{"department":[{"_id":"48"}],"_id":"12980","title":"Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test","citation":{"ieee":"A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,” in <i>13th IEEE Latin American Test Workshop (LATW’12)</i>, 2012, pp. 1–4.","ama":"Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: <i>13th IEEE Latin American Test Workshop (LATW’12)</i>. Quito, Ecuador: IEEE; 2012:1-4. doi:<a href=\"https://doi.org/10.1109/latw.2012.6261229\">10.1109/latw.2012.6261229</a>","mla":"Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” <i>13th IEEE Latin American Test Workshop (LATW’12)</i>, IEEE, 2012, pp. 1–4, doi:<a href=\"https://doi.org/10.1109/latw.2012.6261229\">10.1109/latw.2012.6261229</a>.","apa":"Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., &#38; Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In <i>13th IEEE Latin American Test Workshop (LATW’12)</i> (pp. 1–4). Quito, Ecuador: IEEE. <a href=\"https://doi.org/10.1109/latw.2012.6261229\">https://doi.org/10.1109/latw.2012.6261229</a>","bibtex":"@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={<a href=\"https://doi.org/10.1109/latw.2012.6261229\">10.1109/latw.2012.6261229</a>}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }","chicago":"Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In <i>13th IEEE Latin American Test Workshop (LATW’12)</i>, 1–4. Quito, Ecuador: IEEE, 2012. <a href=\"https://doi.org/10.1109/latw.2012.6261229\">https://doi.org/10.1109/latw.2012.6261229</a>.","short":"A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4."},"user_id":"209","date_created":"2019-08-28T09:16:53Z","status":"public","place":"Quito, Ecuador","year":"2012","publisher":"IEEE","author":[{"last_name":"Cook","full_name":"Cook, Alejandro","first_name":"Alejandro"},{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","id":"209","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"last_name":"E. Imhof","full_name":"E. Imhof, Michael","first_name":"Michael"},{"last_name":"Mumtaz","full_name":"Mumtaz, Abdullah","first_name":"Abdullah"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"doi":"10.1109/latw.2012.6261229","page":"1-4","publication":"13th IEEE Latin American Test Workshop (LATW'12)","type":"conference","date_updated":"2022-01-06T06:51:27Z","language":[{"iso":"eng"}]}