@inproceedings{12982, author = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}}, booktitle = {{20th IEEE Asian Test Symposium (ATS'11)}}, pages = {{285--290}}, publisher = {{IEEE}}, title = {{{Diagnostic Test of Robust Circuits}}}, doi = {{10.1109/ats.2011.55}}, year = {{2011}}, }