{"doi":"10.1109/iccd.2010.5647648","department":[{"_id":"48"}],"year":"2010","place":"Amsterdam, The Netherlands","_id":"12985","language":[{"iso":"eng"}],"citation":{"ama":"Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>. IEEE; 2010:480-485. doi:<a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>","apa":"Indlekofer, T., Schnittger, M., &#38; Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, 480–485. <a href=\"https://doi.org/10.1109/iccd.2010.5647648\">https://doi.org/10.1109/iccd.2010.5647648</a>","chicago":"Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, 480–85. Amsterdam, The Netherlands: IEEE, 2010. <a href=\"https://doi.org/10.1109/iccd.2010.5647648\">https://doi.org/10.1109/iccd.2010.5647648</a>.","mla":"Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, IEEE, 2010, pp. 480–85, doi:<a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>.","ieee":"T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, 2010, pp. 480–485, doi: <a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>.","short":"T. Indlekofer, M. Schnittger, S. Hellebrand, in: 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, Amsterdam, The Netherlands, 2010, pp. 480–485.","bibtex":"@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={<a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }"},"date_created":"2019-08-28T09:21:55Z","publisher":"IEEE","publication":"28th IEEE International Conference on Computer Design (ICCD'10)","page":"480-485","status":"public","author":[{"first_name":"Thomas","last_name":"Indlekofer","full_name":"Indlekofer, Thomas"},{"full_name":"Schnittger, Michael","first_name":"Michael","last_name":"Schnittger"},{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille","last_name":"Hellebrand"}],"title":"Efficient Test Response Compaction for Robust BIST Using Parity Sequences","date_updated":"2022-05-11T16:21:12Z","type":"conference","user_id":"209"}