article published Ronja Köthemann author Nils Weber author Jörg K N Lindner author Cedrik Meier author 20798https://orcid.org/0000-0002-3787-3572 15 department 230 department 429 department 287 department TRR 142 project TRR 142 - Project Area B project TRR 142 - Subproject B1 project TRR 142 - Project Area C project TRR 142 - Subproject C5 project 2019 eng 0268-1242 1361-664110.1088/1361-6641/ab3536 349 Köthemann R, Weber N, Lindner JKN, Meier C. High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. <i>Semiconductor Science and Technology</i>. 2019;34(9). doi:<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a> R. Köthemann, N. Weber, J. K. N. Lindner, and C. Meier, “High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy,” <i>Semiconductor Science and Technology</i>, vol. 34, no. 9, 2019. Köthemann, Ronja, Nils Weber, Jörg K N Lindner, and Cedrik Meier. “High-Precision Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.” <i>Semiconductor Science and Technology</i> 34, no. 9 (2019). <a href="https://doi.org/10.1088/1361-6641/ab3536">https://doi.org/10.1088/1361-6641/ab3536</a>. Köthemann, R., Weber, N., Lindner, J. K. N., &#38; Meier, C. (2019). High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy. <i>Semiconductor Science and Technology</i>, <i>34</i>(9). <a href="https://doi.org/10.1088/1361-6641/ab3536">https://doi.org/10.1088/1361-6641/ab3536</a> R. Köthemann, N. Weber, J.K.N. Lindner, C. Meier, Semiconductor Science and Technology 34 (2019). @article{Köthemann_Weber_Lindner_Meier_2019, title={High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy}, volume={34}, DOI={<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a>}, number={9095009}, journal={Semiconductor Science and Technology}, author={Köthemann, Ronja and Weber, Nils and Lindner, Jörg K N and Meier, Cedrik}, year={2019} } Köthemann, Ronja, et al. “High-Precision Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.” <i>Semiconductor Science and Technology</i>, vol. 34, no. 9, 095009, 2019, doi:<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a>. 129302019-08-14T11:12:33Z2022-01-06T06:51:26Z