{"publication":"35th IEEE VLSI Test Symposium (VTS'17)","date_updated":"2022-01-06T06:51:27Z","type":"conference","doi":"10.1109/vts.2017.7928933","language":[{"iso":"eng"}],"date_created":"2019-08-28T08:37:58Z","citation":{"bibtex":"@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={<a href=\"https://doi.org/10.1109/vts.2017.7928933\">10.1109/vts.2017.7928933</a>}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }","short":"J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.","chicago":"Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.” In <i>35th IEEE VLSI Test Symposium (VTS’17)</i>. Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017. <a href=\"https://doi.org/10.1109/vts.2017.7928933\">https://doi.org/10.1109/vts.2017.7928933</a>.","mla":"Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” <i>35th IEEE VLSI Test Symposium (VTS’17)</i>, IEEE, 2017, doi:<a href=\"https://doi.org/10.1109/vts.2017.7928933\">10.1109/vts.2017.7928933</a>.","ama":"Deshmukh J, Kunz W, Wunderlich H-J, Hellebrand S. Special Session on Early Life Failures. In: <i>35th IEEE VLSI Test Symposium (VTS’17)</i>. Caesars Palace, Las Vegas, Nevada, USA: IEEE; 2017. doi:<a href=\"https://doi.org/10.1109/vts.2017.7928933\">10.1109/vts.2017.7928933</a>","ieee":"J. Deshmukh, W. Kunz, H.-J. Wunderlich, and S. Hellebrand, “Special Session on Early Life Failures,” in <i>35th IEEE VLSI Test Symposium (VTS’17)</i>, 2017.","apa":"Deshmukh, J., Kunz, W., Wunderlich, H.-J., &#38; Hellebrand, S. (2017). Special Session on Early Life Failures. In <i>35th IEEE VLSI Test Symposium (VTS’17)</i>. Caesars Palace, Las Vegas, Nevada, USA: IEEE. <a href=\"https://doi.org/10.1109/vts.2017.7928933\">https://doi.org/10.1109/vts.2017.7928933</a>"},"user_id":"209","department":[{"_id":"48"}],"title":"Special Session on Early Life Failures","_id":"12973","publisher":"IEEE","author":[{"last_name":"Deshmukh","full_name":"Deshmukh, Jyotirmoy","first_name":"Jyotirmoy"},{"first_name":"Wolfgang","last_name":"Kunz","full_name":"Kunz, Wolfgang"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"}],"place":"Caesars Palace, Las Vegas, Nevada, USA","year":"2017","status":"public"}