{"user_id":"3118","citation":{"bibtex":"@inproceedings{Anwer_Platzner_2016, title={Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs}, DOI={10.1109/DSD.2016.35}, booktitle={Euromicro Conference on Digital System Design (DSD)}, author={Anwer, Jahanzeb and Platzner, Marco}, year={2016} }","chicago":"Anwer, Jahanzeb, and Marco Platzner. “Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs.” In Euromicro Conference on Digital System Design (DSD), 2016. https://doi.org/10.1109/DSD.2016.35.","short":"J. Anwer, M. Platzner, in: Euromicro Conference on Digital System Design (DSD), 2016.","mla":"Anwer, Jahanzeb, and Marco Platzner. “Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs.” Euromicro Conference on Digital System Design (DSD), 2016, doi:10.1109/DSD.2016.35.","ama":"Anwer J, Platzner M. Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs. In: Euromicro Conference on Digital System Design (DSD). ; 2016. doi:10.1109/DSD.2016.35","ieee":"J. Anwer and M. Platzner, “Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs,” in Euromicro Conference on Digital System Design (DSD), 2016.","apa":"Anwer, J., & Platzner, M. (2016). Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs. In Euromicro Conference on Digital System Design (DSD). https://doi.org/10.1109/DSD.2016.35"},"date_created":"2019-07-10T09:33:00Z","title":"Boolean Difference Based Reliability Evaluation of Fault Tolerant Circuit Structures on FPGAs","_id":"10622","department":[{"_id":"78"}],"author":[{"first_name":"Jahanzeb","full_name":"Anwer, Jahanzeb","last_name":"Anwer"},{"full_name":"Platzner, Marco","last_name":"Platzner","id":"398","first_name":"Marco"}],"status":"public","year":"2016","date_updated":"2022-01-06T06:50:48Z","type":"conference","publication":"Euromicro Conference on Digital System Design (DSD)","doi":"10.1109/DSD.2016.35","language":[{"iso":"eng"}]}