{"page":"480-485","type":"conference","year":"2010","date_updated":"2022-05-11T16:21:12Z","doi":"10.1109/iccd.2010.5647648","user_id":"209","_id":"12985","date_created":"2019-08-28T09:21:55Z","language":[{"iso":"eng"}],"title":"Efficient Test Response Compaction for Robust BIST Using Parity Sequences","author":[{"last_name":"Indlekofer","full_name":"Indlekofer, Thomas","first_name":"Thomas"},{"full_name":"Schnittger, Michael","last_name":"Schnittger","first_name":"Michael"},{"last_name":"Hellebrand","id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"citation":{"chicago":"Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010. https://doi.org/10.1109/iccd.2010.5647648.","ieee":"T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in 28th IEEE International Conference on Computer Design (ICCD’10), 2010, pp. 480–485, doi: 10.1109/iccd.2010.5647648.","bibtex":"@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }","ama":"Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: 28th IEEE International Conference on Computer Design (ICCD’10). IEEE; 2010:480-485. doi:10.1109/iccd.2010.5647648","mla":"Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.","apa":"Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. 28th IEEE International Conference on Computer Design (ICCD’10), 480–485. https://doi.org/10.1109/iccd.2010.5647648","short":"T. Indlekofer, M. Schnittger, S. Hellebrand, in: 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, Amsterdam, The Netherlands, 2010, pp. 480–485."},"status":"public","publisher":"IEEE","department":[{"_id":"48"}],"place":"Amsterdam, The Netherlands","publication":"28th IEEE International Conference on Computer Design (ICCD'10)"}