{"ddc":["530"],"publication_status":"published","issue":"9","article_number":"095009","doi":"10.1088/1361-6641/ab3536","project":[{"name":"TRR 142","_id":"53"},{"_id":"55","name":"TRR 142 - Project Area B"},{"name":"TRR 142 - Subproject B1","_id":"66"},{"_id":"56","name":"TRR 142 - Project Area C"},{"_id":"75","name":"TRR 142 - Subproject C5"}],"date_created":"2019-08-14T11:12:33Z","language":[{"iso":"eng"}],"type":"journal_article","date_updated":"2022-01-06T06:51:26Z","publication":"Semiconductor Science and Technology","status":"public","intvolume":"        34","year":"2019","author":[{"last_name":"Köthemann","full_name":"Köthemann, Ronja","first_name":"Ronja"},{"last_name":"Weber","full_name":"Weber, Nils","first_name":"Nils"},{"full_name":"Lindner, Jörg K N","last_name":"Lindner","first_name":"Jörg K N"},{"first_name":"Cedrik","orcid":"https://orcid.org/0000-0002-3787-3572","full_name":"Meier, Cedrik","id":"20798","last_name":"Meier"}],"_id":"12930","title":"High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy","department":[{"_id":"15"},{"_id":"230"},{"_id":"429"},{"_id":"287"}],"publication_identifier":{"issn":["0268-1242","1361-6641"]},"volume":34,"user_id":"20798","citation":{"bibtex":"@article{Köthemann_Weber_Lindner_Meier_2019, title={High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy}, volume={34}, DOI={<a href=\"https://doi.org/10.1088/1361-6641/ab3536\">10.1088/1361-6641/ab3536</a>}, number={9095009}, journal={Semiconductor Science and Technology}, author={Köthemann, Ronja and Weber, Nils and Lindner, Jörg K N and Meier, Cedrik}, year={2019} }","chicago":"Köthemann, Ronja, Nils Weber, Jörg K N Lindner, and Cedrik Meier. “High-Precision Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.” <i>Semiconductor Science and Technology</i> 34, no. 9 (2019). <a href=\"https://doi.org/10.1088/1361-6641/ab3536\">https://doi.org/10.1088/1361-6641/ab3536</a>.","short":"R. Köthemann, N. Weber, J.K.N. Lindner, C. Meier, Semiconductor Science and Technology 34 (2019).","mla":"Köthemann, Ronja, et al. “High-Precision Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.” <i>Semiconductor Science and Technology</i>, vol. 34, no. 9, 095009, 2019, doi:<a href=\"https://doi.org/10.1088/1361-6641/ab3536\">10.1088/1361-6641/ab3536</a>.","ama":"Köthemann R, Weber N, Lindner JKN, Meier C. High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. <i>Semiconductor Science and Technology</i>. 2019;34(9). doi:<a href=\"https://doi.org/10.1088/1361-6641/ab3536\">10.1088/1361-6641/ab3536</a>","ieee":"R. Köthemann, N. Weber, J. K. N. Lindner, and C. Meier, “High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy,” <i>Semiconductor Science and Technology</i>, vol. 34, no. 9, 2019.","apa":"Köthemann, R., Weber, N., Lindner, J. K. N., &#38; Meier, C. (2019). High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. <i>Semiconductor Science and Technology</i>, <i>34</i>(9). <a href=\"https://doi.org/10.1088/1361-6641/ab3536\">https://doi.org/10.1088/1361-6641/ab3536</a>"}}