{"user_id":"209","citation":{"mla":"Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” <i>17th IEEE European Test Symposium (ETS’12)</i>, IEEE, 2012, pp. 1–6, doi:<a href=\"https://doi.org/10.1109/ets.2012.6233025\">10.1109/ets.2012.6233025</a>.","ama":"Cook A, Hellebrand S, Wunderlich H-J. Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In: <i>17th IEEE European Test Symposium (ETS’12)</i>. Annecy, France: IEEE; 2012:1-6. doi:<a href=\"https://doi.org/10.1109/ets.2012.6233025\">10.1109/ets.2012.6233025</a>","bibtex":"@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={<a href=\"https://doi.org/10.1109/ets.2012.6233025\">10.1109/ets.2012.6233025</a>}, booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }","ieee":"A. Cook, S. Hellebrand, and H.-J. Wunderlich, “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test,” in <i>17th IEEE European Test Symposium (ETS’12)</i>, 2012, pp. 1–6.","short":"A. Cook, S. Hellebrand, H.-J. Wunderlich, in: 17th IEEE European Test Symposium (ETS’12), IEEE, Annecy, France, 2012, pp. 1–6.","apa":"Cook, A., Hellebrand, S., &#38; Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In <i>17th IEEE European Test Symposium (ETS’12)</i> (pp. 1–6). Annecy, France: IEEE. <a href=\"https://doi.org/10.1109/ets.2012.6233025\">https://doi.org/10.1109/ets.2012.6233025</a>","chicago":"Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In <i>17th IEEE European Test Symposium (ETS’12)</i>, 1–6. Annecy, France: IEEE, 2012. <a href=\"https://doi.org/10.1109/ets.2012.6233025\">https://doi.org/10.1109/ets.2012.6233025</a>."},"date_created":"2019-08-28T09:19:20Z","_id":"12981","title":"Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test","department":[{"_id":"48"}],"publisher":"IEEE","author":[{"first_name":"Alejandro","last_name":"Cook","full_name":"Cook, Alejandro"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"status":"public","year":"2012","place":"Annecy, France","page":"1-6","type":"conference","date_updated":"2022-01-06T06:51:27Z","publication":"17th IEEE European Test Symposium (ETS'12)","doi":"10.1109/ets.2012.6233025","language":[{"iso":"eng"}]}