{"publication_identifier":{"isbn":["9781538604724"]},"author":[{"full_name":"Kampmann, Matthias","first_name":"Matthias","last_name":"Kampmann","id":"10935"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209"}],"year":"2017","title":"Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test","status":"public","date_updated":"2022-05-11T17:14:51Z","publication_status":"published","_id":"10576","language":[{"iso":"eng"}],"publisher":"IEEE","doi":"10.1109/ddecs.2017.7934564","user_id":"209","citation":{"mla":"Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” <i>20th IEEE International Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>, IEEE, 2017, doi:<a href=\"https://doi.org/10.1109/ddecs.2017.7934564\">10.1109/ddecs.2017.7934564</a>.","bibtex":"@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test}, DOI={<a href=\"https://doi.org/10.1109/ddecs.2017.7934564\">10.1109/ddecs.2017.7934564</a>}, booktitle={20th IEEE International Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }","ama":"Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. In: <i>20th IEEE International Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>. IEEE; 2017. doi:<a href=\"https://doi.org/10.1109/ddecs.2017.7934564\">10.1109/ddecs.2017.7934564</a>","ieee":"M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test,” 2017, doi: <a href=\"https://doi.org/10.1109/ddecs.2017.7934564\">10.1109/ddecs.2017.7934564</a>.","apa":"Kampmann, M., &#38; Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. <i>20th IEEE International Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>. <a href=\"https://doi.org/10.1109/ddecs.2017.7934564\">https://doi.org/10.1109/ddecs.2017.7934564</a>","chicago":"Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” In <i>20th IEEE International Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>. IEEE, 2017. <a href=\"https://doi.org/10.1109/ddecs.2017.7934564\">https://doi.org/10.1109/ddecs.2017.7934564</a>.","short":"M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17), IEEE, 2017."},"publication":"20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS'17)","date_created":"2019-07-05T08:23:56Z","department":[{"_id":"48"}],"type":"conference"}