---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Hassan
      foaf_name: Ghasemzadeh Mohammadi, Hassan
      foaf_surname: Ghasemzadeh Mohammadi
      foaf_workInfoHomepage: http://www.librecat.org/personId=61186
  - foaf_Person:
      foaf_givenName: Pierre-Emmanuel
      foaf_name: Gaillardon, Pierre-Emmanuel
      foaf_surname: Gaillardon
  - foaf_Person:
      foaf_givenName: Giovanni
      foaf_name: De Micheli, Giovanni
      foaf_surname: De Micheli
  bibo_doi: 10.1109/TNANO.2015.2482359
  bibo_issue: '6'
  bibo_volume: 14
  dct_date: 2015^xs_gYear
  dct_language: eng
  dct_publisher: IEEE@
  dct_title: From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity
    Silicon Nanowires@
...