{"language":[{"iso":"eng"}],"_id":"12982","year":"2011","date_updated":"2022-01-06T06:51:27Z","status":"public","author":[{"last_name":"Cook","full_name":"Cook, Alejandro","first_name":"Alejandro"},{"last_name":"Hellebrand","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille"},{"first_name":"Thomas","full_name":"Indlekofer, Thomas","last_name":"Indlekofer"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"publication":"20th IEEE Asian Test Symposium (ATS'11)","title":"Diagnostic Test of Robust Circuits","date_created":"2019-08-28T09:19:22Z","page":"285-290","type":"conference","citation":{"apa":"Cook, A., Hellebrand, S., Indlekofer, T., &#38; Wunderlich, H.-J. (2011). Diagnostic Test of Robust Circuits. In <i>20th IEEE Asian Test Symposium (ATS’11)</i> (pp. 285–290). New Delhi, India: IEEE. <a href=\"https://doi.org/10.1109/ats.2011.55\">https://doi.org/10.1109/ats.2011.55</a>","ieee":"A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test of Robust Circuits,” in <i>20th IEEE Asian Test Symposium (ATS’11)</i>, 2011, pp. 285–290.","mla":"Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” <i>20th IEEE Asian Test Symposium (ATS’11)</i>, IEEE, 2011, pp. 285–90, doi:<a href=\"https://doi.org/10.1109/ats.2011.55\">10.1109/ats.2011.55</a>.","bibtex":"@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={<a href=\"https://doi.org/10.1109/ats.2011.55\">10.1109/ats.2011.55</a>}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }","chicago":"Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In <i>20th IEEE Asian Test Symposium (ATS’11)</i>, 285–90. New Delhi, India: IEEE, 2011. <a href=\"https://doi.org/10.1109/ats.2011.55\">https://doi.org/10.1109/ats.2011.55</a>.","ama":"Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust Circuits. In: <i>20th IEEE Asian Test Symposium (ATS’11)</i>. New Delhi, India: IEEE; 2011:285-290. doi:<a href=\"https://doi.org/10.1109/ats.2011.55\">10.1109/ats.2011.55</a>","short":"A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS’11), IEEE, New Delhi, India, 2011, pp. 285–290."},"publisher":"IEEE","place":"New Delhi, India","user_id":"209","department":[{"_id":"48"}],"doi":"10.1109/ats.2011.55"}