{"place":"Mumbai, India","year":"2015","status":"public","publisher":"IEEE","author":[{"first_name":"Matthias","last_name":"Kampmann","id":"10935","full_name":"Kampmann, Matthias"},{"first_name":"Michael","last_name":"A. Kochte","full_name":"A. Kochte, Michael"},{"full_name":"Schneider, Eric","last_name":"Schneider","first_name":"Eric"},{"first_name":"Thomas","full_name":"Indlekofer, Thomas","last_name":"Indlekofer"},{"id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"department":[{"_id":"48"}],"title":"Optimized Selection of Frequencies for Faster-Than-at-Speed Test","_id":"12976","date_created":"2019-08-28T09:03:08Z","citation":{"bibtex":"@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed Test}, DOI={<a href=\"https://doi.org/10.1109/ats.2015.26\">10.1109/ats.2015.26</a>}, booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114} }","mla":"Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” <i>24th IEEE Asian Test Symposium (ATS’15)</i>, IEEE, 2015, pp. 109–14, doi:<a href=\"https://doi.org/10.1109/ats.2015.26\">10.1109/ats.2015.26</a>.","ama":"Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: <i>24th IEEE Asian Test Symposium (ATS’15)</i>. Mumbai, India: IEEE; 2015:109-114. doi:<a href=\"https://doi.org/10.1109/ats.2015.26\">10.1109/ats.2015.26</a>","ieee":"M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed Test,” in <i>24th IEEE Asian Test Symposium (ATS’15)</i>, 2015, pp. 109–114.","short":"M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.","apa":"Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., &#38; Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In <i>24th IEEE Asian Test Symposium (ATS’15)</i> (pp. 109–114). Mumbai, India: IEEE. <a href=\"https://doi.org/10.1109/ats.2015.26\">https://doi.org/10.1109/ats.2015.26</a>","chicago":"Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” In <i>24th IEEE Asian Test Symposium (ATS’15)</i>, 109–14. Mumbai, India: IEEE, 2015. <a href=\"https://doi.org/10.1109/ats.2015.26\">https://doi.org/10.1109/ats.2015.26</a>."},"user_id":"209","language":[{"iso":"eng"}],"doi":"10.1109/ats.2015.26","publication":"24th IEEE Asian Test Symposium (ATS'15)","type":"conference","date_updated":"2022-01-06T06:51:27Z","page":"109-114"}