{"year":"2015","place":"Mumbai, India","page":"109-114","citation":{"ieee":"M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed Test,” in <i>24th IEEE Asian Test Symposium (ATS’15)</i>, 2015, pp. 109–114.","chicago":"Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” In <i>24th IEEE Asian Test Symposium (ATS’15)</i>, 109–14. Mumbai, India: IEEE, 2015. <a href=\"https://doi.org/10.1109/ats.2015.26\">https://doi.org/10.1109/ats.2015.26</a>.","ama":"Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: <i>24th IEEE Asian Test Symposium (ATS’15)</i>. Mumbai, India: IEEE; 2015:109-114. doi:<a href=\"https://doi.org/10.1109/ats.2015.26\">10.1109/ats.2015.26</a>","short":"M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.","mla":"Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” <i>24th IEEE Asian Test Symposium (ATS’15)</i>, IEEE, 2015, pp. 109–14, doi:<a href=\"https://doi.org/10.1109/ats.2015.26\">10.1109/ats.2015.26</a>.","bibtex":"@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed Test}, DOI={<a href=\"https://doi.org/10.1109/ats.2015.26\">10.1109/ats.2015.26</a>}, booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114} }","apa":"Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., &#38; Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In <i>24th IEEE Asian Test Symposium (ATS’15)</i> (pp. 109–114). Mumbai, India: IEEE. <a href=\"https://doi.org/10.1109/ats.2015.26\">https://doi.org/10.1109/ats.2015.26</a>"},"date_updated":"2022-01-06T06:51:27Z","publisher":"IEEE","date_created":"2019-08-28T09:03:08Z","author":[{"first_name":"Matthias","full_name":"Kampmann, Matthias","id":"10935","last_name":"Kampmann"},{"full_name":"A. Kochte, Michael","last_name":"A. Kochte","first_name":"Michael"},{"last_name":"Schneider","full_name":"Schneider, Eric","first_name":"Eric"},{"first_name":"Thomas","last_name":"Indlekofer","full_name":"Indlekofer, Thomas"},{"full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"title":"Optimized Selection of Frequencies for Faster-Than-at-Speed Test","doi":"10.1109/ats.2015.26","publication":"24th IEEE Asian Test Symposium (ATS'15)","type":"conference","status":"public","_id":"12976","department":[{"_id":"48"}],"user_id":"209","language":[{"iso":"eng"}]}