---
_id: '12930'
article_number: '095009'
author:
- first_name: Ronja
  full_name: Köthemann, Ronja
  last_name: Köthemann
- first_name: Nils
  full_name: Weber, Nils
  last_name: Weber
- first_name: Jörg K N
  full_name: Lindner, Jörg K N
  last_name: Lindner
- first_name: Cedrik
  full_name: Meier, Cedrik
  id: '20798'
  last_name: Meier
  orcid: https://orcid.org/0000-0002-3787-3572
citation:
  ama: 'Köthemann R, Weber N, Lindner JKN, Meier C. High-precision determination of
    silicon nanocrystals: optical spectroscopy versus electron microscopy. <i>Semiconductor
    Science and Technology</i>. 2019;34(9). doi:<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a>'
  apa: 'Köthemann, R., Weber, N., Lindner, J. K. N., &#38; Meier, C. (2019). High-precision
    determination of silicon nanocrystals: optical spectroscopy versus electron microscopy.
    <i>Semiconductor Science and Technology</i>, <i>34</i>(9). <a href="https://doi.org/10.1088/1361-6641/ab3536">https://doi.org/10.1088/1361-6641/ab3536</a>'
  bibtex: '@article{Köthemann_Weber_Lindner_Meier_2019, title={High-precision determination
    of silicon nanocrystals: optical spectroscopy versus electron microscopy}, volume={34},
    DOI={<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a>},
    number={9095009}, journal={Semiconductor Science and Technology}, author={Köthemann,
    Ronja and Weber, Nils and Lindner, Jörg K N and Meier, Cedrik}, year={2019} }'
  chicago: 'Köthemann, Ronja, Nils Weber, Jörg K N Lindner, and Cedrik Meier. “High-Precision
    Determination of Silicon Nanocrystals: Optical Spectroscopy versus Electron Microscopy.”
    <i>Semiconductor Science and Technology</i> 34, no. 9 (2019). <a href="https://doi.org/10.1088/1361-6641/ab3536">https://doi.org/10.1088/1361-6641/ab3536</a>.'
  ieee: 'R. Köthemann, N. Weber, J. K. N. Lindner, and C. Meier, “High-precision determination
    of silicon nanocrystals: optical spectroscopy versus electron microscopy,” <i>Semiconductor
    Science and Technology</i>, vol. 34, no. 9, 2019.'
  mla: 'Köthemann, Ronja, et al. “High-Precision Determination of Silicon Nanocrystals:
    Optical Spectroscopy versus Electron Microscopy.” <i>Semiconductor Science and
    Technology</i>, vol. 34, no. 9, 095009, 2019, doi:<a href="https://doi.org/10.1088/1361-6641/ab3536">10.1088/1361-6641/ab3536</a>.'
  short: R. Köthemann, N. Weber, J.K.N. Lindner, C. Meier, Semiconductor Science and
    Technology 34 (2019).
date_created: 2019-08-14T11:12:33Z
date_updated: 2022-01-06T06:51:26Z
ddc:
- '530'
department:
- _id: '15'
- _id: '230'
- _id: '429'
- _id: '287'
doi: 10.1088/1361-6641/ab3536
intvolume: '        34'
issue: '9'
language:
- iso: eng
project:
- _id: '53'
  name: TRR 142
- _id: '55'
  name: TRR 142 - Project Area B
- _id: '66'
  name: TRR 142 - Subproject B1
- _id: '56'
  name: TRR 142 - Project Area C
- _id: '75'
  name: TRR 142 - Subproject C5
publication: Semiconductor Science and Technology
publication_identifier:
  issn:
  - 0268-1242
  - 1361-6641
publication_status: published
status: public
title: 'High-precision determination of silicon nanocrystals: optical spectroscopy
  versus electron microscopy'
type: journal_article
user_id: '20798'
volume: 34
year: '2019'
...