3 Publications

Mark all

[3]
2026 | Journal Article | LibreCat-ID: 65553
S. A. Golebiowska, D. Meinderink, C. Ebbert, S. Kollmann, V. Neßlinger, and G. Grundmeier, “Two-electrode electrochemical impedance spectroscopy at polymer/oxide interfaces,” International Journal of Adhesion and Adhesives, vol. 149, Art. no. 104360, 2026, doi: 10.1016/j.ijadhadh.2026.104360.
LibreCat | DOI
 
[2]
2025 | Journal Article | LibreCat-ID: 59992
X. Xu, S. A. Golebiowska, T. de los Arcos, G. Grundmeier, and A. Keller, “DNA origami adsorption at single-crystalline TiO2 surfaces,” RSC Applied Interfaces, 2025, doi: 10.1039/d5lf00109a.
LibreCat | DOI
 
[1]
2025 | Journal Article | LibreCat-ID: 60913
S. A. Golebiowska, M. Voigt, T. de los Arcos, and G. Grundmeier, “In Situ PM‐IRRAS and XPS Analysis of Nitrogen Plasma Surface Modification of Polylactide Thin Films,” Surface and Interface Analysis, vol. 57, no. 7, pp. 499–509, 2025, doi: 10.1002/sia.7406.
LibreCat | DOI
 

Search

Filter Publications

Display / Sort

Citation Style: IEEE

Export / Embed

3 Publications

Mark all

[3]
2026 | Journal Article | LibreCat-ID: 65553
S. A. Golebiowska, D. Meinderink, C. Ebbert, S. Kollmann, V. Neßlinger, and G. Grundmeier, “Two-electrode electrochemical impedance spectroscopy at polymer/oxide interfaces,” International Journal of Adhesion and Adhesives, vol. 149, Art. no. 104360, 2026, doi: 10.1016/j.ijadhadh.2026.104360.
LibreCat | DOI
 
[2]
2025 | Journal Article | LibreCat-ID: 59992
X. Xu, S. A. Golebiowska, T. de los Arcos, G. Grundmeier, and A. Keller, “DNA origami adsorption at single-crystalline TiO2 surfaces,” RSC Applied Interfaces, 2025, doi: 10.1039/d5lf00109a.
LibreCat | DOI
 
[1]
2025 | Journal Article | LibreCat-ID: 60913
S. A. Golebiowska, M. Voigt, T. de los Arcos, and G. Grundmeier, “In Situ PM‐IRRAS and XPS Analysis of Nitrogen Plasma Surface Modification of Polylactide Thin Films,” Surface and Interface Analysis, vol. 57, no. 7, pp. 499–509, 2025, doi: 10.1002/sia.7406.
LibreCat | DOI
 

Search

Filter Publications

Display / Sort

Citation Style: IEEE

Export / Embed