--- _id: '12975' author: - first_name: Matthias full_name: Kampmann, Matthias id: '10935' last_name: Kampmann - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: 'Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In: 25th IEEE Asian Test Symposium (ATS’16). Hiroshima, Japan: IEEE; 2016:1-6. doi:10.1109/ats.2016.20' apa: 'Kampmann, M., & Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium (ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE. https://doi.org/10.1109/ats.2016.20' bibtex: '@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={25th IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2016}, pages={1–6} }' chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” In 25th IEEE Asian Test Symposium (ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016. https://doi.org/10.1109/ats.2016.20.' ieee: 'M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test,” in 25th IEEE Asian Test Symposium (ATS’16), 2016, pp. 1–6.' mla: 'Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” 25th IEEE Asian Test Symposium (ATS’16), IEEE, 2016, pp. 1–6, doi:10.1109/ats.2016.20.' short: 'M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.' date_created: 2019-08-28T08:53:04Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' doi: 10.1109/ats.2016.20 language: - iso: eng page: 1-6 place: Hiroshima, Japan publication: 25th IEEE Asian Test Symposium (ATS'16) publisher: IEEE status: public title: 'X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test' type: conference user_id: '209' year: '2016' ...