Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments

D. Weber, S. Heid, H. Bode, J. Lange, E. Hüllermeier, O. Wallscheid, IEEE Access 9 (2021) 35654–35669.

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Journal Article | English
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Journal Title
IEEE Access
Volume
9
Page
35654–35669
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Weber D, Heid S, Bode H, Lange J, Hüllermeier E, Wallscheid O. Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments. IEEE Access. 2021;9:35654–35669. doi:10.1109/ACCESS.2021.3062144
Weber, D., Heid, S., Bode, H., Lange, J., Hüllermeier, E., & Wallscheid, O. (2021). Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments. IEEE Access, 9, 35654–35669. https://doi.org/10.1109/ACCESS.2021.3062144
@article{Weber_Heid_Bode_Lange_Hüllermeier_Wallscheid_2021, title={Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments}, volume={9}, DOI={10.1109/ACCESS.2021.3062144}, journal={IEEE Access}, publisher={IEEE}, author={Weber, Daniel and Heid, Stefan and Bode, Henrik and Lange, Jarren and Hüllermeier, Eyke and Wallscheid, Oliver}, year={2021}, pages={35654–35669} }
Weber, Daniel, Stefan Heid, Henrik Bode, Jarren Lange, Eyke Hüllermeier, and Oliver Wallscheid. “Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments.” IEEE Access 9 (2021): 35654–35669. https://doi.org/10.1109/ACCESS.2021.3062144.
D. Weber, S. Heid, H. Bode, J. Lange, E. Hüllermeier, and O. Wallscheid, “Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments,” IEEE Access, vol. 9, pp. 35654–35669, 2021, doi: 10.1109/ACCESS.2021.3062144.
Weber, Daniel, et al. “Safe Bayesian Optimization for Data-Driven Power Electronics Control Design in Microgrids: From Simulations to Real-World Experiments.” IEEE Access, vol. 9, IEEE, 2021, pp. 35654–35669, doi:10.1109/ACCESS.2021.3062144.

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