---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Ronja
      foaf_name: Köthemann, Ronja
      foaf_surname: Köthemann
  - foaf_Person:
      foaf_givenName: Nils
      foaf_name: Weber, Nils
      foaf_surname: Weber
  - foaf_Person:
      foaf_givenName: Jörg K N
      foaf_name: Lindner, Jörg K N
      foaf_surname: Lindner
  - foaf_Person:
      foaf_givenName: Cedrik
      foaf_name: Meier, Cedrik
      foaf_surname: Meier
      foaf_workInfoHomepage: http://www.librecat.org/personId=20798
    orcid: https://orcid.org/0000-0002-3787-3572
  bibo_doi: 10.1088/1361-6641/ab3536
  bibo_issue: '9'
  bibo_volume: 34
  dct_date: 2019^xs_gYear
  dct_isPartOf:
  - http://id.crossref.org/issn/0268-1242
  - http://id.crossref.org/issn/1361-6641
  dct_language: eng
  dct_title: 'High-precision determination of silicon nanocrystals: optical spectroscopy
    versus electron microscopy@'
...