{"date_created":"2019-08-28T09:20:51Z","doi":"10.1109/ats.2010.24","_id":"12983","status":"public","year":"2010","author":[{"last_name":"Hopsch","full_name":"Hopsch, Fabian","first_name":"Fabian"},{"full_name":"Becker, Bernd","last_name":"Becker","first_name":"Bernd"},{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","id":"209","first_name":"Sybille"},{"first_name":"Ilia","full_name":"Polian, Ilia","last_name":"Polian"},{"full_name":"Straube, Bernd","last_name":"Straube","first_name":"Bernd"},{"full_name":"Vermeiren, Wolfgang","last_name":"Vermeiren","first_name":"Wolfgang"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"user_id":"209","publisher":"IEEE","type":"conference","citation":{"chicago":"Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In <i>19th IEEE Asian Test Symposium (ATS’10)</i>, 87–93. Shanghai, China: IEEE, 2010. <a href=\"https://doi.org/10.1109/ats.2010.24\">https://doi.org/10.1109/ats.2010.24</a>.","mla":"Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” <i>19th IEEE Asian Test Symposium (ATS’10)</i>, IEEE, 2010, pp. 87–93, doi:<a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>.","apa":"Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2010). Variation-Aware Fault Modeling. <i>19th IEEE Asian Test Symposium (ATS’10)</i>, 87–93. <a href=\"https://doi.org/10.1109/ats.2010.24\">https://doi.org/10.1109/ats.2010.24</a>","short":"F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 19th IEEE Asian Test Symposium (ATS’10), IEEE, Shanghai, China, 2010, pp. 87–93.","ama":"Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. In: <i>19th IEEE Asian Test Symposium (ATS’10)</i>. IEEE; 2010:87-93. doi:<a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>","ieee":"F. Hopsch <i>et al.</i>, “Variation-Aware Fault Modeling,” in <i>19th IEEE Asian Test Symposium (ATS’10)</i>, 2010, pp. 87–93, doi: <a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>.","bibtex":"@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={<a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>}, booktitle={19th IEEE Asian Test Symposium (ATS’10)}, publisher={IEEE}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }"},"department":[{"_id":"48"}],"language":[{"iso":"eng"}],"place":"Shanghai, China","page":"87-93","date_updated":"2022-05-11T16:20:07Z","title":"Variation-Aware Fault Modeling","publication":"19th IEEE Asian Test Symposium (ATS'10)"}