{"publisher":"IEEE","department":[{"_id":"48"}],"publication":"35th IEEE VLSI Test Symposium (VTS'17)","place":"Caesars Palace, Las Vegas, Nevada, USA","title":"Special Session on Early Life Failures","author":[{"full_name":"Deshmukh, Jyotirmoy","last_name":"Deshmukh","first_name":"Jyotirmoy"},{"first_name":"Wolfgang","last_name":"Kunz","full_name":"Kunz, Wolfgang"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"last_name":"Hellebrand","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille"}],"citation":{"mla":"Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” 35th IEEE VLSI Test Symposium (VTS’17), IEEE, 2017, doi:10.1109/vts.2017.7928933.","short":"J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.","apa":"Deshmukh, J., Kunz, W., Wunderlich, H.-J., & Hellebrand, S. (2017). Special Session on Early Life Failures. In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE. https://doi.org/10.1109/vts.2017.7928933","bibtex":"@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={10.1109/vts.2017.7928933}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }","ama":"Deshmukh J, Kunz W, Wunderlich H-J, Hellebrand S. Special Session on Early Life Failures. In: 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE; 2017. doi:10.1109/vts.2017.7928933","ieee":"J. Deshmukh, W. Kunz, H.-J. Wunderlich, and S. Hellebrand, “Special Session on Early Life Failures,” in 35th IEEE VLSI Test Symposium (VTS’17), 2017.","chicago":"Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.” In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017. https://doi.org/10.1109/vts.2017.7928933."},"status":"public","doi":"10.1109/vts.2017.7928933","_id":"12973","user_id":"209","language":[{"iso":"eng"}],"date_created":"2019-08-28T08:37:58Z","type":"conference","year":"2017","date_updated":"2022-01-06T06:51:27Z"}