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5 Publications
2023 | Conference Paper | LibreCat-ID: 35426 | 
Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?
C. Richter, J.F. Haltermann, M.-C. Jakobs, F. Pauck, S. Schott, H. Wehrheim, in: 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023.
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C. Richter, J.F. Haltermann, M.-C. Jakobs, F. Pauck, S. Schott, H. Wehrheim, in: 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023.
2020 | Preprint | LibreCat-ID: 17825
Cooperative Verification via Collective Invariant Generation
J.F. Haltermann, H. Wehrheim, ArXiv:2008.04551 (2020).
LibreCat
J.F. Haltermann, H. Wehrheim, ArXiv:2008.04551 (2020).
2019 | Mastersthesis | LibreCat-ID: 12885
Analyzing Data Usage in Array Programs
J.F. Haltermann, Analyzing Data Usage in Array Programs, 2019.
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J.F. Haltermann, Analyzing Data Usage in Array Programs, 2019.
2018 | Conference Paper | LibreCat-ID: 3265 |
Fully-Featured Anonymous Credentials with Reputation System
K. Bemmann, J. Blömer, J. Bobolz, H. Bröcher, D.P. Diemert, F. Eidens, L. Eilers, J.F. Haltermann, J. Juhnke, B. Otour, L.A. Porzenheim, S. Pukrop, E. Schilling, M. Schlichtig, M. Stienemeier, in: Proceedings of the 13th International Conference on Availability, Reliability and Security - ARES ’18, ACM, New York, NY, USA, n.d.
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K. Bemmann, J. Blömer, J. Bobolz, H. Bröcher, D.P. Diemert, F. Eidens, L. Eilers, J.F. Haltermann, J. Juhnke, B. Otour, L.A. Porzenheim, S. Pukrop, E. Schilling, M. Schlichtig, M. Stienemeier, in: Proceedings of the 13th International Conference on Availability, Reliability and Security - ARES ’18, ACM, New York, NY, USA, n.d.
2018 | Conference Paper | LibreCat-ID: 3414
JMCTest: Automatically Testing Inter-Method Contracts in Java
P. Börding, J.F. Haltermann, M.-C. Jakobs, H. Wehrheim, in: Proceedings of the IFIP International Conference on Testing Software and Systems (ICTSS 2018), Springer, 2018, pp. 39--55.
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P. Börding, J.F. Haltermann, M.-C. Jakobs, H. Wehrheim, in: Proceedings of the IFIP International Conference on Testing Software and Systems (ICTSS 2018), Springer, 2018, pp. 39--55.