{"_id":"12976","user_id":"209","date_created":"2019-08-28T09:03:08Z","language":[{"iso":"eng"}],"doi":"10.1109/ats.2015.26","date_updated":"2022-01-06T06:51:27Z","year":"2015","page":"109-114","type":"conference","place":"Mumbai, India","publication":"24th IEEE Asian Test Symposium (ATS'15)","department":[{"_id":"48"}],"publisher":"IEEE","citation":{"chicago":"Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” In 24th IEEE Asian Test Symposium (ATS’15), 109–14. Mumbai, India: IEEE, 2015. https://doi.org/10.1109/ats.2015.26.","ieee":"M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed Test,” in 24th IEEE Asian Test Symposium (ATS’15), 2015, pp. 109–114.","bibtex":"@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed Test}, DOI={10.1109/ats.2015.26}, booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114} }","ama":"Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: 24th IEEE Asian Test Symposium (ATS’15). Mumbai, India: IEEE; 2015:109-114. doi:10.1109/ats.2015.26","mla":"Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” 24th IEEE Asian Test Symposium (ATS’15), IEEE, 2015, pp. 109–14, doi:10.1109/ats.2015.26.","apa":"Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., & Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai, India: IEEE. https://doi.org/10.1109/ats.2015.26","short":"M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114."},"status":"public","author":[{"id":"10935","full_name":"Kampmann, Matthias","last_name":"Kampmann","first_name":"Matthias"},{"full_name":"A. Kochte, Michael","last_name":"A. Kochte","first_name":"Michael"},{"first_name":"Eric","full_name":"Schneider, Eric","last_name":"Schneider"},{"last_name":"Indlekofer","full_name":"Indlekofer, Thomas","first_name":"Thomas"},{"first_name":"Sybille","last_name":"Hellebrand","id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"title":"Optimized Selection of Frequencies for Faster-Than-at-Speed Test"}