{"year":"2010","page":"101-108","type":"conference","date_updated":"2022-05-11T16:21:52Z","doi":"10.1109/dft.2010.19","_id":"12986","user_id":"209","language":[{"iso":"eng"}],"date_created":"2019-08-28T09:21:57Z","author":[{"first_name":"Marc","last_name":"Hunger","full_name":"Hunger, Marc"},{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"title":"The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems","citation":{"apa":"Hunger, M., & Hellebrand, S. (2010). The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–108. https://doi.org/10.1109/dft.2010.19","short":"M. Hunger, S. Hellebrand, in: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, Kyoto, Japan, 2010, pp. 101–108.","mla":"Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, 2010, pp. 101–08, doi:10.1109/dft.2010.19.","ama":"Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10). IEEE; 2010:101-108. doi:10.1109/dft.2010.19","bibtex":"@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={10.1109/dft.2010.19}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }","chicago":"Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010. https://doi.org/10.1109/dft.2010.19.","ieee":"M. Hunger and S. Hellebrand, “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems,” in 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 2010, pp. 101–108, doi: 10.1109/dft.2010.19."},"status":"public","publisher":"IEEE","place":"Kyoto, Japan","publication":"25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10)","department":[{"_id":"48"}]}