{"_id":"10774","citation":{"chicago":"Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Majid Yazdani, and Giovanni De Micheli. “A Fast TCAD-Based Methodology for Variation Analysis of Emerging Nano-Devices.” In <i>2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)</i>, 83–88. IEEE, 2013. <a href=\"https://doi.org/10.1109/DFT.2013.6653587\">https://doi.org/10.1109/DFT.2013.6653587</a>.","bibtex":"@inproceedings{Ghasemzadeh Mohammadi_Gaillardon_Yazdani_De Micheli_2013, title={A fast TCAD-based methodology for Variation analysis of emerging nano-devices}, DOI={<a href=\"https://doi.org/10.1109/DFT.2013.6653587\">10.1109/DFT.2013.6653587</a>}, booktitle={2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)}, publisher={IEEE}, author={Ghasemzadeh Mohammadi, Hassan and Gaillardon, Pierre-Emmanuel and Yazdani, Majid and De Micheli, Giovanni}, year={2013}, pages={83–88} }","mla":"Ghasemzadeh Mohammadi, Hassan, et al. “A Fast TCAD-Based Methodology for Variation Analysis of Emerging Nano-Devices.” <i>2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)</i>, IEEE, 2013, pp. 83–88, doi:<a href=\"https://doi.org/10.1109/DFT.2013.6653587\">10.1109/DFT.2013.6653587</a>.","ieee":"H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, and G. De Micheli, “A fast TCAD-based methodology for Variation analysis of emerging nano-devices,” in <i>2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)</i>, 2013, pp. 83–88.","short":"H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), IEEE, 2013, pp. 83–88.","apa":"Ghasemzadeh Mohammadi, H., Gaillardon, P.-E., Yazdani, M., &#38; De Micheli, G. (2013). A fast TCAD-based methodology for Variation analysis of emerging nano-devices. In <i>2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)</i> (pp. 83–88). IEEE. <a href=\"https://doi.org/10.1109/DFT.2013.6653587\">https://doi.org/10.1109/DFT.2013.6653587</a>","ama":"Ghasemzadeh Mohammadi H, Gaillardon P-E, Yazdani M, De Micheli G. A fast TCAD-based methodology for Variation analysis of emerging nano-devices. In: <i>2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)</i>. IEEE; 2013:83-88. doi:<a href=\"https://doi.org/10.1109/DFT.2013.6653587\">10.1109/DFT.2013.6653587</a>"},"author":[{"last_name":"Ghasemzadeh Mohammadi","first_name":"Hassan","id":"61186","full_name":"Ghasemzadeh Mohammadi, Hassan"},{"full_name":"Gaillardon, Pierre-Emmanuel","last_name":"Gaillardon","first_name":"Pierre-Emmanuel"},{"first_name":"Majid","last_name":"Yazdani","full_name":"Yazdani, Majid"},{"full_name":"De Micheli, Giovanni","first_name":"Giovanni","last_name":"De Micheli"}],"extern":"1","page":"83-88","date_updated":"2022-01-06T06:50:50Z","year":"2013","language":[{"iso":"eng"}],"title":"A fast TCAD-based methodology for Variation analysis of emerging nano-devices","status":"public","user_id":"3118","date_created":"2019-07-10T12:10:17Z","department":[{"_id":"78"}],"publication":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","doi":"10.1109/DFT.2013.6653587","type":"conference","publisher":"IEEE"}