{"date_updated":"2022-01-06T06:51:27Z","type":"conference","page":"1-6","year":"2016","date_created":"2019-08-28T08:53:04Z","language":[{"iso":"eng"}],"user_id":"209","_id":"12975","doi":"10.1109/ats.2016.20","status":"public","citation":{"bibtex":"@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={<a href=\"https://doi.org/10.1109/ats.2016.20\">10.1109/ats.2016.20</a>}, booktitle={25th IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2016}, pages={1–6} }","ama":"Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In: <i>25th IEEE Asian Test Symposium (ATS’16)</i>. Hiroshima, Japan: IEEE; 2016:1-6. doi:<a href=\"https://doi.org/10.1109/ats.2016.20\">10.1109/ats.2016.20</a>","chicago":"Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” In <i>25th IEEE Asian Test Symposium (ATS’16)</i>, 1–6. Hiroshima, Japan: IEEE, 2016. <a href=\"https://doi.org/10.1109/ats.2016.20\">https://doi.org/10.1109/ats.2016.20</a>.","ieee":"M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test,” in <i>25th IEEE Asian Test Symposium (ATS’16)</i>, 2016, pp. 1–6.","mla":"Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” <i>25th IEEE Asian Test Symposium (ATS’16)</i>, IEEE, 2016, pp. 1–6, doi:<a href=\"https://doi.org/10.1109/ats.2016.20\">10.1109/ats.2016.20</a>.","apa":"Kampmann, M., &#38; Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In <i>25th IEEE Asian Test Symposium (ATS’16)</i> (pp. 1–6). Hiroshima, Japan: IEEE. <a href=\"https://doi.org/10.1109/ats.2016.20\">https://doi.org/10.1109/ats.2016.20</a>","short":"M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6."},"title":"X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test","author":[{"first_name":"Matthias","full_name":"Kampmann, Matthias","id":"10935","last_name":"Kampmann"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"}],"department":[{"_id":"48"}],"place":"Hiroshima, Japan","publication":"25th IEEE Asian Test Symposium (ATS'16)","publisher":"IEEE"}