image Quality Assessment.” In <i>2023 IEEE International Joint Conference on Biometrics (IJCB)</i>. IEEE, 2024. <a href=\"https://doi.org/10.1109/ijcb57857.2023.10448905\">https://doi.org/10.1109/ijcb57857.2023.10448905</a>.","ieee":"C. Biagi, L. Rethfeld, A. Kuijper, and P. 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K., Fallahi, M., Strufe, T., Terhörst, P., &#38; Cabarcos, P. A. (2024). 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Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides. <i>Optics Express</i>. Published online 2024. doi:<a href=\"https://doi.org/10.1364/oe.538741\">10.1364/oe.538741</a>","chicago":"Zens, Leon, Vira Besaga, Jens Möller, Nils Christopher Gerhardt, and Martin Hofmann. “Holographic Measurement of Gain and Linewidth Enhancement Factor in Semiconductor Waveguides.” <i>Optics Express</i>, 2024. <a href=\"https://doi.org/10.1364/oe.538741\">https://doi.org/10.1364/oe.538741</a>.","ieee":"L. Zens, V. Besaga, J. Möller, N. C. Gerhardt, and M. Hofmann, “Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides,” <i>Optics Express</i>, 2024, doi: <a href=\"https://doi.org/10.1364/oe.538741\">10.1364/oe.538741</a>.","apa":"Zens, L., Besaga, V., Möller, J., Gerhardt, N. C., &#38; Hofmann, M. (2024). Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides. <i>Optics Express</i>. <a href=\"https://doi.org/10.1364/oe.538741\">https://doi.org/10.1364/oe.538741</a>","bibtex":"@article{Zens_Besaga_Möller_Gerhardt_Hofmann_2024, title={Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides}, DOI={<a href=\"https://doi.org/10.1364/oe.538741\">10.1364/oe.538741</a>}, journal={Optics Express}, publisher={Optica Publishing Group}, author={Zens, Leon and Besaga, Vira and Möller, Jens and Gerhardt, Nils Christopher and Hofmann, Martin}, year={2024} }","short":"L. Zens, V. Besaga, J. Möller, N.C. Gerhardt, M. Hofmann, Optics Express (2024).","mla":"Zens, Leon, et al. “Holographic Measurement of Gain and Linewidth Enhancement Factor in Semiconductor Waveguides.” <i>Optics Express</i>, Optica Publishing Group, 2024, doi:<a href=\"https://doi.org/10.1364/oe.538741\">10.1364/oe.538741</a>."},"publication_status":"published","publication_identifier":{"issn":["1094-4087"]},"title":"Holographic measurement of gain and linewidth enhancement factor in semiconductor waveguides","doi":"10.1364/oe.538741","date_updated":"2026-02-20T11:14:32Z","publisher":"Optica Publishing Group","date_created":"2026-02-20T11:10:34Z","author":[{"full_name":"Zens, Leon","last_name":"Zens","first_name":"Leon"},{"first_name":"Vira","full_name":"Besaga, Vira","last_name":"Besaga"},{"full_name":"Möller, Jens","last_name":"Möller","first_name":"Jens"},{"orcid":"0009-0002-5538-231X","last_name":"Gerhardt","id":"115298","full_name":"Gerhardt, Nils Christopher","first_name":"Nils Christopher"},{"first_name":"Martin","last_name":"Hofmann","full_name":"Hofmann, Martin"}]},{"volume":36,"author":[{"full_name":"Grohsjean, Thorsten","last_name":"Grohsjean","first_name":"Thorsten"},{"first_name":"Gina","last_name":"Dokko","full_name":"Dokko, Gina"},{"first_name":"Philip","last_name":"Yang","id":"100432","full_name":"Yang, Philip"}],"date_created":"2025-04-09T13:25:46Z","date_updated":"2026-02-20T13:55:21Z","publisher":"Institute for Operations Research and the Management Sciences (INFORMS)","doi":"10.1287/orsc.2022.16685","title":"Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees","issue":"2","publication_identifier":{"issn":["1047-7039","1526-5455"]},"publication_status":"published","intvolume":"        36","page":"918-939","citation":{"apa":"Grohsjean, T., Dokko, G., &#38; Yang, P. (2024). Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees. <i>Organization Science</i>, <i>36</i>(2), 918–939. <a href=\"https://doi.org/10.1287/orsc.2022.16685\">https://doi.org/10.1287/orsc.2022.16685</a>","mla":"Grohsjean, Thorsten, et al. “Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees.” <i>Organization Science</i>, vol. 36, no. 2, Institute for Operations Research and the Management Sciences (INFORMS), 2024, pp. 918–39, doi:<a href=\"https://doi.org/10.1287/orsc.2022.16685\">10.1287/orsc.2022.16685</a>.","bibtex":"@article{Grohsjean_Dokko_Yang_2024, title={Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees}, volume={36}, DOI={<a href=\"https://doi.org/10.1287/orsc.2022.16685\">10.1287/orsc.2022.16685</a>}, number={2}, journal={Organization Science}, publisher={Institute for Operations Research and the Management Sciences (INFORMS)}, author={Grohsjean, Thorsten and Dokko, Gina and Yang, Philip}, year={2024}, pages={918–939} }","short":"T. Grohsjean, G. Dokko, P. Yang, Organization Science 36 (2024) 918–939.","ama":"Grohsjean T, Dokko G, Yang P. Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees. <i>Organization Science</i>. 2024;36(2):918-939. doi:<a href=\"https://doi.org/10.1287/orsc.2022.16685\">10.1287/orsc.2022.16685</a>","ieee":"T. Grohsjean, G. Dokko, and P. Yang, “Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees,” <i>Organization Science</i>, vol. 36, no. 2, pp. 918–939, 2024, doi: <a href=\"https://doi.org/10.1287/orsc.2022.16685\">10.1287/orsc.2022.16685</a>.","chicago":"Grohsjean, Thorsten, Gina Dokko, and Philip Yang. “Can You Go Home Again? Performance Assistance Between Boomerangs and Incumbent Employees.” <i>Organization Science</i> 36, no. 2 (2024): 918–39. <a href=\"https://doi.org/10.1287/orsc.2022.16685\">https://doi.org/10.1287/orsc.2022.16685</a>."},"year":"2024","department":[{"_id":"681"}],"user_id":"80877","_id":"59458","language":[{"iso":"eng"}],"publication":"Organization Science","type":"journal_article","status":"public","abstract":[{"text":"<jats:p> Boomerangs, that is, rehires, should have advantages over other new hires when integrating into an organization due to their familiarity with the work context and their pre-existing relationships. However, research suggests that the effects of hiring boomerangs may not be straightforwardly positive. To better understand these effects, we investigate how boomerangs’ social integration into a work team differs from that of other new hires due to their pre-existing relationships and how those relationships shape their and incumbents’ competence and motivation to provide assistance for collective performance. We theorize and find that boomerangs, compared with new hires, exhibit more performance assistance toward incumbent former and incumbent new colleagues. In contrast, incumbent former colleagues do not direct their performance assistance toward boomerangs, contrary to our prediction, nor do incumbent new colleagues. This study contributes to the nascent literature on boomerangs and the literature on job mobility by finding evidence that prior relationships condition the behavior of both boomerangs and incumbents. </jats:p><jats:p> Supplemental Material: The online appendix is available at https://doi.org/10.1287/orsc.2022.16685 . </jats:p>","lang":"eng"}]},{"date_created":"2024-10-17T08:19:34Z","author":[{"id":"44605","full_name":"Müller, Laura","last_name":"Müller","first_name":"Laura"},{"first_name":"Andreas Maximilian","id":"40599","full_name":"Schultz, Andreas Maximilian","last_name":"Schultz"},{"first_name":"Osman","last_name":"Altun","id":"109175","full_name":"Altun, Osman"},{"full_name":"Uhe, Johanna","last_name":"Uhe","first_name":"Johanna"},{"full_name":"Koepler, Oliver","last_name":"Koepler","first_name":"Oliver"},{"first_name":"Soeren","last_name":"Auer","full_name":"Auer, Soeren"},{"full_name":"Mozgova, Iryna","id":"95903","last_name":"Mozgova","first_name":"Iryna"}],"publisher":"The Design Society","date_updated":"2026-02-20T13:00:30Z","doi":"10.35199/norddesign2024.55","title":"Requirements Analysis of a Research Data Management System in Collaborative Projects","publication_status":"published","publication_identifier":{"unknown":["978-1-912254-21-7"]},"quality_controlled":"1","citation":{"apa":"Müller, L., Schultz, A. M., Altun, O., Uhe, J., Koepler, O., Auer, S., &#38; Mozgova, I. (2024). Requirements Analysis of a Research Data Management System in Collaborative Projects. <i>Proceedings of NordDesign 2024</i>, 514–520. <a href=\"https://doi.org/10.35199/norddesign2024.55\">https://doi.org/10.35199/norddesign2024.55</a>","short":"L. Müller, A.M. Schultz, O. Altun, J. Uhe, O. Koepler, S. Auer, I. Mozgova, in: Proceedings of NordDesign 2024, The Design Society, 2024, pp. 514–520.","bibtex":"@inproceedings{Müller_Schultz_Altun_Uhe_Koepler_Auer_Mozgova_2024, title={Requirements Analysis of a Research Data Management System in Collaborative Projects}, DOI={<a href=\"https://doi.org/10.35199/norddesign2024.55\">10.35199/norddesign2024.55</a>}, booktitle={Proceedings of NordDesign 2024}, publisher={The Design Society}, author={Müller, Laura and Schultz, Andreas Maximilian and Altun, Osman and Uhe, Johanna and Koepler, Oliver and Auer, Soeren and Mozgova, Iryna}, year={2024}, pages={514–520} }","mla":"Müller, Laura, et al. “Requirements Analysis of a Research Data Management System in Collaborative Projects.” <i>Proceedings of NordDesign 2024</i>, The Design Society, 2024, pp. 514–20, doi:<a href=\"https://doi.org/10.35199/norddesign2024.55\">10.35199/norddesign2024.55</a>.","ieee":"L. Müller <i>et al.</i>, “Requirements Analysis of a Research Data Management System in Collaborative Projects,” in <i>Proceedings of NordDesign 2024</i>, 2024, pp. 514–520, doi: <a href=\"https://doi.org/10.35199/norddesign2024.55\">10.35199/norddesign2024.55</a>.","chicago":"Müller, Laura, Andreas Maximilian Schultz, Osman Altun, Johanna Uhe, Oliver Koepler, Soeren Auer, and Iryna Mozgova. “Requirements Analysis of a Research Data Management System in Collaborative Projects.” In <i>Proceedings of NordDesign 2024</i>, 514–20. The Design Society, 2024. <a href=\"https://doi.org/10.35199/norddesign2024.55\">https://doi.org/10.35199/norddesign2024.55</a>.","ama":"Müller L, Schultz AM, Altun O, et al. Requirements Analysis of a Research Data Management System in Collaborative Projects. In: <i>Proceedings of NordDesign 2024</i>. The Design Society; 2024:514-520. doi:<a href=\"https://doi.org/10.35199/norddesign2024.55\">10.35199/norddesign2024.55</a>"},"page":"514-520","year":"2024","user_id":"44605","department":[{"_id":"741"}],"_id":"56655","language":[{"iso":"eng"}],"type":"conference","publication":"Proceedings of NordDesign 2024","status":"public"},{"file":[{"relation":"main_file","success":1,"content_type":"application/pdf","file_id":"57470","access_level":"closed","file_name":"crystals-14-01001-v2 (4).pdf","file_size":5779744,"creator":"dlehnert","date_created":"2024-11-28T08:52:48Z","date_updated":"2024-11-28T08:52:48Z"}],"abstract":[{"text":"<jats:p>Additive manufacturing of metallic components often results in the formation of columnar grain structures aligned along the build direction. These elongated grains can introduce anisotropy, negatively impacting the mechanical properties of the components. This study aimed to achieve controlled solidification with a fine-grained microstructure to enhance the mechanical performance of printed parts. Stainless steel 316L was used as the test material. High-intensity ultrasound was applied during the direct energy deposition (DED) process to inhibit the formation of columnar grains. The investigation emphasized the importance of amplitude changes of the ultrasound wave as the system’s geometry continuously evolves with the addition of multiple layers and assessed how these changes influence the grain size and distribution. Initial tests revealed significant amplitude fluctuations during layer deposition, highlighting the impact of layer deposition on process uniformity. The mechanical results demonstrated that the application of ultrasound effectively refined the grain structure, leading to a 15% increase in tensile strength compared to conventionally additively manufactured samples.</jats:p>","lang":"eng"}],"publication":"Crystals","language":[{"iso":"eng"}],"ddc":["670"],"year":"2024","issue":"11","quality_controlled":"1","title":"The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component","date_created":"2024-11-28T08:45:06Z","publisher":"MDPI AG","status":"public","type":"journal_article","file_date_updated":"2024-11-28T08:52:48Z","article_number":"1001","user_id":"93904","department":[{"_id":"149"},{"_id":"321"},{"_id":"9"}],"_id":"57467","citation":{"bibtex":"@article{Lehnert_Bödger_Pabel_Scheidemann_Hemsel_Gnaase_Kostka_Tröster_2024, title={The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component}, volume={14}, DOI={<a href=\"https://doi.org/10.3390/cryst14111001\">10.3390/cryst14111001</a>}, number={111001}, journal={Crystals}, publisher={MDPI AG}, author={Lehnert, Dennis and Bödger, Christian and Pabel, Philipp and Scheidemann, Claus and Hemsel, Tobias and Gnaase, Stefan and Kostka, David and Tröster, Thomas}, year={2024} }","mla":"Lehnert, Dennis, et al. “The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component.” <i>Crystals</i>, vol. 14, no. 11, 1001, MDPI AG, 2024, doi:<a href=\"https://doi.org/10.3390/cryst14111001\">10.3390/cryst14111001</a>.","short":"D. Lehnert, C. Bödger, P. Pabel, C. Scheidemann, T. Hemsel, S. Gnaase, D. Kostka, T. Tröster, Crystals 14 (2024).","apa":"Lehnert, D., Bödger, C., Pabel, P., Scheidemann, C., Hemsel, T., Gnaase, S., Kostka, D., &#38; Tröster, T. (2024). The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component. <i>Crystals</i>, <i>14</i>(11), Article 1001. <a href=\"https://doi.org/10.3390/cryst14111001\">https://doi.org/10.3390/cryst14111001</a>","ama":"Lehnert D, Bödger C, Pabel P, et al. The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component. <i>Crystals</i>. 2024;14(11). doi:<a href=\"https://doi.org/10.3390/cryst14111001\">10.3390/cryst14111001</a>","ieee":"D. Lehnert <i>et al.</i>, “The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component,” <i>Crystals</i>, vol. 14, no. 11, Art. no. 1001, 2024, doi: <a href=\"https://doi.org/10.3390/cryst14111001\">10.3390/cryst14111001</a>.","chicago":"Lehnert, Dennis, Christian Bödger, Philipp Pabel, Claus Scheidemann, Tobias Hemsel, Stefan Gnaase, David Kostka, and Thomas Tröster. “The Influence of Ultrasonic Irradiation of a 316L Weld Pool Produced by DED on the Mechanical Properties of the Produced Component.” <i>Crystals</i> 14, no. 11 (2024). <a href=\"https://doi.org/10.3390/cryst14111001\">https://doi.org/10.3390/cryst14111001</a>."},"intvolume":"        14","publication_status":"published","publication_identifier":{"issn":["2073-4352"]},"has_accepted_license":"1","doi":"10.3390/cryst14111001","author":[{"last_name":"Lehnert","id":"90491","full_name":"Lehnert, Dennis","first_name":"Dennis"},{"last_name":"Bödger","id":"93904","full_name":"Bödger, Christian","first_name":"Christian"},{"id":"67374","full_name":"Pabel, Philipp","last_name":"Pabel","first_name":"Philipp"},{"id":"38259","full_name":"Scheidemann, Claus","last_name":"Scheidemann","first_name":"Claus"},{"id":"210","full_name":"Hemsel, Tobias","last_name":"Hemsel","first_name":"Tobias"},{"id":"25730","full_name":"Gnaase, Stefan","last_name":"Gnaase","first_name":"Stefan"},{"last_name":"Kostka","full_name":"Kostka, David","first_name":"David"},{"id":"553","full_name":"Tröster, Thomas","last_name":"Tröster","first_name":"Thomas"}],"volume":14,"date_updated":"2026-02-23T08:07:37Z"},{"publication":"DECHEMA-Workshop für Klebstoffanwender: Simulation von Klebverbindungen","type":"conference","status":"public","_id":"52211","department":[{"_id":"157"}],"user_id":"537","language":[{"iso":"eng"}],"quality_controlled":"1","year":"2024","corporate_editor":["DECHEMA"],"citation":{"chicago":"Beule, Felix, Dominik Teutenberg, and Gerson Meschut. “Klebstoffmodell - Parameteridentifikation, Verifikation Und Validierung Für Den Lastfall Crash.” In <i>DECHEMA-Workshop Für Klebstoffanwender: Simulation von Klebverbindungen</i>, edited by DECHEMA, 2024.","ieee":"F. Beule, D. Teutenberg, and G. Meschut, “Klebstoffmodell - Parameteridentifikation, Verifikation und Validierung für den Lastfall Crash,” in <i>DECHEMA-Workshop für Klebstoffanwender: Simulation von Klebverbindungen</i>, Köln, 2024.","ama":"Beule F, Teutenberg D, Meschut G. Klebstoffmodell - Parameteridentifikation, Verifikation und Validierung für den Lastfall Crash. In: DECHEMA, ed. <i>DECHEMA-Workshop Für Klebstoffanwender: Simulation von Klebverbindungen</i>. ; 2024.","apa":"Beule, F., Teutenberg, D., &#38; Meschut, G. (2024). Klebstoffmodell - Parameteridentifikation, Verifikation und Validierung für den Lastfall Crash. In DECHEMA (Ed.), <i>DECHEMA-Workshop für Klebstoffanwender: Simulation von Klebverbindungen</i>.","short":"F. Beule, D. Teutenberg, G. Meschut, in: DECHEMA (Ed.), DECHEMA-Workshop Für Klebstoffanwender: Simulation von Klebverbindungen, 2024.","mla":"Beule, Felix, et al. “Klebstoffmodell - Parameteridentifikation, Verifikation Und Validierung Für Den Lastfall Crash.” <i>DECHEMA-Workshop Für Klebstoffanwender: Simulation von Klebverbindungen</i>, edited by DECHEMA, 2024.","bibtex":"@inproceedings{Beule_Teutenberg_Meschut_2024, title={Klebstoffmodell - Parameteridentifikation, Verifikation und Validierung für den Lastfall Crash}, booktitle={DECHEMA-Workshop für Klebstoffanwender: Simulation von Klebverbindungen}, author={Beule, Felix and Teutenberg, Dominik and Meschut, Gerson}, editor={DECHEMA}, year={2024} }"},"date_updated":"2026-02-23T08:26:01Z","date_created":"2024-02-29T12:19:57Z","author":[{"first_name":"Felix","last_name":"Beule","full_name":"Beule, Felix","id":"66192"},{"id":"537","full_name":"Teutenberg, Dominik","last_name":"Teutenberg","first_name":"Dominik"},{"id":"32056","full_name":"Meschut, Gerson","last_name":"Meschut","orcid":"0000-0002-2763-1246","first_name":"Gerson"}],"title":"Klebstoffmodell - Parameteridentifikation, Verifikation und Validierung für den Lastfall Crash","conference":{"location":"Köln","end_date":"2024-02-26","start_date":"2024-02-26","name":"DECHEMA-Workshop für Klebstoffanwender: Simulation von Klebverbindungen"}},{"conference":{"location":"Köln","end_date":"2024-02-28","start_date":"2024-02-27","name":"24. Kolloquium: Gemeinsame Forschung in der Klebtechnik"},"title":"Methodenentwicklung zur Simulation von hyperelastischen Klebverbindungen unter Crashbelastung","author":[{"last_name":"Beule","id":"66192","full_name":"Beule, Felix","first_name":"Felix"},{"last_name":"Teutenberg","id":"537","full_name":"Teutenberg, Dominik","first_name":"Dominik"},{"first_name":"Gerson","id":"32056","full_name":"Meschut, Gerson","last_name":"Meschut","orcid":"0000-0002-2763-1246"},{"first_name":"Lars","full_name":"Schmelzle, Lars","last_name":"Schmelzle"},{"last_name":"Possart","full_name":"Possart, Gunnar","first_name":"Gunnar"},{"last_name":"Mergheim","full_name":"Mergheim, Julia","first_name":"Julia"},{"full_name":"Steinmann, Paul","last_name":"Steinmann","first_name":"Paul"}],"date_created":"2024-02-29T12:24:51Z","date_updated":"2026-02-23T08:26:30Z","citation":{"apa":"Beule, F., Teutenberg, D., Meschut, G., Schmelzle, L., Possart, G., Mergheim, J., &#38; Steinmann, P. (2024). <i>Methodenentwicklung zur Simulation von hyperelastischen Klebverbindungen unter Crashbelastung</i> (DECHEMA, Ed.).","bibtex":"@inproceedings{Beule_Teutenberg_Meschut_Schmelzle_Possart_Mergheim_Steinmann_2024, title={Methodenentwicklung zur Simulation von hyperelastischen Klebverbindungen unter Crashbelastung}, author={Beule, Felix and Teutenberg, Dominik and Meschut, Gerson and Schmelzle, Lars and Possart, Gunnar and Mergheim, Julia and Steinmann, Paul}, editor={DECHEMA}, year={2024} }","short":"F. Beule, D. Teutenberg, G. Meschut, L. Schmelzle, G. Possart, J. Mergheim, P. Steinmann, in: DECHEMA (Ed.), 2024.","mla":"Beule, Felix, et al. <i>Methodenentwicklung Zur Simulation von Hyperelastischen Klebverbindungen Unter Crashbelastung</i>. Edited by DECHEMA, 2024.","ieee":"F. Beule <i>et al.</i>, “Methodenentwicklung zur Simulation von hyperelastischen Klebverbindungen unter Crashbelastung,” Köln, 2024.","chicago":"Beule, Felix, Dominik Teutenberg, Gerson Meschut, Lars Schmelzle, Gunnar Possart, Julia Mergheim, and Paul Steinmann. “Methodenentwicklung Zur Simulation von Hyperelastischen Klebverbindungen Unter Crashbelastung.” edited by DECHEMA, 2024.","ama":"Beule F, Teutenberg D, Meschut G, et al. Methodenentwicklung zur Simulation von hyperelastischen Klebverbindungen unter Crashbelastung. In: DECHEMA, ed. ; 2024."},"corporate_editor":["DECHEMA"],"year":"2024","quality_controlled":"1","language":[{"iso":"eng"}],"user_id":"537","department":[{"_id":"157"}],"_id":"52214","status":"public","type":"conference"}]