{"status":"public","type":"conference","publication":"Proceedings of the 2015 Design, Automation & Test in Europe Conference \\& Exhibition","extern":"1","language":[{"iso":"eng"}],"_id":"10772","user_id":"3118","department":[{"_id":"78"}],"year":"2015","citation":{"ama":"Ghasemzadeh Mohammadi H, Gaillardon P-E, De Micheli G. Fault modeling in controllable polarity silicon nanowire circuits. In: <i>Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition</i>. EDA Consortium; 2015:453-458. doi:<a href=\"https://doi.org/10.7873/DATE.2015.0428\">10.7873/DATE.2015.0428</a>","chicago":"Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “Fault Modeling in Controllable Polarity Silicon Nanowire Circuits.” In <i>Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition</i>, 453–58. EDA Consortium, 2015. <a href=\"https://doi.org/10.7873/DATE.2015.0428\">https://doi.org/10.7873/DATE.2015.0428</a>.","ieee":"H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, and G. De Micheli, “Fault modeling in controllable polarity silicon nanowire circuits,” in <i>Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition</i>, 2015, pp. 453–458.","apa":"Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., &#38; De Micheli, G. (2015). Fault modeling in controllable polarity silicon nanowire circuits. In <i>Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition</i> (pp. 453–458). EDA Consortium. <a href=\"https://doi.org/10.7873/DATE.2015.0428\">https://doi.org/10.7873/DATE.2015.0428</a>","short":"H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, in: Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition, EDA Consortium, 2015, pp. 453–458.","mla":"Ghasemzadeh Mohammadi, Hassan, et al. “Fault Modeling in Controllable Polarity Silicon Nanowire Circuits.” <i>Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition</i>, EDA Consortium, 2015, pp. 453–58, doi:<a href=\"https://doi.org/10.7873/DATE.2015.0428\">10.7873/DATE.2015.0428</a>.","bibtex":"@inproceedings{Ghasemzadeh Mohammadi_Gaillardon_De Micheli_2015, title={Fault modeling in controllable polarity silicon nanowire circuits}, DOI={<a href=\"https://doi.org/10.7873/DATE.2015.0428\">10.7873/DATE.2015.0428</a>}, booktitle={Proceedings of the 2015 Design, Automation &#38; Test in Europe Conference \\&#38; Exhibition}, publisher={EDA Consortium}, author={Ghasemzadeh Mohammadi, Hassan and Gaillardon, Pierre-Emmanuel and De Micheli, Giovanni}, year={2015}, pages={453–458} }"},"page":"453-458","title":"Fault modeling in controllable polarity silicon nanowire circuits","doi":"10.7873/DATE.2015.0428","date_updated":"2022-01-06T06:50:50Z","publisher":"EDA Consortium","date_created":"2019-07-10T12:08:17Z","author":[{"first_name":"Hassan","id":"61186","full_name":"Ghasemzadeh Mohammadi, Hassan","last_name":"Ghasemzadeh Mohammadi"},{"full_name":"Gaillardon, Pierre-Emmanuel","last_name":"Gaillardon","first_name":"Pierre-Emmanuel"},{"first_name":"Giovanni","full_name":"De Micheli, Giovanni","last_name":"De Micheli"}]}