{"year":"2014","language":[{"iso":"eng"}],"_id":"12977","date_updated":"2022-01-06T06:51:27Z","author":[{"orcid":"0000-0002-3717-3939","first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"first_name":"Thomas","full_name":"Indlekofer, Thomas","last_name":"Indlekofer"},{"full_name":"Kampmann, Matthias","last_name":"Kampmann","id":"10935","first_name":"Matthias"},{"full_name":"A. Kochte, Michael","last_name":"A. Kochte","first_name":"Michael"},{"first_name":"Chang","full_name":"Liu, Chang","last_name":"Liu"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"status":"public","date_created":"2019-08-28T09:04:45Z","title":"FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects","publication":"IEEE International Test Conference (ITC'14)","type":"conference","user_id":"209","publisher":"IEEE","citation":{"short":"S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.","ama":"Hellebrand S, Indlekofer T, Kampmann M, A. Kochte M, Liu C, Wunderlich H-J. FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In: <i>IEEE International Test Conference (ITC’14)</i>. Seattle, Washington, USA: IEEE; 2014. doi:<a href=\"https://doi.org/10.1109/test.2014.7035360\">10.1109/test.2014.7035360</a>","chicago":"Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” In <i>IEEE International Test Conference (ITC’14)</i>. Seattle, Washington, USA: IEEE, 2014. <a href=\"https://doi.org/10.1109/test.2014.7035360\">https://doi.org/10.1109/test.2014.7035360</a>.","bibtex":"@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}, DOI={<a href=\"https://doi.org/10.1109/test.2014.7035360\">10.1109/test.2014.7035360</a>}, booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }","mla":"Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” <i>IEEE International Test Conference (ITC’14)</i>, IEEE, 2014, doi:<a href=\"https://doi.org/10.1109/test.2014.7035360\">10.1109/test.2014.7035360</a>.","apa":"Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &#38; Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In <i>IEEE International Test Conference (ITC’14)</i>. Seattle, Washington, USA: IEEE. <a href=\"https://doi.org/10.1109/test.2014.7035360\">https://doi.org/10.1109/test.2014.7035360</a>","ieee":"S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, and H.-J. Wunderlich, “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects,” in <i>IEEE International Test Conference (ITC’14)</i>, 2014."},"place":"Seattle, Washington, USA","department":[{"_id":"48"}],"doi":"10.1109/test.2014.7035360"}