High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy Köthemann, Ronja Weber, Nils Lindner, Jörg K N Meier, Cedrik ddc:530 2019 info:eu-repo/semantics/article doc-type:article text http://purl.org/coar/resource_type/c_6501 https://ris.uni-paderborn.de/record/12930 Köthemann R, Weber N, Lindner JKN, Meier C. High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. <i>Semiconductor Science and Technology</i>. 2019;34(9). doi:<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a> eng info:eu-repo/semantics/altIdentifier/doi/10.1088/1361-6641/ab3536 info:eu-repo/semantics/altIdentifier/issn/0268-1242 info:eu-repo/semantics/altIdentifier/issn/1361-6641 info:eu-repo/semantics/closedAccess