{"user_id":"209","_id":"12986","language":[{"iso":"eng"}],"date_created":"2019-08-28T09:21:57Z","doi":"10.1109/dft.2010.19","date_updated":"2022-05-11T16:21:52Z","year":"2010","page":"101-108","type":"conference","place":"Kyoto, Japan","publication":"25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10)","department":[{"_id":"48"}],"publisher":"IEEE","citation":{"apa":"Hunger, M., &#38; Hellebrand, S. (2010). The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, 101–108. <a href=\"https://doi.org/10.1109/dft.2010.19\">https://doi.org/10.1109/dft.2010.19</a>","short":"M. Hunger, S. Hellebrand, in: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, Kyoto, Japan, 2010, pp. 101–108.","mla":"Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, IEEE, 2010, pp. 101–08, doi:<a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>.","ama":"Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>. IEEE; 2010:101-108. doi:<a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>","bibtex":"@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={<a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }","chicago":"Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, 101–8. Kyoto, Japan: IEEE, 2010. <a href=\"https://doi.org/10.1109/dft.2010.19\">https://doi.org/10.1109/dft.2010.19</a>.","ieee":"M. Hunger and S. Hellebrand, “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems,” in <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, 2010, pp. 101–108, doi: <a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>."},"status":"public","author":[{"last_name":"Hunger","full_name":"Hunger, Marc","first_name":"Marc"},{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","first_name":"Sybille"}],"title":"The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems"}